Lulu Kang - Illinois Institute of Technology

Lulu KangContactInformationDepartment of Applied MathematicsIllinois Institute of Technology Tel: (312) 567-5322Engineering 1 Building, Rm 105A Fax: (312) 567-313510 West 32 Street E-mail: lkang2@math.iit.eduChicago, IL 60616www.math.iit.edu/˜lkang2AcademicAppointmentsAssistant ProfessorDepartment of Applied Mathematics,Illinois Institute of TechnologyAugust 2010 to presentResearchInterestsEducationDesign of Experiments, Data mining, Computer experiments, Bayesian experimentaldesign, Multivariate Interpolation, Nonparametric modeling, Engineeringstatistics, etc.Ph.D. in Industrial Engineering, August 2010H. Milton Stewart School of Industrial and Systems Engineering, GeorgiaInstitute of Technology, Atlanta, GAThesis: Computer and Physical Experiments: Design, Modeling, and MultivariateInterpolationAdviser: Professor Roshan J. VengazhiyilM. S. in Operations Research, May 2010H. Milton Stewart School of Industrial and Systems Engineering, GeorgiaInstitute of Technology, Atlanta, GAPublicationsKang, L. and Joseph, V.R. (2009) Bayesian Optimal Single Arrays for RobustParameter Design. Technometrics, 51, 250-261. (Winner of the Best StudentPaper Award, QSR, INFORMS, 2009.)Ai, M., Kang, L., and Joseph, V.R. (2009) Bayesian Optimal Blocking of FactorialDesigns. Journal of Statistical Planning and Inference, 139, 3319-3328.Kang, L., Joseph, V.R., and Brenneman, W. (2011) Design and Modeling Strategiesfor Mixture-of-Mixtures Experiments. Technometrics, 53, 125-136.Joseph, V.R. and Kang, L. (2011) Regression-Based Inverse Distance Weightingwith Applications to Computer Experiments. Technometrics, 53, 254-265.Kang, L. and Brenneman, W. A. (2011) Product Defect Rate Confidence Boundwith Attribute and Variable Data. Quality and Reliability Engineering International,27, 353-368.Kang, L. and Joseph, V. R. (2012) Kernel Approximation: from Regression toInterpolation. Submitted.1 of 4

FundingsProfessionalExperience• PI, Duke University/NSF SAMSI “Uncertainty Quantification Program, ResearchOn-Campus”. $10,000 from Sep 1- Dec 31, 2011.Statistical and Applied Mathematical Sciences Institute, Durham, NCVisiting Research Fellow• Program on Uncertainty Quantification Fall, 2011Procter & Gamble Company, Cincinnati, OHIntern at Statistics Department Summer 2007• Mixture-of-Mixture Experiments for new formula of Mini Pringles product.• Mixture Experiments with Molecular Structure.Intern at Statistics Department Summer 2006• Confidence Bounds for the Overall Product Defect Rate with Attributeand Variable Data.TeachingExperienceIllinois Institute of Technology, Chicago, ILMATH 476 & 563: Statistics. Spring, 2012MATH 569: Statistical Learning. Spring, 2011MATH 474: Probability and Statistics for Engineers.Fall, 2010Spring, 2012 andGeorgia Institute of Technology, Atlanta, GAInstructorISyE 4031: Regression and Forecasting Summer, 2010Teaching AssistantISyE 7400: Advanced Design and Analysis of Experiments Spring, 2009ISyE 6420: Bayesian Statistics Spring, 2009ISyE 6413: Design and Analysis of Experiments Spring, 2007ISyE 3039: Methods for Quality Improvement Fall, 2005Awards• Best Student Paper Award, Quality, Statistics, and Reliability (QSR) Sectionof Institute for Operations Research and the Management Sciences (IN-FORMS), San Diego, 2009.• Kiplinger Fellowship, Georgia Institute of Technology, 2005.• Samsung Scholarship, Nanjing University, 2004.2 of 4

Invited TalksPresentations& Posters• Design of Experiments and Data MiningDepartment of Computer Science, IIT, Mar 2012.• Kernel Approximation: From Regression to InterpolationIEMS, Northwestern University, Jan 2012.• Analysis of Large-Scale Computer ExperimentsDepartment of Industrial Engineering, Tsinghua University, Beijing, China,Dec 2011.• Analysis of Large-Scale Computer ExperimentsNational Centre for Materials Service Safety, University of Science and TechnologyBeijing, Beijing, China, Dec 2011.• Analysis of Large-Scale Computer ExperimentsOpening Workshop and Tutorials: Methodology of Uncertainty Quantification,SAMSI, Durham, NC, Sep 2011.• Regression-Based Inverse Distance Weighting with Applications to ComputerExperimentsInvited Technometrics Session, Joint Statistical Meeting, Aug 2011.• Product Defect Rate Confidence Bound with Attribute and Variable DataIndustrial Engineering Research Conference, Reno, Nev, May 2011.• Analysis of Large-Scale Computer ExperimentsMSCS, University of Illinois at Chicago, April 2011.• Kernel Sum Regression and InterpolationINFORMS Annual Meeting, Austin, TX, November 2010.• Regression-Based Inverse Distance Weighting with Application to ComputerExperimentsArmy Conference on Applied Statistics, Tempe, AZ, October 2009.• Bayesian Optimal Single Arrays for Robust Parameter DesignQSR Best Student Paper Competition, INFORMS Annual Meeting, SanDiego, CA, October 2009.• Kernel Sum Regression and Interpolation1st International Symposium on System Informatics and Engineering, Qingdao,China July 2011.• Kernel Sum Regression and InterpolationSpring Research Conference on Statistics in Industry and Technology, NorthwesternUniversity, Chicago, IL June 2011.• Regression-Based Inverse Distance Weighting with Application to ComputerExperimentsINFORMS Annual Meeting, San Diego, CA, October 2009.• A New Modeling Approach for Mixture-of-Mixtures ExperimentsJoint Statistical Meeting, Washington, D.C., August 2009.• A New Modeling Approach for Mixture-of-Mixture Experiments (Poster)NSF CMMI Engineering Research and