Serie SP Miniature Plane-Mirror Interferometer SP-Series - SIOS ...
Serie SP Miniature Plane-Mirror Interferometer SP-Series - SIOS ...
Serie SP Miniature Plane-Mirror Interferometer SP-Series - SIOS ...
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Miniaturinterferometer<br />
<strong>Miniature</strong> <strong>Plane</strong>-<strong>Mirror</strong><br />
mit Planspiegelreflektor<br />
<strong>Interferometer</strong><br />
<strong>SP</strong>-<strong>Serie</strong>s<br />
<strong>Serie</strong> <strong>SP</strong>
Aufbau und Funktionsweise<br />
Die Miniaturinterferometer mit Planspiegelreflektor der <strong>Serie</strong><br />
<strong>SP</strong> sind Einbaumessgeräte und dienen der Präzisionslängenmessung.<br />
Sie sind geometrisch und funktionell aufgabenspezifisch<br />
anpassbar. Die Miniaturisierung des Sensorkopfes<br />
erlaubt die Anwendung als fest installiertes Messsystem.<br />
Als Messreflektor können Planspiegel oder reflektierende<br />
Oberflächen optischer Qualität verwendet werden. Der<br />
Messreflektor kann im Bereich von Winkelminuten zur<br />
optischen Achse des Messstrahls verkippt werden, ohne dass<br />
die Funktion beeinträchtigt wird. Die Zuführung des Laserlichtes<br />
zum Sensorkopf erfolgt über Lichtwellenleiter (LWL).<br />
Das Miniaturinterferometer wandelt die Messbewegung des<br />
Planspiegels in Richtung der optischen Achse des Messstrahles<br />
in ein Interferenzsignal. Das interferenzoptische Signal wird<br />
zur optoelektronischen Auswerte- und Versorgungs-einheit<br />
übertragen und als Messergebnis zur Verfügung gestellt. Die<br />
Bedienung und Anzeige erfolgt wahlweise über ein separates<br />
Display oder einen PC mit optionaler Software.<br />
Technische Daten<br />
Besondere Merkmale und Vorteile<br />
Längenmesssystem höchster Genauigkeit<br />
einstrahliges Messprinzip minimiert Abbe-Fehler<br />
bei entsprechender Einbaulage<br />
flexibles Einbaumesssystem, kunden-spezifisch<br />
anpassbar<br />
LWL-Einkopplung des Laserlichtes<br />
als Reflektor ist ein Planspiegel bzw. eine<br />
reflektierende Oberfläche direkt verwendbar<br />
entsprechend der Größe des Messreflektors<br />
kann sich das Messobjekt senkrecht zur<br />
Messbewegung bewegen<br />
He-Ne-Laser mit hoher Frequenzstabilität als<br />
Lichtquelle<br />
Korrektur der Umwelteinflüsse auf die<br />
Wellenlänge des Laserlichtes<br />
Material des Sensorkopfes wählbar zwischen<br />
Aluminium, Edelstahl und Invar<br />
Anwendungen<br />
Laserinterferometrisches Präzisionslängenmesssystem<br />
für Messtische, Mikroskoptische,<br />
Positioniertische, Messmaschinen, Werkzeugmaschinen,<br />
Härte- und Materialprüfgeräte als<br />
Einbaumess- oder Kalibriergerät<br />
Ein,- Zwei- und Mehrkoordinatenmessungen<br />
Zweikoordinatenmessungen, z.B. an Planartischen,<br />
durch zwei Sensorköpfe an einer elektronischen<br />
Auswerte- und Versorgungseinheit<br />
Kalibrierung von Längenmessgeräten<br />
Schlagfehlermessungen<br />
Rundlauffehlermessungen<br />
Berührungslose Oberflächenvermessungen<br />
Modell <strong>SP</strong> 120 Modell <strong>SP</strong> 2000<br />
100<br />
1 / 0,1<br />
632,8<br />
3 · 10 -7<br />
2000<br />
1 / 0,1<br />
632,8<br />
2 · 10<br />
1<br />
-8<br />
Design and Operation<br />
Our <strong>SP</strong>-<strong>Serie</strong>s miniature plane-mirror interferometers are precision<br />
length measurement instruments designed for incorporation<br />
into customer supplied systems, and are readily adapted to<br />
suit a wide variety of experimental setups and tasks. The<br />
miniaturized sensor head allows their employment as permanently<br />
installed metrological systems.<br />
Planar mirrors or other optical-quality reflective surfaces may be<br />
employed as reflectors on their translating arms, and may be<br />
angularly misaligned by as much as several minutes of arc with<br />
respect to the laser beam without adversely affecting the<br />
operation of the interferometer. The beam from the laser light<br />
source is transmitted to the sensor head by a fiberoptic cable.<br />
The miniature interferometer converts motions of the planar<br />
mirror along the beam axis into optical interference signals that<br />
