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Serie SP Miniature Plane-Mirror Interferometer SP-Series - SIOS ...

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Miniaturinterferometer<br />

<strong>Miniature</strong> <strong>Plane</strong>-<strong>Mirror</strong><br />

mit Planspiegelreflektor<br />

<strong>Interferometer</strong><br />

<strong>SP</strong>-<strong>Serie</strong>s<br />

<strong>Serie</strong> <strong>SP</strong>


Aufbau und Funktionsweise<br />

Die Miniaturinterferometer mit Planspiegelreflektor der <strong>Serie</strong><br />

<strong>SP</strong> sind Einbaumessgeräte und dienen der Präzisionslängenmessung.<br />

Sie sind geometrisch und funktionell aufgabenspezifisch<br />

anpassbar. Die Miniaturisierung des Sensorkopfes<br />

erlaubt die Anwendung als fest installiertes Messsystem.<br />

Als Messreflektor können Planspiegel oder reflektierende<br />

Oberflächen optischer Qualität verwendet werden. Der<br />

Messreflektor kann im Bereich von Winkelminuten zur<br />

optischen Achse des Messstrahls verkippt werden, ohne dass<br />

die Funktion beeinträchtigt wird. Die Zuführung des Laserlichtes<br />

zum Sensorkopf erfolgt über Lichtwellenleiter (LWL).<br />

Das Miniaturinterferometer wandelt die Messbewegung des<br />

Planspiegels in Richtung der optischen Achse des Messstrahles<br />

in ein Interferenzsignal. Das interferenzoptische Signal wird<br />

zur optoelektronischen Auswerte- und Versorgungs-einheit<br />

übertragen und als Messergebnis zur Verfügung gestellt. Die<br />

Bedienung und Anzeige erfolgt wahlweise über ein separates<br />

Display oder einen PC mit optionaler Software.<br />

Technische Daten<br />

Besondere Merkmale und Vorteile<br />

Längenmesssystem höchster Genauigkeit<br />

einstrahliges Messprinzip minimiert Abbe-Fehler<br />

bei entsprechender Einbaulage<br />

flexibles Einbaumesssystem, kunden-spezifisch<br />

anpassbar<br />

LWL-Einkopplung des Laserlichtes<br />

als Reflektor ist ein Planspiegel bzw. eine<br />

reflektierende Oberfläche direkt verwendbar<br />

entsprechend der Größe des Messreflektors<br />

kann sich das Messobjekt senkrecht zur<br />

Messbewegung bewegen<br />

He-Ne-Laser mit hoher Frequenzstabilität als<br />

Lichtquelle<br />

Korrektur der Umwelteinflüsse auf die<br />

Wellenlänge des Laserlichtes<br />

Material des Sensorkopfes wählbar zwischen<br />

Aluminium, Edelstahl und Invar<br />

Anwendungen<br />

Laserinterferometrisches Präzisionslängenmesssystem<br />

für Messtische, Mikroskoptische,<br />

Positioniertische, Messmaschinen, Werkzeugmaschinen,<br />

Härte- und Materialprüfgeräte als<br />

Einbaumess- oder Kalibriergerät<br />

Ein,- Zwei- und Mehrkoordinatenmessungen<br />

Zweikoordinatenmessungen, z.B. an Planartischen,<br />

durch zwei Sensorköpfe an einer elektronischen<br />

Auswerte- und Versorgungseinheit<br />

Kalibrierung von Längenmessgeräten<br />

Schlagfehlermessungen<br />

Rundlauffehlermessungen<br />

Berührungslose Oberflächenvermessungen<br />

Modell <strong>SP</strong> 120 Modell <strong>SP</strong> 2000<br />

100<br />

1 / 0,1<br />

632,8<br />

3 · 10 -7<br />

2000<br />

1 / 0,1<br />

632,8<br />

2 · 10<br />

1<br />

-8<br />

Design and Operation<br />

Our <strong>SP</strong>-<strong>Serie</strong>s miniature plane-mirror interferometers are precision<br />

