Automated Correlation Wafer Management and Processing
Automated Correlation Wafer Management and Processing
Automated Correlation Wafer Management and Processing
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CWM – <strong>Automated</strong> Map Manager Integration<br />
Incoming<br />
Scribe<br />
Reader<br />
Outgoing<br />
Scribe<br />
Reader<br />
Offshore<br />
Packaging<br />
Customer<br />
Global Sites<br />
Packaging<br />
Lot <strong>and</strong> <strong>Wafer</strong><br />
Tracking<br />
Lot Verification<br />
Fab Visual<br />
FIS<br />
Factory Information<br />
System<br />
Process Control<br />
Probers<br />
Probers<br />
Probers<br />
Probers<br />
SORTmanager<br />
Map Repository<br />
4090 Prober<br />
4090 Prober<br />
4090 Prober<br />
4090 Prober<br />
4090 Prober<br />
Camtek<br />
Die Sorter<br />
Die Sorter<br />
Die Sorter<br />
Die Sorter<br />
Die Sorter<br />
August<br />
August<br />
Inspection<br />
Inspection August<br />
August<br />
Inspection<br />
Inspection<br />
SWTW 2006 Jeffrey Quinton, Delphi Electronics <strong>and</strong> Safety; Steve Sato <strong>and</strong> F.B. Lynch, III, Electroglas, Inc. 12
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