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Reliable Circuit Techniques for Low-Voltage Analog Design in Deep ...

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30 Fayomi, Sawan and Roberts<br />

2.2. <strong>Analog</strong> CMOS Switches<br />

Fig. 9.<br />

<strong>Low</strong>-voltage opamp based on DTMOS.<br />

<strong>in</strong> standard digital CMOS technology. The operation<br />

of the DTMOS is similar to weak-<strong>in</strong>version pMOS<br />

operation and has similarities with bipolar operation<br />

<strong>in</strong>, <strong>for</strong> example, lateral pnp’s. The spread and match<strong>in</strong>g<br />

of the DTMOS is caused by the same mechanism<br />

that leads to V th variations <strong>in</strong> MOS transistors such<br />

as well-doped fluctuations and oxide thickness variations<br />

[31]. However, it appears from both device simulations<br />

[29] and device measurements that the V GS<br />

variations <strong>in</strong> DTMOS are only about half the value of<br />

the V th variations <strong>in</strong> an equally large pMOS transistor<br />

(with <strong>in</strong>terconnected well-source) operated at the<br />

same current. Hence the match<strong>in</strong>g of two DTMOS<br />

is about twice as good as the match<strong>in</strong>g between the<br />

same devices operated as (source-well-<strong>in</strong>terconnected)<br />

pMOS transistors at the same current. Also the batchto-batch<br />

variations (the spread <strong>in</strong> V GS and <strong>in</strong> V th )of<br />

DTMOS is about half of the value of their pMOS<br />

counterparts.<br />

The design of the folded cascode rail-to-rail <strong>in</strong>put<br />

stage is not different from a classical folded cascode<br />

<strong>in</strong>put stage with respect to ga<strong>in</strong>, noise and frequency<br />

behavior. The problem of CMOS opamp circuit siz<strong>in</strong>g<br />

is covered by Mandal [32]. Given a circuit and its per<strong>for</strong>mance<br />

specifications, the described approach, automatically<br />

determ<strong>in</strong>es the device sizes <strong>in</strong> order to meet<br />

the given per<strong>for</strong>mance specifications while m<strong>in</strong>imiz<strong>in</strong>g<br />

a cost function, such as weighted sum of the active<br />

area and power dissipation. The approach is based<br />

on the observation that the first order behavior of a<br />

MOS transistor <strong>in</strong> the saturation region is such that the<br />

cost and the constra<strong>in</strong>t functions <strong>for</strong> the optimization<br />

problem can be modeled as polynomial <strong>in</strong> the design<br />

variables.<br />

<strong>Analog</strong> switches are used <strong>in</strong> various circuits such as:<br />

multiplexers, sample-and-hold (S/H) circuits, analogto-digital<br />

converters (ADCs), digital-to-analog converters<br />

(DACs), and <strong>in</strong> particular <strong>in</strong> discrete-time<br />

analog systems such as switched-capacitor (SC) and<br />

switched-current (SI) build<strong>in</strong>g blocks.<br />

One of the ma<strong>in</strong> characteristics of the MOS transistors<br />

is the switch<strong>in</strong>g feature. Dra<strong>in</strong> and source term<strong>in</strong>als<br />

are the two switch term<strong>in</strong>als and the gate (and<br />

sometimes the bulk) is used to control the conductivity.<br />

Ideally, the switch <strong>in</strong> the on state acts as a fixed<br />

l<strong>in</strong>ear conductance g ds .Inpractice, the conductance<br />

is strongly signal-dependent. The switch conductivity<br />

depends not on the absolute potential of the control<br />

term<strong>in</strong>als, but on their potential relative to the others.<br />

Also the conductance through the whole range of <strong>in</strong>put<br />

is not constant, and depends on the supply voltage,<br />

which becomes extremely low and there<strong>for</strong>e lead<strong>in</strong>g<br />

to a dead band conduction region. To ensure rail-torail<br />

switch<strong>in</strong>g operations control, signals exceed<strong>in</strong>g the<br />

supply voltage range are required. This is known as<br />

bootstrapped switch<strong>in</strong>g technique [33].<br />

A general block diagram of the bootstrapped switch<br />

is shown <strong>in</strong> Fig. 10. It consists of three ma<strong>in</strong> elements:<br />

the pass-transistor (nMOS, pMOS or both types), a control<br />

signal generator and, f<strong>in</strong>ally, a clock booster. The<br />

control circuit generates a signal l<strong>in</strong>early related to the<br />

<strong>in</strong>put signal. The purpose of the clock booster is to generate<br />

a clock signal over and above the supply voltage.<br />

For the purpose of sampl<strong>in</strong>g a cont<strong>in</strong>uous-time signal,<br />

Brooks proposed a bootstrapp<strong>in</strong>g technique [33], where<br />

the gate-to-channel voltage is almost constant <strong>in</strong> sampl<strong>in</strong>g<br />

phase. The <strong>in</strong>put dependent control signal part is<br />

shown <strong>in</strong> Fig. 11 with the n-type pass transistor N 0 . Neglect<strong>in</strong>g<br />

the body-effect, the switch’s conductance will<br />

be signal <strong>in</strong>dependent and the ma<strong>in</strong> switch element gate<br />

oxide will not be subject to unacceptable large electric<br />

Fig. 10.<br />

Block diagram of bootstrapp<strong>in</strong>g switch.

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