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Harnessing inductance for top-down RF IC design

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<strong>Harnessing</strong> <strong>inductance</strong> <strong>for</strong> <strong>top</strong>-<strong>down</strong> <strong>RF</strong> <strong>IC</strong> <strong>design</strong><br />

Sotiris Bantas, Helic S.A. s.bantas@helic.com<br />

Inductance challenges<br />

The <strong>design</strong> of modern <strong>RF</strong> <strong>IC</strong>s depends a lot on <strong>inductance</strong>, either exploiting it in the <strong>for</strong>m of spiral inductors and<br />

trans<strong>for</strong>mers, or avoiding it as a parasitic effect. Accurate modeling and efficient <strong>top</strong>-<strong>down</strong> <strong>design</strong> are needed <strong>for</strong><br />

harnessing <strong>inductance</strong> and putting it to good use in the chip. To effectively address the <strong>inductance</strong>-related<br />

challenges, a <strong>top</strong>-<strong>down</strong> methodology should have the following merits:<br />

• Modeling speed: A capability <strong>for</strong> rapidly and accurately modeling <strong>inductance</strong> and mutual <strong>inductance</strong> in its actual<br />

on-chip context means the <strong>design</strong>er can try out different arrangements, re-simulate and optimize <strong>RF</strong> circuitry in<br />

short cycles. On the other hand, resorting to generic electromagnetic (EM) solvers or exhaustive RLC extraction<br />

usually leads to extremely long modeling times and/or gigantic netlist sizes, rendering iterations cumbersome and<br />

inefficient.<br />

• Flow integration: Another drawback to using generic EM solvers with little or no <strong>IC</strong> <strong>design</strong> flow integration, is<br />

that you end up manipulating layout <strong>for</strong> the purposes of exporting to the EM tool, and then manually annotating<br />

results from EM simulation to your circuit testbenches. Clearly, this approach is not only time -consuming, it’s also<br />

error-prone. Ideally, <strong>inductance</strong> modeling should be available within the circuit schematic and simulation<br />

environment. Additionally, the flow should offer a capability to extract <strong>inductance</strong> and mutual <strong>inductance</strong> models<br />

from the layout in a seamless manner, along with other circuit devices and RC parasitics, with no manual<br />

annotation from the <strong>design</strong>er.<br />

• Full-chip scalability: Modern silicon <strong>RF</strong> transceivers are<br />

rather complex in terms of component count, employing<br />

several inductors and a multitude of on-chip wires that<br />

exhibit parasitic <strong>inductance</strong> and mutual <strong>inductance</strong>. Global<br />

extraction of <strong>inductance</strong> at the chip-level means you can<br />

verify your transceiver as a system, to simulate effects such<br />

as VCO-to-LNA feedthrough and other <strong>RF</strong> phenomena.<br />

For these purposes, the <strong>inductance</strong> modeler should provide<br />

good scalability, in other words be able to produce models<br />

with reasonable speed, that simulate well in circuit<br />

simulators.<br />

• Real-estate : Planar spiral inductors are area-consuming,<br />

and a large portion of their footprint is plain white space.<br />

Additionally, the common practice has been to separate<br />

them physically on chip, by several tens of µm, to mitigate<br />

mutual <strong>inductance</strong> effects. This practice leads to excessive<br />

real estate and increases the production cost of the <strong>RF</strong> <strong>IC</strong>,<br />

while it does little to reduce risks since mutual <strong>inductance</strong>s<br />

are still there and cannot be fully avoided. Layout-correct,<br />

distributed mutual <strong>inductance</strong> modeling empowers the<br />

<strong>design</strong>er to achieve more compact layouts (Fig. 1), while<br />

predicting mutual <strong>inductance</strong> consequences on circuit<br />

per<strong>for</strong>mance.<br />

• Top-<strong>down</strong> <strong>design</strong>: Efficient inductor <strong>design</strong> should follow<br />

the proven <strong>top</strong>-<strong>down</strong> <strong>IC</strong> <strong>design</strong> flow (Fig. 2). Spiral<br />

inductors are introduced by means of a synthesis engine<br />

that produces inductor models according to user<br />

Fig. 1: Area-efficient layout with spirals<br />

System Design &<br />

Modeling<br />

Circuit Design<br />

Circuit<br />

Simulation<br />

Layout<br />

LVS<br />

Extraction<br />

Signoff<br />

• Synthesis of spiral<br />

inductors<br />

• Modeling of spiral<br />

inductors<br />

• Automated inductor<br />

layout (Pcells)<br />

• LVS <strong>for</strong> inductive<br />

components<br />

• Automatic extraction<br />

of <strong>inductance</strong><br />

Fig. 2: Top-<strong>down</strong> flow <strong>for</strong> inductor <strong>design</strong>


specifications, optimizing metrics such as quality factor, area and placement of leads. Generated inductors are<br />

encapsulated in Pcell definitions, so that they may be easily manipulated by the <strong>design</strong>er by editing geometry<br />

parameters. Pcells can de <strong>design</strong>ed to be always DRC-clean, while complying with foundry-specific <strong>design</strong>-<strong>for</strong>manufacturability<br />

rules (e.g. metal slotting, current carrying limits). When placed and routed in a layout, all<br />

generated inductor instances should pass LVS. For this purpose, special rules should be added to the verification<br />

deck, so that inductor connectivity and geometry can be correctly identified from the layout; otherwise, all spirals<br />

would be treated as plain metal shorts. Finally, at the chip extraction phase inductor models should be<br />

automatically incorporated in the extracted netlist, including all applicable mutual <strong>inductance</strong>; by definition, this<br />

process is non-hierarchical and a special interface should be employed that achieves this in conjunction with the<br />

extraction - verification engine.<br />

Top-<strong>down</strong> <strong>inductance</strong> <strong>design</strong> with Veloce<strong>RF</strong><br />

