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SEMICONDUCTOR DIODES 1051 SENSITIVITY ANALYSIS<br />

RT miniaturization<br />

RT oscillators<br />

RT photoelectric cells<br />

RT semiconductor detectors<br />

SEMICONDUCTOR DIODES<br />

UF diodes (semiconductor)<br />

BT1 semiconductor devices<br />

NT1 germanium diodes<br />

NT1 junction diodes<br />

NT1 light emitting diodes<br />

NT1 photodiodes<br />

NT1 schottky barrier diodes<br />

NT1 silicon diodes<br />

NT1 switching diodes<br />

NT1 tunnel diodes<br />

NT1 variable capacitance diodes<br />

RT betavoltaic cells<br />

RT photovoltaic cells<br />

RT semiconductor junctions<br />

RT semiconductor rectifiers<br />

RT thermionic diodes<br />

SEMICONDUCTOR JUNCTIONS<br />

SF junctions<br />

NT1 heterojunctions<br />

NT1 homojunctions<br />

NT1 mim junctions<br />

NT1 p-n junctions<br />

RT junction detectors<br />

RT junction transistors<br />

RT semiconductor diodes<br />

RT semiconductor materials<br />

SEMICONDUCTOR LASERS<br />

BT1 semiconductor devices<br />

*BT1 solid state lasers<br />

SEMICONDUCTOR MATERIALS<br />

If known, coordinate with descriptors for the<br />

specific materials.<br />

UF materials (semiconductor)<br />

BT1 materials<br />

NT1 magnetic semiconductors<br />

NT1 n-type conductors<br />

NT1 organic semiconductors<br />

NT1 p-type conductors<br />

RT depletion layer<br />

RT doped materials<br />

RT electric conductors<br />

RT electron mobility<br />

RT fano factor<br />

RT graded band gaps<br />

RT nanostructures<br />

RT p-n junctions<br />

RT photoconductors<br />

RT semiconductor junctions<br />

RT semimetals<br />

RT thermoelectric materials<br />

RT traps<br />

SEMICONDUCTOR RECTIFIERS<br />

*BT1 rectifiers<br />

BT1 semiconductor devices<br />

RT semiconductor diodes<br />

SEMICONDUCTOR RESISTORS<br />

UF varistors<br />

*BT1 resistors<br />

BT1 semiconductor devices<br />

SEMICONDUCTOR STORAGE<br />

DEVICES<br />

BT1 memory devices<br />

BT1 semiconductor devices<br />

SEMICONDUCTOR SWITCHES<br />

BT1 semiconductor devices<br />

*BT1 switches<br />

semidiurnal variation<br />

USE daily variations<br />

semihomog<strong>en</strong>eous critical assembly<br />

INIS: 1993-11-09; ETDE: 2002-06-13<br />

USE shca reactor<br />

SEMILEPTONIC DECAY<br />

INIS: 1978-02-23; ETDE: 1978-05-01<br />

Weak decay with at least one neutrino and<br />

hadron among the decay products.<br />

*BT1 weak particle decay<br />

RT beta decay<br />

RT leptonic decay<br />

RT leptons<br />

RT neutrinos<br />

RT weak hadronic decay<br />

SEMIMETALS<br />

UF metalloids<br />

BT1 elem<strong>en</strong>ts<br />

NT1 ars<strong>en</strong>ic<br />

NT1 boron<br />

NT1 sel<strong>en</strong>ium<br />

NT1 silicon<br />

NT1 tellurium<br />

RT alloys<br />

RT intermetallic compounds<br />

RT metals<br />

RT nonmetals<br />

RT semiconductor materials<br />

seminal vesicles<br />

USE male g<strong>en</strong>itals<br />

SEMIPALATINSK TEST SITE<br />

INIS: 1997-11-07; ETDE: 1998-06-01<br />

BT1 nuclear test sites<br />

RT kazakhstan<br />

RT nuclear explosions<br />

RT nuclear weapons<br />

SEMISUBMERSIBLE PLATFORMS<br />

2008-07-04<br />

BT1 offshore platforms<br />

s<strong>en</strong>a reactor<br />

