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<strong>ECAD</strong>/ECAE 2004<br />

PROCEEDINGS OF THE 1 ST INTERNATIONAL CONFERENCE ON ELECTRICAL /<br />

ELECTROMECHANICAL COMPUTER AIDED DESIGN & ENGINEERING<br />

Technical Papers<br />

University of Durham<br />

15 th & 16 th November 2004<br />

Edited by P. G. Maropoulos and D. Schaefer


© The University of Durham 2004<br />

All rights reserved. No reproduction, copy or transmission of this publication<br />

may be made without written permission.<br />

Except as o<strong>the</strong>rwise permitted under <strong>the</strong> Copyright, Designs and Patents Act<br />

1988, this publication may only be reproduced, stored or transmitted, in any<br />

form or by any means, with <strong>the</strong> prior permission in writing of <strong>the</strong> publisher, or, in<br />

<strong>the</strong> case of reprographic reproduction, in accordance with <strong>the</strong> terms of a licence<br />

issued by a Copyright Licensing Agency. Enquires concerning reproduction<br />

outside those terms should be sent to <strong>the</strong> publisher.<br />

British Copyright Council<br />

http://www.britishcopyright.org.uk<br />

29-33 Berners Street, London, W1T 3AB.<br />

Published by<br />

The University of Durham,<br />

School of Engineering,<br />

South Road,<br />

Durham,<br />

DH1 3LE, UK.<br />

ISBN 0-9535558-3-6<br />

ii


<strong>ECAD</strong>/ECAE 2004<br />

PROCEEDINGS OF THE 1 ST INTERNATIONAL<br />

CONFERENCE ON ELECTRICAL / ELECTROMECHANICAL<br />

COMPUTER AIDED DESIGN & ENGINEERING<br />

University of Durham<br />

15 th & 16 th November 2004<br />

Edited by P. G. Maropoulos and D. Schaefer<br />

Produced by D. G. Bramall, W.M. Cheung and C.D.W. Lomas<br />

iii


Contents about this CD<br />

Committees vi<br />

List of Sponsors vii<br />

About <strong>the</strong> Editors viii<br />

Editorial ix<br />

Part 1. Mechatronics 1<br />

Comos® ET/ME as System Solution in <strong>the</strong> Mechatronics Field<br />

M. F. Zaeh, F. Graetz and A. Mankel<br />

Vibration-Based Interface for Collaboration in Mechatronics Design<br />

T. Ito<br />

XML-based Product and Process Data Representation for Distributed Process<br />

Planning<br />

D. N. Šormaz, J. Arumugam and N. Neerukonda<br />

Part 2. Integration, Product Variants and Complexity 20<br />

The Integration of ECAE into <strong>the</strong> Complete Manufacturing Workflow (Presentation<br />

Only)<br />

T. Ward<br />

Release-Engineering – An Innovative Approach to Handle Complexity of Mechatronic<br />

Products<br />

G. Schuh, J.C. Desoi, M. Lenders, V. Witte<br />

Costing Issues Regarding Product Variant Design<br />

P. Baguley, D. Schaefer<br />

A New Method for Variant Design Technology in <strong>ECAD</strong><br />

D. Schaefer<br />

Part 3. Micro Electro-Mechanical <strong>Systems</strong> (MEMS) 50<br />

Use of CoventorWare in <strong>the</strong> Design of innovative IC Probes Based on Microsystems<br />

Technology<br />

M.D.Cooke and D. Wood<br />

CAD Framework for <strong>the</strong> Design and Process Modelling of Micro-electromechanical<br />

systems (MEMS)<br />

B. Solano, D. Wood, S. Rolt and P.G. Maropoulos<br />

The Applicability of CoventorWare to RF MEMS<br />

A.J.Gallant and D. Wood<br />

Part 4. Process Automation 74<br />

Concurrent Electrical Engineering Methods<br />

N.S. Zughaid and P.D Hackney<br />

Electrical and Process Automation Framework for Engineering & Maintenance with<br />

3 rd CAE System Generation (Presentation Only)<br />

D. Mukherjee<br />

iv<br />

2<br />

6<br />

12<br />

21<br />

36<br />

41<br />

46<br />

51<br />

59<br />

67<br />

75<br />

80


Automatic Wiring in Switch Cabinets<br />

W. Vigerske, B. Stube, M. Plessow<br />

Part 5. PCB Design & Knowledge Management 94<br />

Genetic Algorithm for Xilinx-style FPGA Placement<br />

M. Yang, A. Almaini<br />

Maintaining Electromagnetic Compatibility (EMC) Through Design for Fabrication<br />

and Assembly of Printed Circuit Boards (PCB)<br />

T. Page, P.Baguley and D. Schaefer<br />

Ensuring Electromagnetic Compliance in Printed Circuit Boards through Design and<br />

Assembly Guidelines<br />

T. Page, P. Baguley and D. Schaefer<br />

Knowledge Transfer in Networks of Competence<br />

C. A. Schumann, C. Tittmann and K. Grebenstein<br />

Part 6. Late Papers 116<br />

Fuzzy Sliding Mode Control Solution to an Inverted Pendulum: An Implementation<br />

Issue<br />

M. Bouchoucha, A. Souissi and A. Derdouche<br />

Modelling of Transport Flows for Inter-disciplinary <strong>Systems</strong> Integration (Abstract<br />

Only)<br />

A. Suslenkovs and A. Levchenkov<br />

Modelling of Power Distribution <strong>Systems</strong> with <strong>the</strong> help of Internet Based Data<br />

Processing Technologies (Abstract Only)<br />

D. Rihtere and A. Levchenkov<br />

Author Index 125<br />

Searchable Index 127<br />

v<br />

90<br />

95<br />

101<br />

106<br />

111<br />

117<br />

123<br />

124


International Scientific Advisory Committee<br />

Prof. P.G. Maropoulos (Chair)<br />

University of Durham, UK<br />

Dr. M. Plessow<br />

GFaI e.V., Berlin, Germany<br />

Prof. P. Xirouchakis<br />

Swiss Federal Institute of Technology,<br />

Switzerland<br />

Prof. W.F. Reiter<br />

Oregon State University, USA<br />

Prof. A. Bernard<br />

Ecole Centrale de Nantes, France<br />

Prof. G. Schuh<br />

RWTH-Aachen, Germany<br />

Prof. K. Feldmann<br />

University of Erlangen-Nuremberg, Germany<br />

Prof. D. Qin<br />

Chongqing University, China<br />

Prof. K. Cheng<br />

Leeds Metropolitan University, UK<br />

Local Organising Committee<br />

Prof. P.G. Maropoulos Dr. D. Schaefer<br />

Dr. G. Coates Dr. H. Long<br />

Dr. Q. Wang Dr. P. Mat<strong>the</strong>ws<br />

Mr. O. Vogt Mr. C.D.W. Lomas<br />

Mr. P. Baguley Mr. B. C. Rogers<br />

Mr. P. Chapman Mr. W.M. Cheung<br />

Mr. D. G. Bramall<br />

vi<br />

Dr. D. Schaefer (Co-Chair)<br />

University of Durham, UK<br />

Prof. D. Roller<br />

University of Stuttgart, Germany<br />

Prof. T.R. Kurfess<br />

Georgia Tech, Atlanta, USA<br />

Prof. J. Duflou<br />

K.U. Leuven, Belgium<br />

Prof. D. Brissaud<br />

University of Grenoble, France<br />

Prof. P. Cunha<br />

IST, Portugal<br />

Dr. Steve Newman<br />

Loughborough University, UK<br />

Dr. R.D. Sriram<br />

NIST, USA


List of Sponsors<br />

Technische Computer<br />

Systeme, Suessen<br />

GmbH<br />

ePLAN Rittal Ltd<br />

Euro Info Centres<br />

(ECI)<br />

One North East<br />

Gesellschaft fuer<br />

Informatik e.V.<br />

International Journal<br />

of Computer<br />

Integrated<br />

manufacturing<br />

Global Digital<br />

Enterprise Research<br />

<strong>Laboratory</strong><br />

Agility<br />

Derwentside<br />

Engineering Forum<br />

NetPark<br />

University of Durham<br />

vii<br />

http://www.tcs-s.de/english<br />

http://www.eplan.co.uk<br />

http://www.euro-info.org.uk<br />

http://www.onenor<strong>the</strong>ast.co.uk<br />

http://www.giev.de/allgemeines/indexenglish.htm<br />

http://www.tanf.co.uk/journals/titles<br />

/0951192X.asp<br />

http://gderl.dur.ac.uk/<br />

http://www.dur.ac.uk/agility/<br />

http://www.def.org.uk/<br />

http://www.uknetpark.com/<br />

http://www.dur.ac.uk/<br />

All links verified on 26 th October 2004


About <strong>the</strong> Editors<br />

Paul Maropoulos<br />

Dipl Ing, MSc, PhD, Eur Ing<br />

Paul Maropoulos is Professor of Engineering in <strong>the</strong> School of<br />

Engineering at <strong>the</strong> University of Durham. He directs <strong>the</strong><br />

research of <strong>the</strong> Design and Manufacturing Research Group<br />

and is Joint Director of <strong>the</strong> Centre for Industrial Automation<br />

and Manufacture. He has close links with industry and heads<br />

<strong>the</strong> ‘Agility Project’ - a manufacturing consultancy<br />

specialising in lean methodologies.<br />

His first degree was in Mechanical Engineering from <strong>the</strong> University of<br />

Thessaloniki in Greece and he subsequently obtained his MSc and PhD<br />

degrees from <strong>the</strong> University of Manchester Institute of Science & Technology<br />

(UMIST).<br />

He is actively pursuing research in <strong>the</strong> following areas; design and<br />

manufacturing integration, collaborative and distributed product and process<br />

development, technical evaluation of <strong>the</strong> supply chain, new generation process<br />

planning and routing using aggregate methods, aggregate process modelling,<br />

assembly planning and system design, distributed tool selection and support for<br />

machining, factory design and cell formation, capability analysis and laser<br />

metrology for manufacturing systems.<br />

Dirk Schaefer<br />

Toolmaker, BSc, MSc, PhD<br />

Dirk Schaefer is a Lecturer in <strong>the</strong> School of Engineering at<br />

<strong>the</strong> University of Durham. Before this, he was a Research &<br />

Teaching Assistant at <strong>the</strong> University of Stuttgart, Germany,<br />

where he earned his PhD in Computer Science. During this<br />

time, Dirk also held part-time positions as an Assistance<br />

Professor in Computer Science at <strong>the</strong> University of Applied<br />

Sciences at Aalen, and as a Lecturer in Computer Science at<br />

two private IT Academies at Esslingen and Dresden. Fur<strong>the</strong>rmore, he was <strong>the</strong><br />

Managing Director of an IT consulting firm, which he founded in 1999.<br />

Prior to working in academia, he gained experience as a Software Engineer with<br />

HOCHTIEF GmbH in Essen, Germany. In this role he designed and<br />

implemented software modules for an object-oriented Civil Engineering CAD<br />

system. Dirk started his career as an apprentice Toolmaker with Graebener<br />

Press <strong>Systems</strong>, one of Germany’s leading metal forming companies, where he<br />

specialised on CNC machining and <strong>the</strong> manufacture of compound tool sets for<br />

knuckle joint presses. Between working as a Software Engineer and Toolmaker,<br />

he obtained his first degree in Mechanical Engineering at <strong>the</strong> Technical College<br />

in Siegen, Germany, and graduated some years later with a Masters degree in<br />

Ma<strong>the</strong>matics from <strong>the</strong> University of Duisburg, Germany.<br />

His current research interests are focused on <strong>the</strong> development of novel<br />

approaches and computer applications involved in <strong>the</strong> interfaces between<br />

applied Computer Science, Ma<strong>the</strong>matics and Engineering. Recent work has<br />

primarily addressed several aspects of CAE and CAD/CAM technology in<br />

mechanical, electrical and electromechanical engineering.<br />

viii


Editorial<br />

Industry is undergoing a rapid transformation internationally, characterised by <strong>the</strong><br />

liberalization of global markets, increased mobility of people and capital and <strong>the</strong> constant<br />

requirement for exploiting <strong>the</strong> enabling capability of <strong>the</strong> internet to rapidly add value to<br />

products and services. Increased competition has also led to <strong>the</strong> gradual consolidation of<br />

sectors as companies adopt corporate alliances and mergers in order to manage <strong>the</strong>ir<br />

spiralling R&D and marketing costs across different markets. Currently, <strong>the</strong> defence and<br />

aerospace sectors are largely consolidated on both sides of <strong>the</strong> Atlantic and <strong>the</strong> same is true<br />

for <strong>the</strong> automotive, pharmaceuticals and chemicals industries.<br />

The removal of protectionist policies, coupled with <strong>the</strong> availability of a skilled workforce and<br />

comprehensive communication technologies in many parts of <strong>the</strong> world, has allowed large<br />

enterprises to adopt globalisation and plan manufacturing and design operations on a truly<br />

global basis. The benefit of this approach is that <strong>the</strong> resources of an enterprise can be finetuned<br />

to allow competitive operations in traditional major markets, like <strong>the</strong> North American<br />

and <strong>the</strong> European regions, as well as covering <strong>the</strong> varied demands of emerging new markets.<br />

In addition, an enterprise can seek to exploit specific scientific skills that may be available in<br />

abundance in certain countries, such as design technology and ma<strong>the</strong>matical analysis in<br />

Russia and software engineering skills in India. Globalisation can be rewarding for industry at<br />

an enterprise level, but it can be problematic for small and medium size enterprises (SMEs),<br />

which underpin <strong>the</strong> operation of larger enterprises and are crucial for <strong>the</strong> economic growth of<br />

specific countries and regions. Initial fears of a massive employment drift to low wage regions<br />

have largely not been realized. A good example of <strong>the</strong> opposite trend is <strong>the</strong> recent growth of<br />

manufacturing industry in <strong>the</strong> United States, which was principally sustained by developing<br />

business practices that apply computer-based technologies and use a first class electronic<br />

networking and communications infrastructure. Clearly, computer-based methods for design<br />

and manufacture supported by electronic networking and communication infrastructure (ecommerce)<br />

represent an essential level of technology required by SMEs in order to support<br />

competitive manufacturing operations on a regional and global basis.<br />

Globalisation and enterprise consolidation amplify <strong>the</strong> effects of socio-economic events<br />

and market requirements in industries and economies of <strong>the</strong> industrialised world, in much<br />

more direct and immediate ways than previously. These conditions create <strong>the</strong> need for:<br />

(i) Highly agile and innovative corporations that can seize and exploit market<br />

opportunities, world-wide.<br />

(ii) Effective management of corporate revenue streams across major technology<br />

development phases.<br />

(iii) Formation of dynamic supply networks and development of flexible manufacturing<br />

capabilities within <strong>the</strong> extended enterprise, based on <strong>the</strong> sound management of<br />

<strong>the</strong> product’s life cycle.<br />

Industry and research organizations can now capitalize on recent advances in computer<br />

modelling, graphic visualization and distributed information management, in order to positively<br />

impact product development and realization and develop objective risk mitigation strategies<br />

on a global basis. These technologies will allow <strong>the</strong> development of new business processes<br />

to take advantage of <strong>the</strong> rapid formation of production networks and effectively manage<br />

workflow during all phases of a product’s life cycle. “Digital Enterprise Technology” (DET)<br />

represents this emerging, new syn<strong>the</strong>sis of technologies and systems for product and process<br />

development and life cycle management on a global basis. DET can be defined as “<strong>the</strong><br />

collection of systems and methods for <strong>the</strong> digital modelling of <strong>the</strong> global product<br />

development and realization process, in <strong>the</strong> context of lifecycle management”.<br />

DET is implemented by <strong>the</strong> syn<strong>the</strong>sis of technologies and systems from five main technical<br />

areas, <strong>the</strong> DET “cornerstones”, corresponding to; (i) distributed and collaborative design, (ii)<br />

process modelling and process planning, (iii) production equipment and factory modelling, (iv)<br />

digital to physical environment integrators and (v) enterprise integration technologies. The first<br />

ix


three technical areas of DET can now be performed entirely in <strong>the</strong> digital domain, utilising <strong>the</strong><br />

enhanced graphics and computer processing technologies developed over <strong>the</strong> past five years<br />

as well as <strong>the</strong> communication infrastructure of <strong>the</strong> internet. The fourth category is of particular<br />

importance as it involves methods for <strong>the</strong> bi-directional integration of <strong>the</strong> digital and physical<br />

environments in order to achieve risk mitigation at product and system levels using shop floor<br />

based metrology and discrete event simulation respectively. The fifth area of DET includes<br />

methods that are predominantly employed to manage physical resources when <strong>the</strong>se have<br />

been released for manufacturing and as such are used when product realization has<br />

commenced. The fifth area also includes web-centric methods for product data management<br />

that is applicable from <strong>the</strong> very early stages of product development and spans <strong>the</strong> five areas<br />

of DET.<br />

One particular area of Computer Aided Engineering on which <strong>the</strong> framing Digital Enterprise<br />

Technology (DET) philosophy may be applied to is <strong>the</strong> development of Computer-Aided<br />

Design and Engineering systems and software tools for electrical/electromechanical<br />

engineering (<strong>ECAD</strong>/ECAE). These systems have already undergone major changes during<br />

<strong>the</strong> past couple of years and are still subject to groundbreaking change and innovation in<br />

respect to both systems technology and philosophy.<br />

The early, so-called 2 nd generation <strong>ECAD</strong> systems, which were hardly more than a digital<br />

replacement of <strong>the</strong> drawing board, have recently been replaced by an entirely new<br />

development of 3 rd generation <strong>ECAD</strong>/ECAE systems. These new systems are called<br />

Electrical Engineering Solutions (EES) and focus on supporting an entirely integrated<br />

engineering process from design to manufacture. One of <strong>the</strong>ir major philosophies is to<br />

facilitate global concurrent engineering along <strong>the</strong> whole product lifecycle chain. Specifically,<br />

<strong>the</strong> integration of electrical and mechanical engineering tools is of increasing relevance, in<br />

order to allow interdisciplinary, bi-directional product modelling, as well as process planning.<br />

Hence, <strong>the</strong> development of appropriate interfaces and international standardisation issues<br />

has become an essential task.<br />

Current R&D activities within <strong>the</strong> area of <strong>ECAD</strong>/ECAE mainly focus on:<br />

1. <strong>ECAD</strong>/ECAE Product and Process Modelling Automation<br />

- Product modelling and product data management<br />

- Process modelling and workflow management<br />

- Agile design, configuration and manufacture of product variants<br />

- Automatic generation of schematics and project documentation<br />

2. Distributed and Collaborative Engineering<br />

- Integration of electrical with mechanical engineering systems<br />

- Representation of interdisciplinary design knowledge<br />

- Modelling and propagation of multidisciplinary constraints<br />

- Multidisciplinary global concurrent engineering<br />

3. <strong>ECAD</strong>/ECAE Product Platforms and System Development<br />

- Novel architectures for <strong>ECAD</strong>/ECAE systems<br />

- Current state-of-<strong>the</strong>-art-systems: opportunities and challenges<br />

- Advances in database technology for engineering applications<br />

- Emerging trends for developing future <strong>ECAD</strong>/ECAE software<br />

4. International <strong>ECAD</strong>/ECAE Standardisation Issues<br />

- Standardised exchange of product model data (STEP – ISO 10303)<br />

- Embedding of international standards into <strong>ECAD</strong>/ECAE software<br />

- Standards for interdisciplinary systems integration<br />

- Standardised internet based data processing<br />

5. Implementation of <strong>ECAD</strong>/ECAE <strong>Systems</strong> in Industry<br />

x


- Business process re-engineering<br />

- Validation and selection criteria for <strong>ECAD</strong>/ECAE systems<br />

- Implementation/Migration strategies and case studies<br />

- Integration of contemporary systems into legacy environments<br />

6. Beyond <strong>the</strong> Borders of Classical <strong>ECAD</strong>/ECAE<br />

- <strong>ECAD</strong>/ECAE systems in hydraulics and pneumatics<br />

- Design and development of mechatronic systems<br />

- Simulation of mechatronic systems<br />

- From mechatronic to micro-electro-mechanical-systems<br />

This Proceedings volume contains papers submitted for <strong>the</strong> 1st International Conference on<br />

Electrical/Electromechanical Computer Aided Design and Engineering (<strong>ECAD</strong>/ECAE’04).<br />

This meeting is <strong>the</strong> first international event on <strong>ECAD</strong>/ECAE Technology and follows three<br />

national meetings consecutively held at Stuttgart University, Germany, between 2000 and<br />

2003.<br />

The main aim of <strong>ECAD</strong>/ECAE’04 is to provide an international forum for <strong>the</strong> exchange of<br />

scientific knowledge and industrial experience regarding state-of-<strong>the</strong>-art in <strong>the</strong> various<br />

aspects of Electrical/Electromechanical Computer Aided Design and Engineering.<br />

Fur<strong>the</strong>rmore, <strong>ECAD</strong>/ECAE’04 aims to increase <strong>the</strong> international awareness of a rapidly<br />

growing field of engineering research and systems development.<br />

The Proceedings are organized in 7 main sections, which contain some 20 papers covering a<br />

wide area of <strong>ECAD</strong>/ECAE related research, from product modelling and internet based data<br />

processing; automation and systems integration; to mechatronics and micro electromechanical<br />

systems (MEMS). Papers are organised as presented during <strong>the</strong> various sessions<br />

of <strong>the</strong> conference.<br />

<strong>ECAD</strong>/ECAE’04 has special significance for <strong>the</strong> University of Durham and <strong>the</strong> North East<br />

region, since it is <strong>the</strong> third major meeting (following CAPE’99 and DET’02) in production<br />

engineering to be organized and hosted by Durham University. The North East of England is<br />

a region with a long tradition in manufacturing and engineering. The future development of <strong>the</strong><br />

region, and in particular of County Durham, is based on <strong>the</strong> adoption and exploitation of new,<br />

knowledge intensive technologies that can give local companies a competitive advantage on<br />

a global basis. Hence <strong>ECAD</strong>/ECAE, within <strong>the</strong> framing concept of DET, is <strong>the</strong>matically ideally<br />

aligned with <strong>the</strong> strategic development plans of <strong>the</strong> North East region and will benefit local<br />

industry and regional agencies of economic and industrial development.<br />

The Editors would like to gratefully acknowledge <strong>the</strong> help and support of all those who helped<br />

in any way during <strong>the</strong> months of preparations for <strong>ECAD</strong>/ECAE’04. In particular, sincere<br />

thanks go to <strong>the</strong> <strong>ECAD</strong>/ECAE’04 Local Organising Committee Members, who have played a<br />

major role in all aspects of <strong>ECAD</strong>/ECAE’04 organisation and management. The Editors also<br />

wish to acknowledge <strong>the</strong> support of <strong>the</strong> International Advisory Committee, <strong>the</strong> financial<br />

support of <strong>the</strong> major <strong>ECAD</strong>/ECAE’04 sponsors; TCS GmbH (Germany) who produce <strong>the</strong><br />

promis engine e® / SIGRAPH CAE software, OneNorthEast, Eplan/Rittal Ltd.<br />

Professor P.G. Maropoulos<br />

University of Durham<br />

Editor and <strong>ECAD</strong>/ECAE’04 Chairman<br />

Durham, November 2004<br />

xi<br />

Dr D. Schaefer<br />

University of Durham<br />

Co-Editor, <strong>ECAD</strong>/ECAE’04 Co-Chairman<br />

and Manager


PART 1<br />

MECHATRONICS<br />

1


Comos ® ET/ME as System Solution in <strong>the</strong> Mechatronics Field<br />

Michael F. Zaeh (iwb), Florian Graetz (iwb), Alexander Mankel (innotec)<br />

Institute for Machine Tools and Industrial Management (iwb), Technische Universitaet Muenchen, Garching, Germany<br />

Abstract:<br />

innotec GmbH, Schwelm, Germany<br />

This article describes <strong>the</strong> reasons and <strong>the</strong> aims of <strong>the</strong> cooperation between innotec GmbH, a vendor for<br />

CAE-systems, and <strong>the</strong> Institute for Machine Tools and Industrial Management (iwb) of <strong>the</strong> Technische<br />

Universitaet Muenchen. This collaboration resulted in <strong>the</strong> COMOS ® ME software, a system solution for <strong>the</strong><br />

development of mechatronic products. A short overview over <strong>the</strong> system concepts and possible fields of<br />

applications is given.<br />

Keywords:<br />

Computer Aided Engineering, Simultaneous Engineering, Mechatronic System Design<br />

1. INTRODUCTION<br />

The term Mechatronics was formed in Japan in 1969 by<br />

<strong>the</strong> president of Yaskawa Electric Corp., Ko Kikuch [1].<br />

This expression was made up of <strong>the</strong> words "Mechanisms"<br />

and "Electronics" and was registered as trade name from<br />

1971 to 1982. With <strong>the</strong> increasing capabilities and<br />

declining costs of microprocessors, <strong>the</strong> importance of<br />

software in industrial and consumer applications grew<br />

gradually. Nowadays, Mechatronics is commonly<br />

understood as <strong>the</strong> greatest possible integration of<br />

mechanics, electrics and software to one product [2].<br />

With time, <strong>the</strong> number of aspects, which have to be<br />

reflected during <strong>the</strong> development process for a product,<br />

grew tremendously. Therefore, <strong>the</strong> expertise of new fields<br />

of engineering – such as fluid or software engineers –<br />

became essential. To enable developers to complete <strong>the</strong>ir<br />

steadily complicating tasks within a limited time frame,<br />

new approaches and methods were required. The classic<br />

procedure for mechanical engineering as described in [3],<br />

was later enriched with aspects relevant for electrical<br />

engineering and led to new design guidelines, for example<br />

[4]. With <strong>the</strong> growing importance of software components<br />

in mechatronic systems and shortening development<br />

times, highly specific methods for certain industries have<br />

been evolved. One example for machine tools is given in<br />

[5].<br />

2. BACKGROUND<br />

As for many fields of applications, different approaches<br />

have been set up, <strong>the</strong> methods for mechatronic<br />

engineering diverged. Hence, unification became<br />

desirable and was accomplished by <strong>the</strong> Association of<br />

German Engineers (VDI) with guideline no. 2206 "Design<br />

Methodology for Mechatronic <strong>Systems</strong>" [6]. It contains<br />

recommendations of tools covering <strong>the</strong> aspects of<br />

mechatronics. Among <strong>the</strong>m are tools for<br />

• requirement engineering,<br />

• computer aided design (CAD),<br />

• finite element methods (FEM),<br />

• boundary element methods (BEM),<br />

• multi-body simulation,<br />

• computational fluid dynamics (CFD),<br />

• control engineering,<br />

• computer aided engineering (CAE),<br />

• computer aided software engineering (CASE),<br />

• hardware-in-<strong>the</strong>-loop (HIL),<br />

2<br />

• software-in-<strong>the</strong>-loop (SIL), and<br />

• product data management (PDM).<br />

Although [6] is a binding design guideline and covers <strong>the</strong><br />

needs of mechatronic engineering, it has to be specifically<br />

accommodated for every application.<br />

As VDI guideline 2206 is tailored for individualized<br />

mechatronic mass products, it hardly matches <strong>the</strong><br />

requirements for <strong>the</strong> development of mechatronic<br />

investment goods, since in most cases <strong>the</strong>y are produced<br />

at a quantity of or nearby one.<br />

3. REQUIREMENTS<br />

The development at most manufacturers for mechatronic<br />

systems today lacks of communication especially between<br />

<strong>the</strong> mechanical and electrical design. This situation forces<br />

every faculty to await <strong>the</strong> completion of <strong>the</strong> design for all<br />

preliminary phases. Therefore, <strong>the</strong> engineering of<br />

machines can best be described as sequential [7].<br />

3.1 Method<br />

The basic concept of <strong>the</strong> approach suggested in this<br />

paper is shown in figure 1. To shorten <strong>the</strong> time of<br />

development, a pre-design phase is set up, which covers<br />

most aspects of interdisciplinary communication.<br />

Therefore, <strong>the</strong> mechanical, electrical and software design<br />

can run in parallel, leading to a shorter time span between<br />

<strong>the</strong> purchase order for a machine and its delivery.<br />

Due to <strong>the</strong> alikeness of fluid and electric engineering, at<br />

least on an abstract level, <strong>the</strong> same methodology is<br />

suggested for both fields of design. In consequence,<br />

benefits resulting from a general concept can be achieved<br />

[8].<br />

Figure 1: Concept of <strong>the</strong> Method supported by Comos ®


3.2 Tool<br />

To allow <strong>the</strong> advantages of a methodology to pay off in<br />

industrial application, its implementation in software is<br />

mandatory. To achieve <strong>the</strong> user's acceptance,<br />

extraordinary improvements over conventional tools have<br />

to be realized. The main goals during <strong>the</strong> project<br />

described in this paper were<br />

• to guarantee data consistency,<br />

• to automatically generate key documents, and<br />

• to include <strong>the</strong> predevelopment phase in a tool used<br />

for detail engineering.<br />

4. APPROACH<br />

Based on <strong>the</strong> requirements explained in chapter 3, a<br />

method and a tool supporting it, have been developed.<br />

4.1 Method<br />

Figure 2 shows steps to be taken during <strong>the</strong> pre-design<br />

phase (also see 3.1), as suggested in [5]. It is divided into<br />

<strong>the</strong> functional description of a machine and its<br />

infrastructure planning as described below.<br />

Functional Description<br />

A machine is structured according to functional aspects as<br />

recommended in [9]. For every function, an operational<br />

principle (figure 3) and a sequence as a project network<br />

[10] are drawn. Each step in this project network is<br />

assigned to a degree of freedom. For every degree of<br />

freedom a state graph including all attainable states is<br />

defined (also see [4], [11]). Temporary and final states<br />

can be distinguished. While final states are determined by<br />

constant energy within <strong>the</strong> system of interest, temporary<br />

states are required to change from one final state to<br />

ano<strong>the</strong>r. For every transition from a temporary to a final<br />

state, <strong>the</strong> amount of energy within <strong>the</strong> system has to be<br />

determined. Therefore, required measurement quantities<br />

for every degree of freedom can be derived. One example<br />

of a state graph for rising and lowering <strong>the</strong> upper die is<br />

given in figure 4.<br />

Figure 2: Engineering as Supported in Comos ® ME<br />

Figure 3: Operating Principle for a Press<br />

3<br />

Infrastructure Planning<br />

Figure 4: Simple State Graph<br />

After <strong>the</strong> functional description is completed, <strong>the</strong> concepts<br />

defined in operation principles, network diagrams and<br />

state graphs have to be realized with hard- and software<br />

components. Therefore, each degree of freedom is<br />

assigned to an actuator and for every measurement<br />

quantity a sensor is chosen. As suggested in [8], setting<br />

elements – for example valves or relays – elements are<br />

added as required to every degree of freedom. Figure 5<br />

illustrates that <strong>the</strong>n <strong>the</strong> electrical input and output signals<br />

in <strong>the</strong> machine field are determined. Therefore, <strong>the</strong><br />

signals for <strong>the</strong> CNC cabinet can be obtained (also see<br />

figure 6).<br />

Figure 5: Actuators, Sensors and Setting Elements<br />

Figure 6: Connections for Field and Control Components


Derived Documents<br />

As shown in [12], sequential function charts according to<br />

[13] can be received from state graphs and network<br />

diagrams. This kind of document contains a considerable<br />

amount of valuable information for <strong>the</strong> electrical and fluid<br />

design of a machine tool. However, as it does not support<br />

<strong>the</strong> mechanical engineering process, it is rarely provided.<br />

Therefore, a method of automatically generating<br />

functional charts improves <strong>the</strong> interdisciplinary<br />

communication.<br />

Fur<strong>the</strong>rmore, I/O lists can be easily created from<br />

connection diagrams as shown in figure 6 (also see [12]).<br />

4.2 Tool<br />

The documents and data object described in section 4.1<br />

have been integrated into <strong>the</strong> software platform Comos®<br />

[5], a product, which is commonly used in chemical<br />

engineering, which is – like mechatronic engineering –<br />

highly interdisciplinary.<br />

Macros have been provided to perform <strong>the</strong> tasks of<br />

automatically generating key documents, such as<br />

sequential function charts or I/O-Lists. The architecture of<br />

Comos ® is illustrated in figure 7. The component object<br />

server provides an interface between a database, which<br />

saves all project information, and every single engineering<br />

application. Since every piece of information is stored<br />

once in <strong>the</strong> database and depending views link to one<br />

unique record, data consistency is ensured.<br />

The engineering applications "Basic Logical Diagram"<br />

developed by <strong>the</strong> iwb and "Electrical & Instrumentation"<br />

as well as "Hydraulics & Pneumatics" from innotec have<br />

been combined to <strong>the</strong> Comos ® ME bundle.<br />

Figure 7: Architecture of <strong>the</strong> Comos ® Product Family<br />

4<br />

5. CASE STUDY<br />

To prove <strong>the</strong> feasibility of <strong>the</strong> method and tool portrayed in<br />

chapter 4, a complete milling machine has been mapped<br />

in Comos ® in cooperation with an international vendor for<br />

machine tools [14]. All actuators and sensors totaling to<br />

roughly 350 I/O-signals have been modeled in an Access ®<br />

database. Figure 8 shows <strong>the</strong> machine and a screenshot<br />

of a document describing parts <strong>the</strong> electrical wiring.<br />

Information about actuators, sensors and cables have has<br />

been exported to Pro/Engineer via an XML interface<br />

considered in [12] (figure 9). Fur<strong>the</strong>rmore, raw concepts<br />

for <strong>the</strong> PLC software have been generated from <strong>the</strong><br />

sequential function charts and imported into Simatic<br />

Manager in an IEC 61131 format (figure 10).<br />

Figure 8: Electrical Connections of a Machine in Comos ®<br />

Figure 9: Interface to 3D-CAD-System<br />

Figure 10: Interface to PLC-Environment


6. CONCLUSIONS AND FUTURE WORK<br />

The development of <strong>the</strong> Comos ® ME system is an<br />

example, how <strong>the</strong> cooperation between a university and a<br />

software vendor can lead to innovative and promising<br />

products. The research work completed by <strong>the</strong> iwb and<br />

<strong>the</strong> software framework from innotec GmbH lead to a new<br />

generation of engineering tools, ready to enter <strong>the</strong> market.<br />

The viability <strong>the</strong> method and <strong>the</strong> toll described in chapter<br />

4 has been proven in a case study sketched in chapter 5.<br />

Fur<strong>the</strong>r work will focus on customizing <strong>the</strong> COMOS ® ME<br />

to <strong>the</strong> requirements of users. The integration of <strong>the</strong><br />

engineering environment and certain simulation tools, for<br />

example hardware-in-<strong>the</strong>-loop systems as described in<br />

[15] and [16], may lead to even more improved<br />

development cycles in <strong>the</strong> field of mechatronic<br />

engineering.<br />

[1] Harashima, F.; Tomizuka, M.; Fukuda, T.; 1996:<br />

Mechatronics – What Is It, Why, and How? – An<br />

Editorial, IEEE/ASME Transactions on Mechatronics,<br />

Vol. 1, No. 1, 1996, pp. 1-4<br />

[2] Reinhart, G.; Egermeier, H.; Thieke, S.; Dürrschmidt,<br />

S.; 2001: Mechatronik, In: offprint of Enzyklopädie<br />

Naturwissenschaft und Technik, addendum 7<br />

[3] VDI 2221, 1993: Methodik zum Entwickeln und<br />

Konstruieren technischer Systeme und Produkte.<br />

[4] VDI/VDE 2422; 2001: Entwicklungsmethodik für<br />

Geräte mit Steuerung durch Mikroelektronik.<br />

[5] Zaeh, M. F.; Graetz, F.; Rashidy, H., 2003: An<br />

Approach to Simultaneous Development in Machine<br />

Tool industry, Proceedings on International<br />

Workshop on Modeling and Applied Simulation, pp.<br />

128-133, Bergeggi, Italy.<br />

[6] VDI 2206, 2004: Design Methodology for<br />

Mechatronic <strong>Systems</strong>.<br />

[7] Zaeh, M. F.; Graetz, F.; Rashidy, H., 2004:<br />

Installation Planning for Mechatronic Production<br />

<strong>Systems</strong>, Proceedings on <strong>the</strong> IEEE-Conference<br />

"Mechatronics & Robotics 2004", pp. 315-319,<br />

Aachen, Germany.<br />

[8] Zaeh, M. F.; Graetz, F.; Gerdelmann, U.; 2003: Neue<br />

Konstruktion – Mechatronische Systeme Systeme<br />

erfordern neue Konstruktionswerkzeuge, SPS-<br />

Magazin, vol. 11//2003, pp. 68-70.<br />

[9] VDI 2800, 2000: Value Analysis.<br />

[10] DIN 69900-2, 1987: Project Controlling, Project<br />

Network Techniques, Methods of Presentation.<br />

[11] PG3, 2001: Projektgruppe 3, Richtlinie<br />

Funktionsbeschreibung.<br />

[12] Zaeh, M. F.; Graetz, F.; Rashidy, H., 2004:<br />

Installationsplanung – Entwicklung von<br />

mechatronischen Produktionssystemen. In:<br />

Konstruktion 7/8-2004, pp. 59-62.<br />

[13] IEC 60848, 2002: GRAFCET specification language<br />

for sequentional function charts.<br />

[14] Zaeh, M. F.; Graetz, F.; Rashidy, H., 2004: A<br />

Platform for Installation Planning – a case study. In:<br />

Proceedings of <strong>the</strong> CIRP Design Seminar 2004,<br />

Cairo, Egypt.<br />

[15] Maier, M.; Dierssen, S.; Ba<strong>the</strong>lt, J., 2004: Die<br />

Virtuelle Maschine – oder wie Inbetriebnahme vor<br />

Montage möglich ist. In: Seminarband zum<br />

Chemnitzer Produktionstechnischen Kolloquium<br />

2004, pp. 365-380.<br />

5<br />

[16] Zaeh, M. F.; Poernbacher, C.; Wuensch, G., 2003:<br />

Emerging Virtual Machine Tools. In: Proceedings of<br />

<strong>the</strong> DETC 2003, 29 th Design Automation<br />

Conference, Chicago, Illinois.


vibration-based interface as one sort of <strong>the</strong> forcefeedback<br />

one.<br />

Figure 6: System configuration of vibration-based<br />

interface.<br />

Figure 6 shows a configuration of vibration-based<br />

interface developed in this reseach. 4 sets of vibration<br />

motor are used to give a vibration siglal to <strong>the</strong> user. The<br />

vibration motors are controlled by PIC microchip on a<br />

control circuit, based on <strong>the</strong> signals transmitted from PC<br />

through RS-232C serial line. This interface is used by<br />

hand movement of a user, of which position in 3D space<br />

is traced by a magnetic sensor system composed of a<br />

controller, transmitter, and receiver.<br />

Figure 7: User interaction with vibration-based interface.<br />

Figure 7 shows a user interaction with a virtual object via<br />

this vibration-based interface. The user wearing a glove<br />

and a headband in Figure 7 is under manipulation on <strong>the</strong><br />

object in <strong>the</strong> screen. The glove is equipped with magnetic<br />

sensor to trace <strong>the</strong> position and orientation of hand to<br />

manipulate <strong>the</strong> object which is shown in <strong>the</strong> computer<br />

screen. The headband is equpped with 4 vibration motors,<br />

which start and/or stop vibration in various strength<br />

corresponding to <strong>the</strong> signals to feed back to <strong>the</strong> user.<br />

When <strong>the</strong> user touches <strong>the</strong> object, <strong>the</strong> system returns a<br />

signal so that <strong>the</strong> user can feel that his hand touches <strong>the</strong><br />

object. The vibration interface is equipped with 4 vibration<br />

motors. With <strong>the</strong> combination of <strong>the</strong>se 4 motors, <strong>the</strong><br />

system provides <strong>the</strong> direction toward which <strong>the</strong> user<br />

touches <strong>the</strong> object as well. If <strong>the</strong> user touches from <strong>the</strong> 45<br />

degree to <strong>the</strong> object front, vibration motor 2 and 3 are on<br />

in <strong>the</strong> same strength of vibration, whereas, for example,<br />

<strong>the</strong> user touches <strong>the</strong> object from 60 degree to <strong>the</strong> object<br />

front, or more horizontal direction, vibration of motor 3 is<br />

stronger than that of 2. If <strong>the</strong> user touches around <strong>the</strong><br />

object, <strong>the</strong> vibration moves around <strong>the</strong> object according to<br />

<strong>the</strong> touching point, so that <strong>the</strong> user can feel from which<br />

direction <strong>the</strong> user is currently touching <strong>the</strong> object as a real<br />

time interaction.<br />

Figure 8: Vibration mechanism in remote object<br />

manipulation.<br />

Figure 8 shows a series of interaction with virtual object<br />

with virtual hand which is controlled by <strong>the</strong> user’s hand<br />

through <strong>the</strong> vibration-based interface. When <strong>the</strong> hand is<br />

away from <strong>the</strong> object as show in Picture 1 in Figure 8, no<br />

vibration is given to <strong>the</strong> user. The user moves around <strong>the</strong><br />

hand and it touches to <strong>the</strong> object from <strong>the</strong> front direction<br />

as shonw in Picture 2, vibration starts on motor #2 on <strong>the</strong><br />

front position. During <strong>the</strong> move of object by pushing with<br />

hand, vibration becomes stronger so that <strong>the</strong> user has a<br />

feeling of pushing <strong>the</strong> object. The user keeps on pushing<br />

<strong>the</strong> object along <strong>the</strong> crank-shape route, changing <strong>the</strong><br />

direction of pushing from front-foward to right-forward,<br />

<strong>the</strong>n front-forward direction, during which <strong>the</strong> vibration site<br />

changes corresponding to <strong>the</strong> move so that <strong>the</strong> user also<br />

9


has a feeling of pushing to each direction to follow <strong>the</strong><br />

route to reach <strong>the</strong> goal. The pictures on <strong>the</strong> right hand<br />

side in Figure 8 shows how <strong>the</strong> vibration position changes<br />

during this operation.<br />

Figure 9: Snapshot of computer screen for vibrationbased<br />

interface.<br />

This vibration-based interface not only provides a control<br />

function with digital objects but also provides an interface<br />

to control a mechatronics object. For example, Figure 9<br />

shows a snapshot of teleoperation interaction to <strong>the</strong><br />

remote object. The user in <strong>the</strong> local site is under video<br />

conference with a remote site, where a cylinder-shaped<br />

object can be recognized through video Window 1 on <strong>the</strong><br />

left side of <strong>the</strong> screen. What <strong>the</strong> local user is doing is to<br />

move <strong>the</strong> object with his hand. The object is equipped<br />

with 2 DC motors so that it can be controlled to move in<br />

any direction if a control signal is given to it. A hand in<br />

Window 2 on <strong>the</strong> right side of <strong>the</strong> cylinder-shaped object<br />

is a virtual hand which is corresponding to <strong>the</strong> real hand of<br />

<strong>the</strong> manipulating person in terms of movement of hand.<br />

The user can feel <strong>the</strong> touching point on <strong>the</strong> object, and<br />

also feel <strong>the</strong> vibration indicating <strong>the</strong> direction to which <strong>the</strong><br />

user should move it. It also means that <strong>the</strong> user can move<br />

<strong>the</strong> object to <strong>the</strong> appropriate direction even if <strong>the</strong> user<br />

cannot see <strong>the</strong> window, because <strong>the</strong> vibration signal gives<br />

<strong>the</strong> direction to him. The participants in <strong>the</strong> video<br />

conference can manipulate <strong>the</strong> object with a touch and<br />

feel of movement, which actually controls <strong>the</strong> real object.<br />

3.2 Force-feedback lever interface for mechatronics<br />

design review<br />

Physical interaction plays a very important role in design<br />

review of mechatronics products, for example, a<br />

mechatronics devive. Designers study not only <strong>the</strong><br />

appearance of <strong>the</strong> device but also embedded function and<br />

usability of it. Designers touch <strong>the</strong> device, use it and<br />

check <strong>the</strong> function to discusses <strong>the</strong> feasibility of <strong>the</strong><br />

design. Design review could also be carried out in a video<br />

conference system over <strong>the</strong> network so that participants<br />

remotely distributed should join <strong>the</strong> discussion. However,<br />

physical interaction with <strong>the</strong> device is not available in a<br />

conventional video conference system, including<br />

CELAVIS. This research pays attention on <strong>the</strong> idea of<br />

physical interaction in video conference system, for<br />

example, <strong>the</strong> usage of vibration-based interface as<br />

described in <strong>the</strong> previous section. This section describes<br />

a senario of physical interaction for design review of a<br />

mechatronics device.<br />

Figure 10 shows a force-feedback controller which is<br />

under development as a part of this research. The lever<br />

on <strong>the</strong> right side of <strong>the</strong> box is designed to control <strong>the</strong> up-<br />

10<br />

down movement of a target device. A DC motor in <strong>the</strong> box<br />

generates a dynamic torque based on <strong>the</strong> angle of<br />

movement detected by potentiometers. The lever returns<br />

a force-feedback to a user so that it can be used as an<br />

interface for object manipulation.<br />

Figure 10: A controller with a force-feedback lever.<br />

Figure 11 shows a snapshot of computer screen during<br />

video conference to have design review on some devices<br />

in dental applications. Window 1 in Figure 11 shows a<br />

physical measurement device, called micro-surveyor,<br />

which is used to examine abutment teeth, design dentures,<br />

and to make parallel measurements of abutment teeth for<br />

bridges in dental applications. The window shows a<br />

measurement to check <strong>the</strong> jaw bone condition using a<br />

physical jaw bone model. The pen of <strong>the</strong> micro-surveyor<br />

has free movement on x-y horizontal surface, and updown<br />

movement on its vertical axis.<br />

Window 2 in Figure 11 shows a digital prototype which is<br />

identical to <strong>the</strong> micro-surveyor and jaw bone in Window 1.<br />

We have implemented manipulation software so that this<br />

digital compass can be manipulated by a controller such<br />

as joystick. A user can move up-and-down <strong>the</strong> pen to<br />

check <strong>the</strong> jaw condition, however, <strong>the</strong> user cannot have a<br />

feeling of touching to <strong>the</strong> jaw bone even if <strong>the</strong> pen touches<br />

it or penetrate to inside of <strong>the</strong> jaw bone. We have adopted<br />

<strong>the</strong> force-feedback lever controller shown in Figure 10 to<br />

manipulate <strong>the</strong> movement of <strong>the</strong> pen. In combination with<br />

ano<strong>the</strong>r controller under development, <strong>the</strong> user can<br />

control <strong>the</strong> movement of a virtual micro-surveyor in a<br />

touch and feeling manner, which could control an actual<br />

mechatronics micro-surveyor if it is designed to be<br />

controllable by PC.<br />

Figure 11: Snapshot of computer screen of interactive<br />

manipulation in video conference.


4. Concluding remarks<br />

A number of commercial or free systems are available, as<br />

<strong>the</strong> increasing demand on video conference for business,<br />

technical, and routine meetings. The main objective of<br />

<strong>the</strong>se systems is to provide an environment for<br />

audio/video communication for participants. If we need to<br />

have a video phone conversation with <strong>the</strong> counterparts,<br />

<strong>the</strong>n it surely works fine. We have developed CALAVIS<br />

system as we described in this paper, and we have<br />

confirmed that our small group meeting which we held a<br />

couple of times between Japan and US sites works quite<br />

fine.<br />

In our video meeting experiments, we also have found<br />

that when we have a face-to-face meeting, what we would<br />

like to share is not only <strong>the</strong> information which is discussed<br />

in <strong>the</strong> conference but also <strong>the</strong> data, software, or physical<br />

devices on which <strong>the</strong> agenda of meeting might be related.<br />

Currently available system including CALAVIS does not<br />

provide such an environment where participants can<br />

share those items. What we are pursuing as one of <strong>the</strong><br />

objectives in this study is to setup an environment where<br />

participants can share a virtual workspace where <strong>the</strong>y can<br />

work with <strong>the</strong> common sharing of those items as well as<br />

have a video conference.<br />

This study focuses on <strong>the</strong> physical aspects of interaction<br />

in video conference, which means that participants not<br />

only should share information/data through visual<br />

interactions but also should share <strong>the</strong>m through physical<br />

interactions to work toge<strong>the</strong>r much more collaboratively.<br />

For this objective, this paper presented a web-based<br />

video conference system with vibration-based interface to<br />

manipulate a remote mechatronics object through virtual<br />

space. Our system makes it possible to have physical<br />

interaction with <strong>the</strong> object over <strong>the</strong> network.<br />

The vibration-based interface presented in this paper is<br />

not as powerful as forced-feed back device interaction but<br />

users can feel <strong>the</strong> manipulation. While vibration signal is<br />

commonly used to draw attention from users, such as<br />

silent mode of mobile phone, and to let <strong>the</strong>m know<br />

something, such as phone call, or new messages, etc.,<br />

but it is not suitable to guide physical direction to users to<br />

support manipulation. With <strong>the</strong> combination of multiple<br />

vibration motor based on a simple protocol to show<br />

direction of movement, <strong>the</strong> interface of our system<br />

provides not only signals of notice, but also guidance of<br />

manipulation. For example, a user may receive vibration<br />

signal at <strong>the</strong> time of contact with an object during<br />

manipulation, and <strong>the</strong>n may be given directional vibration<br />

to move accordingly. Reporting <strong>the</strong> result of experiment<br />

using a simple mechatronics prototype via vibration-based<br />

interface for collaboration, <strong>the</strong> paper discussed <strong>the</strong><br />

feasibility of <strong>the</strong> interface for collaboration as well as <strong>the</strong><br />

usability of <strong>the</strong> interface.<br />

BOCOLLA interface presented in this paper is also a new<br />

approach to support collaborative work over video<br />

conference. When we have a meeting, we often use a<br />

whiteboard-like panel to write down words, phrases,<br />

figures, marks, etc., which surely support understanding<br />

each o<strong>the</strong>r with reducing difficulty and mistakes caused by<br />

miscommunication, and with increasing easiness and<br />

mutual understanding supported by visual aides. With<br />

only a marker pen, participants can not only control<br />

computers located locally or remotely, but also even<br />

manipulate teleoperation to control a remote machine<br />

located on a remote site. Although what we did in this<br />

study was limited to a simple operation on a miniature<br />

crane, but we are actually able to manipulate various<br />

kinds of devices, including remote computers, mechanical<br />

machines, electrical devices, home appliances, etc. only if<br />

we can make it available to control <strong>the</strong>m via IT network,<br />

which can be available in a variety of ways.<br />

What we have employed in our test environment was a<br />

teleoperation as an example of collaborative work during<br />

video conference. To do so, we have prepared a toy<br />

crane and controller, both of which can be connected to<br />

PC ei<strong>the</strong>r locally or remotely, so that an operator can<br />

control it during video conference. BOCOLLA interface<br />

allows participants to control <strong>the</strong> crane during <strong>the</strong><br />

conference. Vibration-based interface presented in this<br />

paper can also be used as an interface. Participants can<br />

have a touch-and-feel of control on <strong>the</strong> crane. The forcefeedback<br />

lever presented in this paper can also be<br />

integrated in this test environment to support physical<br />

interaction in video conference.<br />

The idea of physical interaction presented in this paper is<br />

to support much more collaboration in mechatronics<br />

design over <strong>the</strong> network. We will continue our research,<br />

and work much more on <strong>the</strong> development on each<br />

interface modules and subsystems to implement an<br />

integrated test environment. Using such an integrated<br />

environment, we will study <strong>the</strong> feasibility of our idea in<br />

more practical scenarios.<br />

11<br />

Acknowledgement<br />

This research was supported in part by <strong>the</strong> Grants-in-Aid<br />

for Scientific Research in 2003-2004 (Scientific Research<br />

(C) 15500347) from <strong>the</strong> Japan Society of Promotion of<br />

Science. The author would like to thank Prof. Teisuke<br />

Sato of Department of Mechanical Engineering, and Prof.<br />

Tetsuo Ichikawa, Dr. Yoritoki Tomotake, DDS. Keiko<br />

Shibutani of School of Dentistry of <strong>the</strong> University of<br />

Tokushima, Prof.Koichi Sairyo of School of Medicine at<br />

<strong>the</strong> University of Tokushima, Dr. Andrew Milne of Stanford<br />

University. The author would also like to thank <strong>the</strong><br />

members of Collaborative Engineering <strong>Laboratory</strong> at <strong>the</strong><br />

University of Tokushima.<br />

References<br />

[1] Ito, T. 2004, Vibration-based interface for remote<br />

object manipulation in video conference system, 13 th<br />

IEEE International Workshop on Robot and Human<br />

Interactive Communication, Kurashiki, Japan, pp.295-<br />

300.<br />

[2] Ito, T. 2004. (ed. K. Chen, D.Webb and R. March), An<br />

approach of virtual environment for planning of implant<br />

placement, Advances in e-Engineering and Digital<br />

Enterprise Technology. Pp.355-362.<br />

[1] Johanson, B., A. Fox, T Winograd. 2002. “The<br />

Interactive Workspaces Project: Experiences with<br />

Ubiquitous Computing Rooms.” IEEE Pervasive<br />

Computing Magazine April-June, 1/2:71-78.<br />

[2] Milne, A., T. Winograd. 2003. “The iLoft Project: A<br />

Technologically Advanced Collaborative Design<br />

Workspace as Research Instrument.” Proc. Int’l Conf.<br />

on Engineering Design ICDE2003, Stockholm, August,<br />

pp-no.1657.<br />

[3] Ponnekanti, S. R., B. Johanson, E. Kiciman and A. Fox.<br />

2003. “Portability, Extensibility and Robustness in<br />

iROS.” Proc. IEEE International Conference on<br />

Pervasive Computing and Communications<br />

(Percom2003), Dallas-Fort Worth, TX. March.<br />

[4] Telemedical.com home page URL<br />

http://www.telemedical.com/Telemedical/Products/vidc<br />

onf.htm


XML-based Product and Process Data Representation for Distributed Process Planning<br />

Dušan N. Šormaz, Jaikumar Arumugam, Narender Neerukonda<br />

Department of Industrial and Manufacturing <strong>Systems</strong> Engineering<br />

Ohio University, A<strong>the</strong>ns, OH 45701<br />

Abstract<br />

The need to exchange product and process data between different software applications has been identified<br />

across manufacturing industries. An efficient model for communications between CAD, CAPP and CAM<br />

applications in distributed manufacturing planning environment has been seen as key ingredient for CIM.<br />

The paper proposes neutral, XML-based representation for product data required for process planning and<br />

for process data required for downstream manufacturing applications (like cell design, and scheduling). The<br />

representation is based on established standards for product data exchange and serves as a prototype<br />

implementation of <strong>the</strong>se standards. The procedures for writing and parsing XML representations have been<br />

developed in object-oriented approach, in such a way that each object from object oriented model is<br />

responsible for storing its data into XML format. Similar approach is adopted for reading and parsing of <strong>the</strong><br />

XML model. Parsing is preformed by a stack of XML handlers, each corresponding to a particular object in<br />

XML hierarchical model. This is very useful approach for direct distributed applications, in which data are<br />

passed in <strong>the</strong> form of XML streams to allow on-line communication. The components of <strong>the</strong> XML model for<br />

product and process data are explained in <strong>the</strong> paper, <strong>the</strong> mechanism and procedures for writing and parsing<br />

<strong>the</strong> XML model are described. The feasibility of <strong>the</strong> proposed model is verified in a sample scenario for<br />

distributed manufacturing planning that involves feature mapping from CAD file, process selection for<br />

several part designs and selection of alternative processes using scheduling criteria.<br />

Keywords:<br />

1 INTRODUCTION<br />

Computer Integrated Manufacturing (CIM) is still moving<br />

target in industrial and manufacturing engineering<br />

research and applications. There are numerous reports<br />

outlining individual islands of automation within <strong>the</strong> CIM<br />

model, with a significant effort in research papers being<br />

focused on a particular task, and much less effort devoted<br />

to integration of <strong>the</strong>se manufacturing engineering and<br />

planning tasks. Integration involves <strong>the</strong> transfer of data<br />

between applications, but also should focus on data and<br />

model integrity, distributed processing of <strong>the</strong> data,<br />

incorporation of knowledge into <strong>the</strong> planning tasks, and so<br />

on. Computer aided process planning (CAPP) is rightly<br />

seen as an integration fabric for CIM with its relations to<br />

design (CAD), manufacturing (CAM), and scheduling<br />

tasks. By virtue of being an integrator between CAD,<br />

CAM, and scheduling, process planning involves decision<br />

making process on various levels of details with <strong>the</strong> final<br />

goal of generating feasible and/or optimal process plan.<br />

The need for integration requires that such model is<br />

transparent between <strong>the</strong>se tasks, that it can be easily<br />

saved, transferred, and re-created as needs arise.<br />

This paper proposes such neutral data model in <strong>the</strong> form<br />

of XML model and describes its details and application in<br />

manufacturing process planning. The paper is organized<br />

as follows. Section 2 describes previous work in process<br />

plan representation and modeling. Section 3 describes<br />

process planning representation object model, which<br />

includes major entities and relations between <strong>the</strong>m.<br />

Section 4 explains process planning XML schema model<br />

that is built for previous object model. Section 5 describes<br />

a flexible mechanism for writing data in XML format and<br />

parsing XML streams into object model. Section 6<br />

describes a sample scenario of integration between<br />

process selection and scheduling using data in XML<br />

format. The paper ends with conclusions and <strong>the</strong> list of<br />

references.<br />

12<br />

2 PREVIOUS WORK<br />

Data and knowledge representation in process planning<br />

have received significant interest in research. An early<br />

work on ALPS [1] proposed a graphical representation for<br />

manufacturing processes and means for specifying serial,<br />

parallel and concurrent tasks. Since <strong>the</strong>n, several papers<br />

addressed knowledge representation, for example, using<br />

frames and rules [2] or an object-oriented data model [2].<br />

International standard for product data exchange (STEP)<br />

has been developed to enable data transfer between<br />

applications that includes process data [8]. Recent results<br />

are in generation of <strong>the</strong> Process Specification Language<br />

(PSL) as a neutral format for <strong>the</strong> specification of process<br />

representation and exchange of different ontologies or<br />

semantics between various domains. Development of<br />

process planning specific, NC data within STEP standard<br />

has been described in [3]. Work on XML [6], as a very<br />

flexible language that transfers both data and <strong>the</strong>ir<br />

description (metadata) prompted its widespread use in<br />

many research efforts. Paper [12] discusses similarities<br />

and differences between STEP and XML and proposes<br />

<strong>the</strong>ir convergence.<br />

3 PROCESS PLANNING REPRESENTATION AND<br />

MODELING<br />

Manufacturing planning object model developed in this<br />

work is based on process planning object model proposed<br />

in [2], which described a data model for representation of<br />

process plans based on <strong>the</strong> different activities involved in<br />

manufacturing. A process planning representation model<br />

facilitates <strong>the</strong> development of algorithms for<br />

manufacturing problems like sequencing, scheduling etc.<br />

by reducing <strong>the</strong> over-all algorithm development time. The<br />

model accommodates a variety of data that may be<br />

needed in manufacturing planning algorithms.<br />

Components of <strong>the</strong> model are manufacturing planning<br />

model, feature object model, and process object model<br />

and <strong>the</strong>y are described in this section.