length measurement instruments designed for incorporation<br />

into customer supplied systems, and are readily adapted to<br />

suit a wide variety of experimental setups and tasks. The<br />

miniaturized sensor head allows their employment as permanently<br />

installed metrological systems.<br />

Planar mirrors or other optical-quality reflective surfaces may be<br />

employed as reflectors on their translating arms, and may be<br />

angularly misaligned by as much as several minutes of arc with<br />

respect to the laser beam without adversely affecting the<br />

operation of the interferometer. The beam from the laser light<br />

source is transmitted to the sensor head by a fiberoptic cable.<br />

The miniature interferometer converts motions of the planar<br />

mirror along the beam axis into optical interference signals that<br />

are transmitted to an optoelectronic signal processing/power<br />

supply unit for processing and output as lengths.<br />

Instrument operation and display of measurement results are<br />

controlled either through a separate keypad/display unit or a<br />

PC running an optional software package.<br />

Technical Data<br />

Messbereich mm<br />

Auflösung nm<br />

Wellenlänge nm<br />

Frequenzstabilität des Lasers (nach der Einlaufzeit)<br />

Einlaufzeit des Lasers min<br />

Arbeitstemperaturbereich °C<br />

Verschiebegeschwindigkeit (maximal) mm/s<br />

Abmessungen Sensorkopf mm<br />

(H x B x T) Elektronische Auswerte- u.<br />

Versorgungseinheit mm<br />

Gewicht Sensorkopf g<br />

Elektronische Auswerte- u.<br />

Versorgungseinheit g<br />

Schnittstellen Standard<br />

Optional<br />

Kabellänge zwischen Sensorkopf und<br />

elektronischer Auswerte- u. Versorgungseinheit m<br />

Spannungsversorgung VAC<br />

Hz<br />

Major Performance Features<br />

Ultraprecise length measurement instruments<br />

Single beam design minimizes Abbe aberraions<br />

when correctly aligned<br />

Versatile instruments for incorporation into<br />

customer supplied systems, readily adapted to<br />

suit a wide variety of tasks<br />

Fiberoptic coupled sensor head<br />

A planar mirror or other reflective surface may<br />

be employed as the moving reflector<br />

The specimen can be moved perpendicular to<br />

the direction of measurement depending on<br />

the measuring reflector dimensions<br />

Employs frequency-stabilized HeNe lasers as<br />

light sources<br />

Corrects for variations in laser wavelength<br />

caused by ambient conditions<br />

Sensor head material selectable between<br />

aluminium, stainless steel and Invar<br />

Applications<br />

Precision laser interferometric length measurement<br />

systems for incorporation into, or calirating,<br />

translation stages, microscope stages,<br />

positioning stages, metrological equipment,<br />

machine tools, or hardness testing and mateials<br />

testing equipment<br />

Single/dual/multi-axis coordinate measureents<br />

Two-coordinate measurements, e.g. on planar<br />

stages, by using two sensor heads connected to<br />

an electronic analysis and supply unit<br />

Calibrating length measurement<br />

instrumentation<br />

Runout and eccentricity measurements<br />

Noncontact surface profiling<br />

Model <strong>SP</strong> 120 Model <strong>SP</strong> 2000<br />

100<br />

1 / 0.1<br />

0.1<br />

632.8<br />

3 · 10 10…20<br />

15…30<br />

800<br />

36 x 70 x 70<br />

150 x 450 x 400<br />

200<br />

9.500<br />

RS 232 C, USB<br />

Digitales 32-bit Parallelinterface<br />

Digitale Inkrementalsignale (TTL-Pegel)<br />

Analoge Inkrementalsignale (± 1Vpp) 3, optional bis 10<br />

100…240<br />

47…60<br />

<strong>SIOS</strong> Meßtechnik GmbH<br />

Am Vogelherd 46<br />

D-98693 Ilmenau<br />

Tel: +49-(0)3677-64470 E-mail: info@sios.de<br />

Fax: +49-(0)3677-64478 URL: http://www.sios.de<br />

Wir beraten Sie gern:<br />

Änderungen vorbehalten. 11/2008<br />

-7<br />

2,000<br />

1 / 0.1<br />

0.1<br />

632.8<br />

2 · 10<br />

1<br />

-8<br />

Design and Operation<br />

Our <strong>SP</strong>-<strong>Serie</strong>s miniature plane-mirror interferometers are precision<br />

