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Lulu Kang - Illinois Institute of Technology

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INFORMS Annual Meeting, Washington DC, October 2008.• Bayesian Optimal Single Arrays for Robust Parameter DesignJoint Statistical Meeting, Denver, CO, August 2008.• Bayesian Optimal Blocking Factorial DesignQuality and Productivity Research Conference, University <strong>of</strong> Wisconsin-Madison, Madison, WI, June 2008.• Bayesian Optimal Single Arrays for Robust Parameter DesignSpring Research Conference on Statistics in Industry and <strong>Technology</strong>, GeorgiaTech., Atlanta, GA, May 2008.• Bayesian Optimal Single Arrays for Robust Parameter Design (Poster)NSF CMMI Engineering Research and Innovation Grantees and ResearchConference, Knoxville, TN, January 2008.• Bayesian Optimal Single Arrays for Robust Parameter DesignINFORMS Annual Meeting, Seattle, WA, November 2007.• Confidence Bounds for the Overall Product Defect Rate with Attribute andVariable DataSpring Research Conference on Statistics in Industry and <strong>Technology</strong>, IowaState Univ., Ames, IA, May 2007.Referee forJournalsPr<strong>of</strong>essionalSocietyActivities• Annals <strong>of</strong> Statistics• Statistica Sinica• Technometrics• Statistics & Probability Letters• Computational Statistics and Data Analysis• Journal <strong>of</strong> Quality <strong>Technology</strong>• IIE Transactions• Annals <strong>of</strong> Operations Research• AIAA Journal• Simulation Modeling Practice and Theory• Member <strong>of</strong> the American Statistical Association.• Member <strong>of</strong> the <strong>Institute</strong> for Operations Research and the Management Sciences(INFORMS).4 <strong>of</strong> 4

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