3.1 Manufacturing planning object model<br />

Manufacturing planning object model is shown in Figure 1.<br />

The model is based on analysis of product and process<br />

design entities and includes hierarchical representation of<br />

manufacturing activities, that has manufacturing<br />

processes as its leaves, collection of manufacturing<br />

features and corresponding manufacturing processes,<br />

and a collection of machines used in <strong>the</strong> manufacturing<br />

system.<br />

A manufacturing activity represents <strong>the</strong> core of <strong>the</strong> model.<br />

Any activity that contributes to <strong>the</strong> manufacturing of a part<br />

is called as a manufacturing activity. A manufacturing<br />

activity has attributes like manufacturing cost,<br />

manufacturing time, member process etc. A<br />

manufacturing activity is subdivided as a part activity, a<br />

machine activity or a tool direction activity. A part activity<br />

describes <strong>the</strong> process plan for a part. There is an<br />

association relationship between part activity and part.<br />

Each part activity is associated with a part. A process plan<br />

for a part is a collection of <strong>the</strong> machines through which a<br />

part has to pass through to be completely manufactured.<br />

The part in turn can have multiple alternative process<br />

plans. The machining process of a part on each machine<br />

in its process plan is represented by a machine activity.<br />

Each machine activity is associated with a machine<br />

object. There is an aggregation relationship between part<br />

activity and machine activity. Each part activity is a<br />

collection of machine activities. The part object has<br />

attributes like a collection of its alternative process plans,<br />

part material, features list, process list etc. The machine<br />

object has attributes like machine name, number of units,<br />

usage frequency, SICGE code etc. Each machine activity<br />

is a collection of tool direction activities. A tool direction<br />

activity holds directional information about a machining<br />

process. The member process attribute of manufacturing<br />

activity is used to store <strong>the</strong> aggregations of a<br />

manufacturing activity. Thus, <strong>the</strong> member process<br />

attribute of a part activity holds a collection of machine<br />

activity. The member process attribute of a machine<br />

activity holds a collection of tool direction activities. The<br />

representation model for <strong>the</strong> cellular manufacturing shown<br />

in Figure 2 is built on <strong>the</strong> basis of <strong>the</strong> process plan<br />

Figure 1.Process plan representation model for manufacturing<br />

representation model and serves as its extension for cell<br />

formation.<br />

Figure 2. Cellular manufacturing representation model<br />

The core of <strong>the</strong> cellular manufacturing model is <strong>the</strong><br />

manufacturing system. A manufacturing system is a place<br />

where parts are manufactured on machines. The main<br />

task of cell formation is <strong>the</strong> partition of <strong>the</strong> parts in <strong>the</strong><br />

system into part families and machines into machine cells<br />

to reduce intercellular traffic. The objective is to find a<br />

partition for machines into machine cells and parts into<br />

part families in such a way as to minimize intercellular<br />

traffic.<br />

3.2 Feature object model<br />

Feature object model represents a hierarchical<br />

representation of various machining features with<br />

inheritance relations within it. The model is shown in<br />

Figure 3. The major class is MfgFeature that abstracts all<br />

common properties for all features. Properties at this level<br />

include feature name, containing part, tolerance data, list<br />

of alternative processes, and precedence relations.<br />

MfgFeature class is extended into several subclasses that<br />

correspond to machining feature types found in<br />

mechanical prismatic parts (such as Hole, Slot, and<br />

Pocket). These classes model properties of particular<br />

feature type and include different dimension parameters,<br />

and process capability data. However, model properties<br />

on general, feature ,level are of generic nature and can be<br />

applied by extending this model to o<strong>the</strong>r domains (like<br />

rotational parts, sheet metal parts, and so on). Model also<br />

contains several auxiliary classes that serve <strong>the</strong> purpose<br />

of generating various feature relations and displaying<br />

<strong>the</strong>m to user.<br />

13


javax.swing.filechooser.FileFilt<br />

SaveFilter<br />

Exception<br />

UnsupportedFeatureExcept<br />

TableCellGenerator<br />

mfgFeatureInteractorGenerat<br />

TestPocket<br />

java.awt.event.ActionListen<br />

...actionAdapter<br />

Pocket<br />

Hole<br />

+HolePanel<br />

3.3 Machining process object model<br />

The knowledge about processes is also represented in an<br />

objected-oriented model. In order to map this knowledge<br />

representation, <strong>the</strong> machining processes are categorized<br />

based on <strong>the</strong>ir characteristics. Figure 4 presents this<br />

hierarchy in a UML based model.<br />

The class MfgProcess represents <strong>the</strong> most generic<br />

process class, i.e., a process with <strong>the</strong> common data<br />

shared by <strong>the</strong> rest of <strong>the</strong> processes. Fur<strong>the</strong>r distinctions<br />

are carried out based on <strong>the</strong> process characteristics such<br />

as hole making processes and profile generating milling<br />

processes. The hole making processes are fur<strong>the</strong>r divided<br />

into CoreMaking, HoleStarting and HoleImproving<br />

processes, while <strong>the</strong> Milling process has as sub-type<br />

java.awt.event.ActionListen<br />

...actionAdapter MfgPartMode<br />

TableCellGenerator<br />

MyMfgPartModel<br />

mfgFeatureNeighborGenera<br />

ImpObject<br />

MfgFeature<br />

MfgFeatureContentHandle<br />

ImpXmlHandler<br />

MfgFeatureSubclassHand<br />

Figure 3. Class diagram for features<br />

TableCellGenerator<br />

MfgFeaturePrecedenceGenera<br />

Slot<br />

+SlotPanel<br />

Figure 4. Machining process hierarchy<br />

14<br />

FeatureSet<br />

javax.swing.filechooser.FileFilt<br />

PartFilter<br />

InstanceFeature<br />

CheckBoxListene<br />

DovetailSlot TSlot<br />

LinearFeatureSe CircularFeatureSe<br />

EndMilling process. These generalized classes are<br />

implemented as abstract classes and are shown with<br />

italicized titles in Figure 4. The classes under <strong>the</strong>se<br />

umbrella classes are for representing <strong>the</strong> actual<br />

machining processes (for example, TwistDrilling,<br />

EndMIllingSlotting, or FaceMilling). Therefore, based on<br />

<strong>the</strong> inheritance, EndMillingSlotting process acquires<br />

process information from ‘Endmilling’, which fur<strong>the</strong>r leads<br />

to <strong>the</strong> parent class MfgProcess’. The following<br />

paragrpahs give a brief description about <strong>the</strong> MfgProcess<br />

and EndMilling classes., while description of o<strong>the</strong>r classes<br />

is part of working documentation.<br />

MfgProcess: This class contains member variables such<br />

as feature, stock, workpiece, cutting parameters,


constraints, tool, and tool path. These listed variables are<br />

used in every inherited process class as every process<br />

contains <strong>the</strong>se components of machining process. Also,<br />

this class carries <strong>the</strong> GUI components for showing<br />

process information and a graphical interface to display a<br />

process.<br />

EndMilling: The implementation for visualization is mainly<br />

concentrated on end milling operations, so this class<br />

contains some graphical components. This class provides<br />

methods to prepare <strong>the</strong> scene graph, which carries nodes<br />

to display machining process components and <strong>the</strong><br />

animation for visualization. The GUI required for eventbased<br />

interaction with <strong>the</strong> virtual world displayed is<br />

provided in this class. The subclasses --slotting and<br />

peripheral end milling-- use this implementation with<br />

distinctive modifications in tool approach for machining.<br />

4 PROCESS PLANNING XML SCHEMA MODEL<br />

This section discusses <strong>the</strong> persistent and neutral data<br />

storage mechanism for <strong>the</strong> process plan representation<br />

model (PPRM) based on XML. It describes <strong>the</strong> XML<br />

schema which is <strong>the</strong> basis or template for process plan<br />

data generation, and provides few examples of XML data.<br />

A schema is a set of rules that have to be satisfied in valid<br />

XML document [6]. Figure 5 shows <strong>the</strong> XML Schema<br />

definition for <strong>the</strong> process plan representation model as<br />

shown in a tool for XML development XMLSpySuite.<br />

Figure 5.XML schema for PPRM from XML Spy Suite.<br />

The root element of <strong>the</strong> schema is that<br />

holds all information about a factory model. This element<br />

holds two collection elements and<br />

. The element is a collection of<br />

part models represented by <strong>the</strong> element.<br />

The is a collection of <strong>the</strong> available<br />

machines represented by element. Each<br />

element has a list element called<br />

, which is a collection of alternative<br />

process plans, for <strong>the</strong> enclosing part element. These<br />

alternative process plans are represented as<br />

elements on <strong>the</strong> part model. Each<br />

element has a <br />

element. The element is a<br />

collection of all <strong>the</strong> elements in <strong>the</strong><br />

enclosing process plan. Each element<br />

encloses a element that holds information<br />

about <strong>the</strong> machine on which <strong>the</strong> machining operation is<br />

done. Each element holds a<br />

element, This element holds<br />

<strong>the</strong> spatial information about <strong>the</strong> tools used in this<br />

machining activity. in turn, holds<br />

element as reference to a machining<br />

process. The hierarchical relationship between parts,<br />

machines, part activities, machine activities, tool activities,<br />

features and processes is in such way incorporated into<br />

<strong>the</strong> XML document.<br />

Information on features and processes may be included in<br />

few levels of detail. For feature modeling, geometric<br />

reasoning and process selection all details are needed, so<br />

element actually carry <strong>the</strong> name of <strong>the</strong> feature or process<br />

class, with inclusion of all details. Example of this model<br />

for two features is shown in Figure 6. Feature tags are<br />

actually class names, and feature have all details of <strong>the</strong>ir<br />

dimensions stored.<br />

Figure 6. Detailed XML data for features<br />

Different XML elements are used when feature and<br />

process data are used in cell formation or scheduling, as<br />

will be shown in detailed example in section 6.<br />

5 MECHANISM FOR WRITING AND PARSING XML<br />

DATA<br />

This section describes flexible mechanism for generation<br />

of XML data from Java and reconstruction of class<br />

instances from XML code.<br />

5.1 XML data generation mechanism<br />

An object-oriented data generation framework was<br />

constructed for <strong>the</strong> purpose of generating XML data for<br />

factory models based on <strong>the</strong> process plan representation<br />

model. The different entities whose XML data needs to be<br />

generated for <strong>the</strong> factory model include MfgPartModel,<br />

Machine, PartActivity, MachineActivity and<br />

ToolDirectionActivity, MfgFeatue and MfgProcess. All <strong>the</strong><br />

Java classes built for <strong>the</strong> process plan representation<br />

model are capable of generating self-describing XML<br />

data. We propose two alternative ways for achieving this<br />

goal: a) each class implements methods for XML data<br />

generation, or b) XML data generation is delegated to<br />

special XML writer classes.<br />

The first approach was used for Machine class as shown<br />

in Figure 7 where <strong>the</strong> code for its method writeXML() is<br />

given. The Machine class holds data about <strong>the</strong> machine<br />

like name, number of units, usage frequency, SICGE code<br />

etc. It is this state data for each machine that needs to be<br />

saved into XML.<br />

15<br />

<br />

<br />

<br />

<br />

<br />

<br />

Figure 7. Machine Java class showing XML data<br />

generation mechanism


To establish uniformity, a method called writeXML() with<br />

<strong>the</strong> following syntax is defined fro each class using this<br />

way:<br />

public void writeXML (StringBuffer xmlTarget,<br />

String indent)<br />

This method is called on <strong>the</strong> Java class whenever data<br />

about <strong>the</strong> state of an instance of <strong>the</strong> class has to be<br />

generated in <strong>the</strong> form of XML. The argument xmlTarget<br />

holds all <strong>the</strong> factory model information generated in XML<br />

form until <strong>the</strong> Machine class method was called. The<br />

generated XML data from <strong>the</strong> Machine class is <strong>the</strong>n<br />

included in <strong>the</strong> xmlTag variable. The indent argument is to<br />

generate properly indented XML code to improve<br />

readability.<br />

Alternative approach is to implement XML writer class for<br />

each PPRM class. The XML writers write out XML data at<br />

a given state of manufacturing process planning .The<br />

PartWriter writes part material and part activities. It calls<br />

FeatureWriter to write <strong>the</strong> feature data.<br />

The feature writers also work in <strong>the</strong> same manner. The<br />

FeatureWriter writes <strong>the</strong> dimensional details like radius,<br />

depth, axis and axis-point about <strong>the</strong> feature. It gives a call<br />

to <strong>the</strong> PropertyTableWriter which writes <strong>the</strong> tolerance<br />

details like surface finish, roundness, true position and<br />

straightness. It also calls ProcessWriter that writes data<br />

fro alternative processes like, class name (type), process<br />

name, cutting parameters, machine name, process time<br />

and cost. This chain of XML data writing is shown in<br />

Figure 8.<br />

Part Writer<br />

Feature Writer<br />

Process Writer<br />

Part name<br />

Part material<br />

Batch size<br />

Call feature writer<br />

Call activity writer<br />

Feature name<br />

Radius<br />

Depth<br />

Axis<br />

Axis point<br />

Call tolerance writer<br />

Call process writer<br />

Tool Material<br />

Depth of cut<br />

Cutting parameters<br />

Machine name<br />

Process time<br />

Process cost<br />

Figure 8:XMLWriters for processes<br />

It should be noted that during <strong>the</strong> writing process writers<br />

verify <strong>the</strong> state of <strong>the</strong> process planning and write only data<br />

that is available. For example, at <strong>the</strong> end of feature<br />

mapping only feature details are written, and <strong>the</strong> writer<br />

does not write anything about processes or tolerances.<br />

5.2 XML data parsing<br />

XML data generated from PPRM holds all <strong>the</strong> information<br />

necessary to reconstruct <strong>the</strong> Java class instance,<br />

including data about all <strong>the</strong> parts in <strong>the</strong> factory model, <strong>the</strong><br />

machines in <strong>the</strong> factory model, <strong>the</strong> routing information for<br />

all <strong>the</strong> parts etc. XML parsers can be used to reconstruct<br />

instances of Java classes from <strong>the</strong> XML data. There are<br />

two kinds of parsers available for XML data parsing [6]:<br />

SAX parser (Simple API for XML parsing) and DOM parse<br />

(Document object model). DOM views an XML document<br />

16<br />

as a tree structure and loads <strong>the</strong> entire document into<br />

memory. It builds parent-child relationship between<br />

nested elements. The DOM API provides standard<br />

methods for querying <strong>the</strong> XML document and<br />

reconstructing Java objects. SAX is an event-based<br />

parser that fires different events based on <strong>the</strong> element<br />

parsed. A SAX parser, unlike <strong>the</strong> DOM parser, does not<br />

maintain a default model for <strong>the</strong> parsed data. If a listener<br />

can be set on <strong>the</strong> SAX parser to listen to parsing of<br />

specific tags, <strong>the</strong>n whenever <strong>the</strong> corresponding element is<br />

parsed, <strong>the</strong> listener can construct a Java instance of <strong>the</strong><br />

class corresponding to <strong>the</strong> element. The SAX parser used<br />

in Factory Model Generator is an instance of <strong>the</strong> Java<br />

class (javax.xml.parsers.SAXParser). This parser is used<br />

to construct factory models from <strong>the</strong> saved XML files. The<br />

listener for this parser is called as content handler and is<br />

an instance of <strong>the</strong> Java class<br />

(org.xml.sax.helpers.DefaultHandler). Every object (or<br />

class) in <strong>the</strong> PPRM is responsible for defining and<br />

implementing a content handler that can reconstruct<br />

instances of <strong>the</strong> Java class from <strong>the</strong> XML element parsed.<br />

For example, for <strong>the</strong> Machine class, <strong>the</strong> content handler is<br />

defined as an inner class and an instance of <strong>the</strong> content<br />

handler can be obtained by calling a method called<br />

getSAXHandler(). XML data can <strong>the</strong>n be parsed with this<br />

content handler.<br />

The content handler provides three methods that are used<br />

to reconstruct <strong>the</strong> wrapper class instance: startElement(),<br />

endElement(), and characters(). The content handler<br />

class for parsing XML data of <strong>the</strong> machine XML data is<br />

shown in Figure 9.<br />

Figure 9. Parsing machine XML data with a content<br />

handler<br />

An instance of <strong>the</strong> SAXHandler class is capable of<br />

generating events when a element is parsed<br />

in <strong>the</strong> XML document. Separate events are generated<br />

corresponding to <strong>the</strong> parsing of ,<br />

and character data. The startElement ()<br />

method is called when <strong>the</strong> SAXParser parses <strong>the</strong><br />

tag. Since all <strong>the</strong> information in <strong>the</strong> <br />

element is available as attributes of <strong>the</strong> element, <strong>the</strong><br />

values corresponding to <strong>the</strong> attributes can be obtained<br />

from <strong>the</strong> atts argument of <strong>the</strong> method, as shown in <strong>the</strong><br />

code above. Thus, <strong>the</strong> Java object mac corresponding to<br />

<strong>the</strong> element tag parsed is constructed. The<br />

characters method is fired when characters are parsed<br />

between <strong>the</strong> and <strong>the</strong> .<br />

Since <strong>the</strong> tag shown above does<br />

not have any characters, this method never gets fired.<br />

The endElement () method gets fired when <strong>the</strong>


tag is parsed by <strong>the</strong> SAXParser. This method<br />

can be used to deal with <strong>the</strong> instance of <strong>the</strong> Machine<br />

class constructed in <strong>the</strong> startElement () method. For<br />

example, this instance can be added to <strong>the</strong> machineList<br />

variable of <strong>the</strong> MfgSystem object, which holds this<br />

machine. The content handler of <strong>the</strong> MfgSystem class has<br />

already constructed <strong>the</strong> MfgSystem object by <strong>the</strong> time <strong>the</strong><br />

Machine element is parsed. This MfgSystem object is<br />

passed to <strong>the</strong> machine content handler as a variable<br />

called parent.<br />

5.3 Hierarchy of XML Handlers<br />

In order to accommodate method described in <strong>the</strong><br />

previous section, it was necessary to provide a<br />

mechanism for parsing a single XML file (or stream). This<br />

is responsibility of ImpXmlReader class. This class<br />

accepts <strong>the</strong> XML stream and initial handler, and delegates<br />

XML parsing task to this handler. As different XML<br />

elements require different handlers, ImpXmlReader keeps<br />

a stack of handlers, so that when new handler is invoked,<br />

<strong>the</strong> old is kept stored in <strong>the</strong> stack. When parsing of one<br />

PPRM object is completed, <strong>the</strong> last handler is recalled<br />

from <strong>the</strong> stack and it continues parsing. At <strong>the</strong> end,<br />

parsing of <strong>the</strong> file is completed by <strong>the</strong> very first handler<br />

that started it. Thus, <strong>the</strong> entire PPRM model instance is<br />

constructed from <strong>the</strong> XML data.<br />

In order to better explain <strong>the</strong> above described process,<br />

and example of parsing a single part file is shown in<br />

Figure 10. The file is given to ImpXmlReader, which starts<br />

parsing using <strong>the</strong> PartHandler. The PartHandler starts<br />

interpreting tags (or elements) in <strong>the</strong> XML file. As soon as<br />

it encounters <strong>the</strong> tag it switches <strong>the</strong><br />

handler and sets it to <strong>the</strong> FeatureHandler class which<br />

continues parsing <strong>the</strong> file fur<strong>the</strong>r. The PartHandler is<br />

pushed into <strong>the</strong> stack of ImpXmlReader. The feature<br />

handler instantiates <strong>the</strong> feature object and populates it<br />

with data using setter methods as explained earlier. The<br />

feature handler as it parses and reads <strong>the</strong><br />

tag shifts and sets <strong>the</strong> handler to<br />

PropertyTableHandler class. This class sets all <strong>the</strong><br />

tolerances on <strong>the</strong> current feature. On parsing <strong>the</strong> closing<br />

tolerance tag <strong>the</strong> handler is switched<br />

back to <strong>the</strong> FeatureHandler.<br />

XML tag Handler Action<br />

PartHandler<br />

Switch to FeatureHandler<br />

<br />

<br />

<br />

<br />

Switch to<br />

PropertyTablehandler<br />

Switch back to<br />

Featurehandler<br />

Keep <strong>the</strong> same handler<br />

Switch back to Part handler<br />

MfgPart Object<br />

instantiated<br />

Feature object instantiated<br />

feature dimesions set:<br />

axis, axis point, radius,<br />

depth<br />

Tolerances to Feature<br />

set: truePosition,<br />

roundness, positive<br />

tolerance, sets surface<br />

finish, etc.<br />

Feature added to part<br />

MfgPart Object completed<br />

Figure 10.Functioning of XML Handlers.<br />

The feature also is added to MfgPartModel object. Finally<br />

when all features are done and <strong>the</strong> tag is<br />

encountered <strong>the</strong> handler is reset to PartHandler, which<br />

completes <strong>the</strong> parsing <strong>the</strong> file.<br />

This approach provides for great flexibility in parsing XML<br />

data. For example, in cell formation, layout design,<br />

capacity planning, or scheduling applications, all data may<br />

be stored in a single file that corresponds to <strong>the</strong> whole<br />

factory model. In that case, MfgSystemHandler starts<br />

parsing, and it calls PartHandler and MachineHandler at a<br />

corresponding tag in <strong>the</strong> file and resumes parsing when<br />

<strong>the</strong>y finish <strong>the</strong> work. This approach also provides fro a<br />

scenario in which parts may be parsed from different files<br />

or o<strong>the</strong>r sources, and <strong>the</strong>n combined into single file, or<br />

parsed in a single file and <strong>the</strong>n split for individual<br />

processing in some application.<br />

The existence of separate XML writers and handlers<br />

provides for ano<strong>the</strong>r extensibility of <strong>the</strong> approach. The<br />

XML writer and handler can be specified at run time, so<br />

that it is possible to parse data in one format and <strong>the</strong>n<br />

store it back in a different format. Utilization of this method<br />

is for applications where not all details about <strong>the</strong> model<br />

are required, but only some subset. Also in cases where<br />

applications already exist with particular structure, this<br />

structure may be used to extend <strong>the</strong> applicability.<br />

We have tested this approach in a rule-based process<br />

selection system in which communication between<br />

IMPlanner [12] (<strong>the</strong> prototype in which this approach has<br />

been implemented and tested) successfully implemented<br />

a different set of writers and handlers, with <strong>the</strong> need to reimplement<br />

any o<strong>the</strong>r class and we were able to utilize<br />

system in this case.<br />

6 INTEGRATION OF PROCESS PLANNING AND<br />

SCHEDULING – AN EXAMPLE SCENARIO<br />

Utilization of XML-based process plan data model will be<br />

demonstrated in distributed integration of process<br />

planning and scheduling. Scenario is <strong>the</strong> following. For a<br />

group of designed parts it is necessary to perform process<br />

planning and select <strong>the</strong> process plan from several<br />

alternatives in order to achieve shortest processing time<br />

(makespan) on a group of available machines. Cad<br />

models are available for <strong>the</strong>se parts.<br />

This scenario will be illustrated on several mechanical<br />

parts from NIST design repository [5]. Four different parts<br />

were chosen as shown in Figure 11. For each part CAD<br />

model was modified to feature based model to<br />

accommodate our approach to CAD/CAPP integration.<br />

The procedure will be illustrated on AES94 model.<br />

Feature based model was created in Unigraphics CAD<br />

package (Figure 12). Each model has been separately run<br />

by feature mapping application (details are in [9]) as<br />

shown in Figure 13. The result for all models is saved into<br />

XML file with <strong>the</strong> full feature details (Figure 14). Process<br />

selection is done by rule-based system [10] which was<br />

developed for an industrial partner, with results shown in<br />

Figure 15. For scheduling application, XML files for all<br />

models are used in simplified version (scheduling is not<br />

concerned with feature details, but only with process<br />

times and machines), so different writers and parsers are<br />

used (Figure 16 shows one input file). Scheduling<br />

application used LP approach for selection of<br />

simultaneous selection of alternatives and <strong>the</strong>ir<br />

scheduling [11], its results are shown interactively (Figure<br />

17) and saved into XML file, which is shown in Figure 18,<br />

successfully completing <strong>the</strong> whole scenario.<br />

7 CONCLUSIONS<br />

This paper has demonstrated <strong>the</strong> flexible use of XML data<br />

representation in process planning modeling and<br />

integration. The XML schema has been developed for<br />

validation of XML process plan files.<br />

17


Name AES94 Anc101<br />

Model<br />

Number of<br />

features<br />

12 20<br />

Name Switcharm Scfdemo04<br />

Model<br />

Number of<br />

features<br />

Figure 12. Feature based model in CAD system<br />

Flexible approach for writing XML data from PPRM and<br />

parsing data back has been explained. Benefits of this<br />

approach were demonstrated in few small examples.<br />

Scenario for <strong>the</strong> use of proposed XML based model in<br />

integration of feature mapping, process planning, and<br />

scheduling application is demonstrated on simple<br />

example.<br />

9 18<br />

Figure 11. Models used in <strong>the</strong> example scenario<br />

18<br />

Figure 13. Feature mapping application<br />

8 REFERENCES<br />

[1] B. A. Catron, and S. R. Ray, ALPS: A Language for<br />

Process Specification. International Journal of<br />

Computer Integrated Manufacturing, 4, 105-113.<br />

1991.<br />

[2] J. Y. Park, B. Khoshnevis. A real time computer<br />

aided process planning system as a support tool for<br />

economic product design. Journal of Manufacturing<br />

<strong>Systems</strong>, 12(6):181-193, 1993.


Figure 14 XML file as a results of feature mapping<br />

Figure 15. XML file as a result of process selection<br />

Figure 16. XML file as input to scheduling<br />

Figure 17.Scheduling application with <strong>the</strong> solution<br />

19<br />

Figure 18. XML as a solution to scheduling algorithm<br />

[3] D. N. Sormaz and B. Khoshnevis, Process Planning<br />

Knowledge Representation using an Object-oriented<br />

Data Model, Int. Journal of Computer Integrated<br />

Manufacturing, Vol. 10, No. 1-4, p. 92-104, 1997.<br />

[4] C. Schlenoff, A. Knutilla, S. Ray, Proceedings of <strong>the</strong><br />

Process Specification Language (PSL) Roundtable,<br />

National Institute of Standards and Technology,<br />

Gai<strong>the</strong>rsburg, MD, 1997<br />

[5] Regli, William C, Gaines, Daniel M., A repository for<br />

design, process planning and assembly, Computer<br />

Aided Design, Vol. 29, No.12 p. 895-905., 1997.<br />

available on-lone at <strong>the</strong> URL:<br />

[6]<br />

http://edge.mcs.drexel.edu/repository/frameset.html<br />

S. Holzner, Inside XML, New Riders, Publishing,<br />

Indianapolis, Indiana,2001.<br />

[7] S T Newman, Integrated CAD/CAPP/CAM/CNC<br />

Manufacture for <strong>the</strong> 21st Century, Invited paper<br />

Flexible Automation and Intelligent Manufacturing,<br />

FAIM2004, Toronto, CA, 2004.<br />

[8] STEPTools web site www.stepttols.com, September<br />

2004.<br />

[9] J. Arumugam, IMSE Department, Analysis of<br />

Feature Interactions and Generation of Precedence<br />

Network for Automated Process Planning, MSc<br />

<strong>the</strong>sis, Ohio University, 2004.<br />

[10] A. Wadatkar, Process Selection fro Hole Operations<br />

Using a Rule Based Approach, Msc <strong>the</strong>sis, Ohio<br />

University, 2004.<br />

[11] R. S. Harihara, Modeling Scheduling Algorithms with<br />

Alternative Process Plans in OPL, Msc <strong>the</strong>sis, Ohio<br />

University, 2004.<br />

[12] D. N. Sormaz, J. Arumugam, S. Rajaraman,<br />

Integrative Process Plan Model and Representation<br />

for Intelligent Distributed Manufacturing Planning,<br />

International Journal of Production Research, Vol.<br />

42, No. 17, p. 3397 - 3417, 2004.<br />

[13] J. Lubell, R. S. Peak, V. Srinivasan, S. C. Waterbury,<br />

STEP, XML, and UML: Complementary<br />

Technologies, Proceedings of DETC’04, ASME 2004<br />

Design Engineering Technical Conferences and<br />

Computers and Information in Engineering<br />

Conference, Sep.28-Oct. 2, 2004, Salt Lake City, UT


PART 2<br />

INTEGRATION & PRODUCT<br />

VARIANTS AND COMPLEXITY<br />

20


The integration of CAE into <strong>the</strong><br />

Complete Manufacturing Workflow<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

21<br />

1


Acceptance of CAE in <strong>the</strong> market<br />

• The need for E-CAE (Electrical Computer Aided<br />

Engineering) is now far more accepted in <strong>the</strong> market<br />

than 10 years ago<br />

• At that time, <strong>the</strong> mechanical drawing office would<br />

often select <strong>the</strong> CAD system that a company would<br />

use, <strong>the</strong> electrical drawing office having to make best<br />

use of a 2D CAD solution<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

22


Problems with 2D CAD design<br />

• If using a 2D CAD system, <strong>the</strong> process of electrical<br />

design is far less automated.<br />

• Time spent on producing electrical documentation is<br />

a main part of <strong>the</strong> project.<br />

– Circuit diagram<br />

– Cross-References<br />

– Possible terminal diagrams<br />

– Possible bill of materials<br />

• CAD = Computer Aided Drawing, all <strong>the</strong>se<br />

evaluations required for electrical engineering must<br />

still be produced manually<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

23


Compared to conventional 2D CAD<br />

E_CAE solutions can deliver<br />

Reduction in errors and project design costs through:<br />

•Rapid Generation and modification of schematics<br />

•Automatic generation of project documentation<br />

such as terminal, wire, cable lists and BoM’s<br />

•Easy modification process greatly reducing time<br />

and errors<br />

•Single data entry solution reducing errors<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

24


Problems with 2D CAD design<br />

CAD - Alone is not <strong>the</strong> key for success<br />

• Fact: Computer based drawing does not bring all<br />

<strong>the</strong> benefits alone.<br />

Cost & Time intensive evaluations missing.<br />

Evaluations still generated manually<br />

• Higher demands on documentation because of:<br />

– Automisation of machinery /plant.<br />

– Greater demands from quality standards,<br />

customer expects error free documentation<br />

– Optimised document flow<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

25


There is a better way!<br />

• Database driven E-CAE systems are now much more<br />

widely used, particularly in continental Europe but are<br />

still often seen as ‘a design island’ within <strong>the</strong> overall<br />

project management process.<br />

• This leads to multiple entries of <strong>the</strong> same data in<br />

different systems within <strong>the</strong> process<br />

• A far more efficient approach is to optimise this<br />

process through single data entry and interfaces<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

26


PLC I/O<br />

The typical disjointed approach<br />

might consist of a workflow like this:<br />

Bus info<br />

= manual process<br />

PDM<br />

CAE design<br />

MRP<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

27<br />

Drawings<br />

Panel Build<br />

Customer<br />

Maintenance


What is being transferred and how?<br />

= manual process<br />

A verbal transfer of<br />

information such as<br />

PDM<br />

project number,<br />

completion date,<br />

customer details,<br />

CAE design project value,<br />

machine details.<br />

Name of CAE project,<br />

date drawings<br />

completed, revision<br />

information etc.<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

28


PLC I/O<br />

Bus info<br />

What is being transferred and how?<br />

= manual process<br />

PDM<br />

CAE design<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

29<br />

An I/O list may be<br />

printed as a Word<br />

or ASCII file and<br />

passed to <strong>the</strong><br />

designer who <strong>the</strong>n<br />

duplicates this<br />

information in <strong>the</strong><br />

schematic.<br />

Sometimes <strong>the</strong><br />

process works in<br />

reverse


What is being transferred and how?<br />

A parts list is created<br />

by <strong>the</strong> designer <strong>the</strong>n<br />

printed out to be<br />

entered into a stock<br />

control / purchasing<br />

system. A separate<br />

bill of material may<br />

be printed for panel<br />

build, customer and<br />

maintenance<br />

requirements<br />

CAE design Drawings<br />

MRP<br />

= manual process<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

30<br />

Panel Build<br />

Customer<br />

Maintenance


What is being transferred and how?<br />

Paper drawings are<br />

printed out for <strong>the</strong><br />

panel builder to work<br />

to, DXF files may be<br />

created for <strong>the</strong><br />

customer and<br />

maintenance, losing<br />

all <strong>the</strong> intelligence<br />

built into <strong>the</strong> E-CAE<br />

design.<br />

= manual process<br />

CAE design Drawings<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

31<br />

Panel Build<br />

Customer<br />

Maintenance


PLC I/O<br />

Bus info<br />

Now make a modification, can you<br />

be sure <strong>the</strong> change is implemented<br />

in all areas?<br />

PDM<br />

CAE design<br />

MRP<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

32<br />

Drawings<br />

Panel Build<br />

Customer<br />

Maintenance


There is a better way!<br />

• By creating interfaces between <strong>the</strong> different solutions<br />

and transferring data by means of spreadsheets or<br />

<strong>the</strong> lowest common denominator – an ASCII file!<br />

• This ensures a single point of entry for all data, ei<strong>the</strong>r<br />

in <strong>the</strong> PDM system, PLC programme or <strong>the</strong> electrical<br />

design.<br />

• Greatly improves <strong>the</strong> workflow process and reduces<br />

time and, more importantly, errors in <strong>the</strong> manual<br />

transfer of data<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

33


The new concept, workflow process!<br />

PLC<br />

PDM CAE<br />

Bus<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

34<br />

Panel<br />

Language<br />

MRP<br />

Maint.<br />

Customer


To summarise:<br />

E-CAE solutions already offer<br />

• Significantly improved performance through time<br />

saving and quality schematics<br />

• Reduction in errors and reduction in overall project<br />

design costs in excess of 75%<br />

• Quality support documentation (auto generated).<br />

• Improved quality of design and documentation<br />

• Now, take it one step fur<strong>the</strong>r and integrate into <strong>the</strong><br />

workflow process for even greater efficiency<br />

• Let <strong>the</strong> DESIGNER DESIGN!<br />

Integration of ECAE into workflow process Tony Ward / EPLAN Sales / 15 November 2004<br />

35


Aachen Technical University, <strong>Laboratory</strong> for Machine Tools and Production Engineering<br />

Release-Engineering:<br />

An Innovative Approach to Handle Complexity of Mechatronic Products<br />

Introduction<br />

G. Schuh, J.C. Desoi, M. Lenders, V. Witte<br />

Abstract:<br />

Complexity Management has emerged to an essential part of management in <strong>the</strong> automotive industry. Only if all drivers<br />

of complexity are well balanced, an economic optimum of variety can be achieved. Current automotive trends increasingly<br />

accelerate <strong>the</strong> deterioration of mechatronics products especially when compared to more recent rival products.<br />

Driven by <strong>the</strong> advent of innovative vehicle applications, contemporary automotive mechatronic architecture has reached<br />

a level of complexity which requires a technological breakthrough in order to manage it satisfactorily and to fulfil <strong>the</strong><br />

customer and legal requirements. The inevitable complexity drivers in dynamic automotive markets will remain <strong>the</strong> increasing<br />

customer orientation, rising model diversity and <strong>the</strong> increasing software and mechatronics shares. The presented<br />

Release-Engineering approach allows to control and to manage innovation programmes by ra<strong>the</strong>r suitable, dedicated<br />

R&D efforts on emerging variants over <strong>the</strong> product lifecycle.<br />

Keywords: Product Programme Management, Development, Mechatronics<br />

The complexity of R&D projects in <strong>the</strong> automotive industry<br />

is still increasing. The rising number of mechatronics<br />

applications and <strong>the</strong> growing number of derivative product<br />

variants stress <strong>the</strong> factor complexity even more. In fact, in<br />

81% of products <strong>the</strong> number of variants was found to<br />

increase over <strong>the</strong> product life cycle in a recent WZL-study<br />

(with an increase of variants by <strong>the</strong> factor 2 or more in<br />

43% of <strong>the</strong> cases). At <strong>the</strong> same time, only 19% of <strong>the</strong><br />

companies perform a systematic integration of part commonality<br />

schemes into <strong>the</strong> product development process<br />

with a high priority [1]. However, companies within a<br />

premium market are required to offer a greater product<br />

variety to maintain market share. The challenge to handle<br />

<strong>the</strong> increasing number of models and derivative products<br />

to penetrate market niches becomes even more complex.<br />

Thus, <strong>the</strong> balancing act between differentiation due to<br />

customized product offerings being launched at ever<br />

shorter intervals and concurrent amortization of R&D<br />

efforts becomes one of <strong>the</strong> main challenges.<br />

Opportunities and needs in automotive innovation<br />

Current trends increasingly accelerate <strong>the</strong> deterioration of<br />

mechatronics products especially when compared to more<br />

recent rival products. Driven by <strong>the</strong> advent of innovative<br />

vehicle applications, contemporary automotive mechatronic<br />

architecture has reached a level of complexity<br />

which requires a technological breakthrough in order to<br />

manage it satisfactorily and to fulfil customer requirements.<br />

A number of studies have focused on <strong>the</strong> speed and<br />

<strong>the</strong> productivity of individual projects in automotive development<br />

[2,3,4,5,6,7]. A common finding is that in order<br />

to shorten development lead times a relatively projectoriented<br />

organization with cross-functional coordination is<br />

essential. Strong project managers facilitate quick completion<br />

of a project by integrating different functions within<br />

<strong>the</strong> project. This approach has led to successful individual<br />

projects but is not necessarily <strong>the</strong> most efficient one for<br />

considering linkages among multiple projects of an entire<br />

company. Companies understand <strong>the</strong> need to cope with<br />

today’s dynamics of change and to reduce complexityrelated<br />

R&D efforts while utilizing <strong>the</strong> potentials of elec-<br />

36<br />

tronics and embedded software. However, <strong>the</strong> process to<br />

achieve this is usually not clear. Especially mechatronics<br />

and software driven R&D managers have not fully discovered<br />

that uncoordinated innovation and product programme<br />

management itself can produce unnecessary<br />

complexity costs. They realize that <strong>the</strong>y did not examine<br />

thoroughly enough what kind of active standards in terms<br />

of basic design architectures <strong>the</strong>y have to provide to<br />

achieve a cost-effective development strategy over <strong>the</strong><br />

programme lifecycle. The obvious consequence is that <strong>the</strong><br />

proactive management of product variety and complexity<br />

generation during <strong>the</strong> product life cycle and <strong>the</strong> associated<br />

R&D efforts is a key factor to economic success.<br />

The mechatronisation of components, product proliferation<br />

and decreasing model cycles are essential complexity<br />

factors in product development. All factors are challenges<br />

especially in European premium product and component<br />

development. As a consequence, <strong>the</strong> expected economies<br />

of scale associated with <strong>the</strong> launch of new variants are<br />

often overestimated and resulting dis-economies of scope<br />

are underrated [8].<br />

Origins of Release-Engineering<br />

The Release-Management approach is derived from Software-Engineering<br />

and can be carried forward to automotive<br />

(mechatronical) systems and significantly reduce<br />

unnecessary product complexity. Two major reasons<br />

stimulate software developers to coordinate software<br />

development in releases. They differ in <strong>the</strong>ir temporal<br />

domain – proactive complexity reduction over <strong>the</strong> lifecycle<br />

as well as R&D efficiency enhancement over <strong>the</strong><br />

different developing stages. Without a release-based product<br />

programme planning, ei<strong>the</strong>r software would always be<br />

obsolete or none of <strong>the</strong> sophisticated hardware components<br />

could be installed. Product releases are also built so<br />

that <strong>the</strong>y are approved for various platforms and markets<br />

[9]. Thus, one release represents a harmonised bundle of<br />

enhancements to a product’s functionality. The cycles in<br />

which releases take place are planned ahead; i.e. during<br />

<strong>the</strong> Windows 2000 development, Microsoft enforced a<br />

strict schedule for submitting revisions. Here, a release<br />

typically equals up to 250 changes [10].


Engineering in releases could feature a sustainable way to<br />

control and leverage emerging complexity. Especially<br />

those components for which cyclicity of technological<br />

evolutions comes into <strong>the</strong> fore – e.g. telemetrics, engineelectronics,<br />

active chassis frames – are predestined for a<br />

Release-Engineering approach. These components and<br />

<strong>the</strong>ir interfaces can benefit from an early coordination of<br />

following adoptions and innovations in derivatives or<br />

contiguous product families. The best possible functionality<br />

could be combined with <strong>the</strong> best possible robustness of<br />

<strong>the</strong> entire system.<br />

Perspectives of Release-Engineering<br />

Release-Engineering features advantages on three different<br />

levels of product development. It substantially improves<br />

product programme planning, requirement specifications<br />

management and change management efforts during advanced<br />

development stages.<br />

Utilizing Release-Engineering for product programme<br />

planning means evaluating <strong>the</strong> market acceptance of new<br />

innovations beforehand and <strong>the</strong>reby actively planning <strong>the</strong><br />

company’s innovation roadmap. The impact of Release-<br />

Engineering in this context means to focus new innovations<br />

over <strong>the</strong> whole product programme on one’s unique<br />

selling proposition. By a well-targeted timing of <strong>the</strong> introduction<br />

of innovations, innovations are assigned to certain<br />

Release-intervals and <strong>the</strong> perceived level of innovation can<br />

be controlled.<br />

Due to <strong>the</strong> parallel existence of increasingly divergent<br />

component life cycles within today’s automotive systems,<br />

product architecture specifications need to be kept flexible<br />

for decisive functions at <strong>the</strong> right point of time. The decisive<br />

factor is <strong>the</strong> successful identification of <strong>the</strong> underlying,<br />

“ideal” component clock-speeds.<br />

The aspect of consolidating changes represents a central<br />

aspect of <strong>the</strong> methodology of Release-Engineering.<br />

Changes are to be executed only within <strong>the</strong> scope of predefined<br />

release-intervals. The synergy effect of <strong>the</strong> consolidation<br />

of changes consists of <strong>the</strong> savings on reactive<br />

changes. Reactive changes potentially appear whenever a<br />

component is changed that is “coupled” to o<strong>the</strong>r components.<br />

The approach presented in this paper is focussed on <strong>the</strong><br />

product release planning. The Release-Engineering approach<br />

for product management in general is based on <strong>the</strong><br />

following two hypo<strong>the</strong>ses.<br />

1. Hypo<strong>the</strong>sis: Active regulation of <strong>the</strong> commonality<br />

degree within <strong>the</strong> product programme<br />

Only by actively integrating variant planning into <strong>the</strong><br />

product development process it will be possible to generate<br />

a variant- and innovation triggered economic growth<br />

next to lucrative cost-structures. In case OEMs and suppliers<br />

are not able to consider future variants already within<br />

<strong>the</strong> concept phase, rising complexity cost will ruin <strong>the</strong><br />

profitable efficiency [11]. High degrees of commonality<br />

and notable product innovations are not contradictory. The<br />

duty of conventional program planning is to aim at a<br />

sensible compromise between a mere increase of <strong>the</strong> newproduct-rate<br />

and <strong>the</strong> introduction of new technologies as<br />

opposed to <strong>the</strong> extensive reuse of existing technologies<br />

37<br />

and applications („[...] <strong>the</strong> rapid reuse among multiple<br />

projects of new technology may actually improve <strong>the</strong><br />

overall newness or technological sophistication of a firm’s<br />

product offerings. Therefore, we can hypo<strong>the</strong>size that <strong>the</strong><br />

negative impact on a firm’s market competitiveness<br />

should depend to some extent on <strong>the</strong> average design age of<br />

new products introduced into <strong>the</strong> marketplace” [3]). The<br />

success factor of covering <strong>the</strong> competitive ability of OEMs<br />

and suppliers is a consequent integration of variant planning<br />

into <strong>the</strong> development process, defined for <strong>the</strong> complete<br />

product programme lifecycle [12]. Successful control<br />

of product variety starts at <strong>the</strong> beginning of <strong>the</strong> development<br />

process and ends with <strong>the</strong> withdrawal of <strong>the</strong> product<br />

from <strong>the</strong> market. It requires tools and methods to control<br />

<strong>the</strong> evolution of product and part variants and <strong>the</strong> recognition<br />

and elimination of unnecessary variants from both <strong>the</strong><br />

technical and economical point of view. Professional<br />

complexity management will be assisted by engineering in<br />

releases.<br />

2. Hypo<strong>the</strong>sis: Active planning of intended innovations<br />

Innovation planning has to be focussed on long term<br />

ranges and also has to be implemented uncoupled of market<br />

cyclicity. As a consequence of shifting value-added<br />

share to first tier suppliers, <strong>the</strong> system and component<br />

creation will be one of <strong>the</strong> main triggers for innovation<br />

planning. The classical product development process will<br />

not be obsolete, but <strong>the</strong> creation of innovation grades will<br />

be defined by innovations on component level. Amortisation<br />

of R&D expenditure, calculated for component usage<br />

within different product lines, will be one of <strong>the</strong> valuable<br />

decision points for new innovation cycles.<br />

Focusing Automotive Development on Releases<br />

Automotive OEMs have recognized <strong>the</strong> complexity problem<br />

in <strong>the</strong> early nineties. Complexity increases R&Dcosts<br />

exponentially through exotic status of most of <strong>the</strong><br />

resolving variants and reduces OEMs and supplier profits<br />

[13]. Existing cost calculation systems often do not<br />

support an identification of costs and R&D efforts according<br />

to <strong>the</strong> input involved. Especially <strong>the</strong> phenomenon of<br />

unconscious cross-subsiding of niche variants is problematic.<br />

Management of R&D activities by means of Release-<br />

Engineering means to glance at synergy potential according<br />

to upcoming product innovations. However, for trendsetting<br />

product innovations, it can be strategically sensible<br />

to cross-subsidize new solutions, even if <strong>the</strong>y are overengineered<br />

for <strong>the</strong> actual project.<br />

To address <strong>the</strong> general complexity problem, companies<br />

have two possibilities: <strong>the</strong>y can ei<strong>the</strong>r make <strong>the</strong>ir processes<br />

and systems more efficient in order to handle increased<br />

variant variety throughout <strong>the</strong> whole company or<br />

<strong>the</strong>y can concentrate on developing a product release<br />

strategy that is optimized to meet <strong>the</strong> market requirements<br />

<strong>the</strong>reby avoiding unnecessary variants and R&D efforts.<br />

The first approach seems currently to be most common<br />

among OEMs and suppliers, but is like curing <strong>the</strong> symptoms<br />

instead of killing <strong>the</strong> virus itself. It is really promising<br />

to keep focus on single project complexity management<br />

because it allows for keeping <strong>the</strong> internal product<br />

systems as simple as possible, <strong>the</strong>reby reducing internal<br />

error rates and allowing for more streamlined processes.


