Feinmetall Spring Contact Probes, Product News 2011 - Perel

Spring Contact Probes
PRODUCt neWS
FeINMeTALL
Contact technologies for electronics

Feinmetall News
Dear valued
Customers,
FEINMETALL joined an extreme positive
business development during the year
2010 impacted by the upturn of the
Electronic-, Automotive- and Semiconductor-Industry.
So we are joining a
phenomal growth rate and are encouraged
by further potentials, also in new
market segments. Our investments in
product innovation and skilled personnel
are creating future prospects which may
offer you new opportunities in terms of
contacting solutions.
FEINMETALL Newsletter
successfully established
The newsletter is published three to
four times a year and contains current
information from our product divisions
Contact Probes, Test Fixtures and Wafer
Probe Cards.
Would you like to get regularly
information on FEINMETALL News?
Yes, are you interested?
Than simply send us your
contact data by e-mail to
newsletter@feinmetall.de
or call us at phone:
+49 7032 2001 – 191
FEINMETALL´s traditionally high innovation
rate, despite the recent difficult times, has
created a bunch of new products for
various new applications.
3D-CAD-Data online
This leaflet is presenting a selection of
the top new products from our product
division Contact Probes.
Please use this as a supplement to our
General Catalogue 2010.
By our successfully launched Newsletter
we keep you updated regularly on new
products, important events and other
interesting subjects at FEINMETALL.
We wish you a successful business with
best regards from Herrenberg, your
FEINMETALL offers you a special service for your product designs.
3D-CAD-modells of our spring contact probes are online available for you.
You can download from our homepage the data as step-files and integrate the
products into your designs. You reach the product file selection on our web-site
at “contact probes” and ”products” ( see picture above).
Wolfgang Bürkle
Managing Director

Feinmetall news
new Contact Probes
The success base of FEINMETALL spring
contact probes is the most appropriate
integration of customer requirements
into functional and applicable products.
To manage this it is vital to be close to
the customer, to perform innovative
product design and to possess great
fine-mechanical skills – all of this typical
strengths of FEINMETALL.
We are eager to provide value added
products to our customers by integration
of several functions and additional
features. Our major target always is to
offer a cost benefit in terms of total
cost of ownership.
Demanding market segments like
“Wire Harness and Connector Test”,
“High Current Applications” and “High
Frequency Test” are continuously
requesting new complex and high
functionality probes. Our market
position and the business success show
that FEINMETALL has an outstanding
performance in succeeding this
innovation process.
Probes for iCt and Functional test 2-3
Probes for Wire Harness and Connector test 4-5
Probes for High Current applications 6-
Probes for Radio Frequency applications 8-9
new Compact Fixtures
Compact Fixtures
For loaded board test at small or medium size batches and for laboratory
tests, FEINMETALL has developed a new generation of cost saving
Compact Fixtures.
Top ergonomics, robustness, remarkable pointing accuracy and multiple
application capabilities are realized at the new design.
The fixtures are available for stand alone operation as well as
interchangeable kit system in two sizes. The 50 pin D-Sub interface
to the test system is freely accessible.
1

2
ICT/FCT Probes
Progressive
Series
The Progressive Series has been developed
for contacting lead free solder
pads or very oxidized/contaminated
PCBs. Our customers are excited and
commend the increased contacting
capability as well as the improved FPY
(First Pass Yield).
The frequently used probes with most
common tip styles are now available
from the shelf.
So far used Standard Probes in test
fixtures can be simply replaced by
the Progressive Series Probes.
Features of Progressive Series Probes
→ Specifically grinded probe tip with ultra sharp edges for optimal penetration
→ Functional coating (Progressive Coating) for reduced probe tip contamination
→ Higher preload for increased initial contact force, but standard contact force
at nominal travel
Spring Force
Increased Preload
Standard Preload
Nominal Travel
Travel
Advantages over conventional coating
→ 3 times more hardness than standard coating
→ Less contamination by solder debris and other contamination
→ Higher durability and improved FPY
Available Probe Types
Progressive Series
→ 50 mil, 75 mil and 100mil probes
→ L-Versions for 75 and 100 mil centres
→ Long Travel Probes for 75 and 100
mil (for dual stage fixtures)
The Functional Coating of Progressive
Series is possible for other FEINMETALL
probes and tip styles if reasonable
quantities are requested.
Comparison: Common Standard Probe F100 with gold plating
versus Progressive Series Probe
Probe F10033S090L300 F10033S090P300HP
Application Standard Lead free soldering, contaminated boards
Tip Material Steel Steel
Coating Longtime gold Functional coating
Preload 50 cN 200 cN
R typically

