XXXIV International School on the Physics of Semiconducting ...
XXXIV International School on the Physics of Semiconducting ...
XXXIV International School on the Physics of Semiconducting ...
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Liquid helium temperature scanningprobe microscope - cantileverAFM CantileverTip∆R cR c= 4 x 10 -7 /ÅR c ≈ 2000 ΩV BiasRR C25µmRRVV out∆R∝V outµ ∆R outcRVcV biasBias