Fur<strong>the</strong>rmore, it leads to high shares of commonality on<br />

part usage rates, but impedes to find <strong>the</strong> really big treasures.<br />

The second possibility is focussing on <strong>the</strong> product programme<br />

planning with new innovation triggers, and seems<br />

to be <strong>the</strong> most probable way – according to <strong>the</strong> trend of<br />

rising added value on supplier’s side. The key success<br />

factor of complexity management can be found in <strong>the</strong><br />

product planning phase. To control and manage <strong>the</strong> diversity<br />

of variants means to describe profits as well as R&D<br />

efforts not only for <strong>the</strong> basic project, but ra<strong>the</strong>r for <strong>the</strong><br />

following application projects over <strong>the</strong> product lifecycle.<br />

The careful analysis of all relevant product programme<br />

lifecycle requirements as well as <strong>the</strong> definition of <strong>the</strong><br />

product variants to be offered on <strong>the</strong> market is <strong>the</strong> enabler<br />

for cost-effective product programme development. Only<br />

companies that master aspects of product specific R&D<br />

efforts and realise <strong>the</strong> matching of following application<br />

project requirements will be on <strong>the</strong>ir way out of <strong>the</strong> dilemma<br />

of economies-of-scale in engineering departments.<br />

Requirements have not to be defined only for <strong>the</strong> basic<br />

project but ra<strong>the</strong>r have to be managed for all possible<br />

application projects in <strong>the</strong> future. Release-Engineering as a<br />

methodical principle means balancing <strong>the</strong> complexity<br />

drivers correctly over <strong>the</strong> product programme lifecycle on<br />

Multi-Project Management.<br />

The automotive development process is already well<br />

defined by gateways and milestones – but merely in perspective<br />

of a single project and only on a generic level.<br />

The creation of product variety and <strong>the</strong> timing of change<br />

programs over <strong>the</strong> product lifecycle are usually not implemented<br />

within <strong>the</strong>se schemes. A stronger focus on<br />

change management within <strong>the</strong> context of release requirements<br />

will be a solution to proactively shape <strong>the</strong> future<br />

product variance formation (see Figure 1). Not every change<br />

cycle is absolutely necessary– an optimum ratio of interdependencies<br />

that have to be overcome and innovation<br />

contribution is important.<br />

Quantity<br />

Release 3<br />

Release 2<br />

Release 1<br />

Today gestern Yesterday<br />

Frequency<br />

scale<br />

Exotics Standard<br />

Exotics<br />

Figure 1: Dynamic generation of product variants<br />

Time<br />

Many product adoptions and changes obviously have to be<br />

inserted to cover development faults during <strong>the</strong> development<br />

phase or to shape product innovativeness over <strong>the</strong><br />

product lifecycle. Due to distributed development responsibilities<br />

towards suppliers as well as towards wider product<br />

ranges this isolated approach is no longer feasible.<br />

Impacts of necessary and unnecessary changes as well as<br />

reactive changes have to be implicated in <strong>the</strong> long term.<br />

Automotive innovation frequency – as ano<strong>the</strong>r reason for<br />

38<br />

necessary changes – is determined by a mix of innovation<br />

rates e.g. for engine, body & mechatronics/ electronics<br />

[14]. But innovation cycles are mainly different –<br />

electronic products rarely last longer than 18 months with<br />

performance doubling from generation to generation [15]<br />

where power train cycles could exist several years. Decoupling<br />

in releases is <strong>the</strong> solution to manage <strong>the</strong> dichotomy<br />

between rising R&D effort for product or component<br />

changes and necessary economies of scale of <strong>the</strong> entire<br />

product [16].<br />

Reduction of R&D-complexity through<br />

Release-Engineering<br />

The methodology of Release-Engineering can be utilised<br />

to consequently structure <strong>the</strong> product program towards an<br />

“optimum” fulfilment of customer requirements. The preplanning<br />

of releases on behalf of configuration management<br />

allows a steady realignment of variants demanded by<br />

<strong>the</strong> markets without causing a disproportionate increase in<br />

variance. Within <strong>the</strong> framework of Release-Engineering,<br />

<strong>the</strong> ra<strong>the</strong>r ample “Major Releases” provide useful points in<br />

time to revise <strong>the</strong> significance of actual, current product<br />

variants and replace less relevant ones (see Figure 2). Configuration<br />

management plans releases so that <strong>the</strong> mandatory<br />

adjustment to changed customer requirements takes<br />

place. At <strong>the</strong> same time, <strong>the</strong> commonly observed disproportionate<br />

increase in product variety can be avoided.<br />

X<br />

A<br />

B<br />

Release Intervals<br />

Product<br />

Variance<br />

„Major Release“ „Major Release“<br />

Figure 2: Continuous adjustment of product variance<br />

time<br />

R&D-efforts will be lowered by <strong>the</strong> time-wise bundling of<br />

component changes without affecting <strong>the</strong> diversity necessary<br />

marketwise yet including price sensitive configuration<br />

opportunities. More significant innovation programs<br />

by more dedicated R&D efforts on system variants could<br />

be achieved by governed variant reduction cycles. Disadvantageous<br />

features and according variants can be eliminated<br />

or replaced at each major release cycle.<br />

The Spiral Model of Software Development and its<br />

Implications for Release-Engineering<br />

The spiral model for software development is a model for<br />

cyclic, risk oriented development (see Figure 3). In general,<br />

<strong>the</strong>re are no harmonised hard- and software-cycles in <strong>the</strong><br />

computer industry, nei<strong>the</strong>r by generating nor by voiding of<br />

innovations. An active Release-Engineering <strong>the</strong>reby supports<br />

a continuous improvement of innovativeness over<br />

<strong>the</strong> software lifecycle. In <strong>the</strong> computer industry, software<br />

always has to be adapted to new hardware specifications<br />

or devices. Without a release-bases management, software<br />

developers could not react on new hardware technology or


and update <strong>the</strong> software. The principle development methodology<br />

can be carried forward to automotive mechatronic<br />

development, but here <strong>the</strong> major trigger for new product<br />

adoption are product characteristics or requirements defined<br />

for application or variant projects e.g. when downscaling<br />

product component innovations to lower product<br />

segments. Simultaneously, fix synchronisation points have<br />

to be defined and transferred to suited parts of <strong>the</strong> spiral<br />

process.<br />

Product development<br />

Example: Operating System<br />

Market<br />

Launch<br />

Release 1 Release 2<br />

Definition of<br />

synchronisation points<br />

Market Release 1‘<br />

Launch<br />

Development of application<br />

Example: Office package<br />

Synchronisation point product development<br />

Synchronisation point development of application<br />

Identify targets, alternatives<br />

and restrictions<br />

Planning of<br />

next release<br />

Plan next cycle<br />

Release 1<br />

Assess alternatives,<br />

identify and minimize risks<br />

System specification<br />

Market Launch<br />

Concept for<br />

architecture<br />

Realise and verify<br />

chosen alternatives<br />

Figure 3: Cyclic synchronisation points within <strong>the</strong> product programme<br />

For example if actively regulated chassis components,<br />

originally developed for limousines, have to be adapted for<br />

o<strong>the</strong>r derivatives like station wagons or sports cars on <strong>the</strong><br />

same platform, <strong>the</strong> dimensioning for maximum loading<br />

and deceleration values has to be adjusted.<br />

In industrial practice, it is very common to first develop<br />

<strong>the</strong> basic product instead of generating a whole building<br />

set. After start of production, <strong>the</strong> basic product is gradually<br />

supplemented by additional product features. After<br />

enabling <strong>the</strong> basic type, those applications cause an overproportional<br />

growth of development expenses. Objective<br />

of <strong>the</strong> Release-Engineering methodology is to consider <strong>the</strong><br />

to-be product features within <strong>the</strong> basic product structure<br />

during early phases. The managing complexity methodology<br />

“Variant Mode and Effect Analysis (VMEA)” is<br />

applied to analyze <strong>the</strong> complexity origin and provides a<br />

structured and transparent survey of how variety is emerging<br />

[17]. Availability of information is one of <strong>the</strong> key<br />

requirements for <strong>the</strong> active process of managing releases.<br />

The procedure for release planning can be deducted from<br />

<strong>the</strong> VMEA methodology. The major step forward by<br />

means of Release-Engineering is to consider <strong>the</strong> dynamic<br />

evolution of variants over <strong>the</strong> product lifecycle.<br />

The VMEA uses two interpretations – <strong>the</strong> functional and<br />

<strong>the</strong> structural description of product variants. As can be<br />

seen in Figure 4, <strong>the</strong> functional structure of each variant is<br />

described by related product functions. Thereby it is important<br />

to define necessary product functions and <strong>the</strong>ir<br />

respective attributes, but not to focus too much about <strong>the</strong><br />

later technical implementation. The features can be arranged<br />

according to <strong>the</strong>ir importance or o<strong>the</strong>r criteria,<br />

forming a so-called Feature Tree as shown in Figure 4.<br />

The right end of <strong>the</strong> Feature Tree represents all product<br />

types to be offered on <strong>the</strong> market and should be completed<br />

by sales volumes which <strong>the</strong>n allows for <strong>the</strong> calculation of<br />

attribute usage analysis on all levels and branches of <strong>the</strong><br />

Feature Tree. After finalization, this type list represents<br />

<strong>the</strong> diversity target for <strong>the</strong> product programme to be developed.<br />

39<br />

On <strong>the</strong> o<strong>the</strong>r hand, from a complexity management point<br />

of view <strong>the</strong> main question to be answered in this phase is<br />

how to technically implement <strong>the</strong> required product diversity<br />

most effectively and efficiently. The development of<br />

parts and modules is supported by <strong>the</strong> Variant Tree methodology<br />

(Figure 4). While similar to <strong>the</strong> Feature Tree, this<br />

methodology is used to control <strong>the</strong> internal complexity and<br />

to ensure that products are realized with <strong>the</strong> least variety<br />

possible on <strong>the</strong> parts and module level. The Variant Tree<br />

shows <strong>the</strong> development of diversity along <strong>the</strong> assembly<br />

sequence of any part or module. Parts information of<br />

existing parts (e.g. carry-over parts) can be loaded and<br />

new parts can be entered easily with all relevant information.<br />

In terms of Release-Engineering, <strong>the</strong> most important question<br />

is how <strong>the</strong> mutation of both structures over <strong>the</strong> product<br />

life cycle can be compromised.<br />

Product Structure<br />

E<br />

B B B<br />

B T T T B<br />

Functional Structure<br />

B471<br />

T T T T T T T<br />

10kW<br />

20kW<br />

Product Characteristics<br />

Keilr.<br />

Zahnr.<br />

Wasser<br />

Öl<br />

Wasser<br />

Öl<br />

3.0<br />

3.5<br />

3.0<br />

3.5<br />

3.0<br />

3.5<br />

4.0<br />

4.5<br />

3.0<br />

3.5<br />

4.0<br />

4.5<br />

100C<br />

100C<br />

120C<br />

100C<br />

120C<br />

100C<br />

120C<br />

120C<br />

120C<br />

120C<br />

120C<br />

120C<br />

120C<br />

120C<br />

System<br />

specification<br />

Concept for<br />

architecture<br />

Market Launch<br />

Release 1<br />

Variants<br />

Figure 4: Interdependencies of product functions and product structure<br />

Complexity management by means of Release-<br />

Engineering is deduced form <strong>the</strong> methodical procedure of<br />

product platform definition. In Figure 5 <strong>the</strong> basic steps for<br />

building product releases in terms of Release-Engineering<br />

are described.<br />

1. Step: Product functions required by <strong>the</strong> market and<br />

related characteristics have to be analysed and clustered<br />

according to favoured customer segments. By means of<br />

Release-Engineering <strong>the</strong> according sales volume for each<br />

customer segment has to be forecasted considered achieving<br />

ranking of <strong>the</strong> most important product features. After<br />

analysing market demands <strong>the</strong> customer requirements<br />

have to be translated to real product features.<br />

2. Step: Product features are assigned to modules. The<br />

major challenge is to isolate <strong>the</strong> most volatile product<br />

characteristics – so called complexity drivers – on only<br />

minor modules. Especially volatile product features should<br />

be composed on easily changeable modules. The achievement<br />

of <strong>the</strong> second step is a transparent overview of<br />

“must-change-in-any-case” modules in <strong>the</strong> future, to be<br />

considered in upcoming releases. The focus of <strong>the</strong> classical<br />

complexity managements is on determination of common<br />

and non-common shares. With <strong>the</strong> focus on Release-<br />

Engineering, <strong>the</strong> focus is also on <strong>the</strong> timewise static and<br />

dynamic differentiation of product functions. As mentioned<br />

in <strong>the</strong> previous section, with <strong>the</strong> VMEA methodology<br />

<strong>the</strong> dynamic evolution of variants - due to emerging<br />

demands of feature level - over <strong>the</strong> product lifecycle is <strong>the</strong><br />

most important challenge. Therefore an evaluation matrix<br />

of <strong>the</strong> most dynamic features has to be developed. Based<br />

T1<br />

T2<br />

T3<br />

T4<br />

T5<br />

T6<br />

T7<br />

T8<br />

T9<br />

T10<br />

T11<br />

T12<br />

T13<br />

T14


on such a dynamic feature, a ranking of release cycle<br />

predictions and matters has to be made.<br />

3. Step: Analysis of emerging module interfaces. The main<br />

challenge is to generate a modular product structure, so<br />

that <strong>the</strong> product features influencing complexity most are<br />

isolated preferably on only a few modules. Main target is<br />

to create as few as possible module interfaces.<br />

4. Step: Analysis and optimisation of commonality on part<br />

level. As mentioned before, high degrees of commonality<br />

could be achieved, when <strong>the</strong> product development is based<br />

on common design rules. The optimisation <strong>the</strong>reby may<br />

not only focus on common parts; in order to improve R&D<br />

effectiveness it is also possible to implicate parametric<br />

design procedures. Main target is to use <strong>the</strong> related R&D<br />

efforts for optimisation of ideal commonality. Likewise<br />

mentioned in <strong>the</strong> second step, it will be necessary to comprehend<br />

and to manage <strong>the</strong> degree of commonality on part<br />

level as an active control element for <strong>the</strong> Release-<br />

Engineering approach. As seen in Figure 2, a continuous<br />

adjustment of product variance will be possible at major<br />

release steps. This major step results in certain decision to<br />

reduce complexity on part level and to introduce a new<br />

design layout within <strong>the</strong> next substantial release.<br />

5. Step: Analysis and optimisation of part commonality by<br />

using variant flexible production facilities. Production<br />

facilities are most suitable when highly variant as well as<br />

change over flexibility is provided.<br />

Markets<br />

Applications 1<br />

• Basic requirements<br />

• Specific customer<br />

and project<br />

6<br />

requirements<br />

Price Quality<br />

2<br />

Technical<br />

Functions<br />

(concept<br />

unspecific<br />

Project unspecific<br />

Project specific<br />

Implementation<br />

3<br />

Modules<br />

Modules<br />

Figure 5: Methodical procedure of release building<br />

Evaluation of dynamics<br />

x<br />

x<br />

x<br />

Product-<br />

4 programme<br />

Communalities<br />

Project x<br />

Project 2<br />

Project 1<br />

6. Step: Analysis of ideal clustering of price valuable<br />

features, especially when those features are highly instable<br />

over <strong>the</strong> product lifecycle. Ambition of an ideal clustering<br />

is to meet customer’s preferences with <strong>the</strong> offered product<br />

features and contemporaneously to isolate instable product<br />

features for minimised internal product complexity.<br />

The last three steps, <strong>the</strong> optimisation procedure for achieving<br />

high degrees of commonality on part and production<br />

level as well as defining most differential functions in <strong>the</strong><br />

product structure could only be done in an iterative procedure.<br />

The challenge on <strong>the</strong> one hand is to define low internal<br />

product complexity on a static level and on <strong>the</strong> o<strong>the</strong>r<br />

hand to optimise <strong>the</strong> commonality degree on product<br />

feature level over <strong>the</strong> product programme lifecycle.<br />

Concluding reflection<br />

Release-Engineering reduces R&D complexity and increases<br />

<strong>the</strong> competitiveness of OEMs and <strong>the</strong>ir suppliers<br />

by adopting this development principle from software<br />

engineering and introducing it to <strong>the</strong> field of mechatronics<br />

Processes<br />

5<br />

40<br />

engineering. R&D efforts can be reduced over <strong>the</strong> entire<br />

product programme life cycle. Ano<strong>the</strong>r effect of Release-<br />

Engineering is <strong>the</strong> well-directed control of a product’s<br />

perceived innovation level in <strong>the</strong> market place. The process<br />

of building Release-units needs to be integrated with<br />

o<strong>the</strong>r processes of structuring a product such as modularisation.<br />

Only if <strong>the</strong>se approaches will intertwine to a large<br />

extent, cost-effective R&D procedures and a refinancing<br />

of R&D expenditure is enabled.<br />

The process of complexity management by managing<br />

product programme variety on component level has not<br />

received much research attention yet. In order to fully<br />

utilise <strong>the</strong> benefits of Release-Engineering, principles of<br />

calculation and optimisation of possible product structure<br />

scenarios have to be aligned with presented programme<br />

planning by means of Release-Engineering. Along with<br />

this, <strong>the</strong> impact of <strong>the</strong> controlling within <strong>the</strong> supply chain<br />

by means of degrees of product maturity for different<br />

release stages needs to be examined.<br />

1. References<br />

1 Schuh, G.: Complexity-Management Study 2004. <strong>Laboratory</strong><br />

for Machine Tools and Production Engineering (WZL)<br />

and GPS Schuh & Co. GmbH, Aachen, 2004<br />

2 Clark, K. B.; Fujimoto, T.: Product Development Performance<br />

– Strategy, Organization and Management in <strong>the</strong> World<br />

Auto Industry. Boston, Mass., Harvard Business School<br />

Press, 1991<br />

3 Nobeoka, K.; Cusumano, M.: Multi-Project Strategy and<br />

Market-Share Growth: The Benefits of Rapid Design Transfer<br />

in New Product Development. MIT Sloan School of<br />

Management Working Paper, WP #3686-94/BPS, 1994<br />

4 Womack, J.; Jones, D.; Roos, D.: The Machine that Changed<br />

<strong>the</strong> World. Rawson Associates, New York 1990<br />

5 Cusumano, M. A.: Japan’s Software Factories: A Challenge to U.S.<br />

Management. Oxford University Press, New York 1991<br />

6 von Braun, C. F.: The Acceleration Trap in <strong>the</strong> Real World. In: Sloan<br />

Management Review, summer 1991, pp.43-52<br />

7 Crawford, C. M.: The Hidden Coasts of Accelerated Product<br />

Development. In: Journal of Product Innovation Management,<br />

9, 1992, pp. 188-199<br />

8 Schuh, G.; Schwenk, U.: Produktkomplexität managen – Strategien,<br />

Methoden, Tools. Hanser, Munich 2001<br />

9 Cusumano, M.; Selby, R.: Microsoft Secrets. The Free Press, a division<br />

of Simon & Schuster, New York 1995<br />

10 Freeman, E.: Building Gargantuan Software, American Scientific,<br />

Winter 1999, pp.28-31<br />

11 Richter, G.: Schnelle Autos schnell entwickeln. Automobil-<br />

Entwicklung, 2000, Nr. 11, S. 45-48<br />

12 Riedel, H.: Mass Customization - Kundenbedürfnisse und<br />

Skaleneffekte verbinden. Vortrag bei der 3. Aachener Tagung<br />

Komplexitätsmanagement, Vaals - Niederlande, 2002<br />

13 Anderson, D. M.: Agile Product Development for Mass<br />

Customization, McGraw-Hill, New York, 1998<br />

14 Fine, C.: Clockspeed – Winning Industry Control in <strong>the</strong> Age<br />

of Temporary Advantage, Perseus Books, Reading, MA,<br />

1998<br />

15 Kipferler, A.; Monti, R.: How Electronics will Revolutionize<br />

Innovation in Autos, The Boston Consulting Group, Stuttgart,<br />

Milan, 2000<br />

16 Eversheim, W.; Schuh, G.: Standard, individualisiert – individuell,<br />

in: Reinhard, G., Zäh, M. F. (editor), Marktchance<br />

Individualisierung, Springer, Berlin, pp. 55-63., 2003<br />

17 www.gps-mbh.de: GPS Schuh Komplexitätsmanagement,<br />

September 2004


Costing Issues Regarding Product Variant Design<br />

P. Baguley 1 , D. Schaefer 1 , and Tom Page 2<br />

1 Design and Manufacturing Research Group, School of Engineering<br />

University of Durham, 2 Department of Design and Technology, Loughborough University<br />

Abstract<br />

Competition for most companies means <strong>the</strong>re is a need to offer <strong>the</strong>ir products in a number of different<br />

variants to <strong>the</strong>ir customers. Tools such as computer-aided product configuration systems to automatically<br />

compose existing components to new variants of a specific product are widely used today. However, in<br />

contemporary CAE tools <strong>the</strong>re is a lack of intelligent mechanisms to consider such aspects, especially in<br />

relation to interaction between <strong>ECAD</strong> and MCAD affects. This paper proposes <strong>the</strong> use of type-2 fuzzy<br />

logic to circumvent such problems in capturing <strong>the</strong> cost of interactions using Integrated Product Teams.<br />

Keywords:<br />

Costing, optimisation, type-2 fuzzy logic, automation, product configuration<br />

1 INTRODUCTION<br />

<strong>ECAD</strong> (Electrical Computer Aided Design) is an<br />

application of design of electrical equipment. The design<br />

of electrical equipment impacts mechanical design of<br />

associated components, such as control/switch cabinets,<br />

etc. The scope of applications of <strong>the</strong> interaction between<br />

<strong>ECAD</strong> and MCAD (Mechanical Computer Aided Design)<br />

is huge, notably factory design and <strong>the</strong> design of systems<br />

that manufacture products being on <strong>the</strong> large scale side,<br />

while switch cabinets etc. are on <strong>the</strong> small scale side.<br />

An important issue is <strong>the</strong> integration of <strong>ECAD</strong> and MCAD<br />

systems within an overall engineering environment.<br />

Usually, <strong>the</strong> electrical and mechanical parts of<br />

electromechanical components are designed individually<br />

with separate systems. There is no bidirectional<br />

modelling incorporating updates on each side. Today,<br />

existing multi- or interdisciplinary constraints between<br />

electrical and mechanical design parts cannot be<br />

modelled properly. Hence, <strong>the</strong>re is no bidirectional<br />

constraint propagation etc. The clear complexity of this<br />

interaction impacts <strong>the</strong> complexity of cost models at all<br />

stages of <strong>the</strong> life cycle.<br />

Product configuration and configuration based modelling<br />

is a widespread means for <strong>the</strong> development of product<br />

variants in MCAD. Recently, this methodology has been<br />

applied to <strong>ECAD</strong> as well. In <strong>ECAD</strong>, configuration objects<br />

are for instance schematics and diagrams representing<br />

particular functional units of an electrical installation.<br />

Plans and diagrams refer to parts that may appear on a<br />

Bill Of Materials (BOM). Cost knowledge is required for<br />

entire installations and all <strong>the</strong> components <strong>the</strong> installation<br />

is made of, such as assemblies, sub-assemblies, and so<br />

on. No previous work has dealt with cost models for <strong>the</strong><br />

<strong>ECAD</strong> and MCAD interaction but previous cost models<br />

have appeared separately for <strong>ECAD</strong> and MCAD ([1]). An<br />

encompassing cost model including both <strong>ECAD</strong> and<br />

MCAD, i.e. an overall systems model, might give<br />

management more opportunities for optimisation and is a<br />

growing concern in <strong>the</strong> design of complex systems.<br />

41<br />

Therefore it is important for <strong>ECAD</strong> to have an indicator<br />

that communicates <strong>the</strong> cost of decisions from MCAD and<br />

vice versa. Because no previous models have been<br />

made in this way, <strong>the</strong>re is also no previous data<br />

supporting <strong>the</strong>se types of models. Fuzzy logic is a<br />

method which can model quantities using no data, but<br />

experts. Fuzzy logic can be categorised into Type-1 and<br />

Type-2 fuzzy logic. Type-1 fuzzy logic includes precise<br />

degrees of membership to a set, whereas type-2 fuzzy<br />

logic includes degrees of membership to a set that are<br />

type-1 fuzzy sets <strong>the</strong>mselves. There are very few<br />

applications of Type-2 fuzzy logic, despite some clear<br />

advantages in modelling accuracy and robustness found<br />

by [2]. Type-2 fuzzy logic can be clearly distinguished by<br />

its efficacy in a team environment. An application of<br />

<strong>ECAD</strong> and type-2 fuzzy logic can be integrated<br />

electronically via spreadsheet or MATLAB files using a<br />

Product Data Management (PDM) system with <strong>the</strong><br />

Computer Aided Design system.<br />

2 EXAMPLE PROBLEM<br />

A company wants to develop an elevator that can carry<br />

10 persons. The elevator has electrical parts as well as<br />

mechanical parts and <strong>the</strong>re exist a lot of constraints<br />

between <strong>the</strong>m. However, division A of <strong>the</strong> company<br />

develops <strong>the</strong> mechanical parts with an MCAD system<br />

and division B develops <strong>the</strong> electrical ones with an <strong>ECAD</strong><br />

system. There is no integration of both systems.<br />

Therefore, <strong>the</strong> corresponding engineers talk to each<br />

o<strong>the</strong>r in a conventional sense and <strong>the</strong>n continue working<br />

with <strong>the</strong>ir CAD systems. There is no interdisciplinary<br />

concurrent engineering at all, nei<strong>the</strong>r in respect to <strong>the</strong><br />

general engineering nor to costing aspects relevant to<br />

management, controlling and o<strong>the</strong>r decisions of <strong>the</strong><br />

company.<br />

Some months later, <strong>the</strong> same company is asked to<br />

develop two variants of <strong>the</strong>ir elevators, one for carrying a<br />

maximum of 5 persons, one for a maximum of 25<br />

persons. The problem is to develop <strong>the</strong> two variants<br />

based on existing drawings, plans, etc., and to calculate<br />

costs.


3 COST MODELLING TYPES<br />

There are a few main types of cost models that are<br />

associated with particular stages of <strong>the</strong> product<br />

development cycle. The 2 main examples of this are:<br />

• Grass roots cost models, and<br />

• Parametric cost models ([3]).<br />

Grass roots cost models break down a product into a<br />

very detailed Bill Of Materials (BOM) and associated<br />

detailed activities. Grass roots cost modelling suffers<br />

from resource intensive data collection that can only<br />

occur late in <strong>the</strong> design stage when <strong>the</strong> detail required is<br />

available. In addition, if <strong>the</strong> detail is available, <strong>the</strong> large<br />

amount of summations involved of <strong>the</strong> small details can<br />

become a significant error in cost. Parametric cost<br />

models are those most significant to this research.<br />

Parametric cost models relate product specifications to<br />

cost. These product specifications can be geometric or<br />

functional or o<strong>the</strong>r, and typically occur early in <strong>the</strong> design,<br />

for example concept or aggregate (as defined by [4]).<br />

Parametric cost models produce relationships between<br />

<strong>the</strong> individual costs of previous variants for which cost<br />

estimates exist, and <strong>the</strong>ir specifications, identified as<br />

“cost drivers”. Such relationships are termed Cost<br />

Estimating Relationships (CERs) and are typically<br />

produced using regression analysis.<br />

4 DATA SOURCES<br />

A key part of cost modelling is in identifying and<br />

collecting relevant data from data sources, <strong>the</strong> part that is<br />

<strong>the</strong> key constraint in subsequent cost modelling tasks.<br />

The lack of data informing designers of <strong>the</strong> bidirectional<br />

impact of MCAD with <strong>ECAD</strong> means cost modelling<br />

methods that can operate with no data are essential.<br />

Fuzzy logic is one such method that can use expert<br />

opinion and intuition to form models. Fuzzy logic that can<br />

be used by an Integrated Product Team (IPT), i.e one<br />

that can lever expertise in both <strong>ECAD</strong> and MCAD, is<br />

Type-2 fuzzy logic.<br />

5 SOLUTION TO THE PROBLEM<br />

The proposed solution to <strong>the</strong> problem is to capture <strong>the</strong><br />

interaction between <strong>ECAD</strong> and MCAD using expert rules.<br />

Such expert rules can be based on <strong>the</strong> dependencies<br />

between design entities, a requirement of parametric<br />

modelling in electrical design identified by [5]. With <strong>the</strong><br />

growing standardisation of parametric parts in both<br />

<strong>ECAD</strong> and MCAD (known as <strong>the</strong> “box of bricks” in<br />

MCAD) a more general set of expert rules can be<br />

foreseen applied to <strong>the</strong> general problem of <strong>the</strong> interaction<br />

between standard parts. For our elevator problem a<br />

sample of <strong>the</strong> set of rules could be:<br />

If “Number of People” is “Large” <strong>the</strong>n “Motor” is “Medium”<br />

If “Motor” is “Medium” <strong>the</strong>n “Motor Cost” is “Small”<br />

If “Motor” is “Medium” <strong>the</strong>n “Cable Strength” is “High”<br />

If “Cable Strength” is “High” <strong>the</strong>n “Cable Cost” is “Very<br />

High”<br />

The interactions are captured as expert knowledge in a<br />

series of structured look up tables. It is envisaged in <strong>the</strong><br />

future, when <strong>the</strong> method will be a mature one, that such<br />

tables can be supplied by <strong>the</strong> manufacturers of electrical<br />

equipment. Hence <strong>the</strong> knowledge becomes a marketable<br />

product. This ultimate knowledge capture mechanism<br />

within fuzzy logic can be termed that of a grammar ([6]).<br />

6 FUZZY SETS<br />

A central issue surrounding fuzzy logic is that of fuzzy<br />

sets. In conventional Boolean thinking elements can<br />

belong to a set (represented by <strong>the</strong> value 1), or not<br />

belong to <strong>the</strong> set (represented by 0). The boundary is<br />

very well defined. Fuzzy sets are different in that<br />

elements can partially belong to a set to a degree<br />

between 0 and 1. Hence a person can belong to <strong>the</strong> set<br />

of tall people (to a degree 0.3) and also to <strong>the</strong> set of short<br />

people (to a degree 0.3). It is noticed that <strong>the</strong> degrees of<br />

membership to <strong>the</strong> sets of tall people and short people do<br />

not necessarily add up to 1. The concepts of tall and<br />

short are fuzzy. Fuzzy sets were developed by Zadeh<br />

([7]) because humans do not think in a Boolean sense,<br />

so that <strong>the</strong>re is not a well defined barrier between being<br />

short and being tall, and in fact any calculations based on<br />

a well defined barrier should come under question. Two<br />

fuzzy sets are shown in Figure 1, where it is noticed that<br />

a person is only thought of as certainly tall (degree of<br />

membership 1 to <strong>the</strong> fuzzy set, tall) if <strong>the</strong>y are 6 foot and<br />

over. Of course this is subjective and might be moved<br />

higher or lower, or o<strong>the</strong>r.<br />

Figure 1: Type-1 fuzzy sets<br />

7 TYPE-2 FUZZY LOGIC<br />

Type-2 fuzzy logic takes <strong>the</strong> concept of fuzzy sets fur<strong>the</strong>r<br />

by recognising that degrees of membership to a fuzzy set<br />

are also precisely defined. Mendel ([2]) and John ([8])<br />

describe how uncertainty is not fully captured by precise<br />

degrees of membership since precision implies a form of<br />

certainty. Hence type-2 fuzzy logic should be considered<br />

as a system when <strong>the</strong> degrees of membership to a set<br />

are fuzzy sets <strong>the</strong>mselves. In addition, when utilising<br />

type-2 fuzzy logic, <strong>the</strong>re is <strong>the</strong> process of type reduction<br />

to reduce type-2 fuzzy sets to type-1 fuzzy sets after<br />

performing inferencing. (This is an algorithmic concern<br />

but also has connotations for <strong>the</strong> interpretation of<br />

uncertainty). Subsequently it is possible to defuzzify <strong>the</strong><br />

type-1 (reduced type-2) fuzzy set. John ([8]), provides a<br />

formal definition from Karnik and Mendel ([9]), "a type-2<br />

fuzzy set is characterised by a fuzzy membership<br />

function, i.e. <strong>the</strong> membership value (or membership<br />

grade) for each element of this set is a fuzzy set in [0,1],<br />

unlike a type-1 fuzzy set where <strong>the</strong> membership grade is<br />

a crisp number in [0,1]".<br />

8 SEQUENCE OF STEPS IN PRODUCING TYPE-2<br />

FUZZY LOGIC MODELS<br />

The sequence of steps in producing type-2 fuzzy logic<br />

models can be summarised (as shown in Figure 2):<br />

1. identify <strong>the</strong> “concepts” to be used in <strong>the</strong> model<br />

2. Identify expert rules<br />

3. Produce type-2 fuzzy sets for <strong>the</strong> concepts in <strong>the</strong><br />

expert rules using knowledge acquisition methods,<br />

or newly developed automatic methods ([10])<br />

42


4. Identify fuzzy logic operators by consensus from <strong>the</strong><br />

existing literature, or by using a decision making<br />

methodology. A decision making methodology was<br />

developed by Baguley and Stockton (2002) within<br />

<strong>the</strong> EPSRC Grant Reference: GR/M58818/01, "IMI:<br />

IMPROVING THE COST MODEL DEVELOPMENT<br />

PROCESS (COSTMOD)", for <strong>the</strong> choice of type-1<br />

fuzzy logic structural elements.<br />

5. Refine choices in (1), (2), and (3) through a learning<br />

mechanism.<br />

Figure 2: Sequence of steps in using fuzzy logic<br />

9 IDENTIFY CONCEPTS IN THE MODEL<br />

Concepts in <strong>the</strong> model include <strong>the</strong> nouns and adjectives<br />

of <strong>the</strong> problem. For example <strong>the</strong> nouns, “motor”, “lift”,<br />

“time”, “labour”, “cost”; and <strong>the</strong> adjectives “low”,<br />

“medium”, “high”, and “very”. Brain storming methods are<br />

typical for identification, for example <strong>the</strong> use of<br />

relationship diagrams, as shown in Figure 3, allows <strong>the</strong><br />

picturing of concepts and <strong>the</strong> relationships between <strong>the</strong>m<br />

using arrows. The formation of rules is made easier using<br />

such diagrams, i.e. <strong>the</strong> identification of relationships<br />

using <strong>the</strong> arrows.<br />

Number of People<br />

Lift Weight<br />

Depends on<br />

Lift Size<br />

Motor Power<br />

Concept<br />

Relationship<br />

Figure 3: Relationship diagram to identify concepts for a<br />

fuzzy logic model<br />

10 IDENTIFY EXPERT RULES<br />

The format of expert rules (if <strong>the</strong>n rules) is familiar to<br />

many. For example if “size” of “lift” is “medium” <strong>the</strong>n<br />

“motor” “power” is “low”. Of importance is whe<strong>the</strong>r <strong>the</strong><br />

rule base is to be a “complete” rule base or an informal<br />

and ad-hoc collection of rules <strong>the</strong> expert uses whilst<br />

informally performing trade-offs between cost and<br />

changes in MCAD and <strong>ECAD</strong> designs. A complete rule<br />

base involves every single combination of variables.<br />

Complete rule bases consume more resources to build,<br />

and when <strong>the</strong>re are lots of rules, are difficult to form<br />

effectively.<br />

43<br />

11 PRODUCE TYPE-2 FUZZY SETS<br />

Firstly <strong>the</strong> range of <strong>the</strong> variables (also known as <strong>the</strong><br />

Universe of Discourse) with which to cover with fuzzy<br />

sets, must be identified. Subsequently <strong>the</strong> following<br />

decisions are required:<br />

1. shape of <strong>the</strong> fuzzy sets (do not all have to be <strong>the</strong><br />

same, for example a mixture of triangular and<br />

trapezoidal shapes)<br />

2. parameters of <strong>the</strong> shape of <strong>the</strong> fuzzy sets (for<br />

example <strong>the</strong> width and centre point of a triangular<br />

fuzzy set)<br />

3. overlap between fuzzy sets (for example how much<br />

fuzzy set widths coincide on <strong>the</strong> range of <strong>the</strong><br />

individual variables)<br />

4. “blurring” of <strong>the</strong> fuzzy sets, i.e. making <strong>the</strong> type-1<br />

fuzzy sets into type-2 fuzzy sets (as shown in Figure<br />

4), (for example each precise degrees of<br />

membership to a fuzzy set are made into a type-1<br />

fuzzy set)<br />

This sequence of tasks, here, is not a unique one. The<br />

decision can be a difficult one, but is aided by <strong>the</strong> robust<br />

properties of fuzzy logic, i.e. errors in detail of <strong>the</strong> shapes<br />

of <strong>the</strong> fuzzy sets can be accommodated by <strong>the</strong> model in<br />

that accuracy is not greatly reduced. In addition, <strong>the</strong>re is<br />

<strong>the</strong> potential extra robust properties of type-2 fuzzy sets.<br />

Degrees of membership to a fuzzy set and <strong>the</strong> ideas of<br />

set <strong>the</strong>ory are essential, but work has been done in which<br />

such knowledge is shielded from experts by indirect<br />

questions provided in a written questionnaire ([11]).<br />

Therefore only <strong>the</strong>ir domain knowledge is required.<br />

Figure 4: Type-2 fuzzy set<br />

12 FUZZY LOGIC OPERATORS<br />

The fuzzy logic operators are ma<strong>the</strong>matical operators or<br />

rules for combining fuzzy sets for inferencing and<br />

particularly involve:<br />

(1) connectives in rules, e.g. <strong>the</strong> “AND” operator<br />

(2) implication operator for using rules<br />

(3) aggregation operator for combining <strong>the</strong> results of<br />

rules<br />

13 TYPE-REDUCTION<br />

Type reduction involves <strong>the</strong> conversion of <strong>the</strong> type-2<br />

fuzzy set produced after inferencing into a type-1 fuzzy<br />

set.<br />

14 DEFUZZIFICATION<br />

Defuzzification converts a fuzzy set into a single value.<br />

This step is most appropriate for control system<br />

applications.


15 REQUIREMENTS FOR A KNOWLEDGE<br />

ACQUISITION METHOD FOR TYPE-2 FUZZY<br />

LOGIC AND <strong>ECAD</strong><br />

An essential step in using fuzzy logic as proposed in this<br />

research is <strong>the</strong> knowledge acquisition phase. Experts'<br />

domain knowledge is mapped into fuzzy logic structural<br />

elements. Some of <strong>the</strong> requirements of a knowledge<br />

acquisition method are shown below.<br />

1. To capture <strong>the</strong> terminology of <strong>ECAD</strong> and MCAD<br />

engineers<br />

2. To consistently capture <strong>the</strong> parameters of type-2<br />

fuzzy sets using (1)<br />

3. To hide fuzzy logic knowledge from <strong>ECAD</strong> and<br />

MCAD experts<br />

16 DIGITAL ENTERPRISE TECHNOLOGY (DET)<br />

ARCHITECTURE FOR THE USE OF TYPE-2 FUZZY<br />

LOGIC AND <strong>ECAD</strong>.<br />

Due to <strong>the</strong> lack of research and practice into type-2 fuzzy<br />

sets, <strong>the</strong>re are no commercial software packages<br />

available to perform type-2 operations. Mendel ([2]) at <strong>the</strong><br />

University of California has produced “m-files” that can<br />

perform some type-2 operations, for <strong>the</strong> MATLAB fuzzy<br />

logic toolbox. The MATLAB fuzzy logic toolbox is a well<br />

known software package for performing type-1 fuzzy logic<br />

operations. The essential aspect of MATLAB is its<br />

intuitive Graphical User Interface. The GUI promotes <strong>the</strong><br />

modelling of expert intuition. Digital Enterprise<br />

Technology (DET) is defined as: "<strong>the</strong> collection of<br />

systems and methods for <strong>the</strong> digital modelling of <strong>the</strong><br />

global product development and realisation process in<br />

<strong>the</strong> context of life cycle management". A fuzzy logic<br />

model can depart from an integrated systems<br />

architecture, by standing outside of any collection of<br />

software components, and to be used by an expert to<br />

express his opinion (Figure 5). The expert may use<br />

existing DET components within a DET architecture to<br />

formulate this opinion, but need not connect MATLAB to<br />

any data sources, as would be <strong>the</strong> case in processing<br />

numerical data.<br />

Distributed and Collaborative<br />

Product Design<br />

Distributed and Collaborative<br />

Process Design & Planning<br />

Equipment and Plant Layout<br />

Design & Modelling<br />

Physical-to-Digital Environment<br />

Integrators<br />

Technologies for Enterprise<br />

Integration & Logistics<br />

Figure 5: Observer using a DET architecture to formulate<br />

opinion<br />

17 HOW TO USE THE TYPE-2 FUZZY LOGIC MODEL<br />

1. Crisp values (non-fuzzy, i.e. ordinary numbers) for<br />

<strong>the</strong> input values are put into <strong>the</strong> model,<br />

2. Because each value corresponds to a degree of<br />

membership to a type-2 fuzzy set, which is a type-1<br />

fuzzy set, <strong>the</strong> input value corresponds to this type-1<br />

fuzzy set,<br />

3. This type-1 fuzzy set is combined with similar type-1<br />

fuzzy sets produced for <strong>the</strong> o<strong>the</strong>r input variables,<br />

P<br />

D<br />

M<br />

from <strong>the</strong>ir respective input values, as indicated by<br />

each rule in turn,<br />

4. The resulting type-1 fuzzy set from <strong>the</strong> several<br />

combinations of input values, is combined with <strong>the</strong><br />

type-2 fuzzy set corresponding to <strong>the</strong> output variable<br />

for each rule in turn,<br />

5. All <strong>the</strong>se resulting type-2 fuzzy sets from each rule<br />

are aggregated toge<strong>the</strong>r to form one overall type-2<br />

fuzzy set,<br />

6. this type-2 fuzzy set undergoes a type-reduction<br />

operation to form a type-1 fuzzy set,<br />

7. this final type-1 fuzzy set is defuzzified.<br />

The structure of a type-2 Fuzzy Logic System is shown in<br />

Figure 6, It is clearly seen that <strong>the</strong>re is a separate typereduction<br />

stage, this is needed to defuzzify type-2 fuzzy<br />

sets.<br />

Figure 6: Type-2 fuzzy inference system<br />

18 CONCLUSION<br />

There is a gap in provision for modelling <strong>the</strong> design of<br />

electrical and mechanical components when <strong>the</strong>y affect<br />

each o<strong>the</strong>r. The interaction of electrical and mechanical<br />

components, for example when predicting costs, is<br />

captured using expert rules and quantified using type-2<br />

fuzzy logic. Type-2 fuzzy logic is used because of <strong>the</strong><br />

exceptional level of uncertainty within an Integrated<br />

Product Team. This uncertainty is especially prevalent<br />

because of <strong>the</strong> diversity of <strong>the</strong> 2 interacting areas of<br />

<strong>ECAD</strong> and MCAD.<br />

19 REFERENCES<br />

[1] Aguirre, E., and Raucent, B. (1994), Economic<br />

Comparison of Wire Harness Assembly <strong>Systems</strong>,<br />

Journal of Manufacturing <strong>Systems</strong>, Vol 13 No. 4.,<br />

pp. 276-288.<br />

[2] Mendel, J. (2001), Uncertain Rule-based Fuzzy<br />

Logic <strong>Systems</strong>, Prentice Hall, ISBN 0-13-040969-3.<br />

[3] Rush, C. and Roy, R. (2001), Expert Judgement in<br />

Cost Estimating: Modelling <strong>the</strong> Reasoning Process,<br />

Concurrent Engineering: Research and<br />

Applications, Vol. 9, No. 4., pp. 271-284.<br />

[4] Maropoulos et al (1998), CAPABLE: an Aggregate<br />

Process Planning System for Integrated Product<br />

Development, Journal of Materials Processing<br />

Technology 76, pp.16-22.<br />

[5] Schaefer, D., Eck, O., and Roller, D., A Shared<br />

Knowledge Base for Interdisciplinary Parametric<br />

Product Data Models in CAD, In: Lindemann, U.,<br />

Birkhofer, H., Meerkamm, H., Vajna, S. (Eds.):<br />

Proceedings of <strong>the</strong> 12th International Conference<br />

on Engineering Design: ICED ’99, Volume 3.<br />

Garching: Technische Universität Muenchen, 1999.<br />

- Munich, Germany, August 24-26, 1999. - ISBN 3-<br />

922979-53-X, pp. 1593-1598.<br />

[6] Hsiao, S., and Chen, C. (1997), A Semantic and<br />

Shape Grammar Based Approach for Product<br />

Design, Design Studies 18, pp. 275-296.<br />

[7] Zadeh, L.A. (1965), Fuzzy Sets, Information and<br />

Control, 8, pp. 338-353.<br />

44


[8] John, R.I. (2002), Embedded Interval Valued Fuzzy<br />

Sets, Proceedings of <strong>the</strong> Fuzz-IEEE 2002, pp.<br />

1316-1321.<br />

[9] Karnik, N.N., and Mendel, J. (1998), An Introduction<br />

to Type-2 Fuzzy Logic <strong>Systems</strong>, Technical Report,<br />

University of Sou<strong>the</strong>rn California, 1998.<br />

[10] John, R.I., and Czarnicki, C. (1999), An Adaptive<br />

Type-2 Fuzzy System for Learning Linguistic<br />

Membership Grades, IEEE International Fuzzy<br />

<strong>Systems</strong> Conference Proceedings, August 22-25,<br />

1999, Seoul, Korea.<br />

[11] Arnold, F., Moody, N., Reiter, W.F., Maunder, C.,<br />

Rogers, B., Baguley, P., Chapman, P., Lomas, C.,<br />

Zhang, D., and Maropoulos, P. (2004), An Extended<br />

Virtual Enterprise SMARTEAM Engineering Project,<br />

2 nd International Seminar on Digital Enterprise<br />

Technology, Seattle, Washington, USA, September<br />

13-15 th 2004.<br />

45


A New Method for Variant Design Technology in <strong>ECAD</strong><br />

D. Schaefer<br />

School of Engineering, University of Durham, UK<br />

Abstract<br />

One of <strong>the</strong> most important approaches to enable cost and time reduction with respect to Computer-Aided<br />

Design for electrical/electromechanical engineering (<strong>ECAD</strong>/ECAE) is to develop, generate, and handle design<br />

variants in an efficient manner. The objective of this paper is to present a generic variant design technology<br />

approach that has a high potential for <strong>the</strong> efficient reusability of existing projects. More precisely, <strong>the</strong> paper<br />

will present <strong>the</strong> procedure to allow <strong>the</strong> new methodology in variant design technology to be implemented<br />

within an arbitrary <strong>ECAD</strong> environment. The method presented automatically generates a complete technical<br />

documentation of an electrical installation on <strong>the</strong> basis of a placed order specification. This involves three<br />

major steps. Firstly, a product variant of an installation is configured on <strong>the</strong> basis of existing standardised<br />

modules. Secondly, based upon <strong>the</strong> corresponding configuration file, a set of commands describing <strong>the</strong><br />

generation of a typical <strong>ECAD</strong> project containing <strong>the</strong> configured modules is automatically compiled. This is a<br />

key novelty, as all commands are expressed in a non-system specific meta-language, which can <strong>the</strong>n be<br />

automatically translated into a macro programming language of a specific <strong>ECAD</strong> system and stored as a file.<br />

Thirdly, <strong>the</strong> specific <strong>ECAD</strong> system can import and process <strong>the</strong> file to create a practical <strong>ECAD</strong> project of<br />

realistic complexity.<br />

Keywords:<br />

Variant Design, <strong>ECAD</strong>/ECAE, Process Automation, Product Configuration<br />

1 INTRODUCTION<br />

In order to remain competitive in <strong>the</strong> market, most<br />

companies offer <strong>the</strong>ir products in a range of different<br />

variants. However, new variants of existing products are<br />

more and more often composed of existing basic<br />

components ra<strong>the</strong>r than newly designed. A precondition to<br />

allow for this is to have modular product structures. An<br />

industrial branch where this is common practice is plant<br />

engineering and construction. The majority of companies<br />

developing electrical/electromechanical installations tend<br />

to reuse <strong>the</strong>ir existing designs, plans and project<br />

documentations to develop additional customer specific<br />

variants.<br />

Unfortunately, this process is predominantly performed<br />

manually, which is far from being efficient and effective.<br />

Due to <strong>the</strong> permanently increasing pressure of competition<br />

it is vital to develop automatisms that facilitate <strong>the</strong><br />

generation of product variants.<br />

The basic idea behind <strong>the</strong> variant design approach<br />

presented in this paper is simply to automate <strong>the</strong> workflow<br />

process of creating <strong>ECAD</strong> variants as it is manually<br />

performed by most companies today. The approach is<br />

closely related to industrial best practice and derived from<br />

day-to-day operations.<br />

1.1 The basic concept as applied in practice<br />

Many companies approach <strong>the</strong>ir potential customers by<br />

technical field sales and distribution staff. These sales<br />

persons usually have selling catalogues on <strong>the</strong>ir disposal,<br />

which allow customers to assemble bespoke product<br />

variants based on basic modules or components that can<br />

be combined. Hereby, <strong>the</strong> number of components that can<br />

46<br />

be chosen from (at this stage of <strong>the</strong> sales process) tends<br />

to be relatively small.<br />

Once a rough pre-configuration is finished, design<br />

engineers and o<strong>the</strong>r office employees get toge<strong>the</strong>r to<br />

determine a resultant technical fine configuration. This fine<br />

configuration comprises all parts and components<br />

necessary to make up <strong>the</strong> product variant desired and –<br />

depending on <strong>the</strong> nature of <strong>the</strong> modular product structure<br />

associated – may consist of thousands of items. This fine<br />

configuration also includes technical knowledge in terms of<br />

rules and constraints pinpointing under what<br />

circumstances what components may or may not be<br />

combined with o<strong>the</strong>rs.<br />

In order to identify specific components or items, designers<br />

usually refer to part numbers, drawing numbers, BOM<br />

entries, or similar terms. Specifically in <strong>the</strong> area of<br />

electrical/electromechanical engineering most of <strong>the</strong>se<br />

configuration items are schematic diagrams, terminal plans<br />

or a variety of o<strong>the</strong>r documents required to express<br />

functionality and assembly of an installation.<br />

The next step in creating <strong>the</strong> configured variant requires a<br />

design engineer to start an <strong>ECAD</strong> system, generate a new<br />

project, copy <strong>the</strong> plans configured into <strong>the</strong> project and<br />

specify individual customer and order details.<br />

Subsequently, alterations necessary to <strong>the</strong> specific project<br />

have to be accomplished and <strong>the</strong> process of generating an<br />

updated complete electrical documentation according to<br />

<strong>the</strong> alterations or amendments made has to be initiated.<br />

In order to make <strong>the</strong> development of product variants more<br />

effective, <strong>ECAD</strong> system vendors aim towards an automatic<br />

computer-aided support of <strong>the</strong> workflow process outlined<br />

above.


2 VARIATIONAL DESIGN TECHNOLOGY APPROACH<br />

2.1 Functional Principle<br />

The basic functional principle of <strong>the</strong> variant design<br />

approach presented in this paper is now described. It is<br />

based on aspects from knowledge-based product<br />

configuration, <strong>the</strong> programming of variants, as well as<br />

parametric modelling and process automation. The<br />

fundamental idea behind <strong>the</strong> approach is to automatically<br />

generate an entire technical documentation of an<br />

electrical/electromechanical installation on <strong>the</strong> basis of a<br />

placed order specification. The overall process to achieve<br />

this involves five steps as shown in figure 1.<br />

Identification of standardised components of<br />

an electrical installation to represent a<br />

modular structured product variant<br />

Composition of identidied components in<br />

terms of data structure expressions<br />

Automatic compilation of commands in non<br />

system specific meta-language describing <strong>the</strong><br />

generation of a typical <strong>ECAD</strong> project containing<br />

<strong>the</strong> previously configured modules<br />

Automatic translation of meta-language<br />

commands into a macro programming<br />

language of a specific <strong>ECAD</strong> system<br />

Import and processing of generated file to<br />

create practical <strong>ECAD</strong> project<br />

Figure 1: Functional principle of<br />

<strong>ECAD</strong> variant design technology approach.<br />

Firstly, based upon a modular product structure a variant of<br />

an installation is configured by composing standardised<br />

modules of existing (previously developed) components.<br />

Secondly, all components identified to compose a specific<br />

variant configuration are stored in a data file. This includes<br />

settings for parameter values that may finally define some<br />

characteristics of <strong>the</strong> components. This configuration file<br />

corresponds to a bespoke data structure newly developed<br />

and appropriate to describe <strong>ECAD</strong> product variants in<br />

general.<br />

Thirdly, based upon <strong>the</strong> configuration file created, a set of<br />

commands describing <strong>the</strong> generation of a typical <strong>ECAD</strong><br />

project containing all <strong>the</strong> components configured toge<strong>the</strong>r<br />

is automatically compiled. This is a key novelty, as all<br />

1.<br />

2.<br />

3.<br />

4.<br />

5.<br />

commands to generate such a project are expressed in a<br />

non system specific meta-language.<br />

Fourthly, <strong>the</strong> variant project description expressed in non<br />

system specific meta-language commands is automatically<br />

transformed into a batch file of commands of a macro<br />

programming language of associated to a particular <strong>ECAD</strong><br />

system.<br />

Fifthly, <strong>the</strong> specific <strong>ECAD</strong> system imports and processes<br />

this batch file to create an actual <strong>ECAD</strong> project. This<br />

project <strong>the</strong>n may be handled or dealt with in any way <strong>the</strong><br />

<strong>ECAD</strong> system allows.<br />

2.2 Technology Approach<br />

A technical approach to realise <strong>the</strong> functional principle is<br />

now given. An overview is illustrated in figure 2. Since step<br />

one of <strong>the</strong> functional principle is obvious, step two is <strong>the</strong><br />

point to start with going into fur<strong>the</strong>r detail.<br />

As already mentioned in paragraph 2.1, a data structure<br />

specifically tailored for representing configuration based<br />

variant projects is required. This data structure primarily<br />

has to cover components and documents typically used to<br />

make up an entire project documentation of an electrical<br />

installation. Fur<strong>the</strong>rmore, <strong>the</strong> data structure it has to span<br />

semantic information on relations and constraints existing<br />

between components or documents. In order to be able to<br />

store, import, process and automatically evaluate variant<br />

projects based on a semantics-based data structure in<br />

subsequent processes, a standardised data format for<br />

representing <strong>the</strong> data structure has to be chosen. In <strong>the</strong><br />

approach described in this paper <strong>the</strong> variant project data<br />

structure has been expressed in terms of a document type<br />

definition (DTD) associated to <strong>the</strong> language XML<br />

(extensible mark-up language). Simply speaking, XML is a<br />

mark-up language for describing hierarchically composed<br />

objects that strictly distinguishes between structure,<br />

content and layout of <strong>the</strong> objects data. The specific<br />

purpose of a DTD is to define <strong>the</strong> structure of XML files.<br />

Based upon <strong>the</strong>se technical arrangements, a variant<br />

project expressed in terms of XML can be validated<br />

against a DTD to check whe<strong>the</strong>r or not its structure<br />

complies with <strong>the</strong> requirements defined in <strong>the</strong> DTD. So far,<br />

configuration based variant projects (components,<br />

documents, relations, constraints, etc.) whose original<br />

underlying data structure has been transferred into a XML<br />

pendant can be stored as XML data files to be fur<strong>the</strong>r<br />

processed later on.<br />

Realising step three of <strong>the</strong> functional principle involves<br />

formulating commands expressing <strong>the</strong> generation of a<br />

configuration based <strong>ECAD</strong> project in a non system specific<br />

form. Hence, a suitable meta-language has been<br />

developed and applied. This meta-language covers a<br />

variety of system commands similar to those being typical<br />

for contemporary <strong>ECAD</strong> system’s macro languages.<br />

Following <strong>the</strong> functional principle of paragraph 2.1, a<br />

variant project stored as XML file now can be transferred<br />

into a new data format describing <strong>the</strong> generation of an<br />

<strong>ECAD</strong> project containing <strong>the</strong> configured components.<br />

Technically speaking, this means to enhance <strong>the</strong> original<br />

XML data structure of a configuration based variant project<br />

in such a way that it allows to model and express<br />

commands in <strong>the</strong> meta-variant-construction language ‘vcl’.<br />

In order to allow for fur<strong>the</strong>r standardised data processing<br />

operations to be performed on vcl files, <strong>the</strong> data structure<br />

of <strong>the</strong> meta-language vcl has to be transferred into an<br />

equivalent XML DTD. Henceforth, this meta-language<br />

expressed in terms of an XML DTD will be denoted as<br />

variant construction language in XML, in short ‘vclX’. To<br />

sum-up, <strong>the</strong> components of a configured <strong>ECAD</strong> variant<br />

project stored as XML file have been picked-up and<br />

transferred into ano<strong>the</strong>r, more sophisticated and powerful<br />

47


New Method for <strong>ECAD</strong> Variant Design Technology<br />

<strong>ECAD</strong> Variant Project<br />

data structure<br />

of<br />

configuration based<br />

variant project<br />

transfer given data<br />

structure into XML-DTD<br />

to allow standardised<br />

data exchange<br />

store variant<br />

project as<br />

XML-file<br />

Transformation of data<br />

structure into vclX<br />

<strong>ECAD</strong> Variant Project<br />

enhanced data structure<br />

of variant project<br />

containing commands for<br />

<strong>ECAD</strong> project generation<br />

in meta-language vcl<br />

transfer vcl into XML-<br />

DTD (vclX) to allow<br />

standardised data<br />

exchange<br />

store variant project<br />

containing project<br />

generation commands<br />

as XML file<br />

Transformations are described in terms of XSL files<br />

Automated transformations are realised by<br />

processing given XSL files using XSLT<br />

XML data structure containing non system specific<br />

commands to describe <strong>the</strong> generation of an <strong>ECAD</strong> project<br />

made up of <strong>the</strong> components configured.<br />

The above transformation process is carried out<br />

automatically using ‘XSL’ (Extensible Style sheet<br />

Language) and a software tool called ‘XSLT’ (XSL<br />

Transformation). XSL is a language specifically developed<br />

to facilitate transformation purposes and allows defining<br />

rules describing <strong>the</strong> transformation from one XML structure<br />

into ano<strong>the</strong>r data structure. The transformation rules<br />

necessary to perform <strong>the</strong> desired transformation are stored<br />

within a specific XSL data file. The actual data<br />

transformation <strong>the</strong>n is carried out by XSLT which requires<br />

three things to work: (1) a source XML file to be<br />

transferred, (2) <strong>the</strong> source file’s corresponding DTD and<br />

(3) a XSL file containing all <strong>the</strong> rules describing <strong>the</strong><br />

mapping onto <strong>the</strong> target XML data structure.<br />

The procedure described above analogously recurs for<br />

step 4 of <strong>the</strong> technology approach. However, this time an<br />

XSL file describing <strong>the</strong> transformation from <strong>the</strong> non-system<br />

specific vclX command list structure into ano<strong>the</strong>r structure<br />

encompassing commands of a specific <strong>ECAD</strong> system’s<br />

macro language is required. The result of this final<br />

transformation is a batch file to be imported and processed<br />

by <strong>the</strong> specific <strong>ECAD</strong> system chosen. In o<strong>the</strong>r words, a<br />

real <strong>ECAD</strong> project in a native data format has been<br />

created.<br />

2.3 Module Conception<br />

In this paragraph a module conception for implementing<br />

<strong>the</strong> approach discussed above is presented. It is tailored to<br />

support a workflow closely related to that described in<br />

Transformation of vclX into<br />

<strong>ECAD</strong> macro language<br />

<strong>ECAD</strong> Variant Project<br />

<strong>ECAD</strong> data structure of a<br />

variant project containing<br />

commands for <strong>ECAD</strong><br />

project generation in<br />

<strong>ECAD</strong> macro language<br />

<strong>ECAD</strong> macro language<br />

as data exchange<br />

format of an <strong>ECAD</strong>system<br />

Store variant project in <strong>ECAD</strong><br />

macro language or.native data<br />

format of <strong>ECAD</strong> system<br />

Figure 2: Approach to an automatic generation of <strong>ECAD</strong> project<br />

48<br />

paragraph 1.1. For an overall illustration of <strong>the</strong> module<br />

conception see figure 3.<br />

The variant module basically comprises of two submodules,<br />

notably <strong>the</strong> ‘configuration module’ and <strong>the</strong><br />

‘coupling module’. It is developed as a self-contained unit<br />

that may be coupled to one or more <strong>ECAD</strong> systems ra<strong>the</strong>r<br />

than directly implemented within a specific system.<br />

The purpose of <strong>the</strong> configuration module is to perform <strong>the</strong><br />

tasks carried out by design engineers and office<br />

employees as described in paragraph 1.1. This means to<br />

ei<strong>the</strong>r create new configurations or adjust existing ones<br />

based upon a modular product structure using existing<br />

basic parts or components. Hereby, <strong>the</strong> various plans of an<br />

electrical documentation (e.g. schematics, terminal plans,<br />

part lists, etc.) are drawn on as configuration objects.<br />

Prior to being able to work with <strong>the</strong> configuration module all<br />

<strong>the</strong> components (projects, sub-projects, etc.) existing on<br />

<strong>ECAD</strong> site and meant to be available for variant projects<br />

have to be imported to <strong>the</strong> configuration module’s<br />

database.<br />

Using <strong>the</strong> features of a comfortable graphical user<br />

interface (GUI), <strong>the</strong> imported <strong>ECAD</strong> components can be<br />

used to combine new variant projects, to adjust previously<br />

created variants and to store fur<strong>the</strong>r basic components into<br />

<strong>the</strong> database. The design knowledge regarding rules<br />

describing possible combinations and configurations has to<br />

be brought into <strong>the</strong> database as well. The system kernel of<br />

<strong>the</strong> configuration module <strong>the</strong>refore has to incorporate an<br />

intelligent mechanism to maintain, check and control <strong>the</strong><br />

compliance of constraints modelled.


