Statistical Estimation and Tracking of Refractivity from Radar Clutter
Statistical Estimation and Tracking of Refractivity from Radar Clutter
Statistical Estimation and Tracking of Refractivity from Radar Clutter
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tally alter the propagation characteristics, the coverage area, <strong>and</strong> hence almost all<br />
<strong>of</strong> the important radar parameters as shown in Fig. 1.3.<br />
The M-pr<strong>of</strong>ile structure seen in Fig. 1.3 (a) is a weak evaporation duct.<br />
Notice how the value <strong>of</strong> M increases at a rate <strong>of</strong> 0.118 M-units/m except for the<br />
evaporative region near the surface. Since the evaporation duct is very weak it<br />
does not affect the propagation as seen <strong>from</strong> its coverage diagram obtained using<br />
the split-step fast Fourier transform (FFT) parabolic equation (PE). The upward<br />
bending effect <strong>of</strong> the normal propagation conditions can be seen clearly. Since the<br />
signal is bend upward, it has minimal interaction with the sea surface resulting<br />
in a clear clutter map, defined as the clutter observed on the radar plan position<br />
indicator (PPI).<br />
150<br />
(a)<br />
-110<br />
150<br />
(b)<br />
-110<br />
100<br />
-130<br />
100<br />
-130<br />
50<br />
50<br />
-150<br />
300 350 20 60 100 140<br />
<strong>Refractivity</strong> (M-unit/m) Range (km)<br />
Reflectivity image: March 11, 1998 Map # 031198-20 15:52:33.3<br />
-250<br />
-150<br />
300 350 20 60 100 140<br />
<strong>Refractivity</strong> (M-unit/m) Range (km)<br />
Reflectivity image: April 02, 1998 Map # 040298-17 18:50:00.3<br />
40 -250<br />
40<br />
-200<br />
35 -200<br />
35<br />
-150<br />
-100<br />
-50<br />
-150<br />
30<br />
-100<br />
25<br />
-50<br />
30<br />
25<br />
0<br />
50<br />
100<br />
150<br />
50 km<br />
100 km<br />
150 km<br />
200 km<br />
20 0<br />
50<br />
15<br />
100<br />
10<br />
150<br />
50 km<br />
100 km<br />
150 km<br />
200 km<br />
20<br />
15<br />
10<br />
200<br />
5<br />
200<br />
5<br />
250<br />
-200 -100 0 100 200<br />
0<br />
250<br />
-200 -100 0 100 200<br />
0<br />
Figure 1.3: Vertical M-pr<strong>of</strong>iles, coverage diagrams, <strong>and</strong> clutter maps resulting <strong>from</strong><br />
(a) a weak evaporation duct <strong>and</strong> (b) a strong surface-based duct.