probe-to-pad positioning process - Semiconductor Wafer Test ...

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Digital Semiconduc<strong>to</strong>r 10/12/97 10

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Digital Semiconduc<strong>to</strong>r 10/12/97 10

Digital Semiconduc<strong>to</strong>r 10/12/97 11

Page 1 and 2: PROBE-TO-PAD POSITIONING PROCESS Di
Page 3 and 4: SCRUB WINDOW MODEL ■ Process Fact
Page 5 and 6: Scrub Window Measurement Yt w Xr Xl
Page 7 and 8: Pad Bounded Scrub Scrub Gaps Measur
Page 9: SCRUB WINDOW SIMULATION ■ Relatio
Page 13 and 14: Digital Semiconductor 10/13/97 13
Page 15: EXAMPLE: Proc_sig = +- sqrt(card_si