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iv<br />

the University of Graz [2] and were published in [3, 4]. The simulation model presented<br />

in [1] is completed by the dynamic calculation of the space charge field using<br />

these formulas. Since the gas parameters like drift velocity and the Townsend and attachment<br />

coefficients depend on the electric field, they are calculated dynamically as<br />

well. The functional dependence of these parameters on the field is obtained with the<br />

simulation programs MAGBOLTZ and IMONTE. For the primary ionization parameters,<br />

we use the values that are predicted by the program HEED. While the described<br />

procedure only simulates the longitudinal avalanche development towards the anode<br />

of the RPC, we also present more dimensional models that allow a careful study of<br />

the transverse repulsive and attractive forces of the space charge fields, and of the<br />

consequences for the avalanche propagation.<br />

We shall show that the efficiencies of single gap Timing RPCs is indeed explained<br />

by the high primary ionization density (about 9.5 /cm as predicted by HEED) and a<br />

large effective Townsend coefficient (around 113 /mm as predicted by IMONTE). We<br />

show that the space charge field reaches the same magnitude as the applied electric<br />

field in avalanches at large gas gain. This strong space charge effect effectively suppresses<br />

large values for the avalanche charges. The shape of the simulated charge<br />

spectra is very similar to the measurements. Also the simulated average charges are<br />

close to the experimental results. RPCs are operated in a strong space charge regime<br />

over a large range of applied voltage, contrary to wire chambers.<br />

We apply only standard detector physics simulations to RPCs. The performance of<br />

Timing and Trigger RPCs is well reproduced by our simulations. The results concerning<br />

the space charge effect were presented and discussed at the ’RPC 2001’ workshop<br />

[5] and on the ’2002 NSS/MIC’ conference [6].

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