Report on future detector requirements at ESRF

Standard diffraction and 2D/3D diffraction - mapping
Project (Former BL) Application
UPBL0: NINA (ID22) Diffraction and diffraction mapping (2D/3D)
UPBL11: TEXAS/EXAFS (BM29) Diffraction
Aim of the detection system
The aim of the detection system is to record 2D or 3D diffraction maps in order to reconstruct
images of polycrystalline samples and to measure diffraction patterns as complementary
information to the main technique of the beamline (absorption spectroscopy, imaging) on
powders or single crystals.
Monochromatic
beam
Sample
Detector
Operating conditions and specifications
Energy range:
The energy ranges from 15 to 60 keV. It is a monochromatic beam on both TEXAS\EXAFS
and NINA, which will carry out diffraction only on the “NA” branch (Nano-Analysis) of the
beamline.
Integration time:
Integration times will range between tens of milliseconds and few seconds. One goal is to
follow chemical reactions or pressure evolution at the same time by diffraction and
spectroscopy, measuring one diffraction pattern at the end of each absorption spectrum. This
requires integration and readout times compatible with the kinetics of the reaction. Moreover,
in order to perform 2D and 3D mapping efficiently, the readout time must be smaller or at
least not longer than the integration time.
Energy resolution:
Energy resolution is not needed for this application.
Spatial resolution:
The sample-to-detector distance can be adapted to obtain the desired angular resolution. Pixel
size between 50 and 150 µm and 2kx2k pixels would be convenient. A an example, a 2D
detector with 2kx2k pixels of 100 µm placed at 20 cm from the sample would let record
reflections up to θ=25 degrees with a resolution of about 1 mrad, which is similar to what is
currently obtained.
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