IEOR 130 Methods of Manufacturing Improvement Fall, 2013 Prof ...
IEOR 130 Methods of Manufacturing Improvement Fall, 2013 Prof ...
IEOR 130 Methods of Manufacturing Improvement Fall, 2013 Prof ...
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(d) Pessimistically, there might be a major drop in die yield if the test runs are not<br />
performed. By what factor would the die yield need to drop to <strong>of</strong>fset the gains in wafer<br />
throughput? Do you think such a drop is likely?<br />
(e) How would the trade-<strong>of</strong>f change if the metal etcher was not the fab bottleneck?<br />
Would we be more inclined or less inclined to eliminate test runs? Explain very briefly.<br />
6
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