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4th Meeting X-ray techniques in investigations of the ... - CrysAC

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Transmission and reflection measurements<br />

near <strong>the</strong> primary beam.<br />

The PIXcel 3D detector allows di�ractionists<br />

to switch from conventional 1D to<br />

scann<strong>in</strong>g and static 2D measurements<br />

without hav<strong>in</strong>g to switch to a di�erent<br />

detector or <strong>in</strong>strument. In <strong>the</strong> 2D mode,<br />

one can freely optimize between resolution<br />

and field <strong>of</strong> view simply by vary<strong>in</strong>g<br />

34<br />

<strong>the</strong> detector-to-sample distance. Thanks<br />

to <strong>the</strong> solid-state detection technology,<br />

<strong>the</strong>se changes can be made without <strong>the</strong><br />

need for calibration by <strong>the</strong> user. The very<br />

high dynamical range <strong>of</strong> <strong>the</strong> detector allows<br />

measurements near <strong>the</strong> direct beam<br />

without <strong>the</strong> need <strong>of</strong> a direct beam stop.

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