Testing 1 - UCSB SoC Design and Test Lab
Testing 1 - UCSB SoC Design and Test Lab
Testing 1 - UCSB SoC Design and Test Lab
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Production <strong><strong>Test</strong>ing</strong> for ICs<br />
Contact<strong>Test</strong><br />
Burn-In <strong>Test</strong><br />
To screen out assembly related failures.<br />
To insure that the tester interface is in<br />
contact with the device.<br />
To screen out infant mortalities<br />
Functional <strong>Test</strong><br />
DC Parametric <strong>Test</strong><br />
Steady state tests<br />
AC Parametric <strong>Test</strong><br />
To ensure that state changes<br />
occurattherighttime<br />
© K.-T. Cheng, component.ppt, v1.0<br />
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DC Parametric <strong><strong>Test</strong>ing</strong><br />
! <strong>Test</strong>s are done by Parametric<br />
Measurement Unit (PMU)<br />
– Leakage test<br />
– Threshold V iL &V iH test<br />
– Output drive current test<br />
– Power consumption test<br />
– Output short current test<br />
© K.-T. Cheng, component.ppt, v1.0<br />
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