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Neutron Source - FRM II - Technische Universität München

Neutron Source - FRM II - Technische Universität München

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KWS-3 very small angle scattering diffractometer<br />

Entrance Slit<br />

r E<br />

δQ = k ·r E<br />

L<br />

2π<br />

(k = )<br />

λ<br />

Description<br />

KWS-3 is a very small angle neutron scattering experiment<br />

running on the focusing mirror principle<br />

with a wave vector transfer resolution between 10 -4<br />

and 10 -3 Å -1 , bridging a gap between Bonse-Hart<br />

and pinhole cameras. After the transfer into the<br />

guide hall of the <strong>FRM</strong> <strong>II</strong> neutron source in Garching<br />

a major upgrade became necessary, with the aim<br />

to make proper use of the enhanced neutron flux,<br />

which is larger by a factor of 7. Especially the<br />

neutron mirror was refurbished with a new 65 Cucoating.<br />

A second sample chamber at the distance<br />

of 1 m allows the extension of the Q-range up to<br />

3.5 · 10 -2 Å -1 giving proper overlap to the Q-range<br />

of the other SANS machines at <strong>FRM</strong> <strong>II</strong>. After mirror<br />

refurbishment and optical alignment the upgrade<br />

activities are going on at the end of the dedicated<br />

neutron guide.<br />

The principle of this instrument is a one-to-one<br />

image of an entrance aperture onto a 2D positionsensitive<br />

detector by neutron reflection from a<br />

double-focusing elliptical mirror. It permits to perform<br />

SANS studies with a scattering wave vector<br />

resolution between 10 -4 and 10 -3 Å -1 with considerable<br />

intensity advantages over conventional<br />

pinhole-SANS and Double Crystal Diffractometers.<br />

Therefore it perfectly bridges the “Q-gap” between<br />

U-SANS and SANS: Very Small Angle Scattering<br />

(V-SANS).<br />

Mirror Sample<br />

λ = 12 Å<br />

k = 0.5 Å -1<br />

r E = 2 mm<br />

L = 10m<br />

L<br />

Detector<br />

δQ = 10 -4 Å -1<br />

Figure 1: Principle of KWS-3 - superior flux of focusing optics in the resolution regime at very low<br />

Q ≤ 10 -2 Å -1 compared to pinhole geometry. Length scales up to 1 µm are accessible.

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