<strong>ECAD</strong> Variant Module<br />

Configurator<br />

XML data<br />

model<br />

Kernel<br />

manual import of projects, components and o<strong>the</strong>r data<br />

Coupling module<br />

Kernel<br />

database database<br />

Figure 3: System architecture of <strong>the</strong> variant module<br />

Due to <strong>the</strong> complexity of knowledge based configuration<br />

systems <strong>the</strong> development of proprietary knowledge based<br />

configuration tools is not recommended. There are many<br />

commercial solutions for almost any configuration tasks<br />

available on <strong>the</strong> market.<br />

The purpose of <strong>the</strong> coupling module is to automate those<br />

steps of <strong>the</strong> workflow process that today are usually<br />

Non<br />

system<br />

specific<br />

language<br />

Figure 4: Example of a simple schematic automatically generated<br />

with <strong>the</strong> variant module<br />

Interface sets<br />

Macro<br />

language 1<br />

Macro<br />

language 2<br />

Macro<br />

language 3<br />

Macro<br />

language n<br />

performed manually by an engineer after <strong>the</strong> components<br />

for a variant configuration have been determined.<br />

A first task for <strong>the</strong> coupling module is to import a variant<br />

configuration from <strong>the</strong> configuration module. Subsequently,<br />

it has to create a batch file of non-system specific<br />

commands describing <strong>the</strong> relevant steps to open a new<br />

<strong>ECAD</strong> project and to include <strong>the</strong> chosen components. After<br />

that, <strong>the</strong> coupling module has to transfer<br />

this non-specific commands into a batch<br />

file for a specific <strong>ECAD</strong> system which can<br />

import and process <strong>the</strong> final batch file<br />

<strong>the</strong>n.<br />

3 CONCLUSION<br />

The approach presented in this paper has<br />

been realised as a software prototype. Its<br />

general applicability has been proven and<br />

several possibilities to amend, extend, or<br />

standardize <strong>the</strong> suggested technological<br />

approach are currently being investigated.<br />

Commercially enhanced, a variant module<br />

like <strong>the</strong> one proposed in this paper would<br />

bear a high potential in respect to cost and<br />

time reduction.<br />

4 REFERENCES<br />

[1] Schaefer, D., 2003, Variantentechnologie<br />

unter besonderer Berücksichtigung<br />

von Elektrotechnik CAD,<br />

Shaker-Verlag, Aachen, ISBN 3-<br />

8322-1901-3, 292 pages<br />

49


PART 3<br />

MICRO ELECTRO-MECHANICAL<br />

SYSTEMS (MEMS)<br />

50


Use of CoventorWare in <strong>the</strong> Design of Innovative IC Probes Based on<br />

Microsystems Technology<br />

M.D. Cooke and D. Wood<br />

Microsystems Technology Group, School of Engineering<br />

University of Durham, Durham, England DH1 3LE<br />

Abstract<br />

This paper presents a detailed examination of <strong>the</strong> use of <strong>the</strong> CoventorWare Tm software in <strong>the</strong> design of<br />

novel IC probes. Analysis is made of <strong>the</strong> factors which can influence <strong>the</strong> device reliability and<br />

performance. Discussion is made of <strong>the</strong> usefulness of <strong>the</strong> analysis in comparison to actual experimental<br />

data. We also demonstrate <strong>the</strong> usefulness of our devices and determine how future designs may be<br />

fur<strong>the</strong>r optimised using <strong>the</strong> software as a design aid.<br />

Keywords:<br />

Integrated Circuit Probe Card, microsystems, CoventorWare Tm<br />

1 INTRODUCTION<br />

A standard probe card to test integrated circuits (ICs) is<br />

a piece of precision mechanical engineering. It consists<br />

of a large number of individually assembled probes,<br />

usually arranged ei<strong>the</strong>r in a circular or a rectangular<br />

perimeter, around a space where <strong>the</strong> chip will sit. The<br />

probes are individually addressable electrically, and<br />

have all to be assembled and set at <strong>the</strong> same correct<br />

height on <strong>the</strong> card in order to function. The complete<br />

card takes a long time to assemble, and is large and<br />

expensive. The cost of a probe card is in <strong>the</strong> range £500<br />

- £5000, or even higher, depending on complexity. No<br />

significant breakthrough has been made in probe card<br />

design for many decades.<br />

Previous microsystems work on IC probes has been<br />

limited mainly to silicon micromachining or simple metal<br />

designs [1-3]. These tend to have issues with contact<br />

resistance or durability. There are also associated issues<br />

in producing enough stress to make <strong>the</strong> metal<br />

cantilevers all deflect evenly. Recently more complex<br />

structures have been developed. The design by Kataoka<br />

et al. was a complex electroplated spring structure<br />

comprising multiple fabrication stages which could be<br />

made straight onto a circuit board [4]. Krüger et al.<br />

demonstrated a beam design optimized on multiple<br />

anchor points to minimize stress with a self alignment<br />

feature for contact bumps [5].<br />

Membrane<br />

Substrate<br />

IC lowered<br />

Probe Bump<br />

Self-Limiting<br />

Sensor<br />

Support Columns<br />

Figure 1: Schematic diagram of <strong>the</strong> IC probe<br />

We have developed a new approach to fabricating IC<br />

probe cards based on Microsystems Technology. It<br />

involves <strong>the</strong> fabrication of electroplated nickel or gold<br />

structures that are both flexible and electrically<br />

51<br />

addressable. The design has unique features to allow it<br />

to be highly durable for application in <strong>the</strong> workplace.<br />

Our design can be seen in figure 1. The electroplated IC<br />

probes are designed as a membrane structure with a<br />

probe bump in <strong>the</strong> centre. This membrane, which in<br />

principle can be any geometry, is supported by a number<br />

of columns with a self-limiting sensor located beneath<br />

<strong>the</strong> structure to allow control of <strong>the</strong> applied force. These<br />

structures can be mass manufactured in large arrays<br />

suitable for use as a probe card, and an additional<br />

benefit is that <strong>the</strong>re is only a minor design change to<br />

make <strong>the</strong> probes suitable for ei<strong>the</strong>r contact pad or solder<br />

bump designed circuits. Our typical structure is a beam<br />

design, with a membrane dimension of 1000µm x 100µm<br />

x 5µm supported on 2µm high columns. Deflection is<br />

less than 3µm under an applied force of 2mN giving a<br />

contact resistance below 1?. We have <strong>the</strong> very real<br />

promise of cheap flexible probe designs which can be<br />

produced quickly. In order to optimise our current probe<br />

devices, <strong>the</strong> CoventorWare package has been used to<br />

model <strong>the</strong>ir performance under loading as seen when an<br />

IC pad or bump would make contact. This allows <strong>the</strong><br />

design to be optimised before any fabrication work is<br />

undertaken. This means that <strong>the</strong> time in producing <strong>the</strong><br />

samples is significantly reduced, and <strong>the</strong> work required<br />

to determine <strong>the</strong> optimum dimensions, materials etc is<br />

much less. Also it allows <strong>the</strong> design solution for a<br />

particular problem to be produced rapidly. We<br />

particularly examine <strong>the</strong> effect of membrane geometry<br />

and dimensions on <strong>the</strong> deflection under load.<br />

2 COVENTORWARE SOFTWARE<br />

2.1 Overview of Software<br />

CoventorWare is an integrated microsystems analysis<br />

environment programmed to determine an effective<br />

design before experimental work is undertaken [6]. It has<br />

a number of individual modules which <strong>the</strong> user can<br />

specifically purchase.<br />

The Designer module allows <strong>the</strong> development of a three<br />

dimensional model of a complex device. Integrated into<br />

this is <strong>the</strong> process emulator which emulates <strong>the</strong><br />

fabrication steps for Microsystems devices. It uses<br />

standard deposition processes and etching with control<br />

of <strong>the</strong> bulk and thin-film geometries.


The layout editor <strong>the</strong>n allows mask design as used in <strong>the</strong><br />

process flow. Integration of a wide range of materials<br />

allows a more accurate evaluation of true device<br />

behaviour. This information is <strong>the</strong>n all combined to give<br />

a 3D generated model, which allows meshing of<br />

individual components for fur<strong>the</strong>r analysis.<br />

The Analyser module is a range of tools specifically<br />

designed to fully determine how a device will interact<br />

under specified conditions. It is split into several sub<br />

packages, for example, MemElectro examines<br />

electrostatic properties, MemMech steady-state <strong>the</strong>rmomechanical<br />

properties and CoSolve-EM analyzes<br />

coupled electromechanics with hysteresis. Fur<strong>the</strong>r<br />

packages allow analysis of damping, piezoelectric,<br />

<strong>the</strong>rmal effects and electrical characterisation. More<br />

detailed modelling allows <strong>the</strong> introduction of <strong>the</strong> package<br />

and external environment to <strong>the</strong> system. These results<br />

can <strong>the</strong>n be viewed using TechPlot, which allows both<br />

3D and graphical information to be extracted from <strong>the</strong><br />

modelling.<br />

2.2 Probe Design Specific Information<br />

To apply our device analysis to <strong>the</strong> software system, it<br />

was essential to set up <strong>the</strong> parameters of our design, in<br />

<strong>the</strong> process designer. Initially, we characterised <strong>the</strong><br />

individual device layer thickness and determined <strong>the</strong><br />

fabrication route using <strong>the</strong> process editor. The defined<br />

substrate was silicon , with a 1000Å <strong>the</strong>rmal oxide<br />

layer on <strong>the</strong> surface to limit any electrical conductivity<br />

and isolate it from <strong>the</strong> device. The column, membrane<br />

and contact regions could <strong>the</strong>n all be specified for <strong>the</strong>ir<br />

individual thickness, with a sacrificial defined layer used<br />

to fully simulate <strong>the</strong> device design process. In Table 1<br />

we show a typical process flow as used for our designs<br />

(<strong>the</strong> parameters are varied as <strong>the</strong> device optimisation is<br />

examined).<br />

Table 1: Process flow parameters as used in <strong>the</strong><br />

examination of <strong>the</strong> IC probe design in <strong>the</strong> Process<br />

Designer element of CoventorWare<br />

The information from <strong>the</strong> process design stage was <strong>the</strong>n<br />

integrated into <strong>the</strong> design layout editor. Using <strong>the</strong> simple<br />

graphical interface, it was possible to apply <strong>the</strong> typical<br />

design of our structures as a two dimensional image<br />

viewed from <strong>the</strong> top side. A typical design in 2D can be<br />

seen in Fig 2.<br />

By linking each structure to <strong>the</strong> information stored in <strong>the</strong><br />

process designer, it was possible to build a three<br />

dimensional model of <strong>the</strong> device.<br />

52<br />

Figure 2: Typical beam probe design as fabricated using<br />

<strong>the</strong> design layout editor<br />

The next stage in <strong>the</strong> device development was to use <strong>the</strong><br />

Preprocessor to view and provide <strong>the</strong> initial modelling of<br />

<strong>the</strong> device. The initial design showed all <strong>the</strong><br />

components. For our modelling, it was important to<br />

define two specific regions, <strong>the</strong> first being <strong>the</strong> substrate,<br />

<strong>the</strong> second being <strong>the</strong> device structure. All components<br />

were defined as solid conductors <strong>the</strong>n added for mesh<br />

modelling. Before modelling was undertaken, it was<br />

important to define <strong>the</strong> key faces which had to be<br />

referenced for interaction during <strong>the</strong> modelling. These<br />

included <strong>the</strong> anchor point, membrane bottom, substrate<br />

surface and top of <strong>the</strong> contact.<br />

As shown in Fig. 3 for our typical device, region 1 (<strong>the</strong><br />

substrate) was modelled using a surface mesh with<br />

individual mesh size of 20 microns. The components in<br />

region 2 (<strong>the</strong> device) were modelled using an extruded<br />

brick mesh using a pave algorithm, with element size of<br />

5 microns. The pre-processor was <strong>the</strong>n used to generate<br />

<strong>the</strong> mesh.<br />

Figure 3: Three Dimensional model of <strong>the</strong> probe<br />

structure with appropriate meshing on each individual<br />

component. Blue corresponds to region 1 (<strong>the</strong><br />

substrate). Green (<strong>the</strong> support columns), red (<strong>the</strong><br />

membrane beam) and orange (<strong>the</strong> probe bump) make<br />

up <strong>the</strong> device (region 2).<br />

The final stage in producing <strong>the</strong> model for <strong>the</strong> device<br />

was to use <strong>the</strong> analyser package. The analysis used for<br />

measuring <strong>the</strong> probe deflection was <strong>the</strong> mechanical<br />

settings. Surface boundary conditions were applied, and<br />

<strong>the</strong> anchor points were fixed. At <strong>the</strong> top of <strong>the</strong> probe<br />

bump, increasing pressure in <strong>the</strong> z-plane was applied,<br />

ranging from 0 to 10 Pa. This parametric range was <strong>the</strong>n<br />

applied to <strong>the</strong> membrane to give <strong>the</strong> variation of<br />

deflection as a function of applied pressure. The typical<br />

expected deflection as a function of pressure can be


seen in Fig 4, while we show <strong>the</strong> profile of <strong>the</strong> beam<br />

during deflection in Fig 5. As expected <strong>the</strong> maximum<br />

deflection is in <strong>the</strong> centre where <strong>the</strong> force is applied to<br />

<strong>the</strong> probe pump. However <strong>the</strong> deflection is not linear with<br />

applied force.<br />

Deflection (μm)<br />

3.0<br />

2.5<br />

2.0<br />

1.5<br />

1.0<br />

0.5<br />

0.0<br />

0 2 4 6 8 10<br />

Applied Pressure (Pa)<br />

Figure 4: Model of <strong>the</strong> deflection of a 1000 x 100 micron<br />

beam of thickness 5 microns made from nickel on 4<br />

micron high support columns.<br />

Figure 5: Modelled deflection profile of <strong>the</strong> IC probe card<br />

device at maximum deflection<br />

It was <strong>the</strong>n possible to examine <strong>the</strong> data to show a<br />

number of key parameter variations as a function of <strong>the</strong><br />

applied pressure. For instance <strong>the</strong> stress in <strong>the</strong> sample<br />

may be modelled. This can provide an insight into <strong>the</strong><br />

regions where <strong>the</strong> device would fail during repeated<br />

cyclic loading. Also it is essential in <strong>the</strong> implementation<br />

of <strong>the</strong> self limiting sensor as this can <strong>the</strong>n be employed<br />

to determine how <strong>the</strong> optimum deflection can be<br />

achieved.<br />

Fig 6 shows <strong>the</strong> deflected cantilever and highlights <strong>the</strong><br />

regions of stress. As expected <strong>the</strong> main stress regions<br />

were those found near <strong>the</strong> column support regions giving<br />

rise to high stress which could result in <strong>the</strong> damage of<br />

<strong>the</strong> membrane surface. Secondary high regions of stress<br />

were found at <strong>the</strong> position where <strong>the</strong> sample is in contact<br />

with <strong>the</strong> underlying surface.<br />

53<br />

Figure 6: Modelled stress of <strong>the</strong> membrane under full<br />

deflection<br />

2.3 Specific Analysis for Probe Optimisation<br />

Using CoventorWare, it was possible to undertake more<br />

specific analysis of <strong>the</strong> beam design for use in <strong>the</strong> probe<br />

card. We performed <strong>the</strong> analysis of <strong>the</strong> change in beam<br />

deflection for a fixed applied pressure ( 0.25 Pa). In Fig<br />

7, <strong>the</strong> effect of producing <strong>the</strong> membrane from different<br />

materials is investigated. Clearly nickel provides a good<br />

deal of rigidity, whilst also being a good conductor. Gold<br />

is <strong>the</strong> most flexible, suggesting that <strong>the</strong> applied force to<br />

give complete deflection is significantly lower. Potentially<br />

a gold membrane may be less durable than a nickel one,<br />

although whe<strong>the</strong>r this durability would be a problem for<br />

our devices in <strong>the</strong> long-term is uncertain.<br />

Deflection (microns)<br />

0.018<br />

0.016<br />

0.014<br />

0.012<br />

0.010<br />

0.008<br />

0.006<br />

0.004<br />

0.002<br />

Nickel nickel Gold Gold Tungsten Copper<br />

Material<br />

Figure 7: Variation in deflection under a fixed load for a<br />

typical 1000 micron long 5 micron thick 100 micron wide<br />

membrane with only variation of <strong>the</strong> material parameters.


Deflection (microns)<br />

0.005<br />

0.004<br />

0.003<br />

0.002<br />

0.001<br />

0.000<br />

0 10 20 30 40 50<br />

Beam Thickness (Microns)<br />

Figure 8: Variation in deflection under a fixed load for a<br />

typical 1000 micron long 100 micron wide Nickel<br />

membrane with only variation of <strong>the</strong> membrane depth.<br />

Deflection (microns)<br />

0.035<br />

0.030<br />

0.025<br />

0.020<br />

0.015<br />

0.010<br />

0.005<br />

0.000<br />

0 50 100 150 200 250 300 350<br />

Beam Width (Microns)<br />

Figure 9: Variation in deflection under a fixed load for a<br />

typical 1000 micron long 5 micron deep Nickel<br />

membrane with only variation of <strong>the</strong> membrane width.<br />

Deflection (microns)<br />

0.005<br />

0.004<br />

0.003<br />

0.002<br />

0.001<br />

0.000<br />

200 300 400 500 600 700 800 900 1000 1100<br />

Beam Length (microns)<br />

Figure 10: Variation in deflection under a fixed load for a<br />

typical 5 micron deep, 100 micron wide Nickel<br />

membrane with only variation of <strong>the</strong> membrane length.<br />

Varying <strong>the</strong> membrane dimensions provides control of<br />

<strong>the</strong> deflection for a fixed applied pressure over <strong>the</strong> probe<br />

bump region. These results are given in Figs. 8-10,<br />

showing that increasing <strong>the</strong> thickness, increasing <strong>the</strong><br />

width and decreasing <strong>the</strong> length of <strong>the</strong> membrane all<br />

make it stiffer. It is <strong>the</strong>refore possible to provide a degree<br />

of control to <strong>the</strong> deflection purely by varying <strong>the</strong><br />

54<br />

membrane dimensions. However, it should be noted that<br />

<strong>the</strong>re are also certain fabrication issues which would<br />

provide a limit on this, as discussed in 3.<br />

(a)<br />

(b)<br />

(c)<br />

Figure 11: Deflection under a fixed load for a typical 5<br />

micron thick membrane a) circular, b) ‘X’ shaped, c) ‘H’<br />

shaped


Relative Deflection (Arb. U.)<br />

1.0<br />

0.8<br />

0.6<br />

0.4<br />

0.2<br />

0.0<br />

1 2 3 4<br />

H Circular X Beam<br />

Membrane Structure<br />

Figure 12: Deflection under a fixed load for a typical 5<br />

micron thick membrane of varying geometry<br />

Finally it is possible to simply examine geometrical<br />

variations of <strong>the</strong> membrane to determine <strong>the</strong> device<br />

behaviour under load. Three typical examples can be<br />

seen in Fig. 11. The circular device was chosen as it is<br />

an optimum shape for looking at solder bumps (Fig.<br />

11a). The ‘X’ and ‘H’ design were considered as <strong>the</strong>y<br />

provide a design which is easier to remove residual<br />

material during <strong>the</strong> sacrificial layer removal stage,<br />

coupled with different control on <strong>the</strong> stress and<br />

deflection for a specific applied force (Fig. 11b-c<br />

respectively). If we <strong>the</strong>n examine <strong>the</strong> deflection for a<br />

fixed force, we find that, as shown in figure 12, <strong>the</strong><br />

deflection will vary depending on our membrane shape.<br />

3 EXPERIMENTAL DETAILS<br />

Experimental fabrication also places constraints on <strong>the</strong><br />

device design. The column z plane dimensions are<br />

limited by <strong>the</strong> thickness of <strong>the</strong> photoresist. Beyond this<br />

<strong>the</strong> samples will start to overplate. The size of <strong>the</strong> upper<br />

membrane is primarily determined by device fabrication<br />

considerations. The larger <strong>the</strong> membrane area, <strong>the</strong><br />

greater <strong>the</strong> associated problems with stiction are found<br />

at <strong>the</strong> device release stage. Also increasing <strong>the</strong><br />

membrane area decreases <strong>the</strong> number of potential<br />

probes. However, too small a structure increases <strong>the</strong><br />

stress in <strong>the</strong> membrane during deflection and limits <strong>the</strong><br />

use of <strong>the</strong> self-limiting sensor. Our typical structures<br />

have a membrane dimension of 1000µm x 100µm x 5µm<br />

supported on 2µm high columns. The probe bump is<br />

100µm x 100µm, which is comparable in size to a typical<br />

IC solder bump or pad dimension.<br />

The individual probe devices were fabricated using a<br />

similar technique to that previously used to produce our<br />

capacitor structures [7]. Initially a seed layer of titanium<br />

(20 A), with a thin layer of nickel (500A), was deposited<br />

on a silicon substrate (Fig. 13A). This was <strong>the</strong>n<br />

patterned using S1813 photoresist to define <strong>the</strong> regions<br />

where <strong>the</strong> anchor points and self-limiting sensor were to<br />

be fabricated. The sample was <strong>the</strong>n placed in <strong>the</strong> gold<br />

(or nickel) electroplating bath using a current of 2mA, <strong>the</strong><br />

columns were plated up to <strong>the</strong> top of <strong>the</strong> photoresist<br />

surface. A fur<strong>the</strong>r layer of photoresist was added, with<br />

only <strong>the</strong> columns being plated this time (Fig. 13B).<br />

55<br />

Figure 13: Schematic diagram of <strong>the</strong> fabrication process<br />

In order to plate <strong>the</strong> membrane, a thin layer of gold<br />

(20nm) was sputter deposited onto <strong>the</strong> surface of <strong>the</strong><br />

sample (Fig 13C). Above this a second layer of photo<br />

resist was spun and defined for <strong>the</strong> membrane region.<br />

Again <strong>the</strong> gold electroplating technique was used to fill<br />

this region to produce <strong>the</strong> membrane (Fig 13D). The<br />

third step was <strong>the</strong> fabrication of <strong>the</strong> probe bump region<br />

using <strong>the</strong> same technique as used to define <strong>the</strong><br />

membrane (Fig 13E).<br />

Finally <strong>the</strong> sample <strong>the</strong>n underwent <strong>the</strong> sacrificial removal<br />

stage to free <strong>the</strong> membrane device. The top layers of<br />

photoresist were removed using full field UV exposure<br />

and immersion of <strong>the</strong> sample in <strong>the</strong> developing solution.<br />

The thin layer of sputtered gold was removed using a<br />

fast wet etch in gold etching solution. The under-layer of<br />

photoresist was <strong>the</strong>n stripped initially using acetone in<br />

an ultrasonic bath followed by iso-propanol. Then <strong>the</strong><br />

sample was placed into <strong>the</strong> gold (or nickel) etch. This<br />

was <strong>the</strong>n followed by a dip in sulphuric acid : hydrogen<br />

peroxide (1 :1) to remove any remaining photoresist and<br />

<strong>the</strong> titanium under-layer. The sample was <strong>the</strong>n washed<br />

again in iso-propanol and release fully achieved by<br />

placing in an oven to give <strong>the</strong> final device (Fig 13F)<br />

Figure 14: SEM image of an individual electroplated<br />

membrane structure. Insert is an typical device with 20<br />

individual measurement pads.


We fabricated a range of <strong>the</strong> electroplated structures<br />

(example Fig. 14), varying in membrane dimensions<br />

from 100µm by 100µm to 1000µm by 1000µm. These<br />

showed good adhesion to <strong>the</strong> substrate via <strong>the</strong> support<br />

columns. In <strong>the</strong> unloaded state <strong>the</strong> samples show no<br />

electrical conduction between <strong>the</strong> probe bump and <strong>the</strong><br />

self-limiting sensor suggesting <strong>the</strong> structure had been<br />

released. In order to verify that no waste material was<br />

left under <strong>the</strong> membrane an electrical probe was used to<br />

apply a force to <strong>the</strong> probe bump and gently bring it into<br />

contact with <strong>the</strong> self limiting sensor. This was cycled,<br />

showing that <strong>the</strong> devices can go through a<br />

load/unloaded cycle repeatedly without damage and that<br />

<strong>the</strong> self- limiting sensor can easily detect when <strong>the</strong><br />

membrane is touching it. For an applied force giving full<br />

membrane deflection, <strong>the</strong> total membrane to self-limiting<br />

sensor resistance was 7 ?, with a low contact resistance<br />

of less than 2 ?. It was also noted that varying <strong>the</strong><br />

sample dimensions changed <strong>the</strong> required force to touch<br />

<strong>the</strong> self-limiting sensor, and that <strong>the</strong> trends in this data<br />

were similar to those suggested by <strong>the</strong> modelling (Fig<br />

15).<br />

Relative Applied Force (Arb. U.)<br />

Contact Resistance (Ω)<br />

1.0<br />

0.8<br />

0.6<br />

0.4<br />

0.2<br />

0.0<br />

2.5<br />

2.0<br />

1.5<br />

1.0<br />

0.5<br />

0.25 0.50 0.75 1.00<br />

Relative Device Width (Arb. U.)<br />

Figure 15: Comparison of experimental data with that<br />

produced from modelling for variations in cantilever<br />

width. [squares correspond to experimental data,<br />

triangles to modelled data].<br />

0.0<br />

0.000 0.001 0.002 0.003 0.004 0.005<br />

Applied Force (N)<br />

Figure 16: Measurement of <strong>the</strong> contact resistance as a<br />

function of applied force for typical membrane beam<br />

(1000 microns x 100 micron x 5 micron)<br />

The contact resistance was determined using fabricated<br />

aluminium pads to simulate IC pads. Increasing force<br />

was applied to <strong>the</strong> pads to determine <strong>the</strong> relationship<br />

between force and contact resistance. The probe bump<br />

is crucial for <strong>the</strong>se measurements. Without this design<br />

56<br />

feature <strong>the</strong> membrane will not deflect giving a high<br />

contact resistance greater than 10 ?. Addition of <strong>the</strong><br />

probe bump allows simple contact to <strong>the</strong> pad while <strong>the</strong><br />

membrane deflects. The contact resistance varies as a<br />

function of applied force (Fig. 16), ultimately giving a<br />

minimum resistance of 0.5 ? for a force of 3.4mN which<br />

is comparable with results of o<strong>the</strong>rs, e.g. [5].<br />

Examination of <strong>the</strong> deflection of <strong>the</strong> membrane probed<br />

using an AFM tip showed that for a constant applied<br />

force <strong>the</strong> membrane deflects until it reaches <strong>the</strong> bump<br />

stop (Fig. 17). The internal structure in <strong>the</strong> signal<br />

suggests that <strong>the</strong> membrane is trying to resist <strong>the</strong><br />

pressure applied by <strong>the</strong> probe.<br />

Delflection (V)<br />

0.20<br />

0.15<br />

0.10<br />

0.05<br />

0.00<br />

-0.05<br />

-0.10<br />

-0.15<br />

-0.20<br />

0 500 1000 1500 2000 2500<br />

Depth (microns)<br />

Figure 17: Measurement of <strong>the</strong> deflection of a typical<br />

membrane beam (1000 microns x 100 micron x 5<br />

micron), using an AFM probe to apply <strong>the</strong> force and<br />

monitoring <strong>the</strong> signal in scope mode.<br />

Using our simple fabrication technique, it was also<br />

possible to fabricate quickly a number of structures of<br />

different geometries. This allows us to tie in our work on<br />

<strong>the</strong> modelling side easily into <strong>the</strong> fabrication route<br />

allowing us to optimise a device. Figure 18 gives SEM<br />

images of comparable devices to those modelled earlier<br />

(Fig. 11).


(a)<br />

(b)<br />

(c)<br />

Figure 18: SEM image of a individual electroplated<br />

membrane structure, following <strong>the</strong> designs produced<br />

using CoventorWare, a) circular membrane, b) ‘H’<br />

membrane, c) ‘X’ membrane<br />

A sample of experimental results for <strong>the</strong> fabricated<br />

devices can be seen in table 2. This clearly shows that<br />

<strong>the</strong> contact force depends on <strong>the</strong> sample geometry, and<br />

indicates <strong>the</strong> potential of integrating a design package<br />

into <strong>the</strong> fabrication route. However, <strong>the</strong> results from <strong>the</strong><br />

modelled simulations are not in agreement with those<br />

found experimentally (Fig. 19). The general trend is<br />

similar, but <strong>the</strong> absolute values disagree. Also <strong>the</strong>re is<br />

some discrepancy seen in <strong>the</strong> data for <strong>the</strong> circular<br />

membrane. This is likely to be caused by limitations in<br />

modelling real devices.<br />

57<br />

Sample Contact Force (mN) Contact<br />

Resistance (? )<br />

‘H’ Sample 0.8 0.28<br />

‘X’ Sample 2.2 0.46<br />

Circular<br />

Sample<br />

2.2 0.51<br />

Beam Sample 3.4 0.50<br />

Table 2: Contact force and Resistance for various<br />

different device geometries.<br />

Contact Force (mN)<br />

6<br />

5<br />

4<br />

3<br />

2<br />

1<br />

0<br />

Circular X H Beam<br />

Sample Geometry<br />

Figure 19: Comparison of contact force for experimental<br />

data (triangles) and modelled data (squares)<br />

4 DISCUSSION<br />

Comparison of <strong>the</strong> modelling solutions provided using<br />

<strong>the</strong> CoventorWare software to our experimental results<br />

allow us to determine <strong>the</strong> use of <strong>the</strong> modelling in relation<br />

to our IC probe project. Clearly information can be<br />

provided on <strong>the</strong> deflection as a function of <strong>the</strong> design<br />

parameters. This is crucial in tuning <strong>the</strong> device to<br />

provide an opposing force to minimise <strong>the</strong> applied force<br />

needed to make a good contact with a low resistance.<br />

Also, it allows us to make an informed decision on <strong>the</strong><br />

mechanical properties of different materials that can be<br />

used to fabricate <strong>the</strong> membrane. This can <strong>the</strong>n be<br />

coupled with information on <strong>the</strong> electrical properties of<br />

<strong>the</strong> material to provide an appropriate solution to <strong>the</strong><br />

problem. In our case materials in <strong>the</strong> range from nickel<br />

to gold were found to behave well both mechanically and<br />

electrically. However, <strong>the</strong> modelling data allows us to<br />

fine tune our devices, particularly in terms of <strong>the</strong><br />

deflection. The self limiting sensor will provide a greater<br />

potential device lifetime when reaching <strong>the</strong> production<br />

stage. Also <strong>the</strong> nature of <strong>the</strong> software means that more<br />

exotic materials could be investigated for <strong>the</strong>ir potential<br />

in improving device stiffness prior to fabrication.<br />

The modelling also provides a good insight into <strong>the</strong><br />

regions of stress. In some of <strong>the</strong> earlier fabricated probe<br />

devices, it became clear that <strong>the</strong> membranes were<br />

becoming damaged and torn from <strong>the</strong> support columns.<br />

This was believed to be due to <strong>the</strong> high stress regions<br />

near <strong>the</strong> column-membrane interface as found in <strong>the</strong><br />

modelling solutions. Therefore by changing <strong>the</strong><br />

dimensions of <strong>the</strong> beam, <strong>the</strong> damage was eliminated.


Finally, we are able to quickly implement a new design in<br />

<strong>the</strong> modelling package to determine if it has any<br />

potential benefits, and <strong>the</strong>n fabricate quickly. This allows<br />

<strong>the</strong> design to be customised for any individual problem.<br />

In terms of negative aspects when producing our<br />

structures, while CoventorWare can be used to look at<br />

relative effects produced by design changes and to give<br />

<strong>the</strong> designer an idea of how <strong>the</strong>se changes will affect a<br />

device performance, it is not yet at a stage where it can<br />

be used to produced a device of a specific performance.<br />

For example if we look at <strong>the</strong> applied force to give full<br />

deflection for a specific 1000 micron long, 5 micron thick<br />

beam, it can be found that <strong>the</strong> modelling suggests 6mN<br />

over a 100 micron square. However, an experimental<br />

value is of <strong>the</strong> order of 3mN.<br />

It is reasonable to expect problems in producing a fully<br />

workable model prior to any experimentation. It is not a<br />

simple process to accurately determine <strong>the</strong> material<br />

structure without some characterisation of <strong>the</strong> processes<br />

involved. Also possible imperfections in <strong>the</strong> device itself<br />

and <strong>the</strong> release process would provide fur<strong>the</strong>r<br />

inconsistencies. It may be possible with fur<strong>the</strong>r<br />

development to include <strong>the</strong>se errors in <strong>the</strong> system to<br />

provide a more accurate model of <strong>the</strong> device process,<br />

but using current technology it is always going to be<br />

difficult to accurately produce a perfect estimate of how<br />

a device will perform in <strong>the</strong> real world.<br />

5 SUMMARY<br />

The work undertaken in this paper clearly shows <strong>the</strong><br />

feasibility of fabricating a novel IC probe card structure.<br />

The use of <strong>the</strong> CoventorWare software allows<br />

optimisation of <strong>the</strong> design prior to fabrication, such that<br />

<strong>the</strong> process is significantly simplified. It also allows us to<br />

determine any weakness points in our sample, as well as<br />

giving us some idea how to control <strong>the</strong> deflection for a<br />

pre-defined applied pressure. Fur<strong>the</strong>rmore, <strong>the</strong> software<br />

allows us <strong>the</strong> potential to make quick design changes<br />

without <strong>the</strong> need for fabricating each individual design<br />

consideration. Comparisons between experimental and<br />

modelled results show similar trends in data, meaning it<br />

is feasible to input more control into <strong>the</strong> final device.<br />

However, it has to be recognised that <strong>the</strong> software does<br />

not easily take into account device limitations and<br />

imperfections. This means that <strong>the</strong>re will be errors in<br />

absolute values.<br />

58<br />

Our electroplated design itself is particularly durable for<br />

industrial application, with multiple cycles showing no<br />

damage to <strong>the</strong> structure. The low contact resistance of<br />

our devices is consistent with that found in more<br />

complex structures. The structures have <strong>the</strong> potential for<br />

mass manufacturing in large arrays, with <strong>the</strong> additional<br />

benefit that <strong>the</strong>y can be simply modified during <strong>the</strong><br />

design phase to accommodate ei<strong>the</strong>r contact pads or<br />

solder bumps. The relatively low production cost means<br />

that our devices have <strong>the</strong> potential to make a significant<br />

impact on <strong>the</strong> IC measurement market.<br />

6 ACKNOWLEDGMENTS<br />

This work is gratefully funded by One North-East via <strong>the</strong><br />

County Durham sub-regional partnership, project<br />

SP/082. We would like to also thank <strong>the</strong> o<strong>the</strong>r members<br />

of <strong>the</strong> Microsystems Technology Group for input and<br />

assistance. This work has a patent (GB 0412728.8).<br />

6 REFERENCES<br />

[1] Park S. at al., 2002 A novel 3d process for singlecrystal<br />

silicon micro-probe structures, J.<br />

Micromech. Microeng. 12 No 5 pp 650-654,<br />

[2] Kataoka K. et al., 2003 Electroplating Ni micro<br />

cantilevers for low contact-force IC probing, Sens.<br />

Act. A: Phys., Vol. 103, issue 1-2, pp 116-121,<br />

[3] Cho Y. et al., 2004 Fabrication of Sharp Knife-edged<br />

micro probe card combined with shadow mask<br />

deposition, Sens. Act. A: Phys. In Press,<br />

[4] Kataoka K. et al., 2004 Multi-layer Electroplated<br />

Micro-spring Array for MEMS Probe Card<br />

MEMS2004 Proceedings, pp 733 -736,<br />

[5] Krüger C., Mokwa W., Schnakenberg U., 2004 NiW-<br />

Micro Springs For Chip Connection, MEMS2004<br />

Proceedings, pp 117 – 120,<br />

[6] CoventorWare Inc., 2001 Analyzer Ref. Guide,<br />

http://www.coventor.com<br />

[7] Gallant A.G., Wood D., 2004 The role of fabrication<br />

techniques on <strong>the</strong> performance of widely tunable<br />

micromachined capacitors, Sns. Act. A : Phys Vol<br />

110, issue 1-3,


CAD FRAMEWORK FOR THE DEVELOPMENT OF A THERMALLY<br />

ACTUATED MICRO-GRIPPER<br />

B. Solano*‡, D. Wood†, S. Rolt‡ and P.G. Maropoulos*‡<br />

*Design and Manufacturing Research Group, School of Engineering<br />

University of Durham, Durham, UK, DH1 3LE<br />

† Microsystems Research Group, School of Engineering<br />

University of Durham, Durham, UK, DH1 3LE<br />

‡ IADET (Institute for Agility and Digital Enterprise technology)<br />

NETPARK Institute, Sedgefield, UK, TS21 3FB<br />

Abstract<br />

This paper describes <strong>the</strong> development of a simplified analytical and finite element model of a<br />

microelectromechanical (MEMS) device. The basic device used in this study is a <strong>the</strong>rmally actuated microgripper<br />

that operates by differential <strong>the</strong>rmal expansion caused by resistive (Joule) heating in its two<br />

constituent U-shaped micro actuators. The design and finite element analysis has been accomplished with<br />

<strong>the</strong> Conventorware TM Computer Aided Design (CAD) software specially developed for MEMS. This CAD<br />

software incorporates a material data base and a process description file that generates a 3D solid model of<br />

<strong>the</strong> device (virtual model) which provides a spatially detailed description of <strong>the</strong> system. Good correlation<br />

between <strong>the</strong> virtual and simplified <strong>the</strong>rmo analytical model and experimental data validates <strong>the</strong> model and<br />

encourages its use for <strong>the</strong> evaluation of <strong>the</strong> system under different design configurations.<br />

Keywords:<br />

Computer aided design, CAD, MEMS, micro-gripper, <strong>the</strong>rmal actuators<br />

1 INTRODUCTION<br />

Micro Electro Mechanical <strong>Systems</strong> (MEMS) is a relatively<br />

new way of making complex electromechanical systems<br />

using batch fabrication techniques adapted from <strong>the</strong><br />

Integrated Circuit (IC) industry. MEMS are highly<br />

miniaturized devices that can include biological, optical,<br />

fluidic, magnetic, and o<strong>the</strong>r systems on a single silicon<br />

chip [1, 2]. Being inherently smaller, lighter, cheaper and<br />

faster than <strong>the</strong>ir macroscopic counterparts, MEMS<br />

devices can open new opportunities for product innovation<br />

in many different areas. Never<strong>the</strong>less, despite <strong>the</strong> clear<br />

potential of this new field <strong>the</strong> growth of <strong>the</strong> market has<br />

been slower than predicted in <strong>the</strong> past few years. There<br />

may be a number of reasons underlying this resistance to<br />

<strong>the</strong> emerging technology. These might include perceived<br />

risks, expensive fabrication, long development cycles and<br />

high costs associated with MEMS products. As in o<strong>the</strong>r<br />

mature disciplines, <strong>the</strong> incorporation of Computer Aided<br />

Design tools to <strong>the</strong> design process can help to reduce <strong>the</strong><br />

long development times associated with MEMS. In<br />

contrast to microelectronics, a MEMS designer has to<br />

optimize three dimensional structures. The simulation<br />

approach, as opposed to <strong>the</strong> heuristic design approach<br />

that relies on <strong>the</strong> fabrication know-how of a few experts, is<br />

gaining wider acceptance amongst <strong>the</strong> MEMS community.<br />

These simulations not only enable <strong>the</strong> interpretation of<br />

limited experimental data but also enable <strong>the</strong> designer to<br />

explore <strong>the</strong> entire parameter space that influences <strong>the</strong><br />

performance of a device.<br />

The modelling strategy [3] adopted in this paper is<br />

twofold. Firstly, to find a simplified analytical model to<br />

capture <strong>the</strong> essential device behaviour and to gain insight<br />

into its operation without employing excessive<br />

computational resources. Secondly, to use finite-element<br />

software to create a more rigorous and accurate 3D<br />

model (virtual prototype) of <strong>the</strong> system capable of<br />

providing an accurate and detailed description of <strong>the</strong><br />

system with high spatial resolution. Good correlation<br />

between <strong>the</strong> virtual model and experimental data validates<br />

59<br />

<strong>the</strong> model, and encourages its use in <strong>the</strong> evaluation of <strong>the</strong><br />

design-environment space: for example, using different<br />

structural materials, various surrounding media and<br />

diverse boundary conditions.<br />

2 THE MICROGRIPPER<br />

In this paper, we use this approach to produce a virtual<br />

prototype of a MEMS micro actuator. The basic device<br />

used for this study is an electro-<strong>the</strong>rmally actuated microgripper<br />

[4].The principle of operation is <strong>the</strong> well<br />

established one-hot-arm <strong>the</strong>rmal actuator. Figure 1 shows<br />

<strong>the</strong> basic scheme of a <strong>the</strong>rmal U-shaped micro-actuator of<br />

this type. The actuation structure, composed of two<br />

adjacent micro beams, deflects in-plane at its tips by <strong>the</strong><br />

asymmetrical <strong>the</strong>rmal expansion of its constituent parts<br />

which have variable cross-sections and lengths.<br />

Thus, after <strong>the</strong> application of a current through <strong>the</strong><br />

conducting layer, <strong>the</strong> thinner arm (hot arm) with a higher<br />

resistance will heat more than <strong>the</strong> wider arm (cold arm)<br />

and <strong>the</strong>refore will expand more. As both arms are<br />

connected at <strong>the</strong>ir free ends an in-plane deflection around<br />

Figure 1: (a) simplified one-dimensional coordinate<br />

system (b) in-plane deflection (c) Schematic of a<br />

traditional one-hot-arm actuator


<strong>the</strong> z axis will take place. The micro-gripper consists of<br />

two such micro actuators positioned face to face (see<br />

Figure 2). The actuating structure of <strong>the</strong> micro-gripper is<br />

composed of two layers: a structural dielectric layer of <strong>the</strong><br />

polymer SU8 [5, 6] and a thin conducting layer of Cr/Au.<br />

The jaws are made of SU8 exclusively. The <strong>the</strong>rmal<br />

expansion of <strong>the</strong> SU8 is achieved through <strong>the</strong> resistive<br />

heating of <strong>the</strong> gold layer.<br />

Given <strong>the</strong> biological end application of <strong>the</strong> micro-gripper,<br />

<strong>the</strong> maximum operating temperature will be limited to<br />

360K to avoid <strong>the</strong>rmal degradation of <strong>the</strong> biological<br />

samples that have to be manipulated. Some physical<br />

properties of <strong>the</strong> polymer SU8 such as its biocompatibility,<br />

structural rigidity and large <strong>the</strong>rmal expansion coefficient<br />

make it an ideal material for biological application inside<br />

physiological-aqueous media[5, 6]. The high coefficient of<br />

expansion permits low temperature difference activation<br />

and <strong>the</strong>refore low activation voltages that are necessary if<br />

electrolysis is to be avoided. Some experimental data has<br />

been reported in this direction for <strong>the</strong> manipulation of cells<br />

in-vitro.<br />

Figure 2: Schematic of <strong>the</strong> layers of <strong>the</strong> micro-gripper<br />

2.1 Modelling Background<br />

The type of <strong>the</strong>rmal in-plane actuator (TIM) shown in<br />

Figure 1 has been extensively studied in <strong>the</strong> literature in<br />

its embedded actuation version, where <strong>the</strong> same material<br />

is used to produce <strong>the</strong> heating and <strong>the</strong> desired expansion.<br />

This in-plane actuator, usually fabricated from poly-silicon<br />

and separated from <strong>the</strong> substrate by a small air gap, has<br />

been demonstrated, and many analytical and finite<br />

element models (FEM) models [7] have been developed.<br />

Also topology optimization techniques have been applied<br />

to <strong>the</strong> design of this type of actuator[8, 9]. However <strong>the</strong><br />

actuators composing our micro-gripper are not an<br />

embedded type TIM. Here <strong>the</strong> conducting layer is<br />

intended only to provide heating and not to produce any<br />

mechanical effects which, unlike <strong>the</strong> TIM, have to be<br />

avoided. Moreover, <strong>the</strong> overhanging configuration of <strong>the</strong><br />

micro-gripper, toge<strong>the</strong>r with <strong>the</strong> high thickness of <strong>the</strong> bilayer<br />

structure and <strong>the</strong> relatively small gap separating <strong>the</strong><br />

arms, can affect <strong>the</strong> <strong>the</strong>rmal behaviour of <strong>the</strong> system and<br />

<strong>the</strong>refore <strong>the</strong> steady-state temperature profile which<br />

causes <strong>the</strong> deflection.<br />

In this context, <strong>the</strong>re exists <strong>the</strong> need to develop fur<strong>the</strong>r<br />

such analytical and FEM models to characterise <strong>the</strong><br />

micro-gripper more accurately. Here, we combine<br />

analytical and FEM approaches to fully characterise <strong>the</strong><br />

deflection of <strong>the</strong> micro-actuator in steady state conditions.<br />

3 MODELLING THE MICROGRIPPER<br />

Imposing <strong>the</strong> correct boundary conditions in finite-element<br />

analysis is important because a change in <strong>the</strong> type of<br />

boundary condition (BC) can modify <strong>the</strong> simulated<br />

behaviour of <strong>the</strong> system. The deflection of <strong>the</strong> micro-<br />

gripper is controlled by <strong>the</strong> steady-state temperature<br />

profile developed along its constituent parts which in turn<br />

causes <strong>the</strong>rmal expansion. As such, correct<br />

implementation of <strong>the</strong> <strong>the</strong>rmal boundary conditions is<br />

crucial for <strong>the</strong> modelling of <strong>the</strong> micro-gripper. The first<br />

step towards establishing <strong>the</strong>se conditions is to perform a<br />

detailed <strong>the</strong>rmal analysis of <strong>the</strong> system. Moreover, a good<br />

understanding of <strong>the</strong> physics underlying <strong>the</strong> <strong>the</strong>rmal<br />

behaviour of <strong>the</strong> device should provide more complete<br />

and accurate simulations. In addition, this understanding<br />

should promote a more efficient use of those simulations,<br />

and consequently a better performance of <strong>the</strong> overall<br />

modelling process<br />

3.1 1-D Electro <strong>the</strong>rmal analysis<br />

Intrinsic to <strong>the</strong> functionality of <strong>the</strong> micro-gripper is its<br />

interaction with <strong>the</strong> environment and with <strong>the</strong> biological<br />

samples that have to be manipulated. An examination of<br />

this configuration indicates that, a priori, all three modes<br />

of heat transfer, namely conduction, convection, and<br />

radiation could take place. Conduction along <strong>the</strong> bi-layer<br />

beam structure to <strong>the</strong> anchors on <strong>the</strong> substrate, coupled<br />

diffusion-convection heat transfer to <strong>the</strong> surrounding<br />

fluidic media, radiation exchange with cooler<br />

surroundings, and also internal heat exchange between<br />

device elements at different temperatures (Figure 3 (b)).<br />

Since <strong>the</strong> characteristic dimensions are very much greater<br />

in <strong>the</strong> x direction, a one-dimensional model is adequate to<br />

describe <strong>the</strong> heat transfer mechanisms taking place in <strong>the</strong><br />

system [10]. Thus, <strong>the</strong> heat transfer relations for each arm<br />

of <strong>the</strong> micro-gripper can be obtained by applying an<br />

energy balance to an infinitesimal volume element (w x z x<br />

∆x) of any of <strong>the</strong> arms (Figure 3 (a))<br />

P<br />

60<br />

. . .<br />

g = q c + q dc + q r<br />

(1)<br />

where <strong>the</strong> term Pg is <strong>the</strong> electrical power generated in <strong>the</strong><br />

volume element, qc is <strong>the</strong> heat rate lost by conduction, qdc<br />

is <strong>the</strong> heat rate lost by a coupled diffusion-conduction<br />

phenomenon and qr is <strong>the</strong> heat rate lost by radiation to <strong>the</strong><br />

environment. At steady-state <strong>the</strong> heat generated within<br />

<strong>the</strong> infinitesimal volume will be entirely dissipated to<br />

maintain <strong>the</strong> steady-state temperature profile.<br />

Figure 3: (a) 1D infinitesimal volume element (b) Heat<br />

losses in steady-state (cross section view)<br />

The power Pg is generated by current flowing through <strong>the</strong><br />

gold layer of <strong>the</strong> element which acts as a resistor and<br />

causes internal heat generation (Joule heating). The<br />

power dissipated by this element per unit volume per unit<br />

time can be calculated by using (2). In general, <strong>the</strong><br />

resistivity of a conductor is temperature dependent.<br />

However, given <strong>the</strong> low range of operating temperatures<br />

(Tmax ≈ 360K) of <strong>the</strong> micro-gripper, ρ| ∆x can be<br />

considered,for practical purposes as a constant.


