S08 Core
S08 Core
S08 Core
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• All automotive <strong>S08</strong>’s are qualified per AEC Q100<br />
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service names are the property of their respective owners. © Freescale Semiconductor, Inc. 2009.<br />
The <strong>S08</strong> Quality Advantage<br />
requirements.<br />
• All automotive <strong>S08</strong>’s are designed with SCAN and NVM BIST test modes<br />
allowing for high test coverage, greater than 95%.<br />
• All automotive <strong>S08</strong> wafers are probed using a sort1-bake-sort2 flow to screen<br />
for potential NVM data retention failures.<br />
• All automotive <strong>S08</strong>’s are launched on a 100% production burn-in and tritemperature<br />
test flow at final test.<br />
• Rigorous controls have been instituted to manage manufacturing changes,<br />
insuring major changes affecting form/fit/function are implemented only after<br />
customer approval.<br />
65<br />
TM
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