PPC_PrecisionCatalog.. - BFi OPTiLAS A/S

At PPC, Metrology MattersAdhesive-FreeBonding—Optical Contactingof Beamsplitter & EtalonNomarski Microscope Surface ImagesCustomizationto OEM PackagingDual-PortBeamsplitter5Å fused silicaDifferential Interference Contrast Microscopy (DICM) Images of standard and superpolishedsurfaces. The method shown here is also known as Nomarski imaging—a primary tool used forcharacterizing sub-Angstrom surfaces.The manufacturing of precision optical components requiresstate of the art metrology. At PPC, we have developed advancedmethods to measure the optical properties of ourdevices because measurement is fundamental to everythingwe do. Whether testing reflectivity to 99.99%, verifyingparallelism to less than 0.1 arc seconds or actually certifyingthe maximum energy thresholds of our coatings, we believeExamples of some of our in-house capabilities are shownhere.AdvancedIon-Beam-Sputtered CoatingsCustom Optical Assemblies—From 10 to 100,000+ PiecesOne of our most successful products, theControlFREQ TM , is a Telcordia-qualifiedwavelength locker for network-deployabletunable lasers. It consistsof a high-precision etalon opticallyCADB ® bonded to a dual0.5Å sapphirenon-polarizing beamsplitter.We designed themicro-optic tothat the numbers don’t lie. PPC also partners with universitiesand national laboratories to access the most advancedmeasurement tools in order to provide you with the mostaccurate and complete information available.Thickness measurements taken with our NISTtraceableSW1500 tunable laser spectrum analyzerconfirm total thickness variations (TTV) as low as11nm across a 68 mm diameter—a parallelism ofless than < 0.05 arcseconds!Transmitted wavefront distortion (TWD) througha 12.7 mm beamsplitter cube taken over a clearaperture of 85%. The data shows a wavefront errorof less than λ/20 peak-to-valley and less than λ/100RMS at 633 nm.4 precisionphotonics.com