P g<br />

2<br />

I ρ<br />

= ∆x<br />

w z<br />

where I [A] is <strong>the</strong> current flowing through <strong>the</strong> conductor,<br />

and ρ| ∆x [Ω m] is <strong>the</strong> resistivity of <strong>the</strong> conductor element.<br />

The conduction term (qc) in (1), is defined as <strong>the</strong> addition<br />

of heat conducted through <strong>the</strong> volume element plus <strong>the</strong><br />

heat conducted through <strong>the</strong> fluidic gap that separates <strong>the</strong><br />

element and <strong>the</strong> opposed arm. The nature of this last term<br />

will be determined by <strong>the</strong> relative size of <strong>the</strong> gap between<br />

<strong>the</strong> arms and <strong>the</strong> wall height. Assuming <strong>the</strong> gap size to be<br />

smaller than <strong>the</strong> height of <strong>the</strong> wall (gap


Figure 4: 3D model of <strong>the</strong> <strong>the</strong>rmal micro actuator generated by Coventorware TM<br />

Once <strong>the</strong> geometrical model has been built, a Manhattan<br />

or brick meshing with hexahedral second order elements<br />

is used in <strong>the</strong> model. The Manhattan Meshing has been<br />

chosen because it provides <strong>the</strong> most accurate results [11]<br />

for all <strong>the</strong> solvers within <strong>the</strong> software when <strong>the</strong> geometry<br />

of <strong>the</strong> 3D model is such that it only contains 90 degree<br />

angles as in <strong>the</strong> case of <strong>the</strong> micro-gripper under study.<br />

The elements were rectangular with variable dimension<br />

between 10x10x10 µm to a minimum size of 2x2x0.15 µm<br />

and 27-nodes. The actuator was modelled with<br />

approximately 6160 volume elements and 4528 surface<br />

elements. The air is modelled with roughly 85000 volume<br />

elements and 16000 surface elements. The size of <strong>the</strong><br />

elements was chosen after a convergence analysis.<br />

Description Value (µm)<br />

Width hot arm (whot), SU8 7<br />

Width hot arm (whot), Gold 2<br />

Width cold arm (wcold), SU8 22<br />

Width cold arm (wcold), Gold 11<br />

Width flexure arm (wflexure), SU8 6<br />

Width flexure arm (wflexure), Gold 4<br />

Length hot arm (Lhot) 200<br />

Length cold arm (Lhot) 140<br />

Thickness (zSU8), SU8 20<br />

Thickness (zAu), Gold 0.3<br />

Gap 11<br />

Table 2(a): Dimensions for <strong>the</strong> micro gripper<br />

Description Units Value<br />

Young's modulus (E), SU8 GPa 4.4<br />

Young's modulus (E), Gold GPa 57<br />

Coefficient of <strong>the</strong>rmal expansion (CTE), SU8 ppm/K 50<br />

Coefficient of <strong>the</strong>rmal expansion (CTE), Gold ppm/K 14.1<br />

Thermal conductivity (κSU8), SU8 W/m K 0.2<br />

Thermal conductivity (κAu), Gold W/m K 297<br />

Thermal conductivity (κAir) W/m K 0.026<br />

Electrical Conductivity (σ), Gold (300K) S/m 4.40E+07<br />

Electrical Conductivity (σ), Gold (400K) S/m 3.21E+07<br />

Electrical Conductivity (σ), Gold (500K) S/m 2.51E+07<br />

Electrical Conductivity (σ), Gold (600K) S/m 2.05E+07<br />

Electrical Conductivity (σ), Gold (700K) S/m 1.71E+07<br />

Table 2(b): Thermo physical properties used in <strong>the</strong><br />

simulation<br />

Fixing Boundary conditions<br />

Based on <strong>the</strong> results of <strong>the</strong> simplified <strong>the</strong>rmal model, <strong>the</strong><br />

boundary conditions to <strong>the</strong> behavioural analysis can be<br />

established<br />

• Electrical BC’s:<br />

Electric currents have been induced along <strong>the</strong> actuator<br />

using a constant-current boundary condition. The<br />

resistance of <strong>the</strong> gold circuit of <strong>the</strong> micro gripper is 19.6Ω .<br />

Thus an applied current of 10.2 mA to <strong>the</strong> contact pads of<br />

<strong>the</strong> gold circuit results in a generated input power of<br />

approximately 2mW. For <strong>the</strong> initial simulations, a<br />

constant-current boundary condition has been considered<br />

to be better suited than a constant-voltage boundary<br />

conditions, as it allows a comparison of both <strong>the</strong><br />

simulation results and <strong>the</strong> experimental data, whilst<br />

excluding <strong>the</strong> influence of o<strong>the</strong>r parameters linked to <strong>the</strong><br />

experimental set-up, e.g. <strong>the</strong> wiring.<br />

62


• Mechanical BC’s<br />

The anchor which provides mechanical support and<br />

connection to <strong>the</strong> substrate has been assumed to be fixed<br />

at all its sides.<br />

• Thermal BC’s<br />

The base of <strong>the</strong> anchor has been maintained at room<br />

temperature which implies that <strong>the</strong> anchor is <strong>the</strong>rmally<br />

grounded by being in contact with a large <strong>the</strong>rmal sink.<br />

Later in this paper we will evaluate <strong>the</strong> significance of this<br />

BC.<br />

Given <strong>the</strong> low value (∼ 10 -5 ) of <strong>the</strong> Grashoff number<br />

associated with a device of <strong>the</strong> size of <strong>the</strong> micro-gripper, it<br />

can be considered that <strong>the</strong> dominant phenomena at this<br />

scale is pure conduction as opposed to convection [12].<br />

Having established this, a simple approach to model <strong>the</strong><br />

device in air would be to place conducting air elements all<br />

around <strong>the</strong> micro-gripper [13] and to fix <strong>the</strong> outer faces of<br />

<strong>the</strong> air at ambient temperature. However, it has been<br />

numerically verified that to avoid influencing <strong>the</strong> simulation<br />

results it is necessary to simulate a cube of air of at least<br />

200x200x800 µm in volume. This is substantially larger<br />

than <strong>the</strong> scale of <strong>the</strong> gripper itself, and would require<br />

substantial computational resource to solve. Therefore, in<br />

order to avoid long computational times, ano<strong>the</strong>r<br />

modelling approach is proposed to take into account <strong>the</strong><br />

losses to air. Firstly, inclusion of a modest number of air<br />

elements in <strong>the</strong> gap between <strong>the</strong> hot and cold (flexure)<br />

arms will account for intra device heat exchange.<br />

Secondly, <strong>the</strong> inclusion of a general heat convection term<br />

or parameter for <strong>the</strong> exposed surfaces (see figure 5(b)),<br />

will describe convective/conductive heat loss to <strong>the</strong><br />

ambient. To do that it is necessary to introduce in <strong>the</strong><br />

software a heat transfer coefficient to air at <strong>the</strong> exposed<br />

surfaces. This coefficient can be obtained running one<br />

simulation with <strong>the</strong> whole volume of air and extracting <strong>the</strong><br />

temperatures and heat losses in each surface. Thus using<br />

equation (6) h can be calculated.<br />

κ ∞ ∗ Heatloss<br />

at <strong>the</strong> surface<br />

h =<br />

T − T<br />

s<br />

∞<br />

The average value obtained for <strong>the</strong> whole micro gripper is<br />

1070 Wm -2 K -1 .<br />

To finalize <strong>the</strong> implementation of <strong>the</strong> <strong>the</strong>rmal boundary<br />

conditions, an effective heat transfer coefficient has been<br />

included at <strong>the</strong> end connection of <strong>the</strong> hot arm to account<br />

for <strong>the</strong> heat losses associated with <strong>the</strong> jaw of <strong>the</strong> microgripper.<br />

This coefficient has been analytically calculated<br />

and implemented in <strong>the</strong> calculations with a value of<br />

4450Wm -2 K -1 .<br />

• Material properties<br />

The electrical conductivity of <strong>the</strong> conducting layer is<br />

dependent on <strong>the</strong> temperature and <strong>the</strong> simulations uses a<br />

look-up table to access values. The corresponding values<br />

are shown in Table 2 (a).<br />

4 VALIDATION OF THE 3D MODEL<br />

The geometry of <strong>the</strong> micro-gripper used for <strong>the</strong> first<br />

simulation is identical to <strong>the</strong> geometry for which<br />

experimental data have been previously published [4].The<br />

most relevant dimensions are summarised in Table 2.<br />

The in-plane tip deflection of <strong>the</strong> <strong>the</strong>rmal actuator was<br />

investigated by systematically applying increasing<br />

voltages to <strong>the</strong> contact pads at <strong>the</strong> anchors. For each of<br />

<strong>the</strong>se simulations it is possible to extract simultaneously<br />

<strong>the</strong> deflection versus <strong>the</strong> applied power or <strong>the</strong> deflection<br />

versus <strong>the</strong> maximum or average temperature in <strong>the</strong> hot<br />

arm. For example, inspection of Figure 5 (a) reveals that<br />

for an applied current of 11.2 mA <strong>the</strong> deflection at its tips<br />

is 1.22µm. At <strong>the</strong> same time inspection of figure 5 (b)<br />

shows that <strong>the</strong> hot arm reaches a maximum temperature<br />

of 366K.<br />

Figure 5:3D Simulation results (a) Deflection with an applied current of 11.2mA<br />

Figure 5(b): Temperature distribution with an applied current of 11.2 mA (Left flexure and cold arm, right hot arm)<br />

63<br />

(6)


At this stage of <strong>the</strong> work, it is interesting to compare <strong>the</strong><br />

simulation results with <strong>the</strong> available experimental data.<br />

Figure 6 shows <strong>the</strong> dependence of <strong>the</strong> deflection versus<br />

induced current in air. The data have been extracted from<br />

simulation and approximate experimental data. The net<br />

displacement in <strong>the</strong> simulation has been calculated at <strong>the</strong><br />

end of <strong>the</strong> actuator (x=200µm) and at <strong>the</strong> middle of <strong>the</strong><br />

hot arm. The y axis indicates <strong>the</strong> net displacement of <strong>the</strong><br />

jaws of <strong>the</strong> micro gripper from its rest position. Depending<br />

on <strong>the</strong> initial separation of <strong>the</strong> two jaws, bodies ranging in<br />

size from two microns in diameter and upwards can be<br />

grasped.<br />

Displacement (um)<br />

12<br />

10<br />

8<br />

6<br />

4<br />

2<br />

0<br />

Approximate experimental data FEA Data in Air<br />

6.0 7.0 8.0 9.0 10.0 11.0 12.0 13.0<br />

Currrent (mA)<br />

Figure 6: (a) Deflection versus induced current between<br />

<strong>the</strong> contact pads.<br />

There is a good agreement between <strong>the</strong> trends in <strong>the</strong><br />

FEA results and experimental data. At low displacements<br />

<strong>the</strong> difference between <strong>the</strong> experimental results and<br />

simulation is bigger, but it is difficult to say whe<strong>the</strong>r this<br />

difference comes from <strong>the</strong> FEA model or from <strong>the</strong><br />

measurements <strong>the</strong>mselves. It will be possible to analyse<br />

this difference when our experimental results are<br />

available.<br />

5 MODEL-BASED SIMULATION PREDICTIONS<br />

The clear and substantial correlation between<br />

experimental and FE data encourage <strong>the</strong> use of <strong>the</strong><br />

proposed model to study <strong>the</strong> influence of boundary<br />

conditions, material properties and geometry of <strong>the</strong> microgripper<br />

prior to its fabrication.<br />

5.1 Boundary conditions at <strong>the</strong> anchors<br />

The choice of <strong>the</strong> <strong>the</strong>rmal BC at <strong>the</strong> anchors is important<br />

because it can modify considerably <strong>the</strong> overall heat<br />

losses in <strong>the</strong> device. Mankame et al [7] demonstrated that<br />

imposing a finite heat loss under <strong>the</strong> anchors of an<br />

embedded TIM via <strong>the</strong> introduction of an insulator (glass)<br />

can increase considerably <strong>the</strong> energy efficiency of <strong>the</strong><br />

system. Theoretically, under <strong>the</strong> same applied input<br />

power, a higher temperature will be attained by <strong>the</strong> hot<br />

arm, increasing <strong>the</strong> overall temperature of <strong>the</strong> actuator.<br />

This may give a higher deflection for <strong>the</strong> whole system,<br />

although it is <strong>the</strong> temperature difference between <strong>the</strong> hot<br />

and cold arms that drives <strong>the</strong> deflection. Figure 7 depicts<br />

<strong>the</strong> anchor of <strong>the</strong> micro gripper and <strong>the</strong> associated<br />

<strong>the</strong>rmal resistance with <strong>the</strong> introduction of a glass<br />

substrate.<br />

To avoid long computational times <strong>the</strong> glass substrate,<br />

with a thickness of 4 mm, is simulated by an effective<br />

64<br />

heat loss applied to <strong>the</strong> base anchor. This effective<br />

coefficient (h’) is given by<br />

Figure 7: (a) Anchor <strong>the</strong>rmally grounded (b) Anchor<br />

<strong>the</strong>rmally isolated<br />

R κ<br />

g = 1 / h'<br />

= z glass / glass<br />

(7)<br />

where κglass (0.96 W/m K) and zglass are <strong>the</strong> <strong>the</strong>rmal<br />

conductivity and <strong>the</strong> thickness of <strong>the</strong> glass plate<br />

respectively.<br />

Using (7) <strong>the</strong> value obtained for h’ is calculated and is<br />

fixed in <strong>the</strong> simulations to a value of 245 Wm -2 K -1 .<br />

Temperature (K)<br />

353<br />

333<br />

313<br />

293<br />

Grounded Anchor Thermally Isolated Anchor<br />

0 50 100 150 200 250 300 350 400<br />

x position along <strong>the</strong> micro actuator (um)<br />

Figure 8 (a): Temperature profile (10.2mA) along <strong>the</strong><br />

actuator under two different boundary conditions at <strong>the</strong><br />

anchor (See Figure 1(a) for coordinate system).<br />

Displacement (um)<br />

FEA Data Anchor Grounded FEA Data Anchor Thermally Isolated<br />

12<br />

10<br />

8<br />

6<br />

4<br />

2<br />

0<br />

7.5 8.5 9.5 10.5 11.5 12.5<br />

Currrent (mA)<br />

Figure 8 (b): Deflection versus induced current between<br />

<strong>the</strong> contact pads from experimental data with two<br />

different BC’s at <strong>the</strong> anchor; anchor grounded and anchor<br />

Thermally isolated.


Figure 8(a) shows <strong>the</strong> resulting temperature profile along<br />

<strong>the</strong> micro gripper arms (see coordinate system in Figure<br />

1(a)) under two BC´s at <strong>the</strong> anchors representing a<br />

grounded anchor (Figure 7(a)) and a <strong>the</strong>rmally isolated<br />

anchor (Figure 7(b)). Figure 8(b) shows <strong>the</strong> improved<br />

deflection of <strong>the</strong> micro gripper with an insulated anchor.<br />

As can be seen, for <strong>the</strong> same input power a 5%<br />

improvement in deflection is achieved. Bigger deflections<br />

could be obtained changing <strong>the</strong> thickness and <strong>the</strong><br />

properties of <strong>the</strong> insulating layer.<br />

These results also indicate that <strong>the</strong> model with <strong>the</strong>rmally<br />

isolated anchors can be chosen only when <strong>the</strong> associated<br />

higher operating temperatures are acceptable.<br />

5.2 Impact of <strong>the</strong> gap size<br />

In this section <strong>the</strong> influence of <strong>the</strong> size of <strong>the</strong> gap between<br />

<strong>the</strong> arms of <strong>the</strong> actuators is studied. The same electrical<br />

power of 2mW is maintained for three simulations with 3<br />

different gap sizes: 5.5µm (model 1), 11µm (model 2) and<br />

22µm (model 3). Figure 9 and 10 illustrate for each of <strong>the</strong><br />

models <strong>the</strong> temperature profile developed along <strong>the</strong><br />

actuators and <strong>the</strong> net deflection in <strong>the</strong> y direction. Table 3<br />

summarizes <strong>the</strong> results of <strong>the</strong> models.<br />

The temperature profiles presented in figure 9 indicate<br />

that <strong>the</strong> simplified electro <strong>the</strong>rmal model proposed in<br />

section 3 correctly describes <strong>the</strong> <strong>the</strong>rmal behaviour of <strong>the</strong><br />

micro gripper. As predicted, <strong>the</strong> temperature difference<br />

between <strong>the</strong> hot and cold arm increase with <strong>the</strong> gap size.<br />

This fact validates <strong>the</strong> assumption of <strong>the</strong> simplified<br />

analytical model that considers a non-negligible amount<br />

of heat transfer through <strong>the</strong> air gap. This heat exchange<br />

toge<strong>the</strong>r with <strong>the</strong> heat loss to <strong>the</strong> ambient dominates <strong>the</strong><br />

heat transfer phenomena in <strong>the</strong> whole micro-gripper.<br />

Temperature (K)<br />

353<br />

343<br />

333<br />

323<br />

313<br />

303<br />

293<br />

Model 1 (gap= 5.5 microns) Model 3 (gap=22 microns)<br />

Model 2 (gap=11 microns)<br />

0 50 100 150 200 250 300 350 400<br />

x position along <strong>the</strong> micro actuator (um)<br />

Figure 9: Temperature profile along <strong>the</strong> arms of <strong>the</strong> micro<br />

actuators with a <strong>the</strong>rmally grounded anchor and an<br />

applied current of 10.2mA<br />

Model 1<br />

(gap=5.5 µm)<br />

Model 2<br />

(gap=11 µm)<br />

Model 3<br />

(gap=22 µm)<br />

T maximum 342.61 347.31 352.08<br />

T average actuator 32.99 33.72 34.32<br />

T average hot arm (Th) 37.40 40.34 43.40<br />

T average cold arm (Tc) 31.13 29.81 28.10<br />

T average flexure 22.64 20.75 18.62<br />

Th-Tc 6.28 10.54 15.30<br />

Deflection maximum 1.18 1.22 1.05<br />

Temperatures relatives to <strong>the</strong> ambien temperature (293K)<br />

Table3: Temperature and deflection relevant data, same<br />

input power (2mW) for models 1, 2 and 3.<br />

65<br />

Figure 10: (a) Deflection model 1 (gap=5.5µm) with an<br />

input power of 2mW (b) Deflection model 2 (gap=11µm)<br />

with an input power of 2mW (c) Deflection model 3 (gap=<br />

22µm)<br />

The net deflection in <strong>the</strong> y axis for <strong>the</strong> model is shown in<br />

Figure 10 and reveals net deflections of 1.10µm, 1.13µm<br />

and 0.97µm for <strong>the</strong> models 1, 2 and 3 of respectively.<br />

These deflection results indicate that <strong>the</strong> impact of <strong>the</strong><br />

end connection of <strong>the</strong> actuator is also important. Thus<br />

model 2 with a smaller gap (50% smaller than model 3)<br />

and a lower change in average change in temperature<br />

(32% lower) produce <strong>the</strong> highest deflection of <strong>the</strong> three<br />

models (16% higher)<br />

These results also reveal that for an increasing size gap,<br />

between 5.5 and 11 µm, <strong>the</strong> higher <strong>the</strong> difference in<br />

temperature between <strong>the</strong> two arms <strong>the</strong> higher <strong>the</strong><br />

deflection. However this trend seems to be interrupted<br />

when <strong>the</strong> size of <strong>the</strong> gap approaches <strong>the</strong> size of 22 µm.<br />

Simulations run with o<strong>the</strong>r gap sizes indicate that a gap<br />

size of 11 µm is near <strong>the</strong> optimal value for an input of<br />

10.2mA


6 CONCLUSIONS AND FUTURE WORK<br />

Simplified electro <strong>the</strong>rmal and FEA models for a SU8<br />

<strong>the</strong>rmally actuated micro-gripper have been developed. In<br />

those models, <strong>the</strong> heat conducted between opposing<br />

arms of <strong>the</strong> actuator and <strong>the</strong> heat dissipated to <strong>the</strong> air,<br />

have been taken into account. The FEA model also takes<br />

into account <strong>the</strong> dependence of <strong>the</strong> conductivity with<br />

temperature. The good correlation of <strong>the</strong> FEA model with<br />

experimental data validates <strong>the</strong> model and encourages<br />

<strong>the</strong> use of it for <strong>the</strong> virtual testing of different conditions at<br />

<strong>the</strong> device anchors and under different geometries. It has<br />

been confirmed that imposing a finite heat loss at <strong>the</strong><br />

base of <strong>the</strong> anchors increase <strong>the</strong> efficiency of <strong>the</strong> system.<br />

Equivalently it has been demonstrated that <strong>the</strong> size of <strong>the</strong><br />

gap is of critical importance. Fur<strong>the</strong>r work on a more<br />

detailed electro <strong>the</strong>rmal model has shown promising<br />

results. We will shortly be validating those models against<br />

our experimental data.<br />

References<br />

[1] J. Judy, "Microelectromechanical systems:<br />

fabrication, design and applications," Smart<br />

materials and structures, vol. 10, pp. 1105-1134,<br />

2001.<br />

[2] J. M. Madou, Fundamentals of Microfabrication,<br />

2nd edition ed, 2002.<br />

[3] S. D. Senturia, Microsystem Design, 3rd Edition<br />

ed, 2001.<br />

[4] N. Chronis and L. P. Lee, "Polymer MEMSbased<br />

Microgripper for single cell manipulation,"<br />

presented at Micro Electro Mechanical <strong>Systems</strong>,<br />

17th IEEE International Conference on. (MEMS),<br />

2004.<br />

[5] E. H. Conradie and D. F. Moore, "SU-8 thick<br />

photoresist processing as a functional material<br />

for MEMS applications," Journal of<br />

microelectromechanics and Microengineering,<br />

vol. 12, pp. 368-371, 2002.<br />

[6] "http://aveclafaux.freeservers.com/SU-8.html,"<br />

1999.<br />

[7] N. D. Mankame and G. K. Ananthasuresh,<br />

"Comprehensive <strong>the</strong>rmal modelling and<br />

characterisation of an electro-<strong>the</strong>rmal-compliant<br />

microactuator," Journal of Micromechanics and<br />

Microengineering, vol. 11, pp. 452-462, 2001.<br />

[8] J. Jonsmann, O. Sigmund, and S. Bouwstra,<br />

"Compliant electro<strong>the</strong>rmal microactuators,"<br />

presented at IEEE Microelectromechanical<br />

<strong>Systems</strong> (MEMS), Orlando FL, 1999.<br />

[9] O. Sigmund, "Design of multiphysics actuators<br />

using topology optimization," Computational<br />

Methods Applied Mechanical Engineering, vol.<br />

190, pp. 6577-6604, 2001.<br />

[10] L. Lin and A. P. Pisano, "Bubble forming on a<br />

micro line heater," presented at MEMS, ASME<br />

Winter Annual meeting, Atlanta, 1991.<br />

[11] Coventor, "www.coventor.com," 2004.<br />

66<br />

[12] F. P. Incropera and D. P. DeWitt, Introduction to<br />

Heat Transfer, 3rd Edition ed, 1996.<br />

[13] A. A. Geisberger, N. Sarkar, M. Ellis, and G. D.<br />

Skidmore, "Electro<strong>the</strong>rmal properties an<br />

modeling of Polysilicon Micro<strong>the</strong>rmal Actuators,"<br />

Journal of Microelectromechanical <strong>Systems</strong>, vol.<br />

12, pp. 513-523, 2003.


The Applicability of CoventorWare to RF MEMS<br />

A.J. Gallant and D. Wood<br />

Microsystems Technology Group, School of Engineering<br />

University of Durham, Durham, England DH1 3LE<br />

Abstract<br />

RF MEMS devices are technologically well placed to enter <strong>the</strong> high volume market of wireless<br />

communications. However, simulation tools for <strong>the</strong> rapid virtual prototyping of RF MEMS are relatively<br />

immature. This paper examines <strong>the</strong> applicability of CoventorWare TM , commercial MEMS simulation<br />

software, to RF MEMS design. This is assessed through <strong>the</strong> case study of a widely micromachined<br />

tunable capacitor which has been developed at <strong>the</strong> University of Durham. The software was found to be<br />

effective at identifying approximate device operating regimes. However, <strong>the</strong> lack of accurate models for<br />

surface topology, reliability and RF simulation capabilities significantly impair its suitability for effective RF<br />

MEMS prototyping.<br />

Keywords:<br />

RF MEMS, varactor, microsystems, CoventorWare TM<br />

1 INTRODUCTION<br />

In recent years, primarily through <strong>the</strong> rapid uptake of<br />

mobile telephony, <strong>the</strong> wireless communications industry<br />

has been forced to adopt high volume production<br />

techniques. Continuous technological advances have led<br />

to exceptionally short product lifecycles which typically<br />

can be quantified in months.<br />

The functionality of <strong>the</strong> mobile telephone now extends far<br />

beyond basic wireless communications. The inclusion of<br />

on-board cameras and personal organisers reduces <strong>the</strong><br />

space available for <strong>the</strong> radio frequency (RF) circuitry. In<br />

parallel, <strong>the</strong> consumer is demanding improved<br />

performance through better reception quality and battery<br />

lifetimes.<br />

Microelectronics achieves miniaturisation through single-<br />

chip solutions. These remove components from <strong>the</strong><br />

printed circuit board and transfer functionality onto <strong>the</strong><br />

microchip. However due to substrate and dielectric<br />

losses, many solid-state microelectronic solutions show<br />

poor RF performance.<br />

In recent years, microsystems technology has been used<br />

to miniaturise electromechanical RF devices.<br />

Micromachined RF switches, resonators, capacitors and<br />

inductors have all been demonstrated [1]. These are<br />

commonly referred to as RF MEMS (Radio Frequency<br />

MicroElectroMechanical <strong>Systems</strong>) and have shown<br />

improved performance over solid-state equivalents.<br />

RF MEMS devices share many fabrication processes<br />

with ICs and are <strong>the</strong>refore well suited for integration. This<br />

is extremely attractive to <strong>the</strong> wireless industry because it<br />

reduces <strong>the</strong> number of printed circuit board components,<br />

which in turn drives down manufacturing costs.<br />

This paper focuses on <strong>the</strong> electromechanical simulation<br />

of micromachined tunable capacitor structures using<br />

CoventorWare TM . This modelling package has been used<br />

extensively as part of an ongoing project to develop<br />

widely tunable capacitors. However, <strong>the</strong>se devices<br />

successfully highlight many shortfalls associated with <strong>the</strong><br />

use of CoventorWare TM for RF MEMS simulations. In<br />

particular, <strong>the</strong>se include an inadequate representation of<br />

67<br />

surface topology and <strong>the</strong> lack of RF and reliability<br />

simulation tools.<br />

2 BACKGROUND<br />

Electrostatic tuning is preferred for RF MEMS structures<br />

because it enables high switching speeds whilst<br />

minimising power consumption. A key consideration with<br />

electrostatically tuned devices is an electromechanical<br />

instability known as pull-in [2]. This is where <strong>the</strong><br />

electrostatic force of attraction cannot be countered by<br />

<strong>the</strong> mechanical restoring force. Electrical control is lost<br />

and <strong>the</strong> electrodes snap toge<strong>the</strong>r.<br />

In RF MEMS switches, pull-in is advantageous because it<br />

is used to ensure a high contact force and <strong>the</strong>refore low<br />

contact resistance. In gap tuning capacitors, however, it<br />

can limit <strong>the</strong> tuning range.<br />

Gap tuning capacitors use <strong>the</strong> variation of <strong>the</strong> distance<br />

between two electrodes to alter <strong>the</strong> capacitance. An<br />

important advantage of <strong>the</strong> gap tuning capacitor is that it<br />

can be fabricated using relatively planar thin film<br />

technologies which are better suited to integration with<br />

existing ICs.<br />

Figure 1 shows a typical electrostatically biased parallel<br />

plate device configuration. As a voltage is applied<br />

between <strong>the</strong> movable driving electrode and <strong>the</strong> fixed<br />

ground electrode, electrostatic attraction reduces <strong>the</strong><br />

gap. This increases <strong>the</strong> capacitance.<br />

Figure 1: A simple parallel plate micromachined capacitor<br />

arrangement


For stable tuning, <strong>the</strong> restoring spring force must counter<br />

<strong>the</strong> electrostatic force of attraction. Because of <strong>the</strong> pull-in<br />

phenomenon this can be shown to only occur for<br />

displacements of up to a third of <strong>the</strong> unbiased gap.<br />

Therefore, in an ideal, parallel plate, single gap capacitor<br />

<strong>the</strong> maximum tuning ratio is 1.5:1. In reality, however,<br />

<strong>the</strong> ideal arrangement may not be a good approximation.<br />

Deviation from parallel plate scenario can have<br />

significant effects on pull-in. CoventorWare TM readily<br />

enables <strong>the</strong> simulation of curved electrodes. The<br />

following section demonstrates its capabilities through<br />

<strong>the</strong> simulation of three capacitor designs.<br />

3 SIMULATION<br />

3.1 The single-gap tunable capacitor<br />

Figure 2 shows <strong>the</strong> dimensions of a single-gap parallel<br />

plate micromachined tunable capacitor fabricated using<br />

two gold electrodes. The movable upper electrode (1µm<br />

thick) is suspended 1µm above a lower electrode. The<br />

lower electrode is fixed to a substrate, which is not<br />

shown. In order to retain <strong>the</strong> generality of <strong>the</strong> results, <strong>the</strong><br />

substrate is excluded from <strong>the</strong> simulations. The material<br />

properties used in <strong>the</strong> model are a Young’s modulus of<br />

57 GPa, a Poisson’s ratio of 0.35, a density of 19300<br />

kgm -3 and zero residual stress.<br />

In any microelectromechanical simulation, at least part of<br />

<strong>the</strong> simulated structure needs to be te<strong>the</strong>red to a fixed<br />

point. This forms a boundary condition for <strong>the</strong> solver.<br />

CoventorWare TM enables particular elements or groups<br />

of elements to be fixed in space. The upper electrode in<br />

this example has its four edges clamped.<br />

If a voltage is applied across <strong>the</strong> two electrodes, <strong>the</strong><br />

upper electrode will be electrostatically attracted to <strong>the</strong><br />

lower electrode. Due to <strong>the</strong> clamping, <strong>the</strong> upper electrode<br />

cannot move parallel to <strong>the</strong> lower one. Consequently, <strong>the</strong><br />

upper electrode has to deform in response to <strong>the</strong><br />

electrostatic force.<br />

1µ m<br />

1µ m<br />

Lower electrode<br />

Upper electrode<br />

500µ m<br />

Clam e<br />

ped<br />

edg<br />

edge ped<br />

Clam 500µ m<br />

1µ m<br />

Figure 2: A single-gap, two electrode tunable capacitor<br />

Figure 3 shows <strong>the</strong> displacement of <strong>the</strong> upper electrode<br />

subjected to a range of biasing voltages. This has been<br />

simulated using <strong>the</strong> CoSolveEM solver. The electrode<br />

can be seen to be deforming most at <strong>the</strong> centre, i.e. <strong>the</strong><br />

point fur<strong>the</strong>st from <strong>the</strong> clamping points. The edge<br />

clamping provides <strong>the</strong> restoring force for <strong>the</strong> upper<br />

electrode.<br />

68<br />

Figure 3: Displacement of <strong>the</strong> upper electrode in <strong>the</strong><br />

single-gap device subject to a range of biasing voltages<br />

(displacement units are µm)<br />

Above 6V, CoventorWare TM predicts pull-in. Figure 4<br />

shows <strong>the</strong> tuning characteristic for this capacitor. A<br />

tuning ratio of only 1.15:1 is achieved prior to pull-in. This<br />

is less than <strong>the</strong> 1.5:1 which could be achieved in a purely<br />

parallel plate situation. The reason behind this is that<br />

towards <strong>the</strong> edges of <strong>the</strong> upper electrode, <strong>the</strong><br />

displacement during biasing tends to zero. The edges of<br />

<strong>the</strong> upper electrode are contributing <strong>the</strong> least to <strong>the</strong><br />

increase in capacitance. In <strong>the</strong> parallel plate scenario, <strong>the</strong><br />

edges are free to contribute to <strong>the</strong> capacitance change.<br />

It should be noted though that <strong>the</strong> maximum deflection of<br />

<strong>the</strong> upper electrode, prior to pull-in, is 0.43µm. This<br />

exceeds <strong>the</strong> predictions of <strong>the</strong> parallel plate situation,<br />

which would allow 0.33µm deflection prior to pull-in.<br />

However this is a local maximum and at <strong>the</strong> clamped<br />

edges <strong>the</strong> displacement is zero.<br />

Capacitance [pF]<br />

2.60<br />

2.55<br />

2.50<br />

2.45<br />

2.40<br />

2.35<br />

2.30<br />

2.25<br />

2.20<br />

0 1 2 3<br />

Biasing voltage [V]<br />

4 5 6<br />

Figure 4: The capacitance tuning characteristic of single<br />

gap device<br />

3.2 Leverage based pull-in avoidance<br />

Figure 5 shows a view of an alternative tunable capacitor<br />

arrangement. It is a beam with only one end clamped,<br />

<strong>the</strong>refore forming a cantilever. There are five lower<br />

electrodes, labelled A to E. Electrode A and <strong>the</strong><br />

cantilever form <strong>the</strong> capacitor electrodes whereas<br />

electrodes B to E are used for DC biasing.


The upper electrode is 500µm by 200µm. The lower<br />

electrodes are 50µm by 200µm with a 50µm spacing.<br />

The metallisation thicknesses and unbiased air gaps are<br />

both set to 1µm.<br />

Figure 5: A cantilever based tunable capacitor<br />

The principle of operation is that of a lever, where a<br />

deflection near to <strong>the</strong> clamping end corresponds to a<br />

larger deflection at <strong>the</strong> free end of <strong>the</strong> upper electrode. In<br />

this design, <strong>the</strong> biasing and capacitive electrodes have<br />

been separated. This enables <strong>the</strong> capacitive electrode to<br />

be positioned at <strong>the</strong> free end of <strong>the</strong> upper electrode. The<br />

biasing electrode can <strong>the</strong>n be placed nearer to <strong>the</strong><br />

clamped end. There will reach a point when <strong>the</strong> biasing<br />

electrode will be able to displace <strong>the</strong> upper electrode to<br />

contact <strong>the</strong> lower capacitive electrode whilst avoiding<br />

pull-in.<br />

Figure 6 shows <strong>the</strong> tuning characteristics of <strong>the</strong> device.<br />

When only electrode B is biased, <strong>the</strong> tuning ratio is<br />

1.39:1 prior to pull-in.<br />

When only electrode C, which is nearer to <strong>the</strong> clamping<br />

point than B, is biased <strong>the</strong> maximum tuning ratio prior to<br />

pull-in is 1.72:1. This is an improvement, although <strong>the</strong><br />

peak tuning voltage has increased from 1V to 2V.<br />

Capacitance [pF]<br />

0.35<br />

0.30<br />

0.25<br />

0.20<br />

0.15<br />

0.10<br />

Electrode B<br />

Electrode C<br />

Electrode D<br />

0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0<br />

Biasing voltage [V}<br />

Figure 6: The capacitance tuning characteristics of <strong>the</strong><br />

cantilever device with electrodes B, C and D used<br />

individually for biasing<br />

Using only electrode D for biasing, pull-in occurs after <strong>the</strong><br />

capacitive electrodes have made contact and has<br />

<strong>the</strong>refore been eradicated. This, in principle, enables any<br />

capacitive gap to be set which leads to an infinite tuning<br />

ratio.<br />

Figure 7 shows <strong>the</strong> displacement of <strong>the</strong> device subject to<br />

a range of electrode D biasing voltages. The simulations<br />

69<br />

have been performed using only a single electrode for<br />

actuation. However, applying a voltage to each electrode<br />

in turn could create discrete capacitances. This would<br />

form <strong>the</strong> basis of a digital variable capacitor.<br />

Figure 7: Displacement of <strong>the</strong> cantilever device subject to<br />

a range of biasing voltages on electrode D (displacement<br />

units are µm)<br />

The cost of using this type of leverage bending is twofold.<br />

First, <strong>the</strong> force required to deflect <strong>the</strong> beam increases<br />

with proximity to <strong>the</strong> clamping point. This can lead to<br />

higher control voltages. Second, <strong>the</strong> separation of <strong>the</strong><br />

capacitive and biasing electrodes consumes more<br />

substrate space leading to larger devices.<br />

3.3 Two-gap based pull-in avoidance<br />

An alternative approach to pull-in avoidance is shown in<br />

figure 8. As in <strong>the</strong> previous section, this uses separate<br />

capacitance and biasing electrodes. However, it also<br />

uses a two-gap arrangement.<br />

A DC bias is applied between <strong>the</strong> upper electrode A and<br />

<strong>the</strong> lower electrodes, B. The upper electrode<br />

electrostatically deforms to reduce <strong>the</strong> gap between it<br />

and electrodes B. Electrodes A and C form <strong>the</strong> capacitive<br />

structure. As <strong>the</strong> upper electrode deforms, so <strong>the</strong> gap<br />

and hence <strong>the</strong> capacitance varies. If near contact can be<br />

achieved between <strong>the</strong> capacitive electrodes before pull-in<br />

occurs <strong>the</strong>n very small gaps, and hence high<br />

capacitances, can be realised.<br />

Figure 8: The two-gap electrostatically tuned<br />

micromachined capacitor<br />

The horizontal dimensions for <strong>the</strong> simulations are shown<br />

in figure 8. For <strong>the</strong> purposes of <strong>the</strong> simulations, electrode<br />

A is clamped at each end. The upper electrode is 3µm<br />

thick. These results are based on an all nickel structure.<br />

In <strong>the</strong>se simulations, nickel has a Young’s modulus of<br />

220.5 GPa, a Poisson’s ratio of 0.3 and a density of 8910<br />

kgm -3 . Figure 9 shows <strong>the</strong> tuning characteristics for a


ange of capacitive gap dimensions. In each case <strong>the</strong><br />

biasing gap is set to three times <strong>the</strong> capacitive gap.<br />

Capacitance [pF]<br />

5 g s =0.1µm<br />

4<br />

3<br />

2<br />

1<br />

g s =0.25µm<br />

g s =0.5µm<br />

g s =0.75µm<br />

g s =1µm<br />

0<br />

0 20 40 60 80 100 120 140 160<br />

Bias voltage [V]<br />

Figure 9: The simulated C-V characteristics of a two-gap<br />

capacitor for a range of capacitive electrode spacings, gs<br />

With this configuration, <strong>the</strong> two-gap approach is shown to<br />

have eliminated <strong>the</strong> effect of pull-in. However, in order to<br />

achieve <strong>the</strong> high tuning ratio, <strong>the</strong> electrodes need to be<br />

brought into very close contact. Fur<strong>the</strong>rmore, this graph<br />

illustrates that, for this configuration, unbiased submicron<br />

air gaps are required to achieve low voltage<br />

operation.<br />

4 FABRICATION<br />

For IC manufacture, many of <strong>the</strong> fabrication routes are<br />

standardised. For MEMS manufacture, this is not <strong>the</strong><br />

case. Many competing process flows exist and currently,<br />

<strong>the</strong>y tend to be device specific.<br />

Consequently, CoventorWare TM can readily identify key<br />

parameters which influence device operation, such as<br />

material properties, dimensions and electrode gaps.<br />

However, it is unable to suggest suitable fabrication<br />

routes. This lack of standardisation is an industry-wide<br />

problem which needs to be addressed for <strong>the</strong> successful<br />

virtual prototyping of general MEMS devices.<br />

For <strong>the</strong> MEMS process engineer, a range of mechanical<br />

considerations need to be considered in addition to <strong>the</strong><br />

simulations. These are illustrated for <strong>the</strong> two-gap<br />

structure in figure 10.<br />

Figure 10: General fabrication considerations for <strong>the</strong><br />

fabrication of <strong>the</strong> two-gap capacitor<br />

70<br />

A primary consideration is <strong>the</strong> self-compatibility of <strong>the</strong><br />

flow. This is from both a chemical etch and mechanical<br />

perspective. For example, <strong>the</strong> structural metals need to<br />

be inert to <strong>the</strong> sacrificial layer etchant. From a<br />

mechanical perspective, <strong>the</strong> total stress on <strong>the</strong> wafer at<br />

any given point during process must not cause structural<br />

cracking or delamination. The micromachined structure<br />

needs to be well attached to <strong>the</strong> substrate for effective<br />

operation.<br />

Figure 11 shows <strong>the</strong> fabrication route for <strong>the</strong> two-gap<br />

tunable capacitor. A titanium sacrificial layer is used with<br />

ei<strong>the</strong>r electroplated nickel or gold forming <strong>the</strong> capacitor.<br />

Specific processing details can be found in <strong>the</strong> literature<br />

[3].<br />

Figure 11: The fabrication of <strong>the</strong> two-gap capacitor<br />

The titanium defines <strong>the</strong> unbiased electrode gaps. These<br />

are set to 0.3µm and 0.1µm for <strong>the</strong> bias and capacitive<br />

gaps respectively. In practice, thin film stress in <strong>the</strong> upper<br />

electrode can cause deviation from <strong>the</strong>se gaps in<br />

released devices.<br />

Figure 12 shows a C-V tuning characteristic from a<br />

fabricated nickel capacitor. This has a tuning ratio of<br />

5.1:1 from an unbiased capacitance of 0.7pF. These are<br />

compared to simulated results for both an unstressed<br />

device and one with an additional 0.1µm of curvature<br />

representing a stressed state.<br />

Capacitance [pF]<br />

3.6<br />

3.2<br />

2.8<br />

2.4<br />

2.0<br />

1.6<br />

1.2<br />

0.8<br />

Simulated 0.1µm gap<br />

Simulated 0.2µm curved gap<br />

Measured results<br />

0.4<br />

0 2 4 6 8 10 12<br />

Bias voltage [V]<br />

Figure 12: The C-V characteristics of a nickel two-gap<br />

capacitor compared to simulated results


The simulations are in <strong>the</strong> correct voltage regime.<br />

However, <strong>the</strong> prediction of <strong>the</strong> tuning characteristic is not<br />

perfect.<br />

CoventorWare TM has been successful in identifying <strong>the</strong><br />

pull-in avoidance associated with <strong>the</strong> two-gap structure.<br />

Gold devices using this process flow have been<br />

demonstrated with tuning ratios up to 7.3:1 [3]. However,<br />

iesults are limited by <strong>the</strong> accuracy of <strong>the</strong> model. The<br />

remainder of <strong>the</strong> paper identifies key areas which are not<br />

effectively simulated by CoventorWare TM .<br />

5 LIMITATIONS OF COVENTORWARE<br />

5.1 Topological accuracy<br />

The two-gap capacitor forces MEMS simulation to its<br />

limits. First, large tuning ranges are only achievable if <strong>the</strong><br />

electrodes can be brought into near contact. Second, <strong>the</strong><br />

sub-micron gaps required to achieve low actuation<br />

voltage devices produce very high aspect ratio devices.<br />

For most finite element analysis, <strong>the</strong> surface topology is<br />

insignificant when compared to <strong>the</strong> dimensions of <strong>the</strong><br />

simulated device. However, for <strong>the</strong> widely tunable<br />

capacitor, <strong>the</strong> surface topology of <strong>the</strong> electrodes<br />

becomes a significant consideration.<br />

Figure 13 shows an electron micrograph of an anchor<br />

region of a released nickel tunable capacitor. The<br />

surface roughness associated with <strong>the</strong> electroplated<br />

metal is visually apparent in both <strong>the</strong> anchor and upper<br />

electrode regions. It is <strong>the</strong>refore, anticipated that this<br />

topology would be evident in <strong>the</strong> critical capacitive region.<br />

Upper electrode<br />

Anchor<br />

Figure 13: A SEM image of <strong>the</strong> anchor region of a<br />

fabricated capacitor<br />

In order to quantify <strong>the</strong> topological features of <strong>the</strong><br />

electrodes, an atomic force microscope (AFM) was used.<br />

Owing to scan area limitations, it was not feasible to track<br />

identical feature areas through <strong>the</strong> structure. However,<br />

general trends in surface roughness and topology<br />

characteristics could be studied.<br />

Surface roughness analysis in-situ of <strong>the</strong> underside of <strong>the</strong><br />

upper electrode is not currently possible. To obtain this<br />

data <strong>the</strong> upper electrodes were lifted off <strong>the</strong> substrate<br />

using adhesive tape, and <strong>the</strong>n examined with <strong>the</strong> AFM<br />

71<br />

[4]. Figure 14 shows <strong>the</strong> underside of a nickel upper<br />

electrode in <strong>the</strong> region above <strong>the</strong> bare silicon. In this<br />

case <strong>the</strong> mean surface roughness is 73Å. This<br />

roughness is primarily associated with <strong>the</strong> 3000Å of<br />

evaporated titanium.<br />

Figure 14: The surface topology of <strong>the</strong> underside of <strong>the</strong><br />

nickel upper electrode in <strong>the</strong> region above bare silicon<br />

This demonstrates that <strong>the</strong> finite surface roughness of<br />

<strong>the</strong> titanium transfers through to <strong>the</strong> underside of <strong>the</strong><br />

upper electrode. Figure 15 shows <strong>the</strong> surface topology of<br />

an electroplated nickel central electrode. A smooth metal<br />

grain is evident from <strong>the</strong> AFM scan. The mean surface<br />

roughness is 230Å.<br />

Figure 15: An AFM scan of <strong>the</strong> electroplated nickel<br />

central electrode<br />

Figure 16: An AFM scan of <strong>the</strong> underside of <strong>the</strong> upper<br />

electrode over <strong>the</strong> central electrode region


Figure 16 shows an AFM scan of <strong>the</strong> underside of <strong>the</strong><br />

upper electrode in <strong>the</strong> region above <strong>the</strong> central electrode.<br />

This is essentially an inverted version of figure 15 with<br />

<strong>the</strong> lower electrode grain still visible. However, in addition<br />

<strong>the</strong> localised roughness associated with <strong>the</strong> evaporated<br />

titanium is also present, superimposed onto <strong>the</strong> grain<br />

pattern of <strong>the</strong> electroplated metal. The mean surface<br />

roughness in this region is 170Å.<br />

Figure 17: An illustration of <strong>the</strong> topology of <strong>the</strong> capacitive<br />

electrodes<br />

Figure 17 illustrates <strong>the</strong> model proposed for surface<br />

interaction in <strong>the</strong> electroplated capacitive structures. It<br />

shows <strong>the</strong> localised topology of <strong>the</strong> sacrificial titanium<br />

transferring to <strong>the</strong> underside of <strong>the</strong> upper electrode.<br />

Second, it shows a reduction in <strong>the</strong> overall surface<br />

roughness observed in <strong>the</strong> upper electrode.<br />

Stiction failure is where two surfaces irreversibly adhere<br />

toge<strong>the</strong>r. This can occur during device release due to <strong>the</strong><br />

capillary forces associated with drying liquids.<br />

Alternatively, it can occur during device operation due to<br />

<strong>the</strong> van der Waal forces which become significant with<br />

sub-micron gaps.<br />

Stiction is related to contact area [5]. In <strong>the</strong>se devices,<br />

complete meshing cannot occur, which effectively<br />

reduces <strong>the</strong> absolute contact area and consequently <strong>the</strong><br />

likelihood of stiction failure.<br />

However, <strong>the</strong> dominant roughness associated with <strong>the</strong><br />

electroplated metal is significant from a capacitive<br />

perspective. The two-gap capacitor operates in a near,<br />

ra<strong>the</strong>r than an absolute, contact state. This roughness<br />

increases <strong>the</strong> capacitive area when compared to smooth<br />

electrodes. Therefore, at near contact, when compared to<br />

simulations, higher capacitances should be achieved.<br />

This is confirmed by <strong>the</strong> results in figure 11.<br />

These topological considerations are dependent upon <strong>the</strong><br />

process flows and materials used for fabrication.<br />

Therefore, specific models need to be developed which<br />

address <strong>the</strong>se issues. This is beyond <strong>the</strong> scope of<br />

conventional general purpose MEMS simulation tools.<br />

5.2 RF simulation<br />

The electromechanical simulations of <strong>the</strong> tunable<br />

capacitor provide an indication of tunability. However,<br />

CoventorWare TM does not address <strong>the</strong> RF performance.<br />

A design compromise exists between RF and mechanical<br />

requirements.<br />

72<br />

In addition to <strong>the</strong> tuning range, <strong>the</strong> quality factor, Q, is an<br />

important figure of merit for micromachined capacitors. A<br />

low Q is indicative of a high loss device. High Q devices<br />

exhibit sharp peaks in voltage controlled oscillators<br />

(VCOs) and tunable filters. This enables <strong>the</strong> RF spectrum<br />

to be used more efficiently and power consumption to be<br />

lower.<br />

The process flow presented here produces relatively low<br />

Q devices because <strong>the</strong>y are fabricated on low resistivity<br />

silicon. A modified process flow which enables thick gold<br />

interconnect (6.2µm) in conjunction with <strong>the</strong> use of a<br />

glass substrate has produced a high measured Q of 243<br />

at 0.9 GHz for a 0.26pF capacitor [6].<br />

The inclusion of RF simulation in a MEMS FEA package<br />

such as CoventorWare TM would make it more applicable<br />

to <strong>the</strong> design of <strong>the</strong> capacitor and RF MEMS in general.<br />

5.3 Reliability<br />

The implementation of an emerging technology such a<br />

RF MEMS into a volume market such a mobile telephone<br />

handsets requires excellent device reliability.<br />

CoventorWare TM can be used to identify regions of high<br />

stress which are likely to fail. However, <strong>the</strong> long-term<br />

issues such as metallic creep, fatigue and wear remain<br />

unsimulated. Fur<strong>the</strong>rmore, <strong>the</strong> effect of <strong>the</strong> environment<br />

on device performance is not well understood.<br />

These issues need to be addressed not only for RF<br />

micromachined devices but for <strong>the</strong> prototyping of MEMS<br />

in general.<br />

6 SUMMARY<br />

This paper has demonstrated <strong>the</strong> use of CoventorWare TM<br />

to simulate micromachined tunable capacitor structures.<br />

Its key functionality is found in electromechanical<br />

simulations of non-parallel plate devices. Two-gap<br />

structures have been shown to avoid pull-in associated<br />

tuning limitations in both simulated and fabricated<br />

devices. Tuning ratios up to 7.3:1 have been<br />

demonstrated for gold devices.<br />

The fit of <strong>the</strong> simulated and measured tuning curves is in<br />

<strong>the</strong> correct voltage regime, but not an absolute.<br />

Topological studies have demonstrated that <strong>the</strong><br />

approximations used in standard FEA simulations are<br />

oversimplified for <strong>the</strong>se two-gap structures which operate<br />

in a near-contact state. The surface roughness<br />

associated with electroplated metals and <strong>the</strong> titanium<br />

sacrificial layer is a significant contributor to device<br />

performance.<br />

At <strong>the</strong> moment fabrication flows are independent of <strong>the</strong><br />

virtual design process. These need to be more closely<br />

integrated. This in turn will enable a realistic<br />

representation of topology.


Finally, a compromise exists between a good<br />

microelectromechanical and RF design. These trade offs<br />

need to be modelled by packages such as<br />

CoventorWare TM to really benefit <strong>the</strong> virtual prototyping of<br />

RF MEMS. This needs to be combined with<br />

improvements to <strong>the</strong> reliability simulation capabilities.<br />

7 ACKNOWLEDGEMENTS<br />

The authors would like to thank Filtronic Compound<br />

Semiconductors Ltd and EPSRC for funding this work. It<br />

is also funded by <strong>the</strong> regional development agency One<br />

North East as part of <strong>the</strong> University Innovation Centre in<br />

Nanotechnology.<br />

8 REFERENCES<br />

[1] J. J. Yao, 2000, RF MEMS from a device perspective,<br />

J. Micromech. Microeng., 10, pp R9-R38.<br />

73<br />

[2] A. Dec and K. Suyama, 1997, Micromachined<br />

varactor with wide tuning range, Elec. Lett., 33, pp 922-<br />

924.<br />

[3] A.J. Gallant and D. Wood, 2004, The role of<br />

fabrication techniques on <strong>the</strong> performance of widely<br />

tunable micromachined capacitors, Sens. Act. A : Phys.,<br />

110, no 1-3, pp 423-431.<br />

[4] A.J. Gallant and D. Wood, 2004, Sacrificial layers for<br />

widely tunable capacitors, IEE Proc. Sci., Meas. & Tech.,<br />

151, no 2, pp 104-109.<br />

[5] N. Tas, T. Sonnenberg, H. Jansen, R. Legtenberg,<br />

and M. Elwenspoek, “Stiction in surface micromachining”,<br />

Journal of Micromechanics and Microengineering, 6, pp.<br />

385-397, 1996.<br />

[6] A.J. Gallant and D. Wood, 2004, Widely tunable<br />

capacitors: The challenges of integration, Proc. IMAPS<br />

MicroTech 2004, Cambridge, UK, March.


PART 4<br />

PROCESS AUTOMATION<br />

74


Concurrent Electrical Engineering Methods<br />

N.S. Zughaid, P.D Hackney<br />

CIM-TEAM UK LTD, Poynton, Stockport, England, SK12 1QS.<br />

Abstract<br />

This paper looks at <strong>the</strong> benefits and practical methods of accomplishing concurrent electrical engineering design tasks, using<br />

today's design tools such as E³.series Enterprise, from CIM-TEAM GmbH.<br />

Concurrent engineering has become a modern day concept used liberally to convey <strong>the</strong> ability for multiple stages of a<br />

products design phases to be carried out simultaneously. A number of tools and forums use collaboration, where engineers,<br />

sometimes, at differing sites come toge<strong>the</strong>r and collaborate, usually in WEB space to bring toge<strong>the</strong>r different aspects of <strong>the</strong><br />

design process in a single location. Here teams from concept to launch can work toge<strong>the</strong>r in a dedicated space. Once <strong>the</strong><br />

individual processes are removed from <strong>the</strong> collaboration area, <strong>the</strong>y become remote and isolated. CIM-TEAM’s E³.series<br />

offers a true multi-user environment.<br />

No o<strong>the</strong>r <strong>ECAD</strong> tool on <strong>the</strong> market can be said to be truly multi-user, most offer a form of concurrency through batch updates<br />

or remote procedures. E³.series with its SQL database engine offers engineers true concurrency where Concept Engineers<br />

and <strong>Systems</strong> Engineers and Design Engineers can all work side by side in <strong>the</strong> same E³ Project. Concept Engineers can be<br />

laying down foundations, building blocks whilst System engineers begin to fill in <strong>the</strong> detail and Design Engineers concentrate<br />

on <strong>the</strong> detailed design. At any stage in <strong>the</strong> process all Engineers have <strong>the</strong> power to influence <strong>the</strong> design, and <strong>the</strong> o<strong>the</strong>r<br />

groups can immediately see any changes or innovations.<br />

The flexibility and power, true, concurrency has to offer today’s Engineers, through E³.series, has yet to be fully explored.<br />

However, through writing and delivering this paper it is hoped that a number of <strong>the</strong> possibilities can be discovered and<br />

presented in a practical manner.<br />

Keywords:<br />

Computer Aided Engineering, <strong>ECAD</strong>, Multi-user, E3.Series, CIM-Team<br />

1. INTRODUCTION<br />

1.1 <strong>ECAD</strong> DEVELOPMENT PHASE<br />

It is safe to say that <strong>the</strong>re has been an explosion of ideas<br />

and concepts for CAD systems in <strong>the</strong> past 20 years, drawing<br />

boards, once <strong>the</strong> proud upstanding pillars of a drawing office<br />

have been thrown out or burned with <strong>the</strong> odd lucky ones<br />

residing in a dusty cupboard, brought out to show <strong>the</strong> new<br />

recruits how it used to be done. Electrical Cad has been<br />

around for <strong>the</strong> majority of <strong>the</strong> past 20 years, it is only in <strong>the</strong><br />

last 10 years that a strong position of its own has been<br />

established. Mechanical CAD on <strong>the</strong> o<strong>the</strong>r hand has been<br />

dominant in <strong>the</strong> drawing office and still today many Electrical<br />

Designers are forced to use <strong>the</strong> mechanical package to carry<br />

out complex electrical designs, much more suited to a<br />

bespoke <strong>ECAD</strong> Package. The reason for this is quite simple<br />

in most organization Mechanical Engineers out number<br />

Electrical Engineers by about four to one <strong>the</strong>refore <strong>the</strong><br />

requirements of <strong>the</strong> masses will be catered for.<br />

In <strong>the</strong> past five years software developers eager to push<br />

back and expose new boundaries have developed<br />

collaboration tools, <strong>the</strong>se tools panacea is <strong>the</strong> involvement of<br />

supplier and customers throughout <strong>the</strong> lifecycle of a products<br />

development phase, all pulling toge<strong>the</strong>r to reduce time to<br />

market and cut down errors and ultimately reduce costs.<br />

Ano<strong>the</strong>r obvious benefit in <strong>the</strong> world of multi-nationals is <strong>the</strong><br />

ability to have departments from different countries working<br />

toge<strong>the</strong>r in <strong>the</strong> same environment to speed up development<br />

time and reduce travel requirements.<br />

These developments eventually filter down to <strong>the</strong> Electrical<br />

CAD market and we are now beginning to see dynamic tools<br />

allowing for concurrent Electrical Engineering. In <strong>the</strong> past<br />

75<br />

large electrical schematics have been broken down in to<br />

smaller sections and engineers and drafts-people have<br />

been able to work on separate jobs. The linkage between<br />

<strong>the</strong> schematics generally, if at all, being carried out as a<br />

post-process operation. The new truly dynamic breed of<br />

concurrent software tools available now offers a true, realtime,<br />

multi-user environment.<br />

1.2 <strong>ECAD</strong> BACKGROUND<br />

An Electrical Project consists of an entire set of schematic<br />

sheets. The design on <strong>the</strong>se sheets show <strong>the</strong> electrical<br />

connectivity of all <strong>the</strong> components which make up <strong>the</strong><br />

products design, be that a Power Station, a Piece of<br />

machinery, or a vehicle harness. The components<br />

contained within <strong>the</strong> Project are generally split into<br />

several Electrical symbols, which can be shown in an<br />

electrically intelligent manner on separate sheets<br />

throughout <strong>the</strong> Project. On an intelligent <strong>ECAD</strong> system<br />

<strong>the</strong>se symbols are all linked toge<strong>the</strong>r through a series of<br />

dynamic cross-references all updating to each o<strong>the</strong>r. Also<br />

shown within a Project are all <strong>the</strong> Devices used to<br />

produce <strong>the</strong> complete product <strong>the</strong>se are displayed using a<br />

device tree. E3.Series from CIM-Team is a multi-module<br />

tool offering a suite of tools for <strong>the</strong> aid in <strong>ECAD</strong> and<br />

Pneumatic/Hydraulic designs. Figure 1, shows <strong>the</strong><br />

modules currently available from <strong>the</strong> product.


