Neutron Source - FRM II - Technische Universität München
Neutron Source - FRM II - Technische Universität München
Neutron Source - FRM II - Technische Universität München
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KWS-3 very small angle scattering diffractometer<br />
Entrance Slit<br />
r E<br />
δQ = k ·r E<br />
L<br />
2π<br />
(k = )<br />
λ<br />
Description<br />
KWS-3 is a very small angle neutron scattering experiment<br />
running on the focusing mirror principle<br />
with a wave vector transfer resolution between 10 -4<br />
and 10 -3 Å -1 , bridging a gap between Bonse-Hart<br />
and pinhole cameras. After the transfer into the<br />
guide hall of the <strong>FRM</strong> <strong>II</strong> neutron source in Garching<br />
a major upgrade became necessary, with the aim<br />
to make proper use of the enhanced neutron flux,<br />
which is larger by a factor of 7. Especially the<br />
neutron mirror was refurbished with a new 65 Cucoating.<br />
A second sample chamber at the distance<br />
of 1 m allows the extension of the Q-range up to<br />
3.5 · 10 -2 Å -1 giving proper overlap to the Q-range<br />
of the other SANS machines at <strong>FRM</strong> <strong>II</strong>. After mirror<br />
refurbishment and optical alignment the upgrade<br />
activities are going on at the end of the dedicated<br />
neutron guide.<br />
The principle of this instrument is a one-to-one<br />
image of an entrance aperture onto a 2D positionsensitive<br />
detector by neutron reflection from a<br />
double-focusing elliptical mirror. It permits to perform<br />
SANS studies with a scattering wave vector<br />
resolution between 10 -4 and 10 -3 Å -1 with considerable<br />
intensity advantages over conventional<br />
pinhole-SANS and Double Crystal Diffractometers.<br />
Therefore it perfectly bridges the “Q-gap” between<br />
U-SANS and SANS: Very Small Angle Scattering<br />
(V-SANS).<br />
Mirror Sample<br />
λ = 12 Å<br />
k = 0.5 Å -1<br />
r E = 2 mm<br />
L = 10m<br />
L<br />
Detector<br />
δQ = 10 -4 Å -1<br />
Figure 1: Principle of KWS-3 - superior flux of focusing optics in the resolution regime at very low<br />
Q ≤ 10 -2 Å -1 compared to pinhole geometry. Length scales up to 1 µm are accessible.