are transmitted to an optoelectronic signal processing/power<br />
supply unit for processing and output as lengths.<br />
Instrument operation and display of measurement results are<br />
controlled either through a separate keypad/display unit or a<br />
PC running an optional software package.<br />
Technical Data<br />
Messbereich mm<br />
Auflösung nm<br />
Wellenlänge nm<br />
Frequenzstabilität des Lasers (nach der Einlaufzeit)<br />
Einlaufzeit des Lasers min<br />
Arbeitstemperaturbereich °C<br />
Verschiebegeschwindigkeit (maximal) mm/s<br />
Abmessungen Sensorkopf mm<br />
(H x B x T) Elektronische Auswerte- u.<br />
Versorgungseinheit mm<br />
Gewicht Sensorkopf g<br />
Elektronische Auswerte- u.<br />
Versorgungseinheit g<br />
Schnittstellen Standard<br />
Optional<br />
Kabellänge zwischen Sensorkopf und<br />
elektronischer Auswerte- u. Versorgungseinheit m<br />
Spannungsversorgung VAC<br />
Hz<br />
Major Performance Features<br />
Ultraprecise length measurement instruments<br />
Single beam design minimizes Abbe aberraions<br />
when correctly aligned<br />
Versatile instruments for incorporation into<br />
customer supplied systems, readily adapted to<br />
suit a wide variety of tasks<br />
Fiberoptic coupled sensor head<br />
A planar mirror or other reflective surface may<br />
be employed as the moving reflector<br />
The specimen can be moved perpendicular to<br />
the direction of measurement depending on<br />
the measuring reflector dimensions<br />
Employs frequency-stabilized HeNe lasers as<br />
light sources<br />
Corrects for variations in laser wavelength<br />
caused by ambient conditions<br />
Sensor head material selectable between<br />
aluminium, stainless steel and Invar<br />
Applications<br />
Precision laser interferometric length measurement<br />
systems for incorporation into, or calirating,<br />
translation stages, microscope stages,<br />
positioning stages, metrological equipment,<br />
machine tools, or hardness testing and mateials<br />
testing equipment<br />
Single/dual/multi-axis coordinate measureents<br />
Two-coordinate measurements, e.g. on planar<br />
stages, by using two sensor heads connected to<br />
an electronic analysis and supply unit<br />
Calibrating length measurement<br />
instrumentation<br />
Runout and eccentricity measurements<br />
Noncontact surface profiling<br />
Model <strong>SP</strong> 120 Model <strong>SP</strong> 2000<br />
100<br />
1 / 0.1<br />
0.1<br />
632.8<br />
3 · 10 10…20<br />
15…30<br />
800<br />
36 x 70 x 70<br />
150 x 450 x 400<br />
200<br />
9.500<br />
RS 232 C, USB<br />
Digitales 32-bit Parallelinterface<br />
Digitale Inkrementalsignale (TTL-Pegel)<br />
Analoge Inkrementalsignale (± 1Vpp) 3, optional bis 10<br />
100…240<br />
47…60<br />
<strong>SIOS</strong> Meßtechnik GmbH<br />
Am Vogelherd 46<br />
D-98693 Ilmenau<br />
Tel: +49-(0)3677-64470 E-mail: info@sios.de<br />
Fax: +49-(0)3677-64478 URL: http://www.sios.de<br />
Wir beraten Sie gern:<br />
Änderungen vorbehalten. 11/2008<br />
-7<br />
2,000<br />
1 / 0.1<br />
0.1<br />
632.8<br />
2 · 10<br />
1<br />
-8<br />
Design and Operation<br />
Our <strong>SP</strong>-<strong>Serie</strong>s miniature plane-mirror interferometers are precision<br />
length measurement instruments designed for incorporation<br />
into customer supplied systems, and are readily adapted to<br />
suit a wide variety of experimental setups and tasks. The<br />
miniaturized sensor head allows their employment as permanently<br />
installed metrological systems.<br />
Planar mirrors or other optical-quality reflective surfaces may be<br />
employed as reflectors on their translating arms, and may be<br />
angularly misaligned by as much as several minutes of arc with<br />
respect to the laser beam without adversely affecting the<br />
operation of the interferometer. The beam from the laser light<br />
source is transmitted to the sensor head by a fiberoptic cable.<br />
The miniature interferometer converts motions of the planar<br />
mirror along the beam axis into optical interference signals that<br />
are transmitted to an optoelectronic signal processing/power<br />
supply unit for processing and output as lengths.<br />
Instrument operation and display of measurement results are<br />