length measurement instruments designed for incorporation<br />

into customer supplied systems, and are readily adapted to<br />

suit a wide variety of experimental setups and tasks. The<br />

miniaturized sensor head allows their employment as permanently<br />

installed metrological systems.<br />

Planar mirrors or other optical-quality reflective surfaces may be<br />

employed as reflectors on their translating arms, and may be<br />

angularly misaligned by as much as several minutes of arc with<br />

respect to the laser beam without adversely affecting the<br />

operation of the interferometer. The beam from the laser light<br />

source is transmitted to the sensor head by a fiberoptic cable.<br />

The miniature interferometer converts motions of the planar<br />

mirror along the beam axis into optical interference signals that<br />

are transmitted to an optoelectronic signal processing/power<br />

supply unit for processing and output as lengths.<br />

Instrument operation and display of measurement results are<br />

controlled either through a separate keypad/display unit or a<br />

PC running an optional software package.<br />

Technical Data<br />

Measurement range mm<br />

Metric resolution, standard nm<br />

optionally nm<br />

Nominal laser wavelength nm<br />

Laser frequency stability (after warm-up)<br />

Laser warm-up period min<br />

Operating temperature range °C<br />

Maximum mirror translation rate mm/s<br />

Dimensions (H x W x D):<br />

Sensor head mm<br />

Optoelectronic signal-processing/power-supply unit mm<br />

Mass:<br />

Sensor head g<br />

Optoelectronic signal-processing/power-supply unit g<br />

Interface: standard<br />

optionally<br />

Fiberoptic cable length m<br />

Supply-line voltage VAC<br />

Supply-line frequency Hz<br />

Major Performance Features<br />

Ultraprecise length measurement instruments<br />

Single beam design minimizes Abbe aberraions<br />

when correctly aligned<br />

Versatile instruments for incorporation into<br />

customer supplied systems, readily adapted to<br />

suit a wide variety of tasks<br />

Fiberoptic coupled sensor head<br />

A planar mirror or other reflective surface may<br />

be employed as the moving reflector<br />

The specimen can be moved perpendicular to<br />

the direction of measurement depending on<br />

the measuring reflector dimensions<br />

Employs frequency-stabilized HeNe lasers as<br />

light sources<br />

Corrects for variations in laser wavelength<br />

caused by ambient conditions<br />

Sensor head material selectable between<br />

aluminium, stainless steel and Invar<br />

Applications<br />

Precision laser interferometric length measurement<br />

systems for incorporation into, or calirating,<br />

translation stages, microscope stages,<br />

positioning stages, metrological equipment,<br />

machine tools, or hardness testing and mateials<br />

testing equipment<br />

Single/dual/multi-axis coordinate measureents<br />

Two-coordinate measurements, e.g. on planar<br />

stages, by using two sensor heads connected to<br />

an electronic analysis and supply unit<br />

Calibrating length measurement<br />

instrumentation<br />

Runout and eccentricity measurements<br />

Noncontact surface profiling<br />

Model <strong>SP</strong> 120 Model <strong>SP</strong> 2000<br />

100<br />

1 / 0.1<br />

0.1<br />

632.8<br />

3 · 10<br />

10 - 20<br />

15 - 30<br />

800<br />

36 x 70 x 70<br />

150 x 450 x 400<br />

200<br />

9,500<br />

RS 232 C, USB<br />

Digital 32-bit parallel interface<br />

Digital increment signals (TTL)<br />

Analog increment signals (±1 Vpp)<br />

3, optionally up to 10<br />

100 - 240<br />

47 - 60<br />

<strong>SIOS</strong> Meßtechnik GmbH<br />

Am Vogelherd 46<br />

D-98693 Ilmenau, Germany<br />

Tel: +49-(0)3677-64470 E-mail: info@sios.de<br />

Fax: +49-(0)3677-64478 URL: http://www.sios.de<br />

We reserve the right to alter products and their specifications without prior notice.<br />

Your contact for further information:<br />

11/2008<br />

-7<br />

2,000<br />

1 / 0.1<br />

0.1<br />

632.8<br />

2 · 10<br />

1<br />

-8<br />

Design and Operation<br />

Our <strong>SP</strong>-<strong>Serie</strong>s miniature plane-mirror interferometers are precision<br />