iCt/FCt Probes
Center 2,54 mm/100 mil
type Current temperature R typ
F100...RP 5,0 A -20°...+80°C

Wire Harness Probes
Center 6,50 mm/256 mil
type Current temperature R typ
F899 1,0 A Switch -20°...+80°C 500 mOhm
Pneumatic
micro Switch Probe
F899
TOP INNOVATION
The pneumatic micro switch probe
has been developed for detection
under limited space conditions. By the
pneumatic movement of the plunger
and the integrated switch function,
the correct position of a DUT can be
detected easily.
mechanical Specifications
Maximum travel:
Projection height:
5,0 mm
0,8 - 5,8 mm
nominal contact force (cN)
at 5 bar 230
at 6 bar 350
at 7 bar 470
materials and Plating
Plunger: Gold plated
Tip: Synthetic material, unplated
Metal head on request
Barrel: Brass, gold plated
Spring: Music wire, silver plated
Operating medium and Pressure
Operating pressure: 6 bar nominal
Operating medium: compressed air
(dry +filtered)
Switch Function for Position test
The F899 switch function works according
to an off-on-off characteristic. After the
plunger movement of a certain distance
the switch circuit will be closed and due
to a further travel of 1 mm distance the
switch circuit opens again. Therefore not
only the presence, but also the correct
position of a DUT or component can be
detected.
Variable Projection Height
The projection height can be adjusted
by 0 to 2 mm just by screwing of the
contact head (see drawing).
mounting and application
Below two mounting examples show
the different options for fixing the F899.
For an adjustable position of the F899
in axial direction a lateral setscrew (M2,
max. torque 8 cNm) can be used.
For a fix and secure position the F899
can be mounted by an axial setscrew
(M8).
The synthetic contact head realizes an
electrically insulated contacting of the
DUT. For an electrical connection of the
DUT, a metal contact head can be
delivered on request.
4

Wire Harness Probes
Test Head for
contacting PSG
Glow Plug Connectors
1860S222
Glow Plug Connector
The 1860S222 enables the testing of
electrical connections at PSG glow plug
adaptors assembled in wire harnesses.
This test head matches the simultaneous
contacting of the three circular
contacts for the pressure sensor and
the internal contact for the glow plug
heating.
Mechanical Specifications
Internal Contact Probe:
Plunger: Tip Style 05
Current: max. 5 A
Travel (mm)
Nominal: 5,0
Maximum: 6,5
Spring Force (cN ±20%)
Nominal Force: 180
Preload: 60
Test Head
PSG Glow Plug
Nowadays at modern common rail diesel engines more and more
Pressure Sensor Glow Plugs (PSG) are used. The glow plug has an
integrated sensor to detect the pressure at the combustion chamber
and transmits the data to the engine control electronics. The picture
shows the schematics of a PSG-Glow Plug assembly in the motor.
Tool for detection of
blocked or tight plungers
Blocking Tester
Plunger moves
LED is off
pass
Plunger is blocked
LED is on
fail
pass
With this tool the correct function of
contact probes built in at test modules
or fixtures can be tested very fast and
simple (max. spring force 600 cN).
Thereby a potential damage of connector
elements can be avoided.
→ simple tool with integrated switch
probe (F885) and LED-display
→ test height (nominal travel)
adjustable by threaded sleeve
→ spring force adjustment possible
by exchange of the integrated
switch probe
fail
Order Code: 32001
5

High Current Probes
Center 3,0 mm/145 mil
type Current temperature R typ
F360 15,0 A -40°...+250°C

