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Statistical Estimation and Tracking of Refractivity from Radar Clutter

Statistical Estimation and Tracking of Refractivity from Radar Clutter

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9<br />

tally alter the propagation characteristics, the coverage area, <strong>and</strong> hence almost all<br />

<strong>of</strong> the important radar parameters as shown in Fig. 1.3.<br />

The M-pr<strong>of</strong>ile structure seen in Fig. 1.3 (a) is a weak evaporation duct.<br />

Notice how the value <strong>of</strong> M increases at a rate <strong>of</strong> 0.118 M-units/m except for the<br />

evaporative region near the surface. Since the evaporation duct is very weak it<br />

does not affect the propagation as seen <strong>from</strong> its coverage diagram obtained using<br />

the split-step fast Fourier transform (FFT) parabolic equation (PE). The upward<br />

bending effect <strong>of</strong> the normal propagation conditions can be seen clearly. Since the<br />

signal is bend upward, it has minimal interaction with the sea surface resulting<br />

in a clear clutter map, defined as the clutter observed on the radar plan position<br />

indicator (PPI).<br />

150<br />

(a)<br />

-110<br />

150<br />

(b)<br />

-110<br />

100<br />

-130<br />

100<br />

-130<br />

50<br />

50<br />

-150<br />

300 350 20 60 100 140<br />

<strong>Refractivity</strong> (M-unit/m) Range (km)<br />

Reflectivity image: March 11, 1998 Map # 031198-20 15:52:33.3<br />

-250<br />

-150<br />

300 350 20 60 100 140<br />

<strong>Refractivity</strong> (M-unit/m) Range (km)<br />

Reflectivity image: April 02, 1998 Map # 040298-17 18:50:00.3<br />

40 -250<br />

40<br />

-200<br />

35 -200<br />

35<br />

-150<br />

-100<br />

-50<br />

-150<br />

30<br />

-100<br />

25<br />

-50<br />

30<br />

25<br />

0<br />

50<br />

100<br />

150<br />

50 km<br />

100 km<br />

150 km<br />

200 km<br />

20 0<br />

50<br />

15<br />

100<br />

10<br />

150<br />

50 km<br />

100 km<br />

150 km<br />

200 km<br />

20<br />

15<br />

10<br />

200<br />

5<br />

200<br />

5<br />

250<br />

-200 -100 0 100 200<br />

0<br />

250<br />

-200 -100 0 100 200<br />

0<br />

Figure 1.3: Vertical M-pr<strong>of</strong>iles, coverage diagrams, <strong>and</strong> clutter maps resulting <strong>from</strong><br />

(a) a weak evaporation duct <strong>and</strong> (b) a strong surface-based duct.

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