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<strong>Ozean</strong> Journal of Applied Sciences 4(4), 2011<br />

Figure 1: X-ray diffraction patterns of NiSe thin films deposited at different bath temperatures (a) 55 °C (b) 65<br />

°C (c) 75°C ( ♦ NiSe; ◊ SiO 2 )<br />

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