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8.3 EXTENDED X-RAY ABSORPTION FINE STRUCTURE 333<br />

Figure 8.38 Curve fitting of Mo extended X-ray absorption fine structure (EXAFS) for<br />

Mo(SC 6H 4NH) 3, taking into account (a) sulphur and (b) sulphur and nitrogen atoms as near<br />

neighbours. (Reproduced, with permission, from Winnick, H. and Doniach, S. (Eds), Synchrotron<br />

Radiation Research, p. 436, Plenum, New York, 1980)<br />

from four identical Fe–S distances in a rubredoxin. In the examples of plant and bacterial<br />

ferredoxins in Figures 8.39(b) and 8.39(c) there are two types of waves indicating two types<br />

of Fe–S linkage consistent with the structures shown.<br />

The example in Figure 8.40 illustrates the use of EXAFS in indicating the degree of order<br />

in a sample of a catalyst. In this figure is shown the k3wðkÞ EXAFS signal from osmium<br />

atoms in the pure metal to be compared with that of a 1% osmium catalyst in small clusters<br />

dispersed on a silica surface. The main peak in the Fourier transformed spectrum is due to<br />

Os–Os nearest neighbours and is much more intense (ca 3.2) in the pure metal than in the<br />

catalyst (ca 0.8), indicating many more Os–Os bonds. When the filter window is applied,<br />

followed by retransformation, the main difference in the catalyst is that the single wave is<br />

damped much more rapidly than in the pure metal. The damping is due to the expð 2s2 j k2Þ factor in Equation (8.20). The quantity sj is a measure of the disorder in the material which<br />

is clearly greater in the catalyst resulting in more rapid damping. Analysis of the data<br />

has shown that (a) N1 ¼ 8:3 2:0 for the catalyst, compared with 12 for pure osmium,<br />

which has a face-centred cubic structure, and (b) Ds 2 1 ¼ s2 1 ðcatalystÞ s2 1<br />

metalÞ ¼<br />

0:0022 0:0002, showing the great disorder in the catalyst.<br />

The EXAFS method can be used for different elements in the same material or for<br />

different absorption edges, such as 1s, 2s or 2p, in the same element.<br />

Auger electrons, produced in the way described in Section 8.2.1, may also produce<br />

scattering interference in the same way as ordinary photoelectrons. The technique is useful<br />

for studying surfaces and is known as surface EXAFS, or SEXAFS. An example of its use is<br />

an investigation of Br 2 adsorbed onto carbon in the form of 50% carbon crystallites and 50%<br />

graphite. The fact that the X-ray radiation from a storage ring is plane polarized was used to<br />

show that, for a 20% Br2 monolayer coverage, the Br–Br bond is randomly orientated<br />

relative to the surface whereas, for 60 to 90 per cent coverage, the alignment is parallel to the<br />

surface.

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