length measurement instruments designed for incorporation<br />

into customer supplied systems, and are readily adapted to<br />

suit a wide variety of experimental setups and tasks. The<br />

miniaturized sensor head allows their employment as permanently<br />

installed metrological systems.<br />

Planar mirrors or other optical-quality reflective surfaces may be<br />

employed as reflectors on their translating arms, and may be<br />

angularly misaligned by as much as several minutes of arc with<br />

respect to the laser beam without adversely affecting the<br />

operation of the interferometer. The beam from the laser light<br />

source is transmitted to the sensor head by a fiberoptic cable.<br />

The miniature interferometer converts motions of the planar<br />

mirror along the beam axis into optical interference signals that<br />

are transmitted to an optoelectronic signal processing/power<br />

supply unit for processing and output as lengths.<br />

Instrument operation and display of measurement results are<br />

controlled either through a separate keypad/display unit or a<br />

PC running an optional software package.<br />

Technical Data<br />

Measurement range mm<br />

Metric resolution, standard nm<br />

optionally nm<br />

Nominal laser wavelength nm<br />

Laser frequency stability (after warm-up)<br />

Laser warm-up period min<br />

Operating temperature range °C<br />

Maximum mirror translation rate mm/s<br />

Dimensions (H x W x D):<br />

Sensor head mm<br />

Optoelectronic signal-processing/power-supply unit mm<br />

Mass:<br />

Sensor head g<br />

Optoelectronic signal-processing/power-supply unit g<br />

Interface: standard<br />

optionally<br />

Fiberoptic cable length m<br />

Supply-line voltage VAC<br />

Supply-line frequency Hz<br />

Major Performance Features<br />

Ultraprecise length measurement instruments<br />

Single beam design minimizes Abbe aberraions<br />

when correctly aligned<br />

Versatile instruments for incorporation into<br />

customer supplied systems, readily adapted to<br />

suit a wide variety of tasks<br />

Fiberoptic coupled sensor head<br />

A planar mirror or other reflective surface may<br />

be employed as the moving reflector<br />

The specimen can be moved perpendicular to<br />

the direction of measurement depending on<br />

the measuring reflector dimensions<br />

Employs frequency-stabilized HeNe lasers as<br />

light sources<br />

Corrects for variations in laser wavelength<br />

caused by ambient conditions<br />

Sensor head material selectable between<br />

aluminium, stainless steel and Invar<br />

Applications<br />

Precision laser interferometric length measurement<br />

systems for incorporation into, or calirating,<br />

translation stages, microscope stages,<br />

positioning stages, metrological equipment,<br />

machine tools, or hardness testing and mateials<br />

testing equipment<br />

Single/dual/multi-axis coordinate measureents<br />

Two-coordinate measurements, e.g. on planar<br />

stages, by using two sensor heads connected to<br />

an electronic analysis and supply unit<br />

Calibrating length measurement<br />

instrumentation<br />

Runout and eccentricity measurements<br />

Noncontact surface profiling<br />

Model <strong>SP</strong> 120 Model <strong>SP</strong> 2000<br />

100<br />

1 / 0.1<br />

0.1<br />

632.8<br />

3 · 10 10 - 20<br />

15 - 30<br />

800<br />

36 x 70 x 70<br />

150 x 450 x 400<br />

200<br />

9,500<br />

RS 232 C, USB<br />

Digital 32-bit parallel interface<br />

Digital increment signals (TTL)<br />

Analog increment signals (±1 Vpp)<br />

3, optionally up to 10<br />

100 - 240<br />

47 - 60<br />

<strong>SIOS</strong> Meßtechnik GmbH<br />

Am Vogelherd 46<br />

D-98693 Ilmenau, Germany<br />

Tel: +49-(0)3677-64470 E-mail: info@sios.de<br />

Fax: +49-(0)3677-64478 URL: http://www.sios.de<br />

We reserve the right to alter products and their specifications without prior notice.<br />

Your contact for further information:<br />

11/2008<br />

-7<br />

2,000<br />

1 / 0.1<br />

0.1<br />

632.8<br />

2 · 10<br />

1<br />

-8<br />

Measurement range mm<br />

Metric resolution, standard nm<br />

optionally nm<br />

Nominal laser wavelength nm<br />

Laser frequency stability (after warm-up)<br />

Laser warm-up period min<br />

Operating temperature range °C<br />

Maximum mirror translation rate mm/s<br />

Dimensions (H x W x D):<br />

Sensor head mm<br />

Optoelectronic signal-processing/power-supply unit mm<br />

Mass:<br />

Sensor head g<br />

Optoelectronic signal-processing/power-supply unit g<br />

Interface: standard<br />

optionally<br />

Fiberoptic cable length m<br />

Supply-line voltage VAC<br />

Supply-line frequency Hz<br />

10 - 20<br />

15 - 30<br />

800<br />

36 x 70 x 70<br />

150 x 450 x 400<br />

200<br />

9,500<br />

RS 232 C, USB<br />

Digital 32-bit parallel interface<br />

Digital increment signals (TTL)<br />

Analog increment signals (±1 Vpp)<br />

3, optionally up to 10<br />

100 - 240<br />

47 - 60<br />

<strong>SIOS</strong> Meßtechnik GmbH<br />

Am Vogelherd 46<br />

D-98693 Ilmenau, Germany<br />

Tel: +49-(0)3677-64470 E-mail: info@sios.de<br />

Fax: +49-(0)3677-64478 URL: http://www.sios.de<br />

Your contact for further information:<br />

We reserve the right to alter products and their specifications without prior notice. 11/2008

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