Figure 1: E3.Series Product Suite<br />

2. MULTIUSER ENVIRONMENT THROUGH A CENTRAL<br />

SERVER PROCESS<br />

Multi-user functionality can be achieved using two different<br />

methods. Ei<strong>the</strong>r with <strong>the</strong> CAD program directly working with<br />

one database which saves all changes and thus always<br />

contains <strong>the</strong> project’s current state, or this can be achieved<br />

using a central server process, connecting <strong>the</strong> users working<br />

on <strong>the</strong> client computers and synchronizing all information<br />

between <strong>the</strong> connected clients. The first variant has <strong>the</strong><br />

disadvantage that <strong>the</strong> user program has to read all data<br />

directly from or write all data directly to <strong>the</strong> database. This<br />

can lead to speed issues with <strong>the</strong> large amount of data<br />

contained in some projects. The second method using a<br />

special server process, shown in Figure 2: also writes data to<br />

<strong>the</strong> database but systematically distributes <strong>the</strong> data to <strong>the</strong><br />

clients. Tests concluded that controlling <strong>the</strong> data via a central<br />

server is <strong>the</strong> better solution for working in multi-user mode.<br />

This is due to <strong>the</strong> reduction in data transfer between <strong>the</strong><br />

server and <strong>the</strong> clients, minimizing <strong>the</strong> network load.<br />

One important request from <strong>the</strong> user is that his/her operation<br />

mode does not differ, whe<strong>the</strong>r <strong>the</strong>y are working on a project<br />

exclusively (single-user) or toge<strong>the</strong>r with o<strong>the</strong>r colleagues,<br />

collectively working on a multi-user project. Both operation<br />

modes must be possible with <strong>the</strong> same underlying system,<br />

any differences must be transparent to <strong>the</strong> user. What is<br />

more, <strong>the</strong> transfer of projects between <strong>the</strong> different working<br />

methods has to be possible as <strong>the</strong> user must have <strong>the</strong><br />

possibility to take out complete projects or parts of a project<br />

in order to work on <strong>the</strong>m remotely, and <strong>the</strong>n transfer it back<br />

to <strong>the</strong> server. And in doing so, <strong>the</strong> user wants to work on his<br />

single and multi-user projects using <strong>the</strong> same program, <strong>the</strong><br />

same functionality and <strong>the</strong> same user interface.<br />

Figure 2: shows <strong>the</strong> multi-user topology. Within <strong>the</strong> SQL<br />

database are <strong>the</strong> Dictionary Tables, which contain <strong>the</strong><br />

system information, which tracks and controls all <strong>the</strong><br />

projects, <strong>the</strong> users and <strong>the</strong> Host services. From <strong>the</strong> diagram<br />

we can see that multiple Hosts can be setup, <strong>the</strong> various<br />

clients connect to <strong>the</strong> services setup by <strong>the</strong> hosts. When new<br />

multi-user projects are Projects are created, a new Database<br />

is created in <strong>the</strong> SQL environment. Each Project <strong>the</strong>n has it’s<br />

own Project Service which manages <strong>the</strong> transactions from<br />

<strong>the</strong> clients.<br />

76<br />

Figure 2: Central Server Process.<br />

3. OPERATIONAL OVERVIEW<br />

A typical operational procedure is as follows: After<br />

opening a Project <strong>the</strong> user can immediately see of all<br />

objects used in that Project, e.g. sheets and devices, and<br />

at this level <strong>the</strong>y can modify <strong>the</strong> devices and <strong>the</strong> sheet<br />

header information. All information which does not require<br />

graphic access to <strong>the</strong> sheets can be modified. This<br />

corresponds to <strong>the</strong> table-like modification of information in<br />

a database. In addition to this, reports concerning <strong>the</strong><br />

overall project can be created anytime without having to<br />

check-in all sheets from <strong>the</strong> server first. Next <strong>the</strong> user can<br />

check-out <strong>the</strong> sheets to be graphically edited from <strong>the</strong><br />

server and create new sheets, Figure 3: shows <strong>the</strong> tree<br />

structure showing <strong>the</strong> sheets being used and <strong>the</strong> ones still<br />

available for check-out. The users’ active sheets, i.e.<br />

sheets checked-out by this user, are locked for o<strong>the</strong>r<br />

users in <strong>the</strong> same project and cannot be edited. However,<br />

this only applies to <strong>the</strong> sheet’s ‘graphic representation’.<br />

The o<strong>the</strong>r users can still work with <strong>the</strong> (shared data)<br />

objects such as sheets or devices. User ‘A’, for example,<br />

can rename a device designation at any time, even if a<br />

symbol of this device is placed on a sheet being edited by<br />

user ‘B’. The new device designation will immediately be<br />

displayed on user ‘B’s opened sheet and User ‘B’ can<br />

continue working with this new information. New devices<br />

added to <strong>the</strong> project can immediately be used by all users<br />

working within <strong>the</strong> project.<br />

If <strong>the</strong> user has finished modifying <strong>the</strong> sheets, he can<br />

check-in <strong>the</strong>se sheets to <strong>the</strong> server and thus unlock <strong>the</strong>m<br />

allowing for ‘graphic modification’ by o<strong>the</strong>r users. The<br />

‘logic modifications’ are transferred immediately to <strong>the</strong><br />

server.


Figure 3: Multi-User Sheet Tree<br />

4. POSSIBLE SCENARIOS<br />

This kind of simultaneous working is not only possible for<br />

large projects whose circuit diagrams are edited by several<br />

colleagues simultaneously. With smaller projects, several<br />

colleagues could be involved in editing different sections of<br />

<strong>the</strong> project. Some examples of this are <strong>the</strong> panel layout and<br />

panel wiring, <strong>the</strong> documentation for <strong>the</strong> cabling and<br />

pneumatics/hydraulics. This is especially true if <strong>the</strong> individual<br />

colleagues are in different design departments and are not<br />

generally working in close physical proximity. A change could<br />

be made to <strong>the</strong> schematic which affects <strong>the</strong> panel layout. In<br />

<strong>the</strong> multi-user environment this change can be picked up<br />

immediately by <strong>the</strong> panel engineer and that change acted<br />

upon if necessary. Prior to multi-user this change could have<br />

at <strong>the</strong> worst been missed, but at <strong>the</strong> best would have to be<br />

manually modified to bring it back into line with <strong>the</strong><br />

schematic, taking time and costing money. Of course this is<br />

also true in <strong>the</strong> case of Pneumatic/Hydraulic schematics;<br />

changes to a coil’s name, function or even placement in <strong>the</strong><br />

Electrical schematic will affect <strong>the</strong> valve in <strong>the</strong><br />

Pneumatic/Hydraulic section. Communication between<br />

colleagues in <strong>the</strong> same department is not always as good as<br />

it could be, and this is especially true between separate<br />

departments. So, for this information to be updated<br />

dynamically, this is an obvious benefit. This is all made<br />

possible by having alternate views of objects, changes to any<br />

view of an object are reflected in all o<strong>the</strong>r views including <strong>the</strong><br />

original view, combining this functionality with <strong>the</strong> multi-user<br />

environment provides a fully functional concurrent work place<br />

77<br />

where shared data really can be dynamic. Having a<br />

standard platform and being able to share projects and<br />

objects with colleagues who previously would have<br />

worked remotely will reduce development time and allow<br />

for checking to be carried out during <strong>the</strong> design phase. All<br />

this is possible without any subsequent effort or<br />

adjustment.<br />

4.1 ELECTRO-PNEUMATIC<br />

Figure 4: shows a pneumatic sheet within a Project, <strong>the</strong><br />

electrical section of <strong>the</strong> valves shown in this schematic<br />

are located on o<strong>the</strong>r sheets. Keeping <strong>the</strong> information in a<br />

readable format, with separate Electrical and<br />

Hydraulic/Pneumatic sections but intelligently linking <strong>the</strong><br />

associated symbols.<br />

Figure 4: Pneumatic/Hydraulic schematic.<br />

Figure 5: shows <strong>the</strong> combining of a pneumatic valve and<br />

<strong>the</strong> electrical solenoid, each symbol has <strong>the</strong> same Device<br />

ID –Y1 and a reference is shown between <strong>the</strong> two<br />

symbols, all stored under <strong>the</strong> one part number.<br />

Figure 5: Electrical/Pneumatic combination


4.2 SCHEMATIC-PANEL<br />

Figures 5: shows a fully wired panel layout in E3.Series, <strong>the</strong><br />

routing of <strong>the</strong> wires can be based on <strong>the</strong> electrical schematic.<br />

Individuals can be placing <strong>the</strong> panel elements whilst o<strong>the</strong>rs<br />

are producing <strong>the</strong> schematic section of <strong>the</strong> Project, both<br />

working toge<strong>the</strong>r to speed up production.<br />

Figure 5: E3.Series Panel Layout.<br />

4.3 WORKING WITH ALTERNATE VIEWS<br />

Figure 6a: Original View of Cable –W2<br />

Figures 6a and 6b show how differing views of elements<br />

within an <strong>ECAD</strong> system can look. In Figure 6a we can see<br />

how <strong>the</strong> schematic shows <strong>the</strong> cable running between<br />

connectors –XS1 and –XP1, as far as <strong>the</strong> design engineer is<br />

concerned, that is enough information. However, <strong>the</strong><br />

production engineer would like to look more closely at <strong>the</strong><br />

make-up of cable –W2. So, by creating alternate views of<br />

cable –W2, shown in figure 6b: we see a documentation<br />

style of layout preferred by production. As <strong>the</strong> views are<br />

dynamically linked, any changes in one view reflect in <strong>the</strong><br />

o<strong>the</strong>r and so once again combining this functionality with a<br />

multi-user technology allows Design and Production<br />

Engineers to share and modify <strong>the</strong> same Project data.<br />

During <strong>the</strong> design phase, production can begin <strong>the</strong> creation<br />

of <strong>the</strong> documentation, using <strong>the</strong>ir production skills, and may<br />

spot errors not usually seen by Designers, those errors can<br />

be rectified and <strong>the</strong> changes filter through to <strong>the</strong> Design<br />

section of <strong>the</strong> schematic. This form of Quality assurance is<br />

similar to techniques used in <strong>the</strong> production line where <strong>the</strong><br />

78<br />

first job of <strong>the</strong> assembly line Engineer is to check <strong>the</strong> work<br />

carried out by <strong>the</strong> previous station. Adopting this<br />

methodology, could save time and money by spotting<br />

errors earlier in <strong>the</strong> design process, prior to assembly.<br />

Figure 6b: Alternate Views of Cable –W2<br />

Figure 7: shows <strong>the</strong> finished article, we can see from <strong>the</strong><br />

picture how <strong>the</strong> product has a mixture of<br />

Pneumatic/Hydraulic and Electrical elements. Using <strong>the</strong><br />

multi-user environment allows <strong>the</strong> various departments to<br />

combine <strong>the</strong>ir efforts in a single Project environment,<br />

sharing information and being dynamically kept up to date<br />

with any changes which affect <strong>the</strong> design.<br />

Figure 7: Combined finished article.<br />

5. FUTURE DEVELOPMENTS<br />

5.1 CONCEPT TO DESIGN APPROACH<br />

This technology is very much in its infancy; <strong>the</strong> uses<br />

discussed above are very much <strong>the</strong> obvious and have


een driven by user requests for a more tightly integrated<br />

Electrical/Pneumatic design space and to allow companies to<br />

flood Projects with engineers. However, we are already<br />

starting to see companies exploring <strong>the</strong> possibility of using<br />

<strong>the</strong> functionality to adopt a more ‘Top Down’ system design<br />

philosophy. Concept Engineers, with very much an overview<br />

of <strong>the</strong> design requirements are placing building blocks within<br />

a Project. These building blocks are embellished fur<strong>the</strong>r by<br />

<strong>Systems</strong> Engineers, adding function to <strong>the</strong> blocks and <strong>the</strong>n<br />

finally Design Engineers are producing detailed schematics<br />

of <strong>the</strong> systems.<br />

The linkage between <strong>the</strong>se three levels is yet again dynamic,<br />

with each department being able to update and modify <strong>the</strong>ir<br />

designs, with any change being automatically reflected in <strong>the</strong><br />

o<strong>the</strong>r levels. This methodology could be described a<br />

Hierarchical design approach. An example of this would be<br />

<strong>the</strong> building blocks which go into <strong>the</strong> design of a new vehicle.<br />

Conceptually <strong>the</strong>re will be two doors, four seats, two<br />

headlights etc, <strong>the</strong>se blocks are placed into <strong>the</strong> design. On<br />

an alternate view <strong>the</strong> System Engineer shows <strong>the</strong> simple,<br />

single line connections between <strong>the</strong>se blocks. How <strong>the</strong>y are<br />

related and interfaced, <strong>the</strong>n finally <strong>the</strong> Design Engineer has<br />

<strong>the</strong> job of filling in <strong>the</strong> detail. How <strong>the</strong> system is wired up, all<br />

79<br />

<strong>the</strong> contacts and switches. Here again all departments<br />

have <strong>the</strong> opportunity to look and check each o<strong>the</strong>r<br />

departments ideas, concepts, technology. Mistakes can<br />

be spotted and rectified and by bringing different<br />

departments into a shared design space, new ideas could<br />

be formulated.<br />

6. SUMMARY<br />

In <strong>the</strong> abstract for this paper it was hoped that by writing<br />

this paper new ideas could be formulated for <strong>the</strong> use of a<br />

collaborative <strong>ECAD</strong> tool an in deed a number of concepts<br />

have come to light, namely <strong>the</strong> quality aspect. But it is felt<br />

that <strong>the</strong>re are many more uses which will fall out of this<br />

technology and <strong>the</strong>y will predominantly come from <strong>the</strong><br />

<strong>ECAD</strong> engineers desire to achieve better tools for <strong>the</strong>ir<br />

current practices.


<strong>ECAD</strong>/<strong>ECAE2004</strong><br />

<strong>ECAD</strong>/<strong>ECAE2004</strong><br />

1st International Conference on Electrical / Electromechanical Computer Aided Design & Engineering<br />

15-16 15 16 November 2004, Durham, UK<br />

Electrical & Process Automation Framework<br />

for<br />

Engineering and Maintenance<br />

with<br />

3rd CAE- CAE Systemgeneration<br />

Technische Computer Systeme<br />

Süssen GmbH<br />

SIGRAPH CAE<br />

Dipl.-Ing. Dipl. Ing.<br />

Debasish Mukherjee<br />

Director International Business<br />

80


Contents<br />

■ What is it all about?<br />

■ Modules of Electrical and Process Automation Framework<br />

■ User Benefits<br />

■ Electrical and Process Automation Workflow<br />

/ SIGRAPH CAE<br />

Two names, one product<br />

■ Electrical and Process Automation Data in One Engineering Database<br />

■ Data exchange within Electrical and Process Automation Framework<br />

■ Technology and Product Life Cycle<br />

81


What is it all about? about<br />

Electrical & Process Automation<br />

✓ Electrical and I&C<br />

Engineering- Engineering and Maintenance-Framework<br />

Maintenance Framework<br />

✓ Modular Solution for <strong>the</strong> whole Life-Cycle Life Cycle of Machines and Plants<br />

3. CAE-Systemgeneration<br />

CAE Systemgeneration<br />

✓ New development middle/End middle/End<br />

of 90<br />

✓ New Target as 2nd System Generation<br />

✓ CAEngineering<br />

CAEngineering<br />

as base of one Engineering Database<br />

✓ Introduction of latest Technology - Integrated Object Orientation<br />

SIGRAPH CAE<br />

82<br />

/ SIGRAPH CAE<br />

Two names, one product


Framework for Electrical & Process Automation<br />

Basic-Engg<br />

Main Modules of Engineering & Maintenance<br />

Multi tasking Concurrent<br />

Engineering<br />

Electrical & Process Automation framework for Engineering and Maintenance<br />

Leads to<br />

Electrical & Process Automation workflow for Engineering and Maintenance<br />

Main Functions<br />

Detail-<br />

Engineering<br />

PLC/ Controls Documentation<br />

and Revesion<br />

Management<br />

Customer<br />

Oriented<br />

User-<br />

Interface<br />

ERP<br />

Report /<br />

Online-List<br />

/ SIGRAPH CAE<br />

Two names, one product<br />

Engineering-Database<br />

Engineering Database<br />

Object Oriented<br />

EDM / PDM PLC<br />

Modules for System Integration<br />

Viewing/<br />

Navigation<br />

• Daten-Browser<br />

• PDF<br />

...<br />

... ...<br />

83


User Benefits<br />

Support of<br />

Electrical &<br />

Process<br />

Automation<br />

Workflow<br />

Electrical and<br />

Process<br />

Automation Data<br />

in one<br />

Engineering<br />

Database<br />

Electrical and Process<br />

Automation Framework<br />

for<br />

Engineering & Maintenance<br />

SIGRAPH CAE<br />

New<br />

Data<br />

Technology Exchange<br />

Begin of<br />

<strong>the</strong> product<br />

Life Cycle<br />

84<br />

System-<br />

integration<br />

/ SIGRAPH CAE<br />

Two names, one product


Electrical and Process Automation-Workflow<br />

Automation Workflow<br />

✓ Global support for Organisation as well as Order<br />

specific Workflows<br />

✓ Is applicable to <strong>the</strong> complete Life cycle of<br />

Equipment and Machine<br />

✓ In moulding phase itself all data are inputted in<br />

<strong>the</strong> Engineering Database<br />

✓ Data are available at any point of time to any<br />

Engineering stage for fur<strong>the</strong>r processing<br />

✓ Jobs can be executed in parallel<br />

✓ Beginning of <strong>the</strong> Engineering activity is not<br />

limited to circuit diagram only<br />

85<br />

/ SIGRAPH CAE<br />

Two names, one product


SIGRAPH CAE<br />

Two names, one product<br />

Electrical and Process Automation Data in Engineering Database<br />

Flow Chart<br />

Engineering of<br />

Measurements,<br />

Measurements,<br />

Instrumentation,<br />

Instrumentation,<br />

E-Consumers Consumers etc<br />

General<br />

Arrangement<br />

Drawing<br />

Loop plans<br />

Engineering Schranklayou<br />

Database of<br />

t, -disposition disposition<br />

Electrical & Process<br />

Automation Framework<br />

Single-Lines<br />

Single Lines<br />

86<br />

Engineering<br />

of PLC/<br />

Controls<br />

Cable Planning<br />

Engineering of<br />

Power Supply<br />

Generation of<br />

Circuits<br />

Diagrams


SIGRAPH CAE<br />

Two names, one product<br />

Dataexchange within Electrical & Process Automation Framework<br />

Consultant<br />

Consultant<br />

Engineering<br />

Engineering<br />

(Operator)<br />

(Operator)<br />

Electrical and Process<br />

Automation-Framework<br />

Automation Framework<br />

for<br />

Engineering & Maintenance<br />

Engineering-Data<br />

Engineering Data bank<br />

Object Oriented<br />

87<br />

Designer<br />

Designer<br />

Maintenance<br />

Maintenance<br />

(Operator)<br />

(Operator)<br />

Manufacture,<br />

Manufacture<br />

Manufacture,<br />

Commissioning,<br />

Commissioning<br />

Commissioning, ,<br />

Service<br />

Service


Technology und Product Life-cycle Life cycle<br />

/ SIGRAPH CAE<br />

Two names, one product<br />

3rd CAE-System<br />

CAE System Generation is already established in <strong>the</strong> Engineering World ...<br />

✓ Integrated Object Orientation (Database, Implementation, Implementation,<br />

User-Interface)<br />

User Interface)<br />

✓ Available software architechture for Integrated and phasewise Engineering<br />

✓ New Demands of <strong>the</strong> Market since middle of 90s<br />

✓ Beginning of Product Life-Cycle Life Cycle<br />

New product for <strong>the</strong> entire<br />

Market, ensures long term<br />

Investment security !<br />

88<br />

Bedarf<br />

Forum Factory Automation 2004; 22.04.04<br />

/ SIGRAPH CAE<br />

Zwei Namen - Ein Produkt<br />

Lebenszyklen 2. <strong>ECAD</strong>-Generation / 3. CAE-Generation<br />

Lebenszyklus<br />

2. <strong>ECAD</strong>-<br />

Systemgeneration<br />

1985 1995 1999 / 2000 2004 2009 / 2010<br />

Start Entwicklung<br />

3. CAE-Systemgeneration<br />

Markteinführung<br />

3. CAE-Systemgeneration<br />

Umstiegszeit<br />

<strong>ECAD</strong> CAE<br />

Lebenszyklus<br />

3. CAE-<br />

Systemgeneration<br />

Zeit in Jahre<br />

10


Technische Computer Systeme Süssen GmbH<br />

Tobelstraße 8<br />

73079 Süssen<br />

Germany<br />

www.tcs-s.de<br />

www.tcs s.de<br />

tcs@tcs-s.de<br />

tcs@tcs s.de<br />

Tel.: +49 (0) 7162 / 4095 - 0<br />

Fax: +49 (0) 7162 / 41032<br />

Debasish Mukherjee<br />

Director International Business<br />

d.mukherjee@tcs-s.de<br />

d.mukherjee@tcs s.de<br />

- Thinking in Solutions<br />

89<br />

/ SIGRAPH CAE<br />

Two names, one product<br />

Solutions! Thank you ve<br />

ry much<br />

for your attention


Automatic Wiring in Switch Cabinets<br />

W.Vigerske, B.Stube and M.Pleßow<br />

R&D Department Graph-based Engineering <strong>Systems</strong><br />

Society for <strong>the</strong> Promotion of Applied Computer Sciences (GFaI), Berlin, Germany<br />

Abstract<br />

The computer-aided design of switch cabinets opens <strong>the</strong> possibility to automate certain layout steps and to<br />

get an optimal layout by efficient, dedicated tools. Among <strong>the</strong> typical layout steps automatic wiring of<br />

switch cabinets has <strong>the</strong> most relevance and is a great challenge. Beside <strong>the</strong> fact that an automatic wiring<br />

delivers an entire (if possible), valid and optimal result, an additional important aspect is <strong>the</strong> possibility to<br />

score customizing cables. Subject of this article are ma<strong>the</strong>matical problems in <strong>the</strong> field of automatic wiring<br />

in switch cabinets.<br />

Keywords:<br />

<strong>ECAD</strong>, Layout, Wiring<br />

1 INTRODUCTION<br />

Switching stations can be found in modern factories and<br />

buildings everywhere. They are utilized as supervisory<br />

station to control and observe different technical<br />

processes.<br />

<strong>ECAD</strong>-systems are often used to design switchboards.<br />

As design result circuit diagrams are mainly developed.<br />

Based on a circuit diagram <strong>the</strong> needed connection list<br />

and <strong>the</strong> device list can be derived. It is typical for <strong>ECAD</strong>systems<br />

that <strong>the</strong>y cover all relevant facets of <strong>the</strong> design<br />

process which concern <strong>the</strong> logic structure of <strong>the</strong><br />

switchboard. Such systems have a long history and offer<br />

a wide range of comfortable features to design circuit<br />

diagrams. But for <strong>the</strong> physical design of a switchboard<br />

<strong>the</strong>y offer no assistance. This fact is <strong>the</strong> reason of <strong>the</strong><br />

strong demand for systems which are able to realize an<br />

integrated approach for handling of general process<br />

chains [1].<br />

The most important layout step during switchboard<br />

design is wiring of <strong>the</strong> connection structure. Automatic<br />

wiring tools are mainly based on classical graph<br />

<strong>the</strong>oretical approaches. But <strong>the</strong> relevant switchboard<br />

applications require a significant extension of <strong>the</strong><br />

existing strategies. Since many of <strong>the</strong>se layout problems<br />

are NP-complete new efficient heuristics have to be<br />

developed.<br />

2 AUTOMATIC WIRING<br />

A switchboard consists mainly of different switch<br />

cabinets, which contain mounting plates for <strong>the</strong> electrical<br />

devices. For connecting electrical devices, conductors<br />

are used and laid out through a channel framework (see<br />

Figure 1).<br />

The aim of automatic wiring is to compute a short and<br />

cost optimal total wiring respectively. During wiring<br />

structural aspects have to be considered, which are<br />

given by <strong>the</strong> resolution process of T-connections<br />

(electrical connections of more than two terminals) in<br />

order to realize <strong>the</strong> connecting structure in <strong>the</strong> switch<br />

cabinet. Fur<strong>the</strong>rmore, wiring is influenced by <strong>the</strong> facts<br />

that cable channels have a limited capacity and<br />

sometimes constraints to avoid electromagnetic<br />

compatibility (EMC) problems have to take into account.<br />

So, <strong>the</strong> degrees of filling of <strong>the</strong> cable channels have to<br />

be modelled and considered during wiring computation.<br />

90<br />

Figure 1: Loaded mounting plate.<br />

In <strong>the</strong> next chapters we will describe relevant aspects for<br />

<strong>the</strong> generation of a single connection in <strong>the</strong> channel<br />

framework. This includes <strong>the</strong> characterization of <strong>the</strong><br />

connecting problem as a shortest path problem in an<br />

edge-weighted graph, <strong>the</strong> graph generation based on <strong>the</strong><br />

channel framework and <strong>the</strong> degree of filling issues.<br />

2.1 Optimal wiring of a single connection<br />

From <strong>the</strong> algorithmic point of view <strong>the</strong> computation of an<br />

optimal total wiring in <strong>the</strong> channel framework is a NPcomplete<br />

problem [2]. Even <strong>the</strong> optimal realization of a<br />

single net of <strong>the</strong> circuit diagram, <strong>the</strong> resolution of a Tconnection,<br />

is probably NP-complete. So, for a practical<br />

handling of <strong>the</strong> wiring problem <strong>the</strong>re is <strong>the</strong> orientation to<br />

resolve <strong>the</strong> T-connections sequentially. Also a single Tconnection<br />

will be resolved by sequentially generation of<br />

optimal single connections. For <strong>the</strong> optimal layout of <strong>the</strong><br />

single connections <strong>the</strong> well known Dijkstra algorithm [2]<br />

can be applied. This algorithm computes cost minimum<br />

paths in a graph with positive edge-weights between<br />

start and destination nodes. With regard to <strong>the</strong> resolution<br />

problem of T-connections <strong>the</strong> algorithm is modified and<br />

extended.<br />

2.2 Preparation of <strong>the</strong> wiring problem<br />

For <strong>the</strong> application of <strong>the</strong> Dijkstra algorithm <strong>the</strong> needed<br />

edge-weighted graph has to be extracted from <strong>the</strong><br />

channel framework. Basis for this graph generation is<br />

<strong>the</strong> channel model. In this model <strong>the</strong> information about


<strong>the</strong> location of <strong>the</strong> cable channels, <strong>the</strong>ir dimensions and<br />

structuring are mapped. Structuring includes <strong>the</strong><br />

information which of <strong>the</strong> cable channels have transitions<br />

and where are <strong>the</strong>y located. Based on this channel<br />

model a static graph is generated.<br />

For wiring of a single T-connection all relevant terminals<br />

will be integrated in <strong>the</strong> static graph. By this means <strong>the</strong><br />

routing graph is constructed (see Figure 2). Based on<br />

this routing graph <strong>the</strong> T-connection layout will be<br />

computed as a sequence of pair-wise connections<br />

between <strong>the</strong> terminals.<br />

Figure 2: Routing graph with entry points derived from<br />

different terminals<br />

Important and not simple is <strong>the</strong> modelling of <strong>the</strong> filling<br />

degree of <strong>the</strong> cable channels. For this modelling each<br />

cable channel has assigned a list of free areas. In each<br />

wiring step <strong>the</strong> channel capacity will be adapted in this<br />

list.<br />

2.3 Resolution of T-connections<br />

During wiring of a T-connection in a switch cabinet <strong>the</strong> Tconnection<br />

will be resolved in pair-wise connections<br />

between <strong>the</strong> terminals of <strong>the</strong> electronic devices which<br />

will be physically realised by electrical conductors while<br />

<strong>the</strong> fabrication of <strong>the</strong> switch cabinet. Figure 3 shows <strong>the</strong><br />

T-connection -X1:1, -F13.1:2, -K27.1:6 which is part of a<br />

circuit diagram.<br />

Figure 3: T-connection example.<br />

The realization of this T-connection in a switch cabinet is<br />

shown in Figure 4.<br />

X1<br />

1<br />

2<br />

K27.1<br />

3<br />

F13.1<br />

Figure 4: T-connection realization.<br />

In this resolution process it is not important which pairwise<br />

connections will be really realised. But, it has to be<br />

guaranteed that in <strong>the</strong> set of <strong>the</strong> given terminals <strong>the</strong>re<br />

exists an electrical connection between any two<br />

terminals and <strong>the</strong> capacity of <strong>the</strong> terminals allows <strong>the</strong><br />

envisaged connection sequence. In this example<br />

terminal X1:1 has capacity 1. Therefore, terminal X1:1<br />

can only be used as first or last terminal of a connection<br />

sequence.<br />

A T-connection can be considered as a hypernet and <strong>the</strong><br />

key problem of routing is <strong>the</strong> decomposition of this<br />

hypernet. The terminals involved in a hypernet must be<br />

connected by a tree, which branches out only at <strong>the</strong><br />

terminals. So <strong>the</strong> decomposition process of a hypernet<br />

(T-connection) involved <strong>the</strong> following problems:<br />

• It is not sufficient to route pair-wise connections<br />

optimal. Optimal tree structures have to be<br />

computed.<br />

• Terminals have maximum valences for technical<br />

reasons. It has to be clarified whe<strong>the</strong>r a<br />

decomposition of <strong>the</strong> hypernet is possible.<br />

Fur<strong>the</strong>rmore, since <strong>the</strong> tree structure will be serially<br />

realised by pair-wise connections <strong>the</strong>re is <strong>the</strong><br />

question which connection sequence is admissible<br />

that <strong>the</strong> procedure will not stopped by capacity<br />

reasons of <strong>the</strong> terminals during computation.<br />

2.4 Optimal tree in an edge-weighted graph<br />

We consider all terminals as nodes in a complete graph<br />

V . The capacity of <strong>the</strong> terminals will be characterized by<br />

+<br />

valences. For a node v ∈ V let potval ( v)<br />

∈ N <strong>the</strong><br />

given prospective valence. This valence is <strong>the</strong> maximum<br />

number of edges (connections) which can incident in this<br />

node. Let val( v)<br />

∈ N0<br />

be <strong>the</strong> actual number of incident<br />

edges in node v and freeval( v)<br />

= potval(<br />

v)<br />

− val(<br />

v)<br />

is<br />

<strong>the</strong> free connection capacity.<br />

In <strong>the</strong> case of potval(<br />

V ) = ∑ potval(<br />

vi<br />

) ≥ 2(<br />

n −1)<br />

than<br />

i=<br />

1<br />

a set of edges E can be generated that T = ( V , E)<br />

is a<br />

spanning tree (a resolved T-connection) in <strong>the</strong> complete<br />

graph V . This tree meets <strong>the</strong> valence constraints. For<br />

<strong>the</strong> spanning tree generation only <strong>the</strong> information about<br />

a global connection capacity is needed. The exact<br />

distribution of this global capacity among <strong>the</strong> nodes is<br />

not important. The constructive proof of this fact is also a<br />

recommendation for <strong>the</strong> generation of a valid connection<br />

sequence. The constellation at <strong>the</strong> beginning is <strong>the</strong> pure<br />

set of nodes of graph V . By successive addition of<br />

edges we generate subtrees T i . In <strong>the</strong> case that more<br />

than one subtree exist we have take into account that<br />

91<br />

n<br />

KK1


criteria freeval ( Ti<br />

) ≥ 1 is fulfilled. Is <strong>the</strong>re only one<br />

subtree, we have generated an envisaged spanning tree.<br />

2.5 The problem of multiple T-connections<br />

Two paired T-connections T1 and T2 are shown in Figure<br />

5. T-connection T1 represents a power subcircuit and<br />

connects terminals E, G, F and D. T-connection T2<br />

represents a control unit with terminals A, B, C and with<br />

one or more connections to T1.<br />

10<br />

T 1<br />

G F D<br />

E<br />

2.5<br />

T 2<br />

A B C<br />

Figure 5: Multiple T-connections.<br />

The connection from T2 to T1 is not more specified. In<br />

<strong>the</strong> resolution process of T1 all terminal capacities of E,<br />

i<br />

G, F, D are used. We define d X as capacity which is<br />

consumed by terminal X during <strong>the</strong> resolution of Tconnection<br />

Ti. Than is valid:<br />

1<br />

1<br />

1 ≤ d E ≤ potval(<br />

E)<br />

, 1 ≤ dG ≤ potval(<br />

G)<br />

, …<br />

1 1 1 1<br />

and d G + d E + d F + dD<br />

= 6 .<br />

We can consider <strong>the</strong> T2 resolution as computation of<br />

connection structure between terminals A, B, C and a<br />

virtual terminal T1 (Figure 6).<br />

T1 A B C<br />

Figure 6: T-connections virtual terminal.<br />

In this case is also valid:<br />

2<br />

1 ≤ d A ≤<br />

2<br />

potval(<br />

A)<br />

, 1≤<br />

d B ≤ potval(<br />

B)<br />

, …<br />

2<br />

1 ≤ dT ≤ potval(<br />

T1)<br />

,<br />

d<br />

1<br />

+ d<br />

+ d<br />

+ d<br />

=<br />

2 2 2 2<br />

A B C T1<br />

and<br />

.<br />

2 2 2 2 2 2 2<br />

= d A + d B + dC<br />

+ dG<br />

+ d E + d F + d D = 6<br />

1 2<br />

Inequalities like d A + d A ≤ potval(<br />

A)<br />

and so on have<br />

to be fulfilled as well. By this means we have got a<br />

system of diophantic equations and inequalities (DiGL).<br />

For each T-connection resolution a set of terminal<br />

capacities can be reserved. If all capacity sets meet <strong>the</strong><br />

system DiGL than all T-connections can be resolved. For<br />

each T-connection <strong>the</strong> set of terminal capacities can be<br />

92<br />

considered as a restriction for possible connection<br />

structures.<br />

2.6 Construction of a minimum connecting<br />

structure<br />

Now, in order to compute cost minimum trees we assign<br />

cost to each edge in graph V . The well known Kruskalalgorithm<br />

[4] can not be applied because it only works on<br />

graphs without restrictions concerning node valences.<br />

Therefore, we have developed a novel heuristic to solve<br />

this problem. This approach is similar <strong>the</strong> strategy we<br />

use for serial construction of optimal trees.<br />

The algorithm works on an edge-weighted graph<br />

G = ( V , E)<br />

and a set of nodes K ⊆ V . We will construct<br />

a minimum spanning tree in K with edges which belong<br />

to graph G .<br />

1. All nodes of subset K are defined as (trivial)<br />

subtrees.<br />

2. Are <strong>the</strong>re subtrees T with freeval ( T ) = 1 , we assign<br />

such trees to <strong>the</strong> start set. If not, than <strong>the</strong> tree<br />

selection for <strong>the</strong> start set is arbitrary. Let subtree s T<br />

be selected. All nodes k of T s with freeval ( k)<br />

> 0<br />

define start set S .<br />

3. Are <strong>the</strong>re more than two subtrees all subtrees T z<br />

with freeval ( Tz<br />

+ Ts<br />

) > 2 will be selected. O<strong>the</strong>rwise<br />

all remaining subtrees can be used for <strong>the</strong><br />

destination set. All nodes k of set T z with<br />

freeval ( k)<br />

> 0 are used for destination set Z .<br />

4. Start of <strong>the</strong> modified Dijkstra-algorithm. A cost<br />

minimum path will be computed which connects a<br />

node of start set S with a node k zz of destination<br />

set Z ( k zz belongs to i T ). By this s T and T i will be<br />

merged to a new subtree.<br />

5. Is <strong>the</strong>re more than one subtree than go to 2<br />

6. STOP.<br />

Now, we will roughly explain <strong>the</strong> applied modified<br />

Dijkstra-algorithm using an example (see Figure 7).<br />

1<br />

2<br />

9<br />

19<br />

19<br />

7<br />

18<br />

39<br />

34<br />

3<br />

4<br />

5<br />

6<br />

7<br />

Start nodes = 1,2; Destnation nodes = 17,18,19<br />

Cost minimum path = 2,5,11,14,17 with costs = 36<br />

33<br />

12<br />

8<br />

11<br />

16<br />

12<br />

35<br />

20<br />

32<br />

48<br />

8<br />

11<br />

9<br />

10<br />

13<br />

44<br />

22<br />

13<br />

2<br />

37<br />

21<br />

6<br />

12<br />

13<br />

14<br />

15<br />

16<br />

27<br />

20<br />

4<br />

3<br />

31<br />

1<br />

9<br />

18<br />

28<br />

7<br />

6<br />

47<br />

14 19<br />

Figure 7: Modified Dijkstra algorithm.<br />

In <strong>the</strong> example nodes 1 and 2 are start nodes (set S)<br />

and nodes 17, 18 and 19 are destination nodes (set Z).<br />

We compute <strong>the</strong> shortest path between each start and<br />

destination node. For each combination<br />

( vi, v j ), vi<br />

∈ S,<br />

v j ∈ Z<br />

a shortest path exists. Based on <strong>the</strong><br />

11<br />

17


set of all shortest paths <strong>the</strong> algorithm finds <strong>the</strong> best<br />

combination (start node, path, destination node) with<br />

minimum costs without computation of all combinations.<br />

For n nodes in subset K <strong>the</strong> computation of (n-1)<br />

shortest paths is necessary. We can estimate <strong>the</strong><br />

algorithmic complexity with O(|V| 2 *|K|). The algorithm<br />

used a Greedy-strategy. This means that only <strong>the</strong> next,<br />

absolute minimum path is taken. So, suboptimal paths<br />

which would fur<strong>the</strong>r reduce <strong>the</strong> shortest path length are<br />

not considered. Therefore, <strong>the</strong> algorithm can not find <strong>the</strong><br />

optimal solution in <strong>the</strong> following example (Figure 8).<br />

... ...<br />

...<br />

Figure 8: Example for a not optimal solution.<br />

As you can see all terminals have a capacity of 2. The<br />

algorithm will begin with <strong>the</strong> left most terminal in <strong>the</strong><br />

upper row as start node and will ever connect <strong>the</strong> next<br />

terminal to <strong>the</strong> right. Unfortunately, in <strong>the</strong> final step a<br />

connection between <strong>the</strong> terminal most to <strong>the</strong> right and<br />

<strong>the</strong> terminal in <strong>the</strong> second row will be generated. In <strong>the</strong><br />

optimal solution <strong>the</strong> terminal in <strong>the</strong> second row would be<br />

connected using <strong>the</strong> vertical channel (dotted line). But in<br />

realistic cases <strong>the</strong> algorithm delivers good results.<br />

2.7 Cable routing<br />

The basic algorithm for automatic wiring was extended to<br />

handle <strong>the</strong> problem of cable routing. This routing<br />

problem can be described as followed: A given shielded<br />

cable consists of several insulated conductors. At both<br />

cable ends it has to be spliced that <strong>the</strong> different wires<br />

can be connected with <strong>the</strong> corresponding terminals. So,<br />

<strong>the</strong> task of optimal cable routing consists in to compute<br />

optimal splice points with <strong>the</strong> restriction that <strong>the</strong> wires<br />

are connectable with <strong>the</strong> terminals and <strong>the</strong> unshielded<br />

wire lengths are minimal. We have developed a novel<br />

algorithm which computes both optimal splice points and<br />

an optimal wiring of <strong>the</strong> unshielded connections. The<br />

algorithm determines <strong>the</strong> optimal spanning tree<br />

connecting <strong>the</strong> terminal points. Due to <strong>the</strong> rectangular<br />

layout of <strong>the</strong> channel framework <strong>the</strong> optimal splice point<br />

can be calculated by walking through <strong>the</strong> spanning tree<br />

and to register <strong>the</strong> balance of terminal points "behind"<br />

and "in front" of <strong>the</strong> current position in <strong>the</strong> spanning tree<br />

[5].<br />

3 SUMMARY<br />

It has been shown that <strong>the</strong> developed wiring algorithms<br />

can meet <strong>the</strong> practical requirements. They are integrated<br />

in an <strong>ECAD</strong>-system and used for wiring of mounting<br />

plates. The next work is concentrated on wiring of a<br />

system of mounting plates.<br />

...<br />

Figure 9: Wired mounting plate<br />

4 ACKNOWLEDGEMENT<br />

The authors are grateful to <strong>the</strong> Federal Ministry of<br />

Economics and Labour of Germany (BMWA) for <strong>the</strong><br />

financial support of several projects on this subject such<br />

as KAVal under <strong>the</strong> project code 1024/99 and Autent<br />

under <strong>the</strong> project code KF 0012518KWD2.<br />

5 REFERENCES<br />

[1] Schneider, D., Roller, D., 1999, Elektro-CAD am<br />

Wendepunkt, CADWORLD 5.<br />

[2] Lengauer, T., 1990, Combinatorial algorithms for<br />

integrated circuit layout, John Wiley&Sons,<br />

[3]<br />

Chichester, UK.<br />

Vigerske, W., Goetze, B., Pleßow, M., Wrobel, G.,<br />

1999, Automatische Verdrahtung in Schaltanlagen,<br />

ZwF Zeitschrift für wirtschaftlichen Fabrikbetrieb,<br />

Heft 1 und 2, Carl-Hanser-Verlag, München.<br />

[4] Kruskal, J.B., 1956, On <strong>the</strong> shortest spanning<br />

subtree of a graph and <strong>the</strong> travelling salesman<br />

problem, Proceedings of <strong>the</strong> Amarican<br />

[5]<br />

Ma<strong>the</strong>matical Society, 7(1), pp. 48-50.<br />

Vigerske, W. :Diskussionspapier zum Kabelrouting.<br />

Arbeitsdokument, GFaI-Autent-22-03, GFaI, Berlin,<br />

2003.<br />

93


PART 5<br />

PCB DESIGN & KNOWLEDGE<br />

MANAGEMENT<br />

94


Abstract<br />

Hybrid Genetic Algorithm for Xilinx-style FPGA Placement<br />

M. Yang and A. E. A. Almaini<br />

School of Engineering<br />

Napier University, Edinburgh, EH10 5DT<br />

Genetic algorithm (GA) techniques are well -suited for solving a wide range of combinatorial optimization<br />

problems. However, infeasible individuals may be generated during <strong>the</strong> search in <strong>the</strong> constraint search<br />

space. This paper introduces a useful representation for two-dimensional Xilinx-style FPGA placement. To<br />

achieve fast convergence and better solution, a hybrid GA is used. Empirical results show fitness<br />

improvement of 52% on average on 9 MCNC benchmarks com pared to <strong>the</strong> results using standard GA based<br />

on 200 generations . After placement, <strong>the</strong> competitive routing channel results are compared to <strong>the</strong> res ults<br />

obtained by <strong>the</strong> Versatile Place and Route (VPR) package.<br />

Keywords:<br />

Hybrid Genetic Algorithm, Placement, FPGA<br />

1 INTRODUCTION<br />

Since <strong>the</strong>ir first introduction in early 80s, Field<br />

Programmable Gate Arrays (FPGAs) have gained<br />

increasing popularity in implementing digital circuits.<br />

Especially as process geometry has shrunk to deep-<br />

submicron, <strong>the</strong> logic capacity of FPGAs has significantly<br />

increased. In FPGAs, all routing resources are<br />

prefabricated; <strong>the</strong> width of all <strong>the</strong> routing channels is set<br />

by <strong>the</strong> FPGA manufacturer. The goal of placement and<br />

routing is <strong>the</strong>n to find efficient utilization of limited and<br />

prefabricated routing resources for different types of<br />

circuits.<br />

Placement problem has been found to be NP-complete,<br />

implying <strong>the</strong>re is unknown deterministic algorithm to solve<br />

it in polynomial time. Several algorithms such as min-cut<br />

algorithm [1], force-directed algorithm [2], and simulated<br />

annealing [3] and so on have been proposed to solve this<br />

problem.<br />

Genetic algorithm (GA) is stochastic search algorithm<br />

based on biological evolution models, whose main<br />

advantage lies in its robustness of search and problem<br />

independence. The basic concepts of GA were developed<br />

by Holland in 1975 [ 4]. Since <strong>the</strong>n it has been widely<br />

applied for solving problems in physical layout, including<br />

standard cell placement [ 5], macro cell placement and<br />

routing [6], traditional channel routing [7] and over-<strong>the</strong>-cell<br />

(OTC) routing [8].<br />

95<br />

Although GA has characteristics of robustness and wide<br />

range search space, it normally takes a large number of<br />

generations to converge to optimum. This makes fast<br />

prototyping of FPGA difficult and impractical for large<br />

circuits. As a result, a hybrid algorithm is introduced to<br />

overcome long computation time.<br />

In <strong>the</strong> paper, section 2 gives a brief description of FPGA<br />

architecture, in particular symmetrical architecture used in<br />

<strong>the</strong> experimental results . Section 3 presents placement<br />

problem definition in Xilinx-style FPGA. In section 4<br />

description of hybrid genetic algorithm is given.<br />

Experimental results showing <strong>the</strong> effectiveness of <strong>the</strong><br />

proposed approach are presented in section 5.<br />

Conclusions are <strong>the</strong>n given in section 6.<br />

2 FPGA ARCHITECTURE<br />

In 1985 Xilinx Inc introduced <strong>the</strong> first Look-Up Table<br />

(LUT) based FPGA. FPGAs are more flexible and<br />

complex than o<strong>the</strong>r programmable devices such as<br />

Programmable Logic Array (PLA) and Programmable<br />

Array Logic (PAL). With <strong>the</strong> rapid improvements in <strong>the</strong><br />

performance and logic densities of <strong>the</strong> FPGAs , <strong>the</strong><br />

number of applications continues to increase.<br />

An FPGA consists of configurable logic blocks (CLBs),<br />

which typically contain ei<strong>the</strong>r combinational or sequential<br />

logic circuits, Input/Output blocks (IOBs) and routing<br />

resources such as wire segm ents and programmable


switches [9]. Programmable switches configure <strong>the</strong> wire<br />

segments between logic blocks and between logic and<br />

I/O blocks. Over <strong>the</strong> last 10 years, several companies<br />

have introduced a number of different types of FPGAs<br />

based on much more complicated architecture than<br />

previous FPGAs to improve <strong>the</strong>ir performance. The<br />

architecture of an FPGA can be subdivided into two main<br />

parts, logic block architecture and routing architecture.<br />

The logic block architectures [10] are:<br />

1. Look-up tables (LUTs);<br />

2. multiplexers;<br />

3. PLD blocks ;<br />

4. transistor pair<br />

The routing architecture is an important characteristic of<br />

an FPGA as routing resources, which occupy 50-90% of<br />

<strong>the</strong> chip area [11]. All types of routing architectures [10]<br />

can be classified into one of four categories . These are:<br />

1. symmetrical;<br />

2. row based;<br />

3. sea-of-gates ;<br />

4. hierarchical<br />

In this paper, we will exclusively investigate <strong>the</strong><br />

symmetrical routing architecture. This style of routing<br />

architecture is shown in Figure 1.<br />

Figure 1: General architecture of Xilinx FPGA.<br />

Logic blocks are surrounded by routing channels of<br />

prefabricated wiring segments on all four sides. A logic<br />

block input or output, which is normally called a pin, can<br />

connect to some or all of <strong>the</strong> wiring segments in <strong>the</strong><br />

channel adjacent to it via a connection block of<br />

programmable switches. At every intersection of a<br />

horizontal channel and vertical channel, <strong>the</strong>re is a switch<br />

block. This is simply a set of programmable switches that<br />

allow some of <strong>the</strong> wire segments incident to <strong>the</strong> switch<br />

block to be connected to o<strong>the</strong>rs. By turning on <strong>the</strong><br />

96<br />

appropriate switches, short wire segment can be<br />

connected toge<strong>the</strong>r to form longer connections.<br />

3 PLACEMENT PROBLEM DEFINITION<br />

The goal of placement algorithm is to determine which<br />

logic block within an FPGA should implement each of <strong>the</strong><br />

logic blocks required by <strong>the</strong> circuit. The optimized<br />

placement is to place connected logic blocks close<br />

toge<strong>the</strong>r so that <strong>the</strong> wire length of placement can be<br />

minimized.<br />

In this paper, we only focus on one optimization goal of<br />

minimizing routing channel density (routability-driven<br />

placement). As a result, <strong>the</strong> quality of <strong>the</strong> placement<br />

depends on <strong>the</strong> routing density after <strong>the</strong> router connects<br />

prefabricated programmable switches while implementing<br />

<strong>the</strong> circuit.<br />

4 HYBRID GENETIC ALGORITHM<br />

4.1 Genetic algorithm<br />

The genetic algorithm (GA) is a search technique which<br />

mimics <strong>the</strong> natural process of evolution as a means of<br />

progressing to <strong>the</strong> optimum. It starts with an initial set of<br />

random configurations termed a population. Each<br />

individual in <strong>the</strong> population is a string of genes. The string<br />

made up of genes is termed chromosome. The<br />

chromosome represents a solution to <strong>the</strong> problem. During<br />

each iteration, which is termed generation, <strong>the</strong> individuals<br />

in <strong>the</strong> current population are evaluated using<br />

measurement of fitness function. Based on <strong>the</strong> fitness<br />

value, two individuals at a time are selected from <strong>the</strong><br />

population. The individuals with higher fitness value will<br />

have more chance to be selected by using crossover<br />

operator followed by mutation operator to generate new<br />

individual solutions called offsprings.<br />

Hybrid GA (HGA) is a standard GA (SGA) which performs<br />

local optimization in every generation to overcome long<br />

computation time and improve fitness of SGA. The HGA<br />

is shown in Algorithm 1. The algorithm begins with an<br />

initial set of random population. After evaluating fitness of<br />

current population, <strong>the</strong> population is reproduced<br />

according to fitness. The fitter <strong>the</strong> individual, <strong>the</strong> more<br />

chance it has to be selected. Two individuals are<br />

randomly selected as parents to generate offsprings by<br />

using crossover operator based on high probability of<br />

crossover. Mutation operator with low probability rate is<br />

carried out. After that, local improvement with low


probability rate is applied to randomly selected individuals<br />

so that visible improvement can be achieved, resulting in<br />

shorter search time. The elitism is employed to retain <strong>the</strong><br />

good solution. After a fixed number of generations, <strong>the</strong><br />

fittest individual, namely <strong>the</strong> one with highest fitness<br />

value, is returned as <strong>the</strong> desired solution.<br />

MAX_GENS: maximum number of generations<br />

POP_SIZE: population size<br />

NUM_GENE: number of genes<br />

NUM_BLOCK: number of blocks for each benchmark<br />

NUM_MOVE: number of moves per individual in local<br />

improvement<br />

Pcrossover: probability of crossover rate<br />

Pmutation: probability of mutation rate<br />

Plocal: probability of local improvement rate<br />

begin<br />

Generate an initial population<br />

for generation = 1 to MAX_GENS do<br />

end for<br />

end algorithm<br />

evaluate population fitness values;<br />

reproduce population probabilistically<br />

based on <strong>the</strong> individual's fitness value;<br />

for i = 1 to POP_SIZE/2 do<br />

pair two parents randomly;<br />

crossover based on Pcrossover;<br />

produce two new offspring;<br />

end for<br />

for j=1 to NUM_GENE do<br />

end for<br />

mutate offsprings based on Pmutation;<br />

for i = 1 to POP_SIZE do<br />

local improvement based on Plocal and<br />

NUM_MOVE ;<br />

end for<br />

elitism;<br />

Algorithm 1 : Pseudo-code of HGA.<br />

4.2 Genetic encoding<br />

In <strong>the</strong> above GA procedure, a chromosome pertaining to<br />

a possible placement solution is represented as a string<br />

with length which equals to <strong>the</strong> numbers of logic blocks in<br />

<strong>the</strong> FPGA. For example, if <strong>the</strong> size of FPGA is 4 by 4, <strong>the</strong><br />

numbers of <strong>the</strong> blocks are 16 and <strong>the</strong> length of<br />

97<br />

chromosome is 16. The values of string can be ei<strong>the</strong>r<br />

positive integer or -1. The positive integer represents ID<br />

of <strong>the</strong> block and <strong>the</strong> value -1 represents empty block. The<br />

position of block in an FPGA is numbered according to its<br />

X-Y position. The block ID is mapped to chromosome<br />

according to its number, e.g. Block 10 with number 1 in<br />

<strong>the</strong> FPGA is mapped to position 1 of <strong>the</strong> chromosome as<br />

shown in Figure 4.<br />

4.3 Selection operator<br />

Figure 2: Genetic encoding.<br />

The GA procedure carries out <strong>the</strong> genetic selection<br />

operator in which individual strings are chosen according<br />

to <strong>the</strong>ir fitness values. A proportional selection scheme as<br />

suggested by Goldberg is employed to select fitter<br />

parents which are required for reproduction. There are a<br />

number of ways to implement <strong>the</strong> selection operator. The<br />

easiest way is to create a biased roulette wheel where<br />

each current chromosome in <strong>the</strong> population has a roulette<br />

wheel slot sized in proportion to its fitness. An individual is<br />

selected by spinning <strong>the</strong> roulette wheel and noting <strong>the</strong><br />

position of <strong>the</strong> marker. However, <strong>the</strong> absolute difference<br />

between an individual’s actual sampling probability and its<br />

expected value is nonzero, resulting in inefficient<br />

reproduction. Hence stochastic universal selection with<br />

zero bias [13] is em ployed in <strong>the</strong> reproduction process<br />

4.4 Fitness measure<br />

A fitness function is used to evaluate <strong>the</strong> quality of<br />

placement. Its functional form is <strong>the</strong> sum of all nets in <strong>the</strong><br />

circuit, as shown in Equation 1<br />

f =<br />

N<br />

100<br />

∑ q(i)[bb (i) + bb (i)]<br />

x y<br />

i = 1<br />

where N stands for number of nets. For each net i, bbx (i)<br />

(1)


and (i)<br />

bb y<br />

denote <strong>the</strong> horizontal and vertical spans of its<br />

bounding box respectively. q(i) factor, which is adapted<br />

from [12], compensates for <strong>the</strong> fact that <strong>the</strong> bounding box<br />

wire length model underestimates <strong>the</strong> wiring necessary to<br />

connect nets with more than three terminals. Its value<br />

depends on <strong>the</strong> number of terminals of <strong>the</strong> net i.<br />

It should be noted that high fitness value indicates a<br />

placement with shorter wire length, hence a better<br />

solution.<br />

4.5 Crossover operator<br />

Crossover is <strong>the</strong> main genetic operator. It operates on two<br />

individuals and generates two offsprings. It is an<br />

inheritance mechanism where <strong>the</strong> offspring inherits some<br />

of <strong>the</strong> characteristics of <strong>the</strong> parents. The operation<br />

consists of choosing a random cut point and generating<br />

<strong>the</strong> offspring by combing <strong>the</strong> segment of <strong>the</strong> o<strong>the</strong>r parent<br />

to <strong>the</strong> right of <strong>the</strong> cut. Unfortunately, <strong>the</strong> elements to <strong>the</strong><br />

left of crossover cut point in one parent appear on <strong>the</strong><br />

right of <strong>the</strong> second parent. This duplication does not<br />

represent a feasible placement solution. Modification of<br />

crossover to avoid duplication has to be carried out.<br />

The modification is implemented as follows. Choose a<br />

random cut point and copy <strong>the</strong> entire segments following<br />

<strong>the</strong> cut point in parent 1 to <strong>the</strong> offspring. Next, <strong>the</strong> left<br />

segment of parent 1 is scanned from <strong>the</strong> left most, gene<br />

by gene, to <strong>the</strong> point of <strong>the</strong> cut. If a gene does not appear<br />

in <strong>the</strong> offspring <strong>the</strong>n it is copied to <strong>the</strong> offspring. However,<br />

if it already exits in <strong>the</strong> offspring, <strong>the</strong>n its position in parent<br />

2 is determined and gene from parent 1 in <strong>the</strong> determined<br />

position is copied. If <strong>the</strong> determined gene still exits in <strong>the</strong><br />

offspring, determine <strong>the</strong> position in parent 2 as before<br />

until <strong>the</strong> gene does not exit in <strong>the</strong> offspring. One particular<br />

case is <strong>the</strong> gene -1 which means <strong>the</strong> block is empty. If<br />

<strong>the</strong>re is no empty block in parent 2, <strong>the</strong> empty gene is<br />

copied to <strong>the</strong> offspring in <strong>the</strong> same way as a gene does<br />

not appear in <strong>the</strong> offspring. However, if empty blocks do<br />

exit, it will randomly select any one of empty positions in<br />

parent 2 and <strong>the</strong> gene from parent 1 in <strong>the</strong> selected<br />

position is <strong>the</strong>n copied to <strong>the</strong> offspring. The selected<br />

empty position is marked to avoid being us ed again. An<br />

example is shown in Figure 3. One possible placement,<br />

which is shown in Figure 2, is encoded as a string of 16<br />

bits, namely, { -1,10,2,-1,1,3,8,5,-1,4,-1,6,9,7,-1,11}. The<br />

o<strong>the</strong>r parent is {1,-1,-1,3,7,11,10,-1,5,6,8,9,-1,2,4,-1}. The<br />

cut point is 7.<br />

98<br />

4.6 Mutation operator<br />

Figure 3: Modified crossover.<br />

Mutation produces incremental random changes in <strong>the</strong><br />

offspring generated by <strong>the</strong> crossover to overcome early<br />

converge to a local optimum . In <strong>the</strong> placement, <strong>the</strong><br />

mutation is pair-wise interchange, namely, two genes of<br />

<strong>the</strong> chromosome are randomly selected according to<br />

probability of mutation rate and <strong>the</strong>ir positions swapped.<br />

4.7 Local improvement<br />

After reproduction, crossover and mutation are<br />

performed, a local improvement is applied to <strong>the</strong> selected<br />

offspring in <strong>the</strong> current population based on <strong>the</strong><br />

probability of local improvement rate. The local<br />

improvement is performed in every generation and keeps<br />

switching blocks in <strong>the</strong> FPGA a number of times for<br />

randomly selected individual in order to improve <strong>the</strong><br />

fitness of this particular individual. Some good schema of<br />

this individual is more likely to be selected and passed to<br />

next generation. The main goal of this process is to get<br />

some visible improvement in <strong>the</strong> offspring ra<strong>the</strong>r than<br />

obtaining a local optimum value. So <strong>the</strong> improvement rate<br />

is kept as low as possible and movement per individual is<br />

also kept to small value. As a result, <strong>the</strong> time for<br />

convergence is reduced significantly.<br />

5 EXPERIMENTAL RESULTS<br />

In this section, experimental results obtained with an<br />

implementation of SGA and HGA to Xilinx-style FPGA are<br />

reported. The implementation is written in <strong>the</strong> C<br />

programming language. All experiments were performed<br />

on Intel Celeron 897 with 128M memory under Linux.<br />

Performance is measured using 9 MCNC benchmark<br />

circuits from VPR placement and routing tool [12]. (Note:<br />

<strong>the</strong> authors can not find benchmark alu4 so e64 which<br />

was shown in <strong>the</strong> appendix of [12] is used instead.)<br />

Table 1 lists <strong>the</strong> main characteris tics of <strong>the</strong>se benchmark<br />

circuits.