Veloce<strong>RF</strong> is a Virtuoso®-based toolset [1] that introduces rapid <strong>inductance</strong> modeling, spiral inductor synthesis<br />

and verification <strong>for</strong> <strong>top</strong>-<strong>down</strong> <strong>RF</strong> <strong>IC</strong> <strong>design</strong> flows. It features a spiral inductor synthesis engine, Spiral Wizard<br />

(Fig. 3a), a variety of spiral inductor Pcells (Fig. 3b), and integrated tools <strong>for</strong> inductor characterization (Fig. 4),<br />

netlist extraction from layout (including mutual <strong>inductance</strong>s), modeling of arbitrary metal lines and LVS with<br />

inductor Pcells. Additionally, it provides an Assura interface so that <strong>design</strong>ed inductors can be extracted with full<br />

connectivity in a unified extracted view along with other layout devices and parasitics.<br />

The Veloce<strong>RF</strong> flow collectively addresses the challenges set <strong>for</strong>th previously, by enabling seamless, <strong>top</strong>-<strong>down</strong><br />

<strong>design</strong> of integrated inductors. Its rapid modeling engine produces distributed RLCk netlists and has adequate<br />

capacity to handle large-scale <strong>design</strong>s employing tens of inductors and several interconnect lines.<br />

(a)<br />

(b)<br />

Fig. 3: Veloce<strong>RF</strong> interface in Virtuoso


Fig. 4: Inductor characterization<br />

Showcase: Low-Noise Amplifier (LNA) <strong>design</strong><br />

An LNA <strong>design</strong> testcase is presented. The circuit is tuned in the 2.4-2.5 GHz band and features differential<br />

input/output, inductive source degeneration, LC-tank load and LC impedance matching at the input and output<br />

terminals (Fig. 5). Inductor layout and placement is shown in Fig. 6. Input-matching inductors are optimized <strong>for</strong> Q<br />

with Veloce<strong>RF</strong>’s Spiral Wizard, to achieve a low noise figure. Source degeneration needs low-value inductors, so<br />

these are laid out as ‘half-turn’ spirals. Drain load inductor Pcells were trimmed by the <strong>design</strong>er to an orthogonal<br />

shape, to achieve the required value and center the amplifier’s gain at the desired frequency. Additionally, the<br />

chosen placement minimizes ‘white space’ and achieves a very compact layout (Fig. 7). The final layout was<br />

extracted using Veloce<strong>RF</strong>’s Assura interface, producing an extracted view with encapsulated Veloce<strong>RF</strong> model <strong>for</strong><br />

the inductors. The results from post-layout simulation are given in Fig. 8. The Veloce<strong>RF</strong> modeler takes a about ten<br />

seconds to produce the model <strong>for</strong> all inductors in this layout (including mutual <strong>inductance</strong>s), on a standard P3 Linux<br />

workstation.


V DD<br />

V DD<br />

Bias<br />

L D<br />

OUT P<br />

M 2P<br />

IN P<br />

M 1P<br />

L IN<br />

L S<br />

Source degeneration<br />

paths<br />

Input matching<br />

inductors<br />

Drain Loads/Output<br />

matching inductors<br />

L IN<br />

L S<br />

IN N<br />

M 1N<br />

M 2N<br />

OUT N<br />

Bias<br />

L D<br />

V DD<br />

V DD<br />

Fig. 5: LNA simplified schematic<br />

Fig. 6: Inductor placement<br />

Benefits – discussion<br />

The <strong>top</strong>-<strong>down</strong> methodology implemented in Veloce<strong>RF</strong> provides all the necessary tools <strong>for</strong> <strong>design</strong>ing standard and<br />

custom spiral inductors, and quickly and efficiently transitioning from schematic to final <strong>RF</strong> <strong>IC</strong> layout. The<br />

<strong>inductance</strong> modeling engine is fast, enabling rapid <strong>design</strong> iterations <strong>for</strong> achieving an optimal <strong>design</strong>. Since mutual<br />

<strong>inductance</strong> modeling is available throughout the flow, compact layouts can be achieved that minimize silicon area<br />

without compromising <strong>design</strong> robustness. At the signoff stage of the <strong>design</strong>, the interface seamlessly encapsulates<br />

inductor models to the extracted view, so that the full circuit can be verified <strong>for</strong> <strong>inductance</strong> and mutual <strong>inductance</strong><br />

rapidly and accurately.<br />

References<br />

[1] Sotiris Bantas, Yorgos Koutsoyannopoulos and Apostolos Liapis, “An Inductance Modeling Flow Seamlessly Integrated in<br />

the <strong>RF</strong> <strong>IC</strong> Design Chain,” in Proc. 2004 Design Automation and Test Europe conference (DATE ’04), Paris, Feb. 2004.


Fig. 7: The finalized layout of the LNA<br />

Fig. 8: Post-layout (extracted view) S-parameter response of the LNA

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