Area Array Cobra Probe Card With 5 GHz. Bandwidth Raphael ...

05.02.2014 • Views

Share Embed Flag

Area Array Cobra Probe Card With 5 GHz. Bandwidth Raphael ...

Area Array Cobra Probe Card With 5 GHz. Bandwidth Raphael ...

DOWNLOAD ePAPER

swtest.org

Create successful ePaper yourself

Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.

START NOW

TDT Characterization<br />

500 Ohm Picoprobe<br />

HP54120B<br />

<strong>Cobra</strong> <strong>Probe</strong><br />

6/12/02 IBM RESEARCH Page [10]

1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22

Probe-tip Clean on Demand - Semiconductor Wafer Test Workshop

VLSIresearch - Semiconductor Wafer Test Workshop

Probing Lead Free Solder Bumps in Final Wafer Test

Tutorial - Semiconductor Wafer Test Workshop

Preliminary Program (PDF) - Semiconductor Wafer Test Workshop

July, 2002 Issue - Semiconductor Wafer Test Workshop

Very Low Cost Probe Cards - Semiconductor Wafer Test Workshop

Impact of Vibration on Contact Resistance

Probe Card Cleaning Media Survey - Semiconductor Wafer Test ...

IntelÂ® Sort-Interface-Unit (SIU) Design Methods for Reducing Burn ...

Standard Probe Head Interface for Cobra Space Transformer

Effect of Ground Return Path on Timing Accuracy

C4 Probe Card Space Transformer Technology Overview

with Pyramid Probe Cards - Semiconductor Wafer Test Workshop

Vertical Probing Goes Power

TDT Characterization 500 Ohm Picoprobe HP54120B <strong>Cobra</strong> <strong>Probe</strong> 6/12/02 IBM RESEARCH Page [10]

TDT For Medium And Low Speed Lines 6/12/02 IBM RESEARCH Page [11]

Page 1 and 2: Area Array Cobra Probe Card With 5
Page 3 and 4: Motivation • Wafer Level, Develop
Page 5 and 6: High Performance Cobra Probe Card 5
Page 7 and 8: Space Transformer 100 mm Micro-Coax
Page 9: Probe Card Features • Space Trans
Page 13 and 14: TDT For High Speed Lines 6/12/02 IB
Page 15 and 16: SerDes Output Experiment HP54120B C
Page 17 and 18: SerDes BERT Experiment 6/12/02 IBM
Page 19 and 20: 10 Gb/s BERT Results At Wafer Level
Page 21 and 22: TFI Contactor Reduces L/R Time Subs