Name<br />

No. of<br />

blocks<br />

No. of<br />

nets<br />

No. of<br />

CLBs<br />

No. of<br />

I/Os<br />

9symml 107 106 97 9/1<br />

alu2 213 207 197 10/6<br />

apex7 188 151 102 49/37<br />

e64 404 339 274 65/65<br />

example2 289 223 138 85/66<br />

k2 609 564 519 45/45<br />

term1 132 122 88 34/10<br />

too-lrg 228 225 187 38/3<br />

vda 374 308 291 17/39<br />

Table 1: Benchmark characteristic<br />

The parameter values are selected following some<br />

experiments and based on previous experience.<br />

Pcrossover=0.6, Pmutation=0.005, POP_SIZE=50. Since<br />

SGA does not involve local improvement mutation<br />

operator, <strong>the</strong> parameter values are Plocal=0 and<br />

MAX_GENS=1000. While in HGA, <strong>the</strong> parameter values<br />

are Plocal=0.05, MAX_GENS=200 and NUM_MOVE=10<br />

X NUM_BLOCK. For example, NUM_MOVE =1070 for<br />

9symml in Table 1.<br />

As can be seen in Table 2, <strong>the</strong> fitness is improved on<br />

average by 79% in 1000 generations compared to initial<br />

random cost of placement. Fur<strong>the</strong>r 52% improvement just<br />

in 200 generations is gained when HGA is employed<br />

compared to SGA. Figure 4 illustrates initial fitness before<br />

optimization, fitness obtained by SGA and HGA for 9<br />

MCNC benchmarks, respectively.<br />

The placement from VPR and our SGA and HGA<br />

algorithms are routed by VPR router. The resulting<br />

channel densities are compared, as shown in Table 3.<br />

The main steps are illustrated by <strong>the</strong> flow chart in<br />

Figure 5. All parameter values for routing are set equal for<br />

<strong>the</strong> purpose of fair comparison.<br />

Name<br />

initial<br />

average<br />

fitness<br />

f<br />

fitness<br />

of SGA<br />

f<br />

improvement<br />

comp. to<br />

init.fitness<br />

%<br />

fitness<br />

of HGA<br />

f<br />

improve<br />

-ment<br />

comp.to<br />

SGA<br />

%<br />

9symml 1349 2147 59 2799 30<br />

alu2 1732 2921 69 4159 42<br />

apex7 1495 3299 121 4364 32<br />

e64 2246 3638 62 6391 76<br />

example2 1528 3626 137 6746 86<br />

k2 3062 4749 55 8261 74<br />

term1 1323 2375 80 2944 24<br />

too-lrg 1957 3239 66 4557 41<br />

vda 2033 3258 60 5293 62<br />

average 79 52<br />

Table 2: Comparison of fitness<br />

99<br />

fitness<br />

10000<br />

9000<br />

8000<br />

7000<br />

6000<br />

5000<br />

4000<br />

3000<br />

2000<br />

1000<br />

0<br />

9symml<br />

alu2<br />

Comparison of fitness<br />

apex7<br />

e64<br />

example2<br />

benchmark<br />

k2<br />

term1<br />

initial average<br />

fitness<br />

fitness obtained<br />

by SGA<br />

fitnest obtained<br />

by HGA<br />

Figure 4: Comparison of fitness based on Table 2.<br />

Placer FPGA<br />

SGA HGA<br />

VPR<br />

Router Size<br />

VPR VPR<br />

9symml 10x10 5 6 5<br />

too-lrg<br />

alu2 15x15 6 10 7<br />

apex7 11x11 5 8 5<br />

e64 17x17 8 17 8<br />

example2 19x19 5 8 5<br />

k2 23x23 9 20 11<br />

term1 10x10 5 7 5<br />

too-lrg 14x14 7 12 8<br />

vda 18x18 8 14 9<br />

Total 58 102 63<br />

Table 3: Comparison of channel density of<br />

GA and VPR<br />

Figure 5 : CAD flow chart.<br />

vda


6 CONCLUSIONS<br />

In <strong>the</strong> paper, SGA and HGA for Xilinx-style FPGA<br />

placement are presented. The experiment verified that <strong>the</strong><br />

proposed SGA is effective for improving fitness for small<br />

size circuits. The fitness improved by 79% on average<br />

compared to fitness without optimization for 9 MCNC<br />

benchmark circuits , though a large number of generations<br />

is required to convergence to optimum. However, <strong>the</strong><br />

proposed HGA can overcome this problem. It can obtain<br />

fur<strong>the</strong>r improvement of 52% on fitness on average<br />

compared to <strong>the</strong> results obtained by SGA and significantly<br />

reduce <strong>the</strong> numbers of generations for convergence.<br />

7 REFERENCES<br />

[1] Lau<strong>the</strong>r, U., 1979, A min-cut placement algorithm of<br />

general cell assemblies based on a graph<br />

representation, Proceedings of 16th Design<br />

Automation Conference, 1-10.<br />

[2] Johannes, F. M., Just, K. M. and Antreich, K. J.,<br />

1983, On <strong>the</strong> force placement of logic arrays,<br />

Proceedings of <strong>the</strong> 6th European Conference on<br />

Circuit Theory and Design, 203-206.<br />

[3] Sechen, C. and Sangiovanni-vincentelli, A., 1986,<br />

TimberWolf3.2: A new standard cell placement and<br />

global routing package, Proceedings of 23rd Design<br />

Automation Conference, 432-439.<br />

[4] Goldberg, D. E., 1989, Genetic algorithms in search,<br />

optimization, and machine learning, Addison Wesley.<br />

[5] Shahookar, K. and Mazumder, P., 1990, A genetic<br />

approach to standard cell placement using meta-<br />

100<br />

genetic parameter optimization, IEEE Trans actions<br />

on CAD, 9/2: 500-511.<br />

[6] Ma zumder, P. and Rudnick, E. M., 1999, Genetic<br />

algorithms for VLSI design, layout & test automation,<br />

Prentice Hall PTR.<br />

[7] Rahmani, A.T. and Ono, N., 1993, A genetic<br />

algorithm for channel routing problem, Proceeding of<br />

<strong>the</strong> 5th International. Conference on Genetic<br />

Algorithms, 494-498.<br />

[8] Goni, B. M., Arslan, T. and Turton, B., 2000, A<br />

genetic algorithm for over-<strong>the</strong>-cell and channel area<br />

optimization, Proceeding of <strong>the</strong> 2000 Congress on<br />

Evolutionary Computation 1:586-592.<br />

[9] Xilinx Inc., 1997, XC4000E and XC4000X series<br />

FPGAs, Data sheet.<br />

[10] Rose J., Gamal, A. E. and Sangiovanni-vincentelli,<br />

A., 1993, Architecture of Field-Programmable Gate<br />

Arrays, Proceedings of <strong>the</strong> IEEE, 81/7:1013-1029.<br />

[11] Brown, S., Francis, R. J., Rose, J. and Vranesic,<br />

Z.G., 1992, Field Programmable Gate Arrays, Kluwer<br />

Academic Publishers .<br />

[12] Betz, V., Rose, J. and Marquardt, A., 1999,<br />

Architecture and CAD for Deep-Submicron FPGAs,<br />

Kluwer Academic Publishers .<br />

[13] Baker, J. E., 1987, Reducing bias and inefficiency in<br />

<strong>the</strong> selection algorithm, Proceedings of <strong>the</strong> 2nd<br />

international conference on genetic algorithms and<br />

<strong>the</strong>ir applications, 14-21.


MAINTAINING ELECTROMAGNETIC COMPATIBILITY THROUGH<br />

DESIGN FOR FABRICATION AND ASSEMBLY OF PRINTED CIRCUIT<br />

BOARDS (PCBs)<br />

Tom Page, * Paul Baguley and * Dirk Schaefer<br />

Department of Design & Technology, Loughborough University, Loughborough, Leics. UK.<br />

* School of Engineering, Durham University, Durham, UK.<br />

ABSTRACT<br />

Recent regulations have demanded that electronics manufacturing companies control emissions<br />

from <strong>the</strong>ir products and <strong>the</strong> susceptibility of <strong>the</strong>ir products to emissions from o<strong>the</strong>r products. In<br />

addition, unexpected product failure and <strong>the</strong> ever-present demands of technology are also forcing <strong>the</strong><br />

electronics industry to face <strong>the</strong> need to maintain electrical integrity.<br />

Our investigations into high-speed design techniques have shown three major causes of failure:<br />

emissions from interconnecting conductors; poor PCB layout and lack of technical knowledge in<br />

electromagnetic compatibility (EMC). Catching <strong>the</strong>se kinds of electrical integrity problems early in <strong>the</strong><br />

design phase allows designers to take timely action without jeopardising project time scales. The<br />

work reported here presents design for manufacturing guidelines and rules to maintain electrical<br />

integrity in printed circuit boards (PCBs). Currently, a common method for handling EMC is through<br />

compliance testing of <strong>the</strong> final product. Similarly, noise budget is measured on finished prototypes.<br />

Since product life cycles are reducing, dealing with EMC late in <strong>the</strong> design cycle is undesirable. The<br />

cost of fixing may also be higher at a final stage because only a few options are available to correct<br />

<strong>the</strong> problem. A ‘find and fix’ approach is no longer acceptable anymore.<br />

More and more companies are facing or will soon be facing EMC and electrical integrity issues.<br />

The majority of analysis tools available today are targeted toward simulation engineers. Such tools<br />

are not easy to use and are dependent on <strong>the</strong> availability and accuracy of complex simulation models.<br />

Moreover, <strong>the</strong>y also tend to be ineffective on how to correct potential EMC problems.<br />

KEYWORDS: Design for Manufacture, EMC, PCB Design<br />

1 INTRODUCTION<br />

The electronics industry is ever-changing, a<br />

good indication of <strong>the</strong>se changes is to consider<br />

microprocessor performance over <strong>the</strong> last few years.<br />

The graph shown in Figure 1 illustrates <strong>the</strong> past,<br />

present and future trends in microprocessor clock<br />

frequency thus necessitating <strong>the</strong> need for signal<br />

integrity issues so as to prevent or minimise <strong>the</strong> effects<br />

of electro-magnetic interference.<br />

Interconnecting traces exhibit “parasitics” such<br />

as self inductance, self capacitance, mutual inductance<br />

and capacitance with <strong>the</strong>ir surroundings. These<br />

parasitics are very small factors with signals running at<br />

low frequencies, but cannot be ignored at high speed.<br />

Presently, <strong>the</strong> continual increase of clock frequencies<br />

and faster rise and fall times, cause interconnects to<br />

start act active as active elements of <strong>the</strong> design and<br />

interconnect delays start to become even greater <strong>the</strong>n<br />

component delays. In o<strong>the</strong>r words, at higher<br />

frequencies, a signal trace becomes an interconnect<br />

component. A PCB trace alone can be represented as<br />

101<br />

a transmission line consisting of series inductance and<br />

shunt capacitance elements distributed along <strong>the</strong> line.<br />

At high speed, a signal propagating down <strong>the</strong> line<br />

has to charge up each inductor and capacitor element<br />

before it is passed to <strong>the</strong> next element. It is intuitively easy<br />

to understand that this charging process has <strong>the</strong> effect of<br />

reducing <strong>the</strong> propagation time and increase <strong>the</strong> impedance<br />

of <strong>the</strong> trace.<br />

The characteristic impedance (electromagnetic wave<br />

resistance) of a PCB trace is determined primarily by its<br />

width, <strong>the</strong> PCB material and <strong>the</strong> thickness between signal<br />

layer and power plane. The physical construction of <strong>the</strong><br />

PCB may be considered as a wave-guide made up of trace<br />

geometry, dielectric insulator and planes. A typical PCB<br />

layer cross-section can be can be divided in five different<br />

configurations: microstrip; embedded microstrip; dual<br />

microstrip; stripline and dual stripline. Each configuration<br />

has its own characteristic impedance and propagation<br />

delay.


MHz<br />

100,000<br />

10,000<br />

1000<br />

100<br />

10<br />

1<br />

0.1<br />

Impedance is expressed as: Z =<br />

80286<br />

8086<br />

1486 TM<br />

Processor<br />

1386 TM<br />

Processor<br />

Pentium- Pro®<br />

Processor<br />

Pentium®<br />

Processor<br />

‘75 ‘80 ‘85 ‘90 ‘95 ‘00 ‘05 ‘10 ‘15<br />

Projected<br />

10GHz<br />

Figure 1:Moore’s Law, Frequency with respect to time<br />

L ---------- (1)<br />

C<br />

2 CROSS-SECTIONS OF VARIOUS<br />

TRANSMISSION LINE CONFIGURATIONS<br />

Microstrip : A track routed over a solid ground plane.<br />

Embedded Microstrip: Same as microstrip but trace is<br />

buried in <strong>the</strong> insulator.<br />

Dual microstrip: Two surface traces buried in <strong>the</strong><br />

insulator.<br />

Stripline: Case of a wire sandwiched between two<br />

planes.<br />

Dual stripline: Two traces centred between two planes.<br />

With reference to figure 2, a signal runs faster on<br />

microstrip configuration than on stripline. So for a given<br />

delay, longer tracks are permitted with a microstrip<br />

configuration. It is important to note that, a wire routed<br />

in microstrip is not shielded from emissions by <strong>the</strong><br />

Microstrip Stripline<br />

Embedded Microstrip Dual Stripline<br />

Dual Microstrip<br />

Source: Intel<br />

L being <strong>the</strong> per unit length<br />

inductance and C <strong>the</strong> per unit<br />

length capacitance.<br />

power and ground planes as it would be <strong>the</strong> case of a wire<br />

routed in stripline.<br />

Shielding in case of stripline gives typically a<br />

reduction of emissions by up to 10bB. For high speed<br />

boards, place power and ground planes directly adjacent.<br />

This will maximise <strong>the</strong> capacitive coupling and thus reduce<br />

supply noise. Also use extra ground planes (and not pwer<br />

planes) to isolate routing layers. For example, for an 8<br />

layer PCB (4 routing), <strong>the</strong> best assignment for EMC<br />

performance is S1, G, S2, G, P, S3, G, S4 where S = signal<br />

routing layer, G = ground plane and P = power plane.<br />

Figure 2: Cross-sections of various transmission line configurations<br />

102


3 PROPAGATION DELAY<br />

Propagation Delay is a complex function of many<br />

parameters including incluing inpedance and loading.<br />

Intended functionality requires that timing constraints<br />

have to be defined. Here are two examples. Delay<br />

control, see figure 3, if Tpd is too long, <strong>the</strong>n <strong>the</strong> pulse will<br />

arrive too late for <strong>the</strong> intended function.<br />

Figure 3: Delay control<br />

Skew management, see figure 4, <strong>the</strong> path delay of<br />

A+C OR B+C must be equal to D within device tolerance.<br />

Important factors for skew management are gate<br />

propagation delays and copper trace delays. Effective<br />

skew management is ideally performed in <strong>the</strong> time<br />

domain not in <strong>the</strong> geometrical domain.<br />

Figure 4: Skew management<br />

4 ATTENUATION<br />

At high frequencies, current density no longer<br />

becomes evenly distributed in <strong>the</strong> cross-section of <strong>the</strong><br />

trace. The current density becomes higher near <strong>the</strong><br />

surface of <strong>the</strong> trace and <strong>the</strong> resistor of <strong>the</strong> conductor<br />

increases. This skin effect has a consequence on <strong>the</strong><br />

high harmonic frequencies and is responsible for signal<br />

degradation and attenuation. Because of <strong>the</strong> skin effect,<br />

a square pulse shape will become slightly rounded. Also,<br />

while <strong>the</strong> resistance increases with <strong>the</strong> frequency, <strong>the</strong><br />

intrinsic trace inductance reduces and it is <strong>the</strong>n <strong>the</strong> loop<br />

inductance that becomes <strong>the</strong> dominant paramater in<br />

<strong>the</strong>characteristic impedance. This inductance is a<br />

function of <strong>the</strong> geometry of <strong>the</strong> signal and its ground<br />

return path. In order to minimise <strong>the</strong>se effects with high<br />

speed signals, short and wide tracks are highly<br />

recommended.<br />

103<br />

Original<br />

Effects of attenuation<br />

Figure 5: Effects Attenuation on an original pulse<br />

5 REFLECTIONS<br />

A signal propagating down a lossless line of<br />

constant characteristic impedance will travel along <strong>the</strong><br />

line without distortion. However, when <strong>the</strong> signal arrives<br />

at <strong>the</strong> end of <strong>the</strong> line (after Td time), reflection will occur if<br />

<strong>the</strong> load impedance does not match <strong>the</strong> impedance of <strong>the</strong><br />

conductor, see figure 6. The reflected wave travels back<br />

down <strong>the</strong> line and after Td time, it hits <strong>the</strong> source and is<br />

reflected back again but now from <strong>the</strong> source.<br />

Figure 6: Chronlogy of a reflection<br />

The signal is partially reflected, <strong>the</strong> amount of<br />

reflection is dependent on <strong>the</strong> magnitude of <strong>the</strong><br />

impedance mismatch. The reflection coefficient,<br />

expressed as a percentage can be calculated as:<br />

Kref<br />

( Zs − Z0)<br />

100×<br />

( Zs + Z0)<br />

= ------------- (2)<br />

When <strong>the</strong> rise time of <strong>the</strong> signal is greater than <strong>the</strong><br />

propagation delay down <strong>the</strong> trace, <strong>the</strong> reflections are<br />

masked by <strong>the</strong> slow rise of <strong>the</strong> signal. If <strong>the</strong> two-way<br />

propagation delay (source-end-source) is longer than <strong>the</strong><br />

rise or fall times, <strong>the</strong>n <strong>the</strong> reflection from <strong>the</strong> far end<br />

arrived after <strong>the</strong> initial transition is finished. The length<br />

beyond which <strong>the</strong> line should be terminated is given by:<br />

Tr<br />

L =<br />

2×<br />

Td<br />

------------- (3)


Where: L = length of trace, Tr = edge rate, Td =<br />

loaded propagation delay.<br />

Long nets may be subject to high amounts of<br />

reflection. For example, rise times of 2 nano-seconds<br />

require special consideration when <strong>the</strong> trace length is<br />

greater <strong>the</strong>n 14 cm (for <strong>the</strong> stripline topology, FR-4<br />

material). This length threshold is often called <strong>the</strong> critical<br />

length, it is <strong>the</strong> maximum permissible unterminated trace<br />

length. Different logic families with characteristic rise<br />

times will demand critical length of traces in order to<br />

reduce <strong>the</strong> impedance. Ensuring that traces are kept<br />

under <strong>the</strong>ir critical length is often unpractical. In such<br />

cases a termination scheme may be <strong>the</strong> best solution.<br />

6 TERMINATION STRATEGIES<br />

As mentioned earlier, in order to reduce<br />

reflections, <strong>the</strong> input impedance of <strong>the</strong> receiver must<br />

appear to match <strong>the</strong> impedance of <strong>the</strong> inductor. The<br />

reflection coefficient, expressed in percentage is<br />

calculated from equation (2). An input impedance of <strong>the</strong><br />

receiver, larger than <strong>the</strong> conductor’s impedance will<br />

cause over/undershoot, while <strong>the</strong> opposite will cause a<br />

drop in <strong>the</strong> pulse. The side affects of termination area:<br />

additional of extra delay to <strong>the</strong> signal; extra power<br />

consumption due to current requirement; and extra cost of<br />

component. Typically, such termination methods are<br />

recommended by <strong>the</strong> semiconductor vendor. Methods of<br />

termination comprise <strong>the</strong> following: series resistor; parallel<br />

resistor; Thevenin (split resistor); RC termination and<br />

diode clamp. With <strong>the</strong> exception of <strong>the</strong> diode clamp<br />

strategy, all o<strong>the</strong>r termination methods involve <strong>the</strong> output<br />

resistance of <strong>the</strong> driver that is non-linear and varies for<br />

most semiconductor processes over a wide range.<br />

7 TOPOLOGY<br />

Timing constraints are taken into account when<br />

selecting <strong>the</strong> appropriate net topology to control <strong>the</strong><br />

arrival time of <strong>the</strong> signals at <strong>the</strong>ir respective receivers.<br />

Various topologies are used to achieve different<br />

objectives, figure 7 illustrates commonly used net<br />

topologies.<br />

Figure 7: Various net topologies<br />

The star topology is characterised by multiple<br />

branches from a central driving point that requires a<br />

strong driver. In this topology, series termination can be<br />

used, on each leg. However, if branch length matching is<br />

not possible, <strong>the</strong>n RC termination close to central point<br />

can be used. In <strong>the</strong> case of <strong>the</strong> daisychain topology<br />

where loads are distributed down <strong>the</strong> line, toge<strong>the</strong>r with a<br />

strong driver <strong>the</strong>re will be skew between loads. As such,<br />

parallel, Thevenin or RC termination can be used. In<br />

point-to-point, connection between two points, when<br />

104<br />

termination is required, a series resistor at <strong>the</strong> source is<br />

recommended, with a resistor value optimised for a rising<br />

or failing edge. This is dependent on how balanced <strong>the</strong><br />

high/low impedance of <strong>the</strong> driver. In <strong>the</strong> case of TEE (Far<br />

end cluster), essentially a variation of star topology,<br />

where loads are close toge<strong>the</strong>r and skew must be<br />

minimised. In this topology it is possible to use ei<strong>the</strong>r<br />

series termination close to <strong>the</strong> driver, or RC termination at<br />

<strong>the</strong> branching point to <strong>the</strong> loads. Finally, <strong>the</strong> H tree<br />

topology is easier to drive than a star topology. With this<br />

method, each line from a tap to a load has <strong>the</strong> same<br />

impedance, so <strong>the</strong> same termination resistor value can be<br />

used at each load. The o<strong>the</strong>r advantage of <strong>the</strong> H-tree<br />

structure is that <strong>the</strong> wire length between <strong>the</strong> driver and<br />

each load is identical, preventing such signal skew<br />

problems.<br />

8 GROUND BOUNCE<br />

Outputs are inductively coupled between power<br />

and ground, as <strong>the</strong> component switches state. The<br />

sudden high current requirement will lead to a reverse<br />

voltage drop called ground bounce or switching noise. To<br />

minimise <strong>the</strong> effect, decoupling capacitors should be used<br />

(with low lead self inductance) and placed close to <strong>the</strong><br />

component to be decoupled. The capacitor maintains a<br />

constant voltage across <strong>the</strong> component and delivers a<br />

more stable current outside of <strong>the</strong> general power planes.<br />

Since ground is more sensitive than VCC, <strong>the</strong> decoupling<br />

capacitor should be located as close as possible to <strong>the</strong><br />

ground pin. Extra capacitance is provided by <strong>the</strong> use of<br />

multilayer PCB power and ground planes. In fact, ground<br />

bounce was <strong>the</strong> main contributing effect to <strong>the</strong> change<br />

from double sided to multilayer PCB with power and<br />

ground planes. Care should be taken when planes are<br />

getting heavily perforated, because this will cause <strong>the</strong><br />

plane inductance to increase. Currents in an imperfect<br />

ground plane flow from ground pins to <strong>the</strong> power<br />

connector and can affect <strong>the</strong> voltage of o<strong>the</strong>r components<br />

with ground pins. High ground currents in <strong>the</strong> plane are<br />

more likely to occur with bus and high current drivers,<br />

<strong>the</strong>y should <strong>the</strong>refore be located close to <strong>the</strong> power<br />

connector. It is important to ensure that self-resonant<br />

frequency of decoupling capacitors is above <strong>the</strong><br />

frequency of <strong>the</strong> signal to be decoupled.<br />

9 CROSSTALK<br />

A high speed trace behaves like a transmitting<br />

antenna. A sudden change of current on one trace can<br />

cause capacitive and inductive coupling into adjacent<br />

traces. When this crosstalk level is sufficient, a false<br />

signal transition can occur. The amount of coupling<br />

between traces is proportional to <strong>the</strong> length of <strong>the</strong> two<br />

traces running in parallel and inversely proportional to<br />

<strong>the</strong>ir spacing. Strategies for <strong>the</strong> reduction of crosstalk<br />

include: minimising <strong>the</strong> length of parallelism; maximising<br />

trace spreading; lowering <strong>the</strong> thickness of <strong>the</strong> dielectric;<br />

minimising impedance; minimising <strong>the</strong> edge rate and<br />

selecting <strong>the</strong> most appropriate termination strategy.<br />

10 CONCLUSIONS EMI REDUCTION TECHNIQUES<br />

In order to reduce electromagnetic interference,<br />

<strong>the</strong>re are a number of approaches including: minimising<br />

rise and fall times on clock and signal edges (see figure<br />

8); utilising slowest logic consistent with <strong>the</strong> circuit<br />

operation (see figure 9); and board partitioning to<br />

minimise ground bounce effects (see figure 10).


Figure 8: Minimising rise and small times on signal and<br />

clock edges<br />

Minimised rise and fall times on signal and clock<br />

edges. Sharper edges cause high harmonic contents in<br />

<strong>the</strong> high frequency spectrum.<br />

Figure 9: Using Slowest logic consistent with <strong>the</strong> circuit<br />

operation<br />

Selection of <strong>the</strong> most appropriate logic family plays<br />

a key role in <strong>the</strong> overall EMC performance. Logic families<br />

that are designed to operate at high frequency will exhibit<br />

sharp edge rates. This will result in larger harmonic<br />

spectral contents. Figure 9 is ordered by <strong>the</strong> noisiest at<br />

<strong>the</strong> top to <strong>the</strong> less noisy at <strong>the</strong> bottom. The ECL family is<br />

relatively less noisy, this is simply because it has <strong>the</strong><br />

small voltage swing. CMOS is slow and also has reduced<br />

drive capability, this is why it is <strong>the</strong> best from an EMC<br />

standpoint.<br />

Figure 10: Board partitioning<br />

To minimise ground bounce effect, it is desirable<br />

to place high speed components close to <strong>the</strong> power<br />

source with slower components placed fur<strong>the</strong>r away. To<br />

minimise cross coupling and thus system noise it is also<br />

advisable to create separate partitions for analogue and<br />

105<br />

digital sections. Fur<strong>the</strong>rmore, to prevent noise conducted<br />

through input/output IO cables, segregate IO connectors,<br />

IO drivers/receivers and non-IO components. Provide<br />

extra spacing between highly radiating nets and IO nets.<br />

11 REFERENCES<br />

1. Anzivino, Rich (2002): The DFA Design<br />

Philosophy, Printed Circuit Design, pp.14-26.<br />

2. Atiyeh, Phillip G. (2003): Design for Assembly:<br />

Sometimes More is Less, Assembly Automation<br />

Vol. 12 No. 2, pp.26-40.<br />

3 Classon, F. (2003): Component Placement,<br />

Surface Mount Technology Vol. 8, 4. pp.45-62.


ENSURING ELECTROMAGNETIC COMPLIANCE IN PRINTED CIRCUIT<br />

BOARDS THROUGH DESIGN FOR ASSEMBLY GUIDELINES<br />

ABSTRACT<br />

Tom Page, *Paul Baguley and *Dirk Schaefer<br />

Department of Design & Technology, Loughborough University, UK.<br />

* School of Engineering, Durham University, Durham. UK<br />

The aim of this work is to provide <strong>the</strong> embodiment of sample PCB design for manufacturing<br />

and assembly rules for fine-pitch devices in a commercially PCB design application. Most<br />

commercially used PCB design applications provide for PCB design rule-checking to an extent,<br />

particularly in setting geometric constraints for laying out components on <strong>the</strong> substrate. For<br />

example, in automatic placement of connectors and components within a PCB design file. The role<br />

of <strong>the</strong> design rule checker within PCB design software is a fundamentally important in ensuring<br />

process yield in PCB fabrication as well as ensuring functional acceptance in test whilst maintaining<br />

accurate placement of components.<br />

The design rules implemented in this paper emanate from a wider programme of research<br />

that focusses on design for manufacturing and assembly issues in Surface Mount Technology<br />

(SMT), Fine-Pitch Technology (FPT) and Flat Pack Ball-Grid Array (FPBGA). This work explores<br />

<strong>the</strong> methodology of decision support in <strong>the</strong> design of electronic products with specific regard to<br />

design for manufacturing and assembly. The design for manufacturing rules used in this<br />

implementation scenario is for <strong>the</strong> precise location and placement of Fine-pitch components.<br />

1 DESIGN REQUIREMENTS FOR ULTRA FINE-<br />

PITCH DEVICES<br />

In order to control overall area requirements for <strong>the</strong><br />

higher pin-count devices, component manufacturers have<br />

reduced <strong>the</strong> lead pitch (<strong>the</strong> space between lead centres).<br />

The standard family of <strong>the</strong> Standard Quad Flat-Pack<br />

(SQFP) has been adopted by <strong>the</strong> industry to provide<br />

commercial packaging of custom and semi-custom<br />

integrated circuits with 0.65mm, 0.5mm, 0.4mm and<br />

0.3mm lead pitch. Although assembly processing has<br />

been refined to acceptable yields levels for 0.65mm and<br />

0.5mm pitch device types, conventional process methods<br />

might not be practical for high pin count using <strong>the</strong> 0.4mm<br />

and 0.3mm pitch devices [1]. While adapting this<br />

advanced packaging technology, <strong>the</strong> users of <strong>the</strong> SQFP<br />

are challenged by several considerations, including<br />

physical, financial and environmental issues. Physical<br />

issues include attachment processes and finished product<br />

reliability. Figure 1 illustrates <strong>the</strong> design guidelines and<br />

rules that require to be considered and adhered to in <strong>the</strong><br />

design for fabrication and assembly of fine-pitch PCBs.<br />

106<br />

Specific reference is made to abbreviations such as<br />

CSG1…CSG10 <strong>the</strong>se correspond to discrete fine-pitch<br />

design rules which have been coded into a knowledgebased<br />

decision-support tool. This was <strong>the</strong> main<br />

deliverable from <strong>the</strong> research programme from which<br />

Figure 1 was taken.<br />

1.1 Designing <strong>the</strong> Substrate for Fine-Pitch<br />

Assembly<br />

Many factors have impact upon assembly yield as<br />

well as solder joint quality. Each of <strong>the</strong> following<br />

elements must be carefully reviewed and calculated so as<br />

to ensure ease of assembly. Formulation <strong>the</strong> land pattern<br />

array and calculate geometry such that devices are<br />

placed exactly on <strong>the</strong> solder lands. Implementation of <strong>the</strong><br />

test model substrate design layout so as to ensure that<br />

<strong>the</strong> fabrication detail is to specification prior to assembly.<br />

The small SQFP devices are manufactured in high<br />

volume and provide rugged, long-term reliability. Newer<br />

packages in <strong>the</strong> industry, such as <strong>the</strong> 0.4mm (0.016-in)<br />

lead pitch SQFP might pose a challenge to manufacturers<br />

in maintaining a consistent assembly process yield [1].


Component Selection<br />

Guidelines:<br />

CSG1...CSG10<br />

Verification of Post<br />

Assembly Evaluation :<br />

PAE1...PAE14<br />

Verification of PCB<br />

Fabrication Details:<br />

VFD1...VFD10<br />

Verification of Assembly<br />

Documentation:<br />

VAD1...VAD16.<br />

Verification of Bare<br />

Board Dimensional<br />

Accuracy:<br />

VBB1...VBB16<br />

Land Pattern Design<br />

Guidelines:<br />

LPD1...LPD11<br />

Design for Test<br />

Rules:<br />

DTR1...DTR6<br />

Design<br />

Requirements for<br />

Fine-Pitch Device<br />

Fabrication &<br />

Assembly<br />

Fine-Pitch<br />

Design Rules:<br />

FPR1...FPR17;<br />

FSC1...FSC11.<br />

PCB Layout Design Guidelines & Rules:<br />

GLD1...GLD18; DLD1...DLD16;<br />

GDR1...GDR12; DLR1...DLR13.<br />

PCB Routing Design<br />

Guidelines & Rules:<br />

RDG1...RDG15;<br />

DRD1...DRD18.<br />

Solder Control<br />

Design Rules:<br />

SCR1...SCR16.<br />

Mixed Technology<br />

PCB Design Rules:<br />

MTD1...MTD18.<br />

Axial-Leaded & Plated<br />

Through Hole Design Rules:<br />

ADR1...ADR16.<br />

Figure 1: A Model of Knowledge-Based Decision Support in PCB Design for Assembly<br />

1.2 Typical Fine-Pitch Device Package Description<br />

The EIAJ standard SQFP 256-pin configuration on<br />

0.4mm (0.016-in) pitch provides adequate termination<br />

channels for more advanced ASIC devices while requiring<br />

a relatively small area for attachment. The total surface<br />

area (lead end to end) of <strong>the</strong> 256-lead plastic device is<br />

less than 31.0mm (1.22-in) square with a maximum<br />

height from <strong>the</strong> substrate surface of 3.5mm (0.137-in).<br />

The leads are formed in <strong>the</strong> gull-wing configuration<br />

extending from <strong>the</strong> device body providing a contact area<br />

of 0.5mm±.0.2mm (0.02-in±0.008-in) [1]. For a process<br />

development or test program, a non-functional component<br />

can be ordered with internal bonding on lead pairs before<br />

moulding.<br />

1.3 Design Allowance for Physical Tolerances of<br />

Devices<br />

Although <strong>the</strong> lead-pitch tolerance can be defined<br />

as non-accumulative, <strong>the</strong> width of <strong>the</strong> lead at <strong>the</strong><br />

attachment area is specified as wide as ±0.07mm (0.003in).<br />

Using <strong>the</strong> maximum material condition of <strong>the</strong> basic<br />

lead width of 0.15mm opens <strong>the</strong> possibility for up to<br />

0.22mm total lead width. The final land pattern geometry<br />

provided on <strong>the</strong> substrate must accommodate this<br />

maximum material condition of <strong>the</strong> device so as to avoid<br />

<strong>the</strong> possibility of lead overlap at ei<strong>the</strong>r <strong>the</strong> toe or heel of<br />

<strong>the</strong> J-lead termination. The land pattern geometry and<br />

spacing between pad rows are derived from calculating<br />

both <strong>the</strong> maximum and minimum material conditions of<br />

<strong>the</strong> device. That is, if <strong>the</strong> device is supplied at <strong>the</strong><br />

maximum overall width (lead end to lead end), <strong>the</strong> land<br />

pattern should provide enough surface area to prevent<br />

lead overhang [1].<br />

107<br />

1.4 The Impact that Design Has on Assembly<br />

Efficiency of Fine-Pitch SMT PCBs<br />

Seventy percent of <strong>the</strong> failures detected on surface<br />

mount assemblies are due to solder defects. Solder<br />

defects found at test are ei<strong>the</strong>r in <strong>the</strong> form of a short<br />

between device leads or open circuits due to insufficient<br />

solder [2]. An ongoing process audit can reduce most of<br />

<strong>the</strong> solder defects but often manufacturing problems are<br />

design related and if not corrected will remain a source of<br />

chronic failure. By <strong>the</strong> implementation of proven circuit<br />

board design rules it is possible fur<strong>the</strong>r reduce solder<br />

defects. These rules specifically employ processcompatible<br />

land pattern geometries for surface mount<br />

devices and each will play a significant role in ensuring<br />

manufacturing efficiency and quality. The design rules<br />

will also focus on PCB fabrication guidelines and<br />

assembly machine compatibility. Land pattern geometry<br />

on <strong>the</strong> o<strong>the</strong>r hand is directly related to process control<br />

and solder attachment uniformity. When each of <strong>the</strong>se<br />

primary disciplines are properly defined and implemented<br />

all solder defects can be eliminated. Solder defects can<br />

be fur<strong>the</strong>r reduced through continued process refinement.<br />

Each process step must be monitored by means of<br />

human or automated visual inspection during <strong>the</strong> initial<br />

start-up of a product, 100% inspection is not uncommon.<br />

After process stabilisation, only sampling of <strong>the</strong> assembly<br />

is needed. As each unit is inspected, defects exceeding<br />

standard limits are identified and recorded. The defect<br />

ratio from one assembly to <strong>the</strong> o<strong>the</strong>r does not seem to be<br />

affected by <strong>the</strong> reflow process as much as <strong>the</strong> solder<br />

paste characteristics [3]. The viscosity of <strong>the</strong> solder paste<br />

will have a more significant impact on <strong>the</strong> solder joint<br />

defect ratio of <strong>the</strong> 0.4-0.5mm (0.016-0.020-in) devices.<br />

Although <strong>the</strong> solder volume of each joint can be<br />

ma<strong>the</strong>matically modelled, visual inspection on <strong>the</strong> finer<br />

pitch devices is not without compromise. A 100%


inspection of every lead on <strong>the</strong> finer pitch devices is not<br />

practical and <strong>the</strong> use of advanced inspection systems for<br />

fine-pitch devices is inevitable. For example, ultrasonic<br />

imaging, X-ray and X-ray laminography might prove to be<br />

very effective in performing a non-destructive solder<br />

quality certification to measure solder density of detection<br />

of solder voids [4]. Solder paste registration for <strong>the</strong><br />

majority of <strong>the</strong> surface mount devices can be improved,<br />

for example, by reducing <strong>the</strong> overall stencil opening and<br />

to compensate for all <strong>the</strong> tolerance variables of a typical<br />

PCB, a reduction of <strong>the</strong> stencil opening by 10-20% might<br />

be adequate.<br />

1.5 Placement Accuracy and Land Pattern Design<br />

Requirements<br />

Less-than-perfect machine placement of passive<br />

and 1.27mm (0.050-in) pitch surface mount devices can<br />

be tolerated to a limited extent. As during <strong>the</strong> reflowsoldering<br />

process <strong>the</strong> entire assembly is heated to<br />

approximately 200°c and <strong>the</strong> solder paste is converted to<br />

a liquid state. These devices are momentarily suspended<br />

in <strong>the</strong> liquid alloy and through surface tension, <strong>the</strong> device<br />

mass will tend to self-centre before <strong>the</strong> solder begins to<br />

cool. This phenomenon while predictable for passive and<br />

coarse-pitch devices, cannot be relied upon for fine-pitch<br />

attachment as <strong>the</strong> land pattern geometry is much more<br />

critical. The land pattern geometry must provide for both<br />

<strong>the</strong> minimum and maximum material condition of <strong>the</strong><br />

device and substrate [5]. The designer must calculate <strong>the</strong><br />

basic land pattern limits with provision for inspection and<br />

machine placement tolerances.<br />

2 USING PCB DESIGN RULES WITHIN PCB<br />

DESIGN SOFTWARE<br />

With PCB design software <strong>the</strong> PCB is designed by<br />

<strong>the</strong> placement of components, tracks, vias and o<strong>the</strong>r<br />

design objects. These objects must be placed in <strong>the</strong><br />

workspace with close regard to each o<strong>the</strong>r. Components<br />

must not overlap, nets must not short, power nets must<br />

be kept clear of signal nets, etc. To allow <strong>the</strong> designer to<br />

remain focused on <strong>the</strong> task of designing <strong>the</strong> board, a<br />

design rule checker can monitor such design<br />

requirements. These design rules are monitored as <strong>the</strong><br />

designer lays out <strong>the</strong> PCB. As soon as an object is<br />

placed in violation of a design rule it is highlighted.<br />

obeyed.<br />

3 AN IMPLEMENTATION OF PCB ROUTING<br />

DESIGN GUIDELINES FOR EMC<br />

A PCB was selected for <strong>the</strong> implementation of<br />

such design rules it was a digital-to-analogue converter<br />

board used in a radio frequency product. The design of<br />

<strong>the</strong> PCB was constrained by <strong>the</strong> product envelope and<br />

<strong>the</strong>refore had to very small in size, specifically 40mm by<br />

75mm. The fine-pitch devices used in this design had<br />

lead-pitch of 0.4mm. Owing to <strong>the</strong> fact that <strong>the</strong> product<br />

was a radio frequency application, specific attention was<br />

made to design for Electro-Magnetic Compatibility (EMC).<br />

EMC is characterised by capacitive and inductive<br />

reactions within signal traces because such traces can<br />

act as unintentional wave-guides for <strong>the</strong> reception and<br />

transmission of radio frequency signals. These reactions<br />

are often referred to as electrical noise and PCB<br />

designers are required to exercise caution in laying out<br />

components and routing traces on PCBs so as to<br />

minimise such noise.<br />

To ensure that <strong>the</strong> PCB was EMC compliant<br />

specific design rules pertaining to signal trace-widths and<br />

corresponding air-gaps between traces need to be<br />

adhered to. As a rule of thumb for EMC, <strong>the</strong> design-rule<br />

checker needs to be instructed that signal traces cannot<br />

be less than 0.13mm wide and <strong>the</strong> gap between signal<br />

traces must not exceed 0.13mm. Moreover, for power<br />

and ground planes namely VCC and GND <strong>the</strong> respective<br />

trace-width cannot be less that 0.2mm and <strong>the</strong> gap<br />

between such traces must not exceed 0.2mm. With<br />

reference to PCB Routing Design Guidelines it is possible<br />

to implement such rules within <strong>the</strong> routing design rule<br />

class, under width constraint and clearance constraint<br />

(see Table 1). Table 1 shows <strong>the</strong> definitions of <strong>the</strong> design<br />

rules for width constraint and clearance constraint, it<br />

explains what happens when a design-rules violation<br />

occurs and explains when <strong>the</strong> design rule can be invoked<br />

by <strong>the</strong> designer.<br />

The implementation of PCB routing rules Figures 1<br />

and 2 respectively. Figures 1 and 2 are design-rule entry<br />

dialogs for 'Routing Width Constraint' and 'Clearance<br />

Constraint' design rules respectively.<br />

Routing Width Constraint design rule Clearance Constraint design rule<br />

Rule class: Routing Rule class: Routing<br />

Defines <strong>the</strong> minimum and maximum width of Defines <strong>the</strong> minimum clearance allowed between any<br />

tracks and arcs on <strong>the</strong> copper layers.<br />

two primitive objects on a copper layer. Use <strong>the</strong><br />

Clearance Constraint to ensure that routing<br />

clearances are maintained. The Connective<br />

How Duplicate Rule Contentions are<br />

Checking option would typically be set to Different<br />

Nets. An example of when Any Net could be used is<br />

to test for vias being placed too close to pads or o<strong>the</strong>r<br />

vias on <strong>the</strong> same net, or any o<strong>the</strong>r net.<br />

How Duplicate Rule Contentions are Resolved:<br />

The rule with <strong>the</strong> largest clearance is obeyed.<br />

Resolved: The rule with <strong>the</strong> tightest range is<br />

Rule Application: During auto-routing and<br />

Batch DRC.<br />

Rule Application: On-line DRC, Batch DRC and<br />

during auto-routing.<br />

Table 1: Routing Width Constraint and Routing Clearance Constraint Design Rules.<br />

108


Figure 1: Rule Implementation in PCB Routing Width Constraint Rule-Check Dialog<br />

Figure 2: Rule Implementation in PCB Clearance Constraint Rule-Check Dialog<br />

109


4 CONCLUSION<br />

This paper demonstrated <strong>the</strong> implementation of<br />

sample fine-pitch PCB design rules in an existing PCB<br />

design file. The design rules implemented were a sample<br />

of those guidelines and rules represented selected from a<br />

programme of wider study in design for assembly in PCB<br />

design. This sample was selected on <strong>the</strong> basis that <strong>the</strong>se<br />

design rules lent <strong>the</strong>mselves to quantitative and<br />

geometric representation. Those PCB design rules that<br />

were implemented included: routing design guidelines;<br />

layout design rules; and device oriented layout rules. The<br />

PCB design-rule editor is instructed of such design<br />

requirements by <strong>the</strong> setting up of a series of design rules.<br />

Also, during <strong>the</strong> board verification process, an integrated<br />

design rule checker can be executed which will generate<br />

a report of any design rule violations on <strong>the</strong> PCB.<br />

5 REFERENCES<br />

1. Chroneos R.J. et. al.,(June 1996): Packaging<br />

Alternatives for High Lead Count, Fine Pitch,<br />

Surface Mount Technology, IEEE Transactions on<br />

Hybrids and Manufacturing Technology, Vol.16,<br />

No.4, pp.396-401.<br />

110<br />

2. Li Y., Mahajan R.L., Tong J., (June 1998): Design<br />

Factors and Their Effect on PCB Assembly<br />

Yield, IEEE Transactions on Components,<br />

Packaging, and Manufacturing Technology,<br />

Part A, Vol.17, No.2, pp.183-191.<br />

3. Neger V., Pawlischek H., (2000): Integration and<br />

Application of Vision <strong>Systems</strong> in SMD Automatic<br />

Placement Machines, Circuit World, Vol.17, No.1,<br />

pp.24-29.<br />

4. Stevens M., Ball E., Protogeros A., (2002):<br />

Process Compensation and Printed Circuit Board<br />

Manufacture, International Journal of Advanced<br />

Manufacturing Technology, No 8, pp.85-90.<br />

5. Wassink R.J.K., (2001): Footprints of Fine Pitch<br />

SMDs, Working Paper Nederlands Philips<br />

Bedrijven BV Centre For Manufacturing<br />

Technology.


Knowledge Transfer in Networks of Competence<br />

Prof. Dr.-Ing. habil. Christian-Andreas Schumann, University of Applied Sciences Zwickau / VDI Representation Saxony<br />

Dipl.-Inf. Claudia Tittmann, University of Applied Sciences Zwickau<br />

Dipl.-Inf. Kay Grebenstein, Middle German Academy of Fur<strong>the</strong>r Education, Zwickau<br />

Abstract<br />

Networks of knowledge transfer have a lasting effect on <strong>the</strong> parallel existing networks of competence. An essential problem is<br />

<strong>the</strong> development of content modules from individual and objective knowledge. The potential of regional networks of<br />

knowledge transfer for solving this problem will be introduced. These networks are based on special projects concerning <strong>the</strong><br />

regional technology transfer. The activities are focused to <strong>the</strong> computer based engineering intelligence.<br />

Keywords:<br />

Knowledge Transfer, Engineering Intelligence, Competence Cell<br />

1 NETWORKS AND CELLS OF COMPETENCE<br />

The recent development in Knowledge Transfer is only to<br />

understand in <strong>the</strong> context of national and international,<br />

interdisciplinary corporation of public, non-profit and<br />

business units. The expenditures of <strong>the</strong> required<br />

resources to determine <strong>the</strong> subjective knowledge, to<br />

transfer it into evaluated know how of <strong>the</strong> organisation,<br />

and to include it into transfer programs is so enormous<br />

that <strong>the</strong>re is a strong constraint for organisations to<br />

cooperate in tailored networks of specialists, developers<br />

and users (Figure 1).<br />

Figure 1: Knowledge Flow.<br />

These networks are well known as networks of<br />

competence based on so called competence cells (Figure<br />

2). Each cell is a separate organisational unit<br />

characterised by independence in law and economy,<br />

special knowledge, skills, performance, competence and<br />

interfaces.<br />

111<br />

Figure 2: Competence Cell.<br />

The separate cells form <strong>the</strong> temporary or constant<br />

networks of competence (Figure 3) in <strong>the</strong> framework of<br />

business, engineering and production activities and<br />

processes in order to be successful in <strong>the</strong> market and<br />

product development. The <strong>the</strong>ory of networks of<br />

competence was developed especially for <strong>the</strong> production<br />

networking, but it includes <strong>the</strong> networking of<br />

interdisciplinary knowledge transfer.<br />

Figure 3: Competence Cell in <strong>the</strong> Network.