Societe d'Energie Nucleaire des Ard<strong>en</strong>nes<br />

reactor, Chooz.<br />

USE chooz-a reactor<br />

SENDAI-1 REACTOR<br />

INIS: 1979-09-18; ETDE: 1979-10-23<br />

Kyushu Electric Power Co., S<strong>en</strong>dai,<br />

Kagoshima, Japan.<br />

UF kyushu-3 reactor<br />

*BT1 pwr type reactors<br />

SENDAI-2 REACTOR<br />

INIS: 1982-06-09; ETDE: 1982-07-08<br />

Kyushu Electric Power Co., S<strong>en</strong>dai,<br />

Kagoshima, Japan.<br />

*BT1 pwr type reactors<br />

s<strong>en</strong>dai cyclotron<br />

INIS: 1983-06-30; ETDE: 2000-09-20<br />

USE tohoku cyclotron<br />

SENEGAL<br />

BT1 africa<br />

BT1 developing countries<br />

SENGIERITE<br />

2000-04-12<br />

*BT1 oxide minerals<br />

*BT1 uranium minerals<br />

RT copper oxides<br />

RT uranium oxides<br />

RT vanadium oxides<br />

s<strong>en</strong>ior c<strong>en</strong>ters<br />

INIS: 2000-04-12; ETDE: 1981-01-09<br />

USE public buildings<br />

s<strong>en</strong>ior executive service<br />

INIS: 2000-04-12; ETDE: 1981-06-13<br />

(Prior to January 1995, this was a valid ETDE<br />

descriptor.)<br />

SEE managem<strong>en</strong>t<br />

SEE personnel<br />

SENIORITY NUMBER<br />

BT1 quantum numbers<br />

RT quantum mechanics<br />

s<strong>en</strong>n reactor<br />

USE garigliano reactor<br />

SENSE ORGANS<br />

*BT1 organs<br />

NT1 auditory organs<br />

NT1 eyes<br />

NT2 conjunctiva<br />

NT2 cornea<br />

NT2 crystalline l<strong>en</strong>s<br />

NT2 lacrimal ducts<br />

NT2 retina<br />

NT2 uvea<br />

NT1 taste buds<br />

NT1 vestibular apparatus<br />

RT chemoreceptors<br />

RT head<br />

RT nervous system<br />

RT nose<br />

RT olfactory bulbs<br />

RT organoleptic properties<br />

RT receptors<br />

RT reflexes<br />

RT s<strong>en</strong>se organs diseases<br />

RT s<strong>en</strong>sors<br />

SENSE ORGANS DISEASES<br />

BT1 diseases<br />

NT1 cataracts<br />

NT1 conjunctivitis<br />

RT nervous system diseases<br />

RT ophthalmology<br />

RT s<strong>en</strong>se organs<br />

RT skin diseases<br />

SENSIBLE HEAT STORAGE<br />

INIS: 1993-06-04; ETDE: 1977-06-30<br />

Storage of thermal <strong>en</strong>ergy utilizing the specific<br />

heat capacity of a material without changing<br />

the phase of the material.<br />

*BT1 heat storage<br />

RT rock beds<br />

RT seasonal thermal <strong>en</strong>ergy storage<br />

RT tanks<br />

RT thermal <strong>en</strong>ergy storage equipm<strong>en</strong>t<br />

RT thermal mass<br />

RT trombe walls<br />

RT water walls<br />

SENSITIVITY<br />

The quantitative aspect concerned with the<br />

threshold for detecting a giv<strong>en</strong> material,<br />

property, etc.<br />

UF detection limits<br />

UF heat stability<br />

NT1 photos<strong>en</strong>sitivity<br />

NT1 radios<strong>en</strong>sitivity<br />

RT accuracy<br />

RT biological adaptation<br />

RT biological effects<br />

RT dead time<br />

RT resolution<br />

RT specificity<br />

RT spectral response<br />

SENSITIVITY ANALYSIS<br />

INIS: 1981-02-27; ETDE: 1979-07-18<br />

Response of a mathematical model to<br />

variations of the input parameters.<br />

RT calculation methods

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