High Current Probes
High Current Kelvin
Probe up to 60 A
1860C003
This coaxial Kelvin Probe has been
developed specifically for precise
internal resistant measurement at high
current applications, e.g. for charging
and discharging of accumulators.
The inner contact for sense measurement
is a discrete contact probe with
tip style 07 and is replaceable.
The outer circular contact is the force
contact for high current load.
Max. continuous current: 60 A
Typ. Resistance:

8
Radio Frequency Probes
Radio Frequency (RF) Probes from FEINMETALL - General Information
Design of RF-Probes
Spring Contact Probes for RF-applications
are designed as Coaxial Probes. The
internal conductor is transmitting the
signal and the outer conductor is for
signal shielding.
Definitions and parameters for description
of RF-Characteristics
For validation of RF-Probes and their
capabilities various terms and parameters
are relevant. Below you will find the
most important basics for the specification
of RF-Probes.
Two-Port -Network
The common two port network describes
the characteristics of all transmission
routes possible. This could be awire,
a radio transmission or even a
RF-Contact Probe.
Describing Parameters
In radio frequency technology the transmission
characteristics of a two-portnetwork
are described by S-Parameters
(Scattering Parameters), for contact
probes defined as reflexion and attenuation
(or transmission loss).
S11: Reflection loss (input)
S21: Transmission loss (forward)
S12: Transmission loss (backward)
S22: Reflection loss (output)
Transmission loss
This attenuation describes the transmission
behaviour of a two port network
and equates the S21 value. As a characteristic
value, often the 3 dB limiting
frequency is used. This means the
frequency for which the attenuation is
3 dB (the performance has dropped by
50% and the voltage is reduced by 30%).
HF860 Variants for Common RF-Connector Types
The overview is a selection of the FEINMETALL RF Probe Program. Further versions on request.
SMA-Female
HF86002B0001G530
H860AE...
SMB-Male
HF86005B0004G530
H860AE...
SMB-Female
HF86002B0005G530
H860AE...
SMC-Male
HF86005B0003G530
H860AE...
U.FL-Male
HF86005B0002G530
H860AE...
RF-Male
HF86005B0007G530
H860AE...
HF819 for contacting HSD Connectors
The HF819 is designed for
contacting HSD connectors.
Further details on request.
H819AE...

Radio Frequency Probes
Coaxial Radio
Frequency Probe
HF860
Version for SMA female
The HF860 is applicable for radio frequency
applications. Both, internal and
circular Connector can be replaced for
maintenance. The circular contact is
twist proof. Due to the connecting
element (H860AE) the probe can be
substituted solder less.
mechanical Specifications
travel (mm) Inner Circular
contact contact
Nominal: 2,0 4,0
Maximum: 3,7 5,0
Spring Force Inner Circular
(cN ±20%) contact contact
Nominal: 130 400
Preload: 75 90
materials and Plating
Barrel: Brass, gold plated
Plunger (inner): BeCu, gold plated
Plunger (outer): BeCu, gold plated
Spring (inner): Music wire, silver plated
Spring (outer): Stainless steel, unplated
Remark:
The limiting frequency is depending on the insertion loss and the backs-catter
attenuation and has to be interpreted for sinusoidal signals different than for digital
rectangular signals. The limiting frequency for HF860 Probes is in between 4 to
8 GHz, according tip style and probe version. The respective limiting frequency is a
reference value for typical applications. The real bandwidth depends on the allowed
tolerance regarding the signal quality.
typical transmission loss (50 Ohm)
(HF860 version for contacting SMA-Female)
typical reflection loss (50 Ohm)
(HF860 version for contacting SMA-Female)
Connecting Cable:
RG 316 (with mCX)
up to 3 GHz
Order code: H860AE1
multiflex 86
(with mCX and Sma-Connector)
up to 10 GHz
Order code:H860AE2
9

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Spring Contact Probes Test Fixtures Probecards for Wafertest
Stand Oktober 2010 Specifications subject to change without notice ergo-grafik.de
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D - 71083 Herrenberg
Germany
+49 (0) 70 32 2001-0 (Headquarter)
+49 (0) 70 32 2001-390 (Sales Office)
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