Corporation and networking have to be managed.<br />

Besides <strong>the</strong> general management and project<br />

management especially <strong>the</strong> management of data,<br />

information, skills as well as knowledge is essential<br />

(Figure 4).<br />

Figure 4: Context of Competence, Skill, Knowledge.<br />

The common information management is supplemented<br />

by <strong>the</strong> knowledge management. Knowledge is <strong>the</strong> ability<br />

to define patterns of facts serving <strong>the</strong> preparation and <strong>the</strong><br />

execution of actions and decisions. The similar relation is<br />

remarkable in <strong>the</strong> case of <strong>the</strong> general business with<br />

regard to <strong>the</strong> management of e-based processes and<br />

functions.<br />

All sides of management, business, production, and<br />

engineering including <strong>the</strong> special fields of information<br />

management and knowledge management as well as <strong>the</strong><br />

e-business, <strong>the</strong> computer integrated manufacturing up to<br />

<strong>the</strong> e-learning are influenced by and related to <strong>the</strong><br />

business, engineering, and production intelligence.<br />

Figure 5: Importance of Knowledge Transfer.<br />

Business, engineering and production intelligence is <strong>the</strong><br />

ability to generate knowledge by analysing <strong>the</strong> state of <strong>the</strong><br />

art in <strong>the</strong> own as well as in <strong>the</strong> competitive business,<br />

engineering or production units and networks (Figure 5).<br />

The competence cells for knowledge transfer are<br />

arranged in chains consisting of development, supply,<br />

and application modules. Due to <strong>the</strong> scale of <strong>the</strong><br />

competence of <strong>the</strong> organisational unit <strong>the</strong> cells are single<br />

or multi functional. The multi functional cells include<br />

integrated functions and processes of development,<br />

supply and/or application. According to <strong>the</strong> integrated<br />

functions and processes <strong>the</strong> competence cells are put in<br />

its proper place in relation to <strong>the</strong> o<strong>the</strong>r cells forming <strong>the</strong><br />

network of competence in all. The networking is one of<br />

<strong>the</strong> main aspects guaranteeing <strong>the</strong> success of <strong>the</strong><br />

business, engineering, production or learning unit,<br />

respectively.<br />

112<br />

2 KNOWLEDGE TRANSFER IN FRAMEWORK<br />

PROJECTS<br />

The key question is to prepare <strong>the</strong> individual knowledge<br />

for generating content modules with objective knowledge<br />

transferred in or outside of <strong>the</strong> organisation. Therefore as<br />

an example <strong>the</strong> network of regional knowledge transfer<br />

was founded.<br />

Figure 6: Real Competence Network.<br />

The representatives of <strong>the</strong> competence cells discussed<br />

and developed <strong>the</strong> transfer concept with special<br />

technology-oriented modules mainly focused for<br />

supporting SME. The modules are designed to constitute<br />

a construction set for content modules for knowledge<br />

transfer from <strong>the</strong> technology leaders to <strong>the</strong> o<strong>the</strong>r<br />

enterprises (Figure 7). Each competence cell generates<br />

its special subprojects due to <strong>the</strong> special profile of <strong>the</strong><br />

organisation.<br />

Figure 7: Model of Sections.<br />

The knowledge of <strong>the</strong> modules is connected by defined<br />

interfaces. The controlling activities were done by <strong>the</strong><br />

strategic partner of <strong>the</strong> network of competence: <strong>the</strong><br />

society of German engineers (VDI). The experts of <strong>the</strong><br />

VDI evaluate <strong>the</strong> detailed proposals for each module in<br />

order to check <strong>the</strong> level of knowledge and <strong>the</strong> relation to<br />

o<strong>the</strong>r contents (Figure 8). After <strong>the</strong> successful evaluation<br />

<strong>the</strong> knowledge transfer module is developed by <strong>the</strong><br />

competence cell and offered <strong>the</strong> consumer contractors of<br />

<strong>the</strong> network of competence or <strong>the</strong> o<strong>the</strong>r interested<br />

partners.


Figure 8: Modules.<br />

For <strong>the</strong> knowledge transfer <strong>the</strong> recent technology is used.<br />

This means new kinds of distance education and blended<br />

learning, tele-teaching and tele-working are included. For<br />

instance new WBT-programs were developed for<br />

Enterprise Resource Planning, Business Intelligence,<br />

Business Process Reengineering and Optimisation,<br />

Media Competence, etc. used by <strong>the</strong> access via internet<br />

portal, tele-platforms and learning spaces (Figure 9).<br />

Figure 9: Learning Platform.<br />

The programs are embedded in courses for students and<br />

employees in <strong>the</strong> framework of tutoring and blended<br />

learning (Figure 10). Some of <strong>the</strong> recent offered or<br />

planned knowledge transfer modules are innovative plant<br />

planning, business process reengineering, and total<br />

quality management as well as business intelligence<br />

engineering, and flexible automated assembly systems.<br />

Figure 10: Map of Page.<br />

For <strong>the</strong> complexity of <strong>the</strong> task a workflow system is<br />

113<br />

essential, and some special systems solutions were<br />

developed by <strong>the</strong> competence cell itself especially in<br />

order to improve <strong>the</strong> performance of <strong>the</strong> whole system<br />

(Figure 11).<br />

Figure 11: Quality Assurance.<br />

3 REGIONAL TECHNOLOGY TRANSFER IN SPECIAL<br />

PROJECTS<br />

The general framework system for knowledge transfer is<br />

based on special projects concerning <strong>the</strong> regional<br />

technology transfer. The activities are focused to <strong>the</strong><br />

intelligent aspects of <strong>the</strong> industrial development: <strong>the</strong><br />

computer based engineering intelligence (Figure 12).<br />

Figure 12: Modules with focus on engineering intelligence.<br />

One of <strong>the</strong> most important factors is <strong>the</strong> innovation in<br />

planning and realisation of factories. Therefore one recent<br />

subproject deals with <strong>the</strong> innovative concepts for factory<br />

planning. The main topics for <strong>the</strong> subproject are:<br />

1. Basics and Introduction such as evolution of <strong>the</strong><br />

industrial production, recent trends and requirements,<br />

visions and strategies<br />

2. Factory of <strong>the</strong> Future such as production in networks,<br />

modular flexible factories (Figure 13)


Figure 13: SCM-<strong>Systems</strong> view.<br />

3. Innovative Concepts such as holistic factory, bionic<br />

manufacturing, digital factory<br />

4. Process-oriented Analyses and Design such as event<br />

driven process chains, workflow analyses and design,<br />

data process analyses and design<br />

5. Manufacturing and Control Techniques such as<br />

enterprise resource planning, just in time, control systems<br />

and stations<br />

6. Maintenance Management such as preventing<br />

maintenance, special maintenance technologies<br />

7. Human Resources such as motivation of employees,<br />

self control regulation, self and external controlling of<br />

performance units<br />

8. Information Management and Technology such as<br />

information management, product data management,<br />

knowledge management, computer integrated<br />

manufacturing, computer based plant planning, factory<br />

information systems, modelling and simulation (Figure 14)<br />

Figure 14: Solution for Information flows.<br />

9. Ecology and Factory such as environmental influence<br />

of production, environmental information systems<br />

10. Energy Supply for <strong>the</strong> Factory such as energy supply<br />

and transformation systems, optimisation by energy<br />

management.<br />

11. Practice of Application such as best practice or best in<br />

class solutions, excursion.<br />

Today each concept and solution is computer based. That<br />

is why <strong>the</strong> computer aided applications in engineering<br />

114<br />

were assimilated to each professional topic of <strong>the</strong><br />

subproject. One of <strong>the</strong> central <strong>the</strong>mes was <strong>the</strong> embedded<br />

computer integrated manufacturing in <strong>the</strong> modern factory<br />

design (Figure 15).<br />

Figure 15: Simulation view to a manufacturing process<br />

For instance <strong>the</strong> Computer Aided Design is important for<br />

<strong>the</strong> plant development as well as <strong>the</strong> facility management,<br />

<strong>the</strong> product development, <strong>the</strong> control and circuit design,<br />

<strong>the</strong> factory layout, etc. The existing knowledge of <strong>the</strong><br />

professionals was presented in several special events by<br />

specialists supported by tutoring based on modern<br />

internet technologies of computer and web based training<br />

opportunities (Figure 16).<br />

Figure 16: Solution – KM-System.<br />

The result was an agreement of <strong>the</strong> partners to continue<br />

<strong>the</strong> knowledge transfer in existing networks of<br />

competence such as <strong>the</strong> association of <strong>the</strong> tool machine<br />

industry in Saxony and <strong>the</strong> association of <strong>the</strong> automation<br />

companies in <strong>the</strong> region.<br />

4 SUMMARY<br />

The knowledge transfer by <strong>the</strong> network of competence<br />

works successful and efficient. Therefore <strong>the</strong> extended<br />

corporation with o<strong>the</strong>r networks of competence is in<br />

progress. Dependent on <strong>the</strong> target group for <strong>the</strong><br />

application of <strong>the</strong> knowledge transfer, <strong>the</strong> competence<br />

cells form modified or new networks of competence.<br />

There is a very flexible and economical way of knowledge<br />

transfer under construction and partly in application. The


knowledge transfer will be promoted by new methods,<br />

contents and software. The best practice applications are<br />

used to push <strong>the</strong> competence cells and <strong>the</strong>ir integrated<br />

networks.<br />

5 REFERENCES<br />

[1] Chr.-A. Schumann, Claudia Tittmann et. al., “AIbased<br />

integration of business intelligence and knowledge<br />

management in enterprises”, AIAI 2004 Toulouse, 2004.<br />

[2] Chr.-A. Schumann, Claudia Tittmann et. al., “Media<br />

Competences and skills for web-based Knowledge<br />

transfer and Blended learning”, EISTA 2004, Orlando,<br />

2004.<br />

[3] Chr.-A. Schumann et. al., “Tele-Education and<br />

Blended Learning in complex Networks of Competence”,<br />

Euromedia-APTEC 2004, Proceedings, 2004.<br />

[4] Claudia Tittmann, “Brokerage und Controlling der<br />

Kopplung von Kompetenzzellen zu<br />

unternehmensübergreifenden Workflows in<br />

Leistungsnetzwerken“, Exposé Dissertation, 2004.<br />

[5] Chr.-A. Schumann, Claudia Tittmann et. al., “Process<br />

Support and Quality in WBT Content Development”,<br />

EDEN Proceedings 2003, Rhodes, Greece, 2003.<br />

[6] Chr.-A. Schumann et. al., “Media Competence for <strong>the</strong><br />

Management of Small and Medium Sized Enterprises<br />

(SME)”, EDMAN 2003 Proceedings, Brno, Ceska, 2003.<br />

[7] Chr.-A. Schumann, Claudia Tittmann et. al., „Globale<br />

IT-Infrastruktur für die interkulturelle Kommunikation“,<br />

Kommunikation in der globalen Wirtschaft, Peter Lang,<br />

Frankfurt Berlin Bern Bruxelles New York Oxford Wien,<br />

2003.<br />

[8] Chr.-A. Schumann et. al., “Weiterbildung<br />

Medienkompetenz für KMU der Region”, 16 th International<br />

Scientific Conference Mittweida (IKWM) Proceedings<br />

2003, 2003.<br />

[9] Chr.-A. Schumann et. al., „Regionaler Wissenstransfer<br />

(REWITRA)“, Learntec 2003 Proceedings, Karlsruhe,<br />

2003.<br />

[10] Chr.-A. Schumann, Claudia Tittmann et. al., “Impact<br />

of <strong>the</strong> reorganisation of <strong>the</strong> enterprise information system<br />

115<br />

by knowledge management methods and tools on supply<br />

chains”, IBEC Proceedings Paris 2002, 2002.<br />

[11] Chr.-A. Schumann, “Knowledge Management”,<br />

Riemann: Wirtschaftsinformatik, Oldenbourg, 2001.<br />

[12] Chr.-A. Schumann et. al., “Improvement of Supply<br />

Chain Management by Knowledge Management in <strong>the</strong><br />

Automotive Industry“, ATTCE 2001 Proceedings Volume<br />

3, Barcelona, 2001.<br />

[13] Chr.-A. Schumann, “Closing <strong>the</strong> Gap between School,<br />

university, and Fur<strong>the</strong>r Education <strong>Systems</strong> in <strong>the</strong> process<br />

of life long learning”, EDEN – Open Classroom<br />

Conference, Proceedings 2000, Barcelona, Spain, 2000.<br />

[14] Chr.-A. Schumann et. al., “Humans and <strong>the</strong>ir Images<br />

in <strong>the</strong> Real and Virtual World of Learning, Training, and<br />

Working”, The Wanderstudent 2000. Proceedings,<br />

International Colloqium, KU Leuven, Belgium, 2000.<br />

[15] Chr.-A. Schumann et. al., “Development and Using of<br />

Regional Networks for Open Learning and Distance<br />

Education”, 19th ICDE World Conference on Open<br />

Learning and Distance Education Proceedings 1999,<br />

Vienna, Austria 1999.<br />

[16] Chr.-A. Schumann et al., “Hypermedia Based<br />

Distance Learning <strong>Systems</strong> and its Applications”, The 8th<br />

International Conference Information <strong>Systems</strong><br />

Development ISD´99, Proceedings, Boise, Idaho, USA,<br />

1999.<br />

[17] Chr.-A. Schumann et. al., “Distance Education as<br />

part of modular-design system for lifelong learning”, XV.<br />

IFIP World Computer Congress Proceedings,<br />

Vienna/Budapest, Austria/Hungary, 1998.<br />

[18] U. Bentlage, P. Glotz, and I. Hamm, E-Learning<br />

Märkte, Geschäftsmodelle, Perspektiven, Verlag<br />

Bertelsmann Stiftung, Gü<strong>the</strong>rsloh, 2002.<br />

[19] B. Hall and J. LeCavalier, E-Learning Across <strong>the</strong><br />

Enterprise – The Benchmarking Study of Best Practices,<br />

Brandon-Hall.com, 2001.<br />

[20] R. Sanchez, Knowledge Management and<br />

Organisational Competence , Oxford University Press,<br />

2003.


PART 6<br />

LATE PAPERS<br />

116


Fuzzy Sliding Mode Control Solution to an Inverted Pendulum : An<br />

Implementation Issues<br />

Mouloud Bouchoucha & Abd El Krim Souissi Abd El Kader Derdouche<br />

Robotics & Computer-integrated manufacturing <strong>Laboratory</strong>, Development and Research center,<br />

Military school Polytechnic(Ex: Enita), Blida, Algeria.<br />

BP 17c, Bordj El Bahri, Algiers, Algeria.<br />

E-mail: mouloud_bouchoucha@yahoo.fr<br />

Abstract<br />

A fuzzy sliding mode control (FSMC) schemes who has<br />

been proposed <strong>the</strong>se last years is adopted as a solution<br />

for a single-input and multi-output benchmark system<br />

which is <strong>the</strong> inverted pendulum to handling instability,<br />

nonlinearity, uncertainly and coupling . The motivation is<br />

to combine <strong>the</strong> best features of <strong>the</strong> variable structure by<br />

sliding mode and fuzzy logic control to achieve rapid and<br />

accurate control. <strong>the</strong> number of <strong>the</strong> fuzzy rules is reduced<br />

by sliding surface and <strong>the</strong> chattering in <strong>the</strong> sliding mode<br />

is greatly reduced by <strong>the</strong> interpolation property of fuzzy<br />

control algorithm. Simulations and experiments to verify<br />

<strong>the</strong> schemes are presented. The results show a robust<br />

performance are attained by elimination of <strong>the</strong> chattering<br />

and rapid and accurate control. In <strong>the</strong> end <strong>the</strong> FSMC<br />

schemes are compared with <strong>the</strong> conventional sliding<br />

mode control design.<br />

Key words: Chattering, fuzzy logic control, fuzzy<br />

sliding mode control, identification, inverted pendulum,<br />

PID controller, variable structure control.<br />

1. Introduction<br />

The inverted pendulum is a SIMO unstable benchmark<br />

system characterized by nonlinearity, coupling, parameter<br />

fluctuations and external disturbances…etc. Variable<br />

structure control VSC(sliding mode control) is one of<br />

invariant control capable to handling of <strong>the</strong>ses<br />

undesirable characteristics. This method is a nonlinear<br />

discontinuous control where <strong>the</strong> control law switch in a<br />

high frequency between two structures according to a<br />

switching(sliding) surface (combination of states system).<br />

Of <strong>the</strong> property of invariance with respect to <strong>the</strong><br />

parametric variations and external disturbances, <strong>the</strong>se<br />

system of control don’t require a high degree of<br />

accuracy in <strong>the</strong> identification of <strong>the</strong> parameters of <strong>the</strong><br />

system to be controlled. However <strong>the</strong> chatter encountered<br />

in <strong>the</strong> VSC due to an oscillations of <strong>the</strong> control in high<br />

frequencies can excite unmodeled dynamics and renders<br />

this method impractical for most application. A<br />

continuous form of control approach (among o<strong>the</strong>rs<br />

approaches) has been proposed replacing discontinuous<br />

form by a linear continuous in a boundary layer around<br />

<strong>the</strong> switching surface [Slotine 84]. Ano<strong>the</strong>r solution has<br />

been appeared <strong>the</strong>se last years : <strong>the</strong> fuzzy control by its<br />

interpolation characteristic combined with <strong>the</strong> sliding<br />

117<br />

mode control allows to reduce <strong>the</strong> control chattering. The<br />

results obtained during <strong>the</strong> application of this hybrid<br />

method of control to <strong>the</strong> inverted pendulum gave better<br />

results in simulation and in real time that those found by<br />

using <strong>the</strong> VSC in its discontinuous and continuous form.<br />

Although <strong>the</strong> order with variable structure has<br />

advantages, <strong>the</strong> phenomenon of chattering limits its<br />

implementation in real time. Indeed, due to <strong>the</strong> fast<br />

commutation of <strong>the</strong> order, <strong>the</strong> oscillations of high<br />

frequencies can excite dynamic not modelled system:<br />

This east can be harmful with <strong>the</strong> actuators. Several<br />

work was <strong>the</strong> subject of <strong>the</strong> development of techniques<br />

to reduce this undesirable phenomenon, among <strong>the</strong>se<br />

last, one finds <strong>the</strong> method of <strong>the</strong> limiting band (Boundary<br />

Layer) of Slotine[11] where <strong>the</strong> discontinuous component<br />

is replaced in <strong>the</strong> vicinity of <strong>the</strong> hypersurface of slip by a<br />

continuous function. Ano<strong>the</strong>r solution appeared <strong>the</strong>se<br />

last years: <strong>the</strong> fuzzy order by its characteristic of<br />

interpolation combined with <strong>the</strong> order by mode of slip<br />

makes it possible to give better results to cure chattering.<br />

The results obtained during <strong>the</strong> application of this hybrid<br />

technique to <strong>the</strong> system of inverted pendulum gave better<br />

results in simulation and in real time that those found by<br />

using <strong>the</strong> VSC in its discontinuous form and <strong>the</strong> VSC in<br />

its continuous form.<br />

2. Variable structure control[1], [5] , [6], [7].<br />

For a given system represented by :<br />

x& = A(<br />

x,<br />

t)<br />

+ B(<br />

x,<br />

t)<br />

⋅u<br />

(1)<br />

Where dim-x=n and dim-u=m<br />

How to solve <strong>the</strong> problem of <strong>the</strong> control of this system<br />

using <strong>the</strong> VSC?<br />

The resolution of this problem comes back to find :<br />

1) m switching functions represented in <strong>the</strong> vectorial<br />

form like S(x):<br />

S(<br />

x)<br />

n<br />

=∑c∑ i = 1<br />

n −1<br />

i⋅e i = en<br />

+ ci⋅e<br />

i ( cn<br />

i = 1<br />

= 1)<br />

With : ei = xi−<br />

xd<br />

: steady state error;<br />

xi : state of <strong>the</strong> system;<br />

xd: desired state;<br />

ci<br />

: parameters of <strong>the</strong> sliding surface.<br />

With a choice of <strong>the</strong> parameters of surface satisfying<br />

<strong>the</strong> desired performances, <strong>the</strong> stability problem is<br />

reduced to that of a linear system, <strong>the</strong>refore one can refer<br />

to <strong>the</strong> traditional criteria of stability.<br />

(2)


2) The variable structure control.<br />

⎧u+<br />

( x,<br />

t)<br />

S(<br />

x)<br />

> 0<br />

U d(<br />

x,<br />

t)<br />

= ⎨<br />

(3)<br />

⎩u−(<br />

x,<br />

t)<br />

S(<br />

x)<br />

< 0<br />

And such as <strong>the</strong> reaching or hitting mode satisfied <strong>the</strong><br />

reaching condition (existence condition of <strong>the</strong> sliding<br />

mode) i.e. to reach S(<br />

x)<br />

= 0 in a finished time.<br />

Among <strong>the</strong> forms used, we find augmenting <strong>the</strong><br />

equivalent control given by:<br />

U=U VSC = Ud +U eq = U eq - M.sign(S) (4)<br />

⎧ 1 S><br />

0<br />

with : sign(<br />

S)<br />

= ⎨<br />

⎩ −1<br />

S≤0<br />

Such as U eq is <strong>the</strong> equivalent control that allows to<br />

take <strong>the</strong> system on <strong>the</strong> sliding surface and it’s value is<br />

<strong>the</strong> average value of <strong>the</strong> discontinuous control during<br />

+ -<br />

commutation between its two values u and u .<br />

U eq is calculated posing S(<br />

x)<br />

= 0.<br />

In order to reduce <strong>the</strong> chattering phenomenon, <strong>the</strong><br />

boundary layer solution method of Slotine was<br />

proposed[11]. In this method instead of a discontinuous<br />

form a continuous has been proposed and it’s given by :<br />

⎪⎧<br />

− M.<br />

S S ≤Φ<br />

U = Ueq<br />

−M.<br />

sat(<br />

S)<br />

= Ueq<br />

+ ⎨ Φ<br />

( 5)<br />

⎪⎩ −M.<br />

sign(<br />

S)<br />

S > Φ<br />

3. Fuzzy sliding mode control(FSMC)[2], [3],<br />

[12].<br />

The fuzzy sliding mode control is adopted as <strong>the</strong><br />

second alternation for <strong>the</strong> reduction of <strong>the</strong> chattering<br />

phenomenon introduced by <strong>the</strong> discontinuous part (Ud)<br />

of <strong>the</strong> structure variable control. This hybrid control is a<br />

fuzzy control with <strong>the</strong> inputs of <strong>the</strong> controller are <strong>the</strong><br />

sliding surface and its derivative :<br />

U = Ueq−U FSMC.<br />

sign(<br />

S)<br />

(6)<br />

With : U eq is <strong>the</strong> equivalent control.<br />

U FSMC is a Mamdani model(sets of fuzzy rules): with<br />

<strong>the</strong> sliding surface and its derivative as <strong>the</strong> input variables<br />

(sets of fuzzy rules):<br />

E J<br />

.<br />

RJ : If S is EJ and S is j Then UFSMC<br />

is AJ (7)<br />

E j<br />

.<br />

E .<br />

and A J are respectively fuzzy sets of <strong>the</strong> input<br />

.<br />

variables S and S and <strong>the</strong> output variable UFSMC<br />

of <strong>the</strong><br />

fuzzy rule J.<br />

With <strong>the</strong> final control input U is calculated by <strong>the</strong><br />

FSMC<br />

gravity center deffuzification method.<br />

4. Modeling of <strong>the</strong> system [8].<br />

The system in question with <strong>the</strong> forces applied are<br />

represented on <strong>the</strong> figure 1.<br />

118<br />

θ<br />

x+l.sin(θ)<br />

Figure 1. Simplified model of <strong>the</strong> inverted pendulum.<br />

Such as:<br />

M : mass of <strong>the</strong> cart;<br />

m : mass of <strong>the</strong> pendulum >> mass of <strong>the</strong> stem;<br />

l : <strong>the</strong> length of <strong>the</strong> pendulum;<br />

F : <strong>the</strong> force applied to <strong>the</strong> cart by <strong>the</strong> DC servomotor;<br />

F : <strong>the</strong> force exerted by <strong>the</strong> cart on <strong>the</strong> pendulum;<br />

p<br />

θ : <strong>the</strong> angle which <strong>the</strong> pendulum with <strong>the</strong> vertical forms;<br />

x : position of <strong>the</strong> cart.<br />

b : coefficient of friction<br />

And as we don’t dispose a values of physical<br />

parameters of <strong>the</strong> system (parameters of <strong>the</strong> motor which<br />

actuates cart... etc), i.e. we cannot obtain a knowledge<br />

model of <strong>the</strong> system, it remains us to make simulations<br />

to identify <strong>the</strong> system.<br />

The system of <strong>the</strong> inverted pendulum is an unstable<br />

system in open loop, <strong>the</strong>refore <strong>the</strong> identification is done<br />

in closed loop after having to stabilize <strong>the</strong> system around<br />

its vertical axis by a simple PID controller determined<br />

experimentally.<br />

By raising of <strong>the</strong> input (U )and of output (θ, x) data and<br />

by <strong>the</strong> direct application of <strong>the</strong> algorithms of<br />

identification(Approach, ARMAX Structure, EP Method,<br />

MCS Criteria) [8] <strong>the</strong> model identified after validation is<br />

as follows:<br />

⎪⎧<br />

x( n+<br />

1)<br />

= Ax(<br />

n)<br />

+ Bu(<br />

n)<br />

⎨<br />

(8)<br />

⎪⎩<br />

y(<br />

n)<br />

= Cx(<br />

n)<br />

+ Du(<br />

n)<br />

Where ( n):<br />

x The state vector of dim ( x)<br />

= 4;<br />

( n):<br />

u The control vector of dim ( u)<br />

= 1;<br />

( n):<br />

m.g<br />

F<br />

y The output vector of dim ( y)<br />

= 2.<br />

With :<br />

⎡ 1.0018 0.0006559<br />

⎢ 0.010537<br />

A = ⎢<br />

⎢ -0.01055<br />

⎢<br />

⎣-0.013181<br />

1.0081<br />

-0.033191<br />

-0.10192<br />

b& x<br />

x x=0<br />

0.022802 -0.005164⎤<br />

⎡-0.000328⎤<br />

0.094702 -0.027377<br />

⎥ ⎢-0.003705⎥<br />

⎥,<br />

= ⎢ ⎥<br />

0.96423 -0.005293<br />

⎥ ⎢ 0.07789 ⎥<br />

0.23494 0.91199 ⎥<br />

⎦<br />

⎢<br />

⎣ -0.11482<br />

⎥<br />

⎦<br />

1 B<br />

M<br />

FP<br />

⎡ 2.8579 -0.00109<br />

0.038219 -0.016017<br />

⎤ ⎡0⎤<br />

C = ⎢<br />

⎥ , D=<br />

⎣0.16267<br />

-0.28894<br />

-0.029871<br />

-0.0054845<br />

⎢ ⎥<br />

⎦ ⎣0⎦<br />

This model will be used in simulation to locate initially<br />

<strong>the</strong> parameters of <strong>the</strong> controller before passing to <strong>the</strong><br />

implementation in real time.<br />

l


5. Simulation Results<br />

5.1 Statement of <strong>the</strong> problem and definition of <strong>the</strong><br />

sliding surface<br />

The problem such as it is posed relates to <strong>the</strong> control of<br />

a system at one input, <strong>the</strong> potential U () t applied to <strong>the</strong><br />

DC servomotor ensuring <strong>the</strong> movement of <strong>the</strong> set cartpendulum<br />

and to two outputs : The angle θ () t between<br />

<strong>the</strong> pendulum and <strong>the</strong> vertical and <strong>the</strong> position of <strong>the</strong> cart<br />

x()<br />

t with regard to a fixed reference mark. In order to<br />

define <strong>the</strong> switching surface, we proposed in this work to<br />

use a variable y () t which includes <strong>the</strong> two variables x()<br />

t<br />

and, with a weighting on θ () t appreciably large, to give<br />

a priority of stabilization of <strong>the</strong> angle. The use of this<br />

variable was validated during <strong>the</strong> application of <strong>the</strong><br />

traditional regulation of type PID.<br />

From where surface is defined as follows:<br />

S(<br />

y)<br />

= λy<br />

+ y&<br />

λ f 0<br />

= λ(<br />

x + aθ<br />

) + ( x&<br />

+ aθ&<br />

) (9)<br />

= λx<br />

+ x&<br />

+ λaθ<br />

+ aθ&<br />

With <strong>the</strong> state representation of our system :<br />

x & = Ax<br />

+ Bu<br />

(10)<br />

The state variables hosen are defined by posing <strong>the</strong> vector<br />

of state [ ] T<br />

= x x x x<br />

x 1 2 3 4<br />

x = x − x<br />

1 d<br />

x = x&<br />

− x&<br />

= −x&<br />

2<br />

d<br />

x3<br />

= θ d −θ<br />

= −θ<br />

x = θ&<br />

−θ&<br />

= −θ&<br />

4<br />

d<br />

And <strong>the</strong> surface S is <strong>the</strong> form :<br />

T<br />

T<br />

T<br />

S = K x ⇒ S&<br />

= K x&<br />

= K ( Ax<br />

+ Bu)<br />

(11)<br />

[ ]<br />

With: K a a<br />

(12)<br />

T<br />

= λ 1 λ<br />

The parameter a is selected equal to 3 in simulation<br />

and real time.<br />

5.2 Calculation of <strong>the</strong> Control input<br />

The control law of <strong>the</strong> system takes <strong>the</strong> form (4).<br />

With <strong>the</strong> equivalent control is calculated as follows:<br />

T<br />

S = 0 ⇒ S&<br />

= K ( Ax<br />

+ Bu)<br />

= 0<br />

(13)<br />

T −1<br />

T<br />

U = − K B K A<br />

eq<br />

( ) x<br />

And <strong>the</strong> discontinuous term takes <strong>the</strong> form:<br />

U d = −M.<br />

sign(<br />

S )<br />

(14)<br />

Therefore <strong>the</strong> total control is written :<br />

T −1 T<br />

U = −(<br />

K B)<br />

K Ax<br />

− Msign(<br />

S ) (15)<br />

After several tests in simulation, and with <strong>the</strong> initial value<br />

of xd = 0m<br />

, <strong>the</strong> values chosen for λ and M in order to<br />

ensure <strong>the</strong> good performances are λ = 17 and M = 2.<br />

4<br />

(figure 2).<br />

The results obtained, with <strong>the</strong>se parameters, show that<br />

<strong>the</strong> increase in λ improves <strong>the</strong> steady state error and <strong>the</strong><br />

settling time that it is on <strong>the</strong> angle of <strong>the</strong> pendulum or <strong>the</strong><br />

position of <strong>the</strong> cart. Whereas a large overshoot and a<br />

degradation of <strong>the</strong> settling time appear as of certain<br />

119<br />

values of λ . The phenomenon of chattering is visible on<br />

<strong>the</strong> response of <strong>the</strong> system. The oscillatory transitory<br />

mode present in <strong>the</strong> response of <strong>the</strong> cart justifies <strong>the</strong><br />

priority of <strong>the</strong> stabilization of <strong>the</strong> angle of <strong>the</strong> pendulum<br />

compared to <strong>the</strong> control of <strong>the</strong> position of <strong>the</strong> cart.<br />

θ(rad)<br />

In order to reduce <strong>the</strong> phenomenon of chattering which<br />

is regarded as a real obstacle in <strong>the</strong> realization of <strong>the</strong><br />

VSC, <strong>the</strong> continuous form of Slotine[11] is adopted (5).<br />

Simulation is made under <strong>the</strong> same conditions as those<br />

fixed in <strong>the</strong> preceding application that it is on <strong>the</strong> initial<br />

conditions or <strong>the</strong> parameters of surface and <strong>the</strong> control<br />

input so that we can make comparisons with Φ = 2.<br />

03 .<br />

θ(rad)<br />

0.25<br />

-0.25<br />

-0.5<br />

0 1 2 3 4 5<br />

4<br />

2<br />

Time (sec)<br />

The Sliding surface<br />

S<br />

0.5<br />

0.25<br />

-0.25<br />

0.5<br />

0<br />

0<br />

-2<br />

0<br />

The angle of <strong>the</strong><br />

pendulum<br />

-0.5<br />

-0.3<br />

0 1 2 3 4 5 0 1 2 3 4 5<br />

Time (sec)<br />

Time (sec)<br />

S<br />

4<br />

2<br />

0<br />

-2<br />

The Sliding surface<br />

The angle of <strong>the</strong><br />

pendulum<br />

x(m)<br />

U(V)<br />

-4<br />

0 1 2 3 4 5<br />

Time (sec)<br />

x(m)<br />

-4<br />

0 1 2 3 4 5<br />

Time (sec)<br />

-0.3<br />

0 1 2 3 4 5<br />

Time(sec)<br />

U (V)<br />

0<br />

-0.1<br />

-0.2<br />

10 The control input<br />

-10<br />

0 1 2 3 4 5<br />

Time (sec)<br />

Figure 3. Simulation results of <strong>the</strong> continuous form<br />

of <strong>the</strong> VSC(U = Ueq −M.<br />

sat(<br />

S ) ).<br />

According to <strong>the</strong> results obtained for <strong>the</strong> two forms of<br />

<strong>the</strong> control(discontinuous, continuous), one notices that<br />

<strong>the</strong> first form ensures a good speed for <strong>the</strong> system, in<br />

figure 2, <strong>the</strong> settling times of <strong>the</strong> cart and of pendulum<br />

are respectively: 1. 3s<br />

and 0 . 8s<br />

0.3<br />

0.2<br />

0.1<br />

0<br />

-0.1<br />

-0.2<br />

10<br />

5<br />

0<br />

-5<br />

0.3<br />

0.2<br />

0.1<br />

5<br />

0<br />

-5<br />

The position of <strong>the</strong> cart<br />

The Control<br />

-10<br />

0 1 2 3 4 5<br />

Time (sec)<br />

Figure 2. Simulation Results of <strong>the</strong> VSC<br />

(U = U eq−Msign<br />

S .<br />

( )<br />

The position of <strong>the</strong> cart


On <strong>the</strong> o<strong>the</strong>r hand, from <strong>the</strong> energy point of view, <strong>the</strong><br />

control input applied to <strong>the</strong> system is large even in<br />

steady state mode and present a considerable chattering<br />

which become null by using <strong>the</strong> continuous form of <strong>the</strong><br />

VSC with <strong>the</strong> settling times of <strong>the</strong> cart and pendulum<br />

equal respectively to: 3s and 1.<br />

3s<br />

that confirms<br />

degradation in term of speed of <strong>the</strong> system (figure 3).<br />

The fuzzy sliding mode control FSMC (6) is adopted<br />

as a second solution for <strong>the</strong> chattering phenomenon. The<br />

control law becomes <strong>the</strong>n nonlinear but continuous and it<br />

is given by a combination of fuzzy rules with <strong>the</strong> inputs<br />

is surface (9) and its derivative and <strong>the</strong> output is <strong>the</strong><br />

control U FSMC as follows:<br />

If S is P and S is P Then U is NH;<br />

& FSMC<br />

If S is P and S is Z Then U is NB;<br />

& FSMC<br />

If S is P and S is N Then U is NM;<br />

& FSMC<br />

If S is Z and S is P Then U is NS;<br />

& FSMC<br />

If S is Z and S is Z Then U is Z;<br />

& FSMC<br />

If S is Z and S is N Then U is PS;<br />

& FSMC<br />

If S is N and S & is P Then U FSMC is PM;<br />

If S is N and S & is Z Then U FSMC is PB;<br />

If S is N and S & is N Then U FSMC is PH.<br />

With <strong>the</strong> memberships functions of S, S and U &<br />

FSMC<br />

chosen after several tests are given on <strong>the</strong> following<br />

figure:<br />

µ<br />

S<br />

N Z P<br />

-2 0 +2<br />

(a)<br />

S<br />

( c)<br />

µ U FSMC<br />

Simulation is made under <strong>the</strong> same conditions as those<br />

fixed in <strong>the</strong> preceding applications.<br />

The obtained results show(figure 5.) a fast convergence<br />

towards <strong>the</strong> stabilization position of <strong>the</strong> pendulum 0.9s<br />

and <strong>the</strong> cart 1.5s. Compared to <strong>the</strong> discontinuous form of<br />

VSC, this approach FSMC allows to reduce considerably<br />

<strong>the</strong> chattering phenomenon of (almost no one), with a<br />

small deterioration in term of performances(rapidity,<br />

overshoot) on <strong>the</strong> o<strong>the</strong>r hand this hybrid approach has a<br />

better speed than that obtained by VSC with a boundary<br />

layer.<br />

µ<br />

S &<br />

N Z P<br />

-40 0 +40<br />

(b)<br />

NH NB NM NS Z PS PM PB PH<br />

-1.5 -1.12 -0.75 -0.37 0 0.37 0.75 1.12 1.5<br />

S &<br />

U FSMC<br />

Figure 4. memberships Functions : (a), (b) sliding surface<br />

and its derivative, (c) FSMC<br />

120<br />

θ(rad)<br />

0.4<br />

0.2<br />

The angle of <strong>the</strong><br />

pendulum<br />

0.3<br />

0.2<br />

0.1<br />

The position of <strong>the</strong> cart<br />

0<br />

0<br />

-0.2<br />

-0.1<br />

-0.2<br />

-0.4<br />

0 1 2 3 4 5<br />

Time (sec)<br />

-0.3<br />

0 1 2 3 4 5<br />

Time (sec)<br />

S<br />

0<br />

-2<br />

x(m)<br />

4<br />

The Sliding surface<br />

10<br />

2<br />

5<br />

-4<br />

0 1 2 3 4 5<br />

Time (sec)<br />

6. Experimental results<br />

-10<br />

0 1 2 3 4 5<br />

Time (sec)<br />

6.1 The interfacing system [ 4 ], [ 9 ]<br />

The system allows <strong>the</strong> interfacing and <strong>the</strong> treatment of<br />

<strong>the</strong> different inputs and <strong>the</strong> implementation of <strong>the</strong> control<br />

algorithms for <strong>the</strong> inverted pendulum is a dSPACE<br />

card(DS1102).<br />

From <strong>the</strong> programming point of view, <strong>the</strong> majority of<br />

<strong>the</strong> algorithms concerning <strong>the</strong> development of <strong>the</strong> control<br />

laws are realized by using MATLAB/SIMULINK<br />

software. This last allows fast implementation thanks to<br />

easy programming and to <strong>the</strong> use of specialized libraries:<br />

TOOLBOXS.<br />

6.2 Calculation of <strong>the</strong> control<br />

In all what follows, <strong>the</strong> conditions of <strong>the</strong> experimental<br />

tests are:<br />

♦ <strong>the</strong> sampling period is fixed at: T sap = 10ms<br />

♦ <strong>the</strong> initial conditions are fixed at:<br />

θ ( ) 0 =θ 0 = − 0.<br />

35 rad and x 0= x(<br />

0)<br />

= 0.<br />

21m,<br />

<strong>the</strong><br />

choice of <strong>the</strong> initial conditions of different signs is<br />

due to <strong>the</strong> technical limitations of <strong>the</strong> system;<br />

♦ <strong>the</strong> best parameters of surface are given by <strong>the</strong><br />

vector :<br />

T<br />

K = [ 12.<br />

07 1 36.<br />

21 3]<br />

For <strong>the</strong> first form of <strong>the</strong> control i.e. :<br />

U = Ueq<br />

−M.<br />

sign(<br />

S )<br />

With : M = 1 it is <strong>the</strong> best value obtained after several<br />

tests and which ensures a certain speed to <strong>the</strong> system.<br />

The results obtained are represented on figure 6, with<br />

<strong>the</strong> initial conditions quoted previously and <strong>the</strong> final<br />

state θ () t = d 0 rad and x () t = d 0 m One notices a fast<br />

convergence of <strong>the</strong> position of <strong>the</strong> cart as well as <strong>the</strong><br />

angle of <strong>the</strong> pendulum towards <strong>the</strong>ir references (null),<br />

<strong>the</strong> settling times of <strong>the</strong> system are approximately 0 . 7 s<br />

for <strong>the</strong> angle and 1s <strong>the</strong> cart (<strong>the</strong> angle of <strong>the</strong> pendulum<br />

U(V)<br />

0<br />

-5<br />

The control input<br />

Figure 5. Simulation results of <strong>the</strong> FSMC :<br />

U = Ueq−U<br />

FSMC.<br />

sign(<br />

S)


has priority that <strong>the</strong> position of <strong>the</strong> cart). In steady state<br />

mode discontinuous form commutates very quickly<br />

between its two limits, which influences <strong>the</strong> total control,<br />

where one notices a range of variation relatively large,<br />

<strong>the</strong> last generates fluctuations on <strong>the</strong> output level of <strong>the</strong><br />

system as well as in <strong>the</strong> sliding surface, it’s <strong>the</strong><br />

chattering phenomenon.<br />

( rad)<br />

θ<br />

Figure 6. Experimental results of <strong>the</strong> VSC<br />

(U = U − Msign ).<br />

eq<br />

( S )<br />

In order to limit <strong>the</strong> chattering phenomenon <strong>the</strong> linear<br />

continuous form of Slotine is adopted(5).<br />

With: M = 1 and <strong>the</strong> value of <strong>the</strong> boundary layer<br />

Φ = 1.<br />

<strong>the</strong>se values chosen after several tests ensure a<br />

certain speed for <strong>the</strong> system and decrease <strong>the</strong> chattering<br />

effect.<br />

θ(rad)<br />

The angle of <strong>the</strong><br />

pendulum<br />

-0.8<br />

Time (sec)<br />

Time (sec)<br />

-0.4<br />

0.8<br />

0.4<br />

0.45<br />

0.3<br />

0.15<br />

The position of <strong>the</strong> cart<br />

0<br />

0<br />

0 2 4 6 8 10<br />

-0.15<br />

-0.3<br />

-0.45<br />

0 2 4 6 8 10<br />

-8<br />

The Sliding surface<br />

8<br />

The control input<br />

0.8<br />

4<br />

4<br />

0.4<br />

S<br />

0.8<br />

0.4<br />

0<br />

-0.4<br />

The angle of <strong>the</strong><br />

pendulum<br />

x(m)<br />

-0.8<br />

0 2 4 6 8 10<br />

Time (sec)<br />

-8<br />

The Sliding surface<br />

4<br />

S<br />

0<br />

-4<br />

-8<br />

0 2 4 6 8 10<br />

Time (sec)<br />

0<br />

-4<br />

x(m)<br />

-8<br />

0 2 4 6 8 10<br />

Time (sec)<br />

x(m)<br />

0.45<br />

0.3 The position of <strong>the</strong> cart<br />

0.15<br />

0<br />

-0.15<br />

-0.3<br />

-0.45<br />

0 2 4 6 8 10<br />

Time (sec)<br />

-8<br />

The control input<br />

4<br />

Figure 7. Experimental results of <strong>the</strong> continuous form<br />

o f <strong>the</strong> VSC ( U = U eq−Msat(S)).<br />

The results obtained are represented on figure 7, for a<br />

final position θ () t = d 0 rad and x () t = d 0 m with <strong>the</strong><br />

same initial conditions. One notices a fast convergence<br />

of <strong>the</strong> position of <strong>the</strong> cart as well as <strong>the</strong> angle of <strong>the</strong><br />

pendulum towards <strong>the</strong>ir references, <strong>the</strong> settling times of<br />

<strong>the</strong> system are approximately 1. 2s<br />

for <strong>the</strong> angle and 1 . 3s<br />

for <strong>the</strong> cart. Compared with <strong>the</strong> results of <strong>the</strong><br />

first(discontinuous) form, <strong>the</strong> system of inverted<br />

pendulum became slow but <strong>the</strong> chattering is reduced what<br />

is similar to <strong>the</strong> results obtained in simulation.<br />

U(V)<br />

U(V)<br />

0<br />

-4<br />

-8<br />

0 2 4 6 8 10<br />

Time (sec)<br />

0<br />

-4<br />

-8<br />

0<br />

2 4 6 8 10<br />

Time (sec)<br />

121<br />

The hybrid control FSMC is adopted as a second<br />

solution to <strong>the</strong> chattering phenomenon(6).<br />

The results obtained are represented on figure 8, for a<br />

final position θ d () t = 0 rad and xd () t = 0 m with <strong>the</strong><br />

same initial conditions. One notices a fast convergence<br />

of <strong>the</strong> position of <strong>the</strong> cart as well as <strong>the</strong> angle of <strong>the</strong><br />

pendulum towards <strong>the</strong>ir desired positions, <strong>the</strong> settling<br />

time is of 1s for <strong>the</strong> angle of <strong>the</strong> pendulum, and 1. 2s<br />

<strong>the</strong><br />

cart. Compared with <strong>the</strong> results obtained with <strong>the</strong><br />

discontinuous form of <strong>the</strong> VSC, <strong>the</strong> system converges<br />

less fast, with less oscillations and a very reduced<br />

chattering, whereas it is faster, with a small overshoot,<br />

that <strong>the</strong> VSC controller with a boundary layer.<br />

θ(rad)<br />

0<br />

-0.4<br />

The angle of <strong>the</strong><br />

pendulum<br />

-0.8<br />

0 1 2 3 4 5 6<br />

Time (sec)<br />

S<br />

8<br />

4<br />

0<br />

-4<br />

-8 0<br />

The Sliding surface<br />

2 3 4 5 6<br />

Time (sec)<br />

x(m)<br />

Figure 8. Experimental results of <strong>the</strong> FSMC<br />

U = Ueq−U FSMC.<br />

sign(<br />

S)<br />

7. Conclusion<br />

The control input<br />

-8<br />

0 1 2 3 4 5 6<br />

Time (sec)<br />

<strong>the</strong> variable structure control was presented and tested<br />

in simulation and in real time on a single-input and<br />

multi-output system type(benchmark) which is <strong>the</strong><br />

inverted pendulum. The results obtained make it possible<br />

to conclude that <strong>the</strong> VSC in its discontinuous form could<br />

stabilize <strong>the</strong> system of <strong>the</strong> inverted pendulum and to<br />

make rapidly take its representative state up to <strong>the</strong><br />

equilibrium point. However <strong>the</strong> chattering is significant<br />

as well as <strong>the</strong> furnished energy. Because of <strong>the</strong><br />

chattering problem, <strong>the</strong> performances in term of precision<br />

are bad. In order to remedy of this phenomenon which is<br />

regarded as a real obstacle in <strong>the</strong> application of <strong>the</strong><br />

VSC, <strong>the</strong> continuous form(boundary layer) of Slotine is<br />

adopted as a first solution and has allowed to reduce<br />

chattering but with a deterioration in term of settling<br />

time. The hybrid control with variable structure and by<br />

fuzzy logic which has been proposed <strong>the</strong>se last years is<br />

adopted as a second solution, and with a good choice of<br />

<strong>the</strong> boundary layer(membership functions), this hybrid<br />

control was able to stabilize <strong>the</strong> system, to reduce <strong>the</strong><br />

chattering and <strong>the</strong> overshoot and to give better<br />

performances compared to <strong>the</strong> method of <strong>the</strong> continuous<br />

form.<br />

Thus, in <strong>the</strong> application of <strong>the</strong> variable structure control<br />

it is necessary to make a compromise between <strong>the</strong> speed<br />

U(V)<br />

0.2<br />

0<br />

-0.2<br />

8<br />

4<br />

0<br />

-4<br />

The position of <strong>the</strong> cart<br />

0 1 2 3 4 5 6<br />

Time (sec)


of <strong>the</strong> system and <strong>the</strong> reduction of <strong>the</strong> chattering<br />

phenomenon and all depends on <strong>the</strong> applications.<br />

References<br />

[1] H. Buhler : Réglage par mode de glissement. Presses<br />

Polytechniques et Universitaires Romandes, 1986.<br />

[2] M. Bouchoucha : Conception d’un contrôleur à logique floue basé<br />

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122


<strong>ECAD</strong>/ECAE 2004, University of Durham, UK, November 15-16, 2004<br />

MODELING OF TRANSPORT FLOWS FOR INTERDISCIPLINARY SYSTEMS<br />

INTEGRATION<br />

Anatoly Levchenkov, Aleksandrs Suslenkovs<br />

Riga Technical University<br />

1, Kalku St., Riga, LV-1658, Latvia<br />

mailto:levas@latnet.lv<br />

Keywords: software agent, schedule , optimization of transport flows,. internet technologies<br />

ABSTRACT<br />

The work is based on <strong>the</strong> algorithm of optimization of transport flows in complicated managing systems.<br />

The aim of <strong>the</strong> work is a decomposing of <strong>the</strong> system and analysis of subsystems for <strong>the</strong> fur<strong>the</strong>r<br />

optimization and correction of <strong>the</strong> information-transport flows using <strong>the</strong> methods of scheduling <strong>the</strong>ory<br />

and decision making.<br />

At <strong>the</strong> same time it is supposed that <strong>the</strong>re is no an interrelation between <strong>the</strong> decisions and an established<br />

order, i.e. <strong>the</strong> operations do not depend on <strong>the</strong>ir execution sequence. Most of <strong>the</strong> well-known methods of<br />

decision making with <strong>the</strong> help of design and analysis of correspondent operational models are<br />

investigated in <strong>the</strong> work.<br />

The transport flows in <strong>the</strong> work are presented as a system which needs an ordering of data with a<br />

reasonable usage during short time limits. The work suggests a modeling of schemes of flows routing<br />

with <strong>the</strong> fur<strong>the</strong>r adaptation in a particular environment with <strong>the</strong> use of standards for interdisciplinary<br />

systems of integration.<br />

There is a developed on <strong>the</strong> obtained data ma<strong>the</strong>matical model of a system of transport flows integration<br />

and representation in <strong>the</strong> form of totality of <strong>the</strong>se flows factors, which could be demonstrated in a vector<br />

expression. The task of adaptation is an application of <strong>the</strong> elaborated algorithm of integration system in<br />

software agents and processing of information with <strong>the</strong> help of integrated data bases. The adaptation<br />

plays a role of deeper feedback (which has several hierarchies), improving <strong>the</strong> process of management of<br />

<strong>the</strong> complicated system namely transport flows.<br />

An additional solution of <strong>the</strong> problem of transport flows management is a development of special<br />

software which allows solving <strong>the</strong> problems in time. The work proposes to use Internet technologies and<br />

standards of system for joining of separate information systems for solution of specific problems caused<br />

by <strong>the</strong> fact that many processes cover several different information applications.<br />

123


<strong>ECAD</strong>/ECAE 2004, University of Durham, UK, November 15-16, 2004<br />

MODELING OF POWER DISTRIBUTION SYSTEMS WITH THE HELP OF<br />

INTERNET BASED DATA PROCESSING TEHNOLOGIES<br />

Anatoly Levchenkov, Diana Rihtere<br />

Riga Technical University<br />

1, Kalku St., Riga, LV-1658, Latvia<br />

mailto:levas@latnet.lv<br />

Keywords: software agent, schedule, electrical energy distribution,. internet technologies<br />

ABSTRACT<br />

During <strong>the</strong> work a software agent modeling has been observed for solving <strong>the</strong> problem of electrical<br />

energy distribution. The tasks of <strong>the</strong> work could be described in <strong>the</strong> following way: to model a power<br />

distribution system, which goes through all <strong>the</strong> points of electrical energy distribution, and which allows<br />

distributing it to all consumers with minimum expenses and time. To provide fast operation of <strong>the</strong><br />

program and simplified location and filtration of information software agents have been applied.<br />

Scientific importance of <strong>the</strong> work is connected with application of <strong>the</strong> algorithms of incoming and<br />

processing of inquiries toge<strong>the</strong>r with algorithms of graph <strong>the</strong>ory. From <strong>the</strong> practical application point of<br />

view <strong>the</strong> results could be used in <strong>the</strong> management of <strong>the</strong> process of power distribution, providing <strong>the</strong><br />

management of a particular unit in a day-night regime and decreasing <strong>the</strong> management expenses for manhour<br />

spent for decision making in states of emergency in order to apply <strong>the</strong> possibilities of systems of <strong>the</strong><br />

Internet data bases as well as to model operation of <strong>the</strong> real power distribution systems.<br />

Software agents are used for providing fast operation of <strong>the</strong> program, location of <strong>the</strong> information and<br />

simplifying of <strong>the</strong> filtration. To display <strong>the</strong> data on consumers a data base has been elaborated in <strong>the</strong><br />

Internet environment, which represents <strong>the</strong> information on payments and time resources of each<br />

consumer that is necessary for delivery of electrical energy. The elaborated algorithm is described and a<br />

logistic practical example of application of <strong>the</strong> algorithm is considered.<br />

There is a wide area of possibilities to solve <strong>the</strong> problems of power distribution. The optimization of<br />

power distribution can provide also an improvement in operation of ano<strong>the</strong>r system. In present economic<br />

conditions a solving of power distribution problem, based on <strong>the</strong> optimization of electric transport<br />

operation, is vary actual. One of <strong>the</strong> solutions is application of algorithms of <strong>the</strong>ory of scheduling. It<br />

seems reasonable to supply of each type of electric transport with electric energy based on real needs.<br />

There are real possibilities to use <strong>the</strong> mentioned above algorithms of graph <strong>the</strong>ory, applied for an optimal<br />

route defining, with <strong>the</strong> algorithms of <strong>the</strong>ory of scheduling, which allow optimizing <strong>the</strong> schedule of <strong>the</strong><br />

vehicle movement. The newly-elaborated combination of <strong>the</strong> methods will help to decrease consumption<br />

of electric energy, expenses of electric transport running, coordinating in its turn <strong>the</strong> routes and schedules<br />

of <strong>the</strong> transport. The data could be input into <strong>the</strong> Internet with <strong>the</strong> help of software agents. Applying <strong>the</strong><br />

suggested Internet technologies for data processing it is possible to find <strong>the</strong> optimal solution of <strong>the</strong><br />

problem.<br />

124


Author Index<br />

A<br />

Almaini, A 95<br />

Arumugam, J. 12<br />

B<br />

Baguley, P. 41, 101, 106<br />

Bouchoucha, M. 117<br />

C<br />

Cooke, M. D. 51<br />

D<br />

Derdouche, A. 117<br />

Desoi, J.C. 36<br />

G<br />

Gallant, A. J. 67<br />

Graetz, F. 2<br />

Grebenstein, K. 111<br />

H<br />

Hackney P.D 75<br />

I<br />

Ito, T 6<br />

125<br />

L<br />

Lenders, M. 36<br />

Levchenkov A. 123,124<br />

M<br />

Mankel, A. 2<br />

Maropoulos, P.G. 59<br />

Mukherjee, D. 80<br />

N<br />

Neerukonda, N. 12<br />

P<br />

Page, T. 101,106<br />

Pleßow, M. 90<br />

R<br />

Rihtere, D. 124<br />

Rolt, S. 59<br />

S<br />

Schaefer, D. 41, 46, 101,106<br />

Schuh, G. 36<br />

Schumann, C.A. 111<br />

Solano, B. 59<br />

Šormaz, D. 12<br />

Souissi, A. 117<br />

Stube, B. 90<br />

Suslenkovs, A. 123<br />

T<br />

Tittmann, C. 111


V<br />

Vigerske, W. 90<br />

W<br />

Ward, T. 21<br />

Witte, V. 36<br />

Wood, D. 51, 59, 67<br />

126<br />

Y<br />

Yang, M. 95<br />

Z<br />

Zaeh, M. F. 2<br />

Zughaid, N.S. 75


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127

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