controlled either through a separate keypad/display unit or a<br />
PC running an optional software package.<br />
Technical Data<br />
Measurement range mm<br />
Metric resolution, standard nm<br />
optionally nm<br />
Nominal laser wavelength nm<br />
Laser frequency stability (after warm-up)<br />
Laser warm-up period min<br />
Operating temperature range °C<br />
Maximum mirror translation rate mm/s<br />
Dimensions (H x W x D):<br />
Sensor head mm<br />
Optoelectronic signal-processing/power-supply unit mm<br />
Mass:<br />
Sensor head g<br />
Optoelectronic signal-processing/power-supply unit g<br />
Interface: standard<br />
optionally<br />
Fiberoptic cable length m<br />
Supply-line voltage VAC<br />
Supply-line frequency Hz<br />
Major Performance Features<br />
Ultraprecise length measurement instruments<br />
Single beam design minimizes Abbe aberraions<br />
when correctly aligned<br />
Versatile instruments for incorporation into<br />
customer supplied systems, readily adapted to<br />
suit a wide variety of tasks<br />
Fiberoptic coupled sensor head<br />
A planar mirror or other reflective surface may<br />
be employed as the moving reflector<br />
The specimen can be moved perpendicular to<br />
the direction of measurement depending on<br />
the measuring reflector dimensions<br />
Employs frequency-stabilized HeNe lasers as<br />
light sources<br />
Corrects for variations in laser wavelength<br />
caused by ambient conditions<br />
Sensor head material selectable between<br />
aluminium, stainless steel and Invar<br />
Applications<br />
Precision laser interferometric length measurement<br />
systems for incorporation into, or calirating,<br />
translation stages, microscope stages,<br />
positioning stages, metrological equipment,<br />
machine tools, or hardness testing and mateials<br />
testing equipment<br />
Single/dual/multi-axis coordinate measureents<br />
Two-coordinate measurements, e.g. on planar<br />
stages, by using two sensor heads connected to<br />
an electronic analysis and supply unit<br />
Calibrating length measurement<br />
instrumentation<br />
Runout and eccentricity measurements<br />
Noncontact surface profiling<br />
Model <strong>SP</strong> 120 Model <strong>SP</strong> 2000<br />
100<br />
1 / 0.1<br />
0.1<br />
632.8<br />
3 · 10<br />
10 - 20<br />
15 - 30<br />
800<br />
36 x 70 x 70<br />
150 x 450 x 400<br />
200<br />
9,500<br />
RS 232 C, USB<br />
Digital 32-bit parallel interface<br />
Digital increment signals (TTL)<br />
Analog increment signals (±1 Vpp)<br />
3, optionally up to 10<br />
100 - 240<br />
47 - 60<br />
<strong>SIOS</strong> Meßtechnik GmbH<br />
Am Vogelherd 46<br />
D-98693 Ilmenau, Germany<br />
Tel: +49-(0)3677-64470 E-mail: info@sios.de<br />
Fax: +49-(0)3677-64478 URL: http://www.sios.de<br />
We reserve the right to alter products and their specifications without prior notice.<br />
Your contact for further information:<br />
11/2008<br />
-7<br />
2,000<br />
1 / 0.1<br />
0.1<br />
632.8<br />
2 · 10<br />
1<br />
-8<br />
Design and Operation<br />
Our <strong>SP</strong>-<strong>Serie</strong>s miniature plane-mirror interferometers are precision<br />
length measurement instruments designed for incorporation<br />
into customer supplied systems, and are readily adapted to<br />
suit a wide variety of experimental setups and tasks. The<br />
miniaturized sensor head allows their employment as permanently<br />
installed metrological systems.<br />
Planar mirrors or other optical-quality reflective surfaces may be<br />
employed as reflectors on their translating arms, and may be<br />
angularly misaligned by as much as several minutes of arc with<br />
respect to the laser beam without adversely affecting the<br />
operation of the interferometer. The beam from the laser light<br />
source is transmitted to the sensor head by a fiberoptic cable.<br />
The miniature interferometer converts motions of the planar<br />
mirror along the beam axis into optical interference signals that<br />
are transmitted to an optoelectronic signal processing/power<br />
supply unit for processing and output as lengths.<br />
Instrument operation and display of measurement results are<br />
controlled either through a separate keypad/display unit or a<br />
PC running an optional software package.<br />
Technical Data<br />
Measurement range mm<br />
Metric resolution, standard nm<br />
optionally nm<br />
Nominal laser wavelength nm<br />
Laser frequency stability (after warm-up)<br />
Laser warm-up period min<br />
Operating temperature range °C<br />
Maximum mirror translation rate mm/s<br />
Dimensions (H x W x D):<br />
Sensor head mm<br />
Optoelectronic signal-processing/power-supply unit mm<br />
Mass:<br />
Sensor head g<br />
Optoelectronic signal-processing/power-supply unit g<br />
Interface: standard<br />
optionally<br />
Fiberoptic cable length m<br />
Supply-line voltage VAC<br />
Supply-line frequency Hz<br />
Major Performance Features<br />
Ultraprecise length measurement instruments<br />
Single beam design minimizes Abbe aberraions<br />
when correctly aligned<br />
Versatile instruments for incorporation into<br />
customer supplied systems, readily adapted to<br />
suit a wide variety of tasks<br />
Fiberoptic coupled sensor head<br />
A planar mirror or other reflective surface may<br />
be employed as the moving reflector<br />
The specimen can be moved perpendicular to<br />
the direction of measurement depending on<br />
the measuring reflector dimensions<br />
Employs frequency-stabilized HeNe lasers as<br />
light sources<br />
Corrects for variations in laser wavelength<br />
caused by ambient conditions<br />
Sensor head material selectable between<br />
aluminium, stainless steel and Invar<br />
Applications<br />
Precision laser interferometric length measurement<br />
systems for incorporation into, or calirating,<br />
translation stages, microscope stages,<br />
positioning stages, metrological equipment,<br />
machine tools, or hardness testing and mateials<br />
testing equipment<br />
Single/dual/multi-axis coordinate measureents<br />
Two-coordinate measurements, e.g. on planar<br />
stages, by using two sensor heads connected to<br />
an electronic analysis and supply unit<br />
Calibrating length measurement<br />
instrumentation<br />
Runout and eccentricity measurements<br />
Noncontact surface profiling<br />
Model <strong>SP</strong> 120 Model <strong>SP</strong> 2000<br />
100<br />
1 / 0.1<br />
0.1<br />
632.8<br />
3 · 10 10 - 20<br />
15 - 30<br />
800<br />
36 x 70 x 70<br />
150 x 450 x 400<br />
200<br />
9,500<br />
RS 232 C, USB<br />
Digital 32-bit parallel interface<br />
Digital increment signals (TTL)<br />
Analog increment signals (±1 Vpp)<br />
3, optionally up to 10<br />
100 - 240<br />
47 - 60<br />
<strong>SIOS</strong> Meßtechnik GmbH<br />
Am Vogelherd 46<br />
D-98693 Ilmenau, Germany<br />
Tel: +49-(0)3677-64470 E-mail: info@sios.de<br />
Fax: +49-(0)3677-64478 URL: http://www.sios.de<br />
We reserve the right to alter products and their specifications without prior notice.<br />
Your contact for further information:<br />
11/2008<br />
-7<br />
2,000<br />
1 / 0.1<br />
0.1<br />
632.8<br />
2 · 10<br />
1<br />
-8<br />
Measurement range mm<br />
Metric resolution, standard nm<br />
optionally nm<br />
Nominal laser wavelength nm<br />
Laser frequency stability (after warm-up)<br />
Laser warm-up period min<br />
Operating temperature range °C<br />
Maximum mirror translation rate mm/s<br />
Dimensions (H x W x D):<br />
Sensor head mm<br />
Optoelectronic signal-processing/power-supply unit mm<br />
Mass:<br />
Sensor head g<br />
Optoelectronic signal-processing/power-supply unit g<br />
Interface: standard<br />
optionally<br />
Fiberoptic cable length m<br />
Supply-line voltage VAC<br />
Supply-line frequency Hz<br />
10 - 20<br />
15 - 30<br />
800<br />
36 x 70 x 70<br />
150 x 450 x 400<br />
200<br />
9,500<br />
RS 232 C, USB<br />
Digital 32-bit parallel interface<br />
Digital increment signals (TTL)<br />
Analog increment signals (±1 Vpp)<br />
3, optionally up to 10<br />
100 - 240<br />
47 - 60<br />
<strong>SIOS</strong> Meßtechnik GmbH<br />
Am Vogelherd 46<br />
D-98693 Ilmenau, Germany<br />
Tel: +49-(0)3677-64470 E-mail: info@sios.de<br />
Fax: +49-(0)3677-64478 URL: http://www.sios.de<br />
Your contact for further information:<br />
We reserve the right to alter products and their specifications without prior notice. 11/2008