Advances in Solid-State Joining at EWI
Advances in Solid-State Joining at EWI
Advances in Solid-State Joining at EWI
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Temper<strong>at</strong>ure, C<br />
L<strong>in</strong>e Speed (m/m<strong>in</strong>)<br />
Prelim<strong>in</strong>ary Assessments of the High-Speed<br />
Manufactur<strong>in</strong>g System for Automotive Panel<br />
<br />
<br />
<br />
Thermal analyses for predict<strong>in</strong>g strip he<strong>at</strong><strong>in</strong>g and<br />
cool<strong>in</strong>g<br />
─<br />
─<br />
─<br />
─<br />
Closed form solutions<br />
Geometric and m<strong>at</strong>erial property effects<br />
Estim<strong>at</strong>es of he<strong>at</strong><strong>in</strong>g and cool<strong>in</strong>g dynamics<br />
Temper<strong>at</strong>ure-time rel<strong>at</strong>ionships <strong>at</strong> each <strong>in</strong>terface<br />
Estim<strong>at</strong>es of process<strong>in</strong>g requirements<br />
─<br />
─<br />
─<br />
─<br />
Total thermal cycles on the order of 10s of milliseconds<br />
Speeds <strong>in</strong> the range of m/m<strong>in</strong><br />
Influence of panel design<br />
Estim<strong>at</strong>es of currents and voltages<br />
Demonstr<strong>at</strong>ion trials underway<br />
w<br />
n<br />
4<br />
w<br />
( 1) (2n<br />
1)<br />
exp<br />
2 2<br />
2<br />
n 0 2n<br />
1 4(<br />
1 2) v<br />
Equ<strong>at</strong>ion Def<strong>in</strong><strong>in</strong>g Conductive He<strong>at</strong><strong>in</strong>g Associ<strong>at</strong>ed with<br />
the Hot Roll Technology (Courtesy CellTech Metals)<br />
0<br />
(<br />
h<br />
0<br />
)exp<br />
v<br />
2<br />
v<br />
2<br />
Equ<strong>at</strong>ion Def<strong>in</strong><strong>in</strong>g Cool<strong>in</strong>g Associ<strong>at</strong>ed with the Hot Roll<br />
Technology (Courtesy CellTech Metals)<br />
2<br />
K<br />
1<br />
(<br />
1<br />
H<br />
x<br />
2<br />
R)<br />
x<br />
700<br />
12<br />
600<br />
500<br />
400<br />
300<br />
10<br />
8<br />
6<br />
0.5-mm core<br />
1.0-mm core<br />
1.5-mm core<br />
200<br />
4<br />
100<br />
2<br />
0<br />
0 0.01 0.02 0.03 0.04 0.05<br />
Loc<strong>at</strong>ion <strong>in</strong> X Direction, m<br />
He<strong>at</strong><strong>in</strong>g and Cool<strong>in</strong>g Profile for a 1.5-mm<br />
Thick Panel Dur<strong>in</strong>g Resistance Roll<br />
Braz<strong>in</strong>g (Courtesy CellTech Metals)<br />
0<br />
0 0.2 0.4 0.6 0.8 1 1.2<br />
Strip Thickness (mm)<br />
Rel<strong>at</strong>ionships Between Panel Geometry<br />
Factors and L<strong>in</strong>e Speed for Resistance Roll<br />
Braz<strong>in</strong>g (Courtesy CellTech Metals)