EDX Series

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EDX-720/800HS FeaturesEDX-720[ More Refined for Higher Sensitivity and Improved Performance ]The EDX-720 is the most optimum tool for the rapidanalysis of hazardous substancesregulated by RoHS and ELV.New filters and a high-count-rate circuit produce twicethe sensitivity of previous models.The time-reduction function and switchingcalibration-curve function make this model easy to useand a more efficient tool for screening assessment.Improved Hardware Enables Twice the Sensitivity in Analysis of Hazardous Elements such as Lead and CadmiumNew Filters Improve Sensitivity in Analysis of Hazardous ElementsThe S/N ratio is improved by adopting two types of new filters that efficiently cut the continuous X-rays component from the X-ray tube. It ispossible to perform the trace analysis with high sensitivity by reducing the background.1000500Reduction in BackgroundHgLaPbLaBrKaPrevious filterPbLb1BrKb400300200100Increase in X-rayFluorescence IntensityCdKaNew filterPrevious filter0New filter010.0011.00 12.00 13.00 [keV]22.00 24.00[keV]Comparison for Standard Sample ofPVC Resin Containing 100-ppm LeadComparison for Standard Sample ofPVC Resin Containing 100-ppm CadmiumDetector Count Rate Increased through Adoption of High-Count-Rate CircuitThe counting system used in the EDX-720 has been modified to process at an even higher countregion than previous system to measure with higher precision.Particularly in the analysis of resin samples, which generate large numbers of scattered X-rays,and in metal samples, which generate a large amount of fluorescent X-rays from the maincomponent, it has been difficult to get information about trace elements because almost allcounted signals are for scattered or fluorescent X-rays from the base material.The count rateattained with the EDX-720 is more than twice that of previous models and detection sensitivity issignificantly higher. It is possible to reduce the analysis time significantly because the same levelof precision can be attained in half the time required with previous models.10007505002500EDX-720PreviousmodelCdKa22.00 23.0024.00Comparison using Standard PVC Resin SampleContaining 100-ppm Cadmium[keV]Maximizing Detectability of Light Elements Provides High-Sensitivity AnalysisEDX-800HSFeaturesSpecial Detector Window Material Reduces Absorption of Light Elements and Provides High-Sensitivity MeasurementAnalysis of light elements must be measured in helium or vacuumatmospheres. However, even in these kinds of atmospheres,particularly with organic component elements such as oxygen (O)and fluorine (F), the detector window itself can act like anabsorbing material and adversely affect the detection efficiency.With the EDX-800HS, an ultrathin film consisting of a specialmaterial is used for the detector window to performhigh-sensitivity analysis of elements lighter than sodium.EDX-800HSEDX-720Comparison for fluoropolymer sample12
SpecificationsSpecificationsMain SpecificationsMeasurement principleMeasurement methodApplicable sample typeMeasurement rangeSample sizeX-ray fluorescence spectrometryEnergy dispersiveSolid, liquid, or powder11Na to 92U (EDX-720)6C to 92U (EDX-800HS)300 mm (dia.) x 150 mm (H) max.X-ray GeneratorX-ray tubeTube voltageTube currentCooling methodExposure areaPrimary filterRh target5 to 50 kV1 to 1,000 AAir cooling (with fan)10 mm dia. (standard)(Automatic switching between4 settings: 1, 3, 5, and 10 mm dia.)*Automatic switching between 5 typesDetectorTypeLN2 supplyLN2 Dewar capacityLN2 consumption(EDX-720/800HS)Si (Li) semiconductor detectorOnly during measurement3 LApprox. 1 L/daySample ChamberAtmosphereSample exchange*Sample observation*Air, vacuum*, helium*8/16-sample turret8-sample turret with spinnerPrecision stageCCD cameraVacuum Unit* (for high-sensitivity analysis of light elements)It is necessary for measurement of elements lighter than S (Sulfur)EvacuationOil rotary vacuum pump, directly connectedVacuum monitor Pirani gaugeAtmospheric-pressure With pressure sensormonitorData Processing Unit (To be procured separately)Main unitIBM PC/AT compatibleMemoryMore than 256 MBHDDMore than 20 GBFDD3.5-inch x 1PrinterColor inkjet printerCDCD-ROM driveOSWindows ® XPSoftwareQualitative analysisQuantitative analysisMatching software(intensity/content)UtilitiesSystem-status monitoring functionAnalysis-result tabulation function(Items with * mark are optional.)Measurement/analysis softwareCalibration-curve method, matrix correction, FP method,Thin-Film FP method, Background FP method.Automatic correction functions (energy correction,FWHM (full-width half-maximum) correction)Installation RequirementsTemperatureRelative humidityEDX-720/800HS (AC100V)Power requirements : AC100V10%, 15A, 50/60HzDimensions of the main body : 580(W) x 650(D) x 420(H)mm(23(W) x 26(D) x 17(H)inches)Main body weight : Approx. 80kgFootprint10C to 30C40% to 70%EDX-720/800HS/900HS CE type (AC230V)Power requirements : AC220V, 230V, 240A10%, 1000VA, 50/60HzDimensions of the main body : 580(W) x 750(D) x 420(H)mm(23(W) x 30(D) x 17(H)inches)Main body weight : Approx. 100kgSample Pretreatment for X-ray Fluorescence Spectrometry750Wall200 or more580460 3701800: AC230V, CE type ONLYSample formatPowder sampleLiquid sampleSolid sampleFood or biologicalsamplePretreatmentNo pretreatment (put in sample cell)PressingMelting; making glass bead sampleNo pretreatment (put in sample cell)Dropping on paper filter and dryingNo pretreatment (flat part put on stage)Surface polishing, cuttingNo pretreatment (put in sample cell)Mashed into paste using blendermill (put in sample cell)Pretreatment equipmentVibration mill, briquette machineAutomatic bead fusion furnaceSample polisher, latheBlender mill5804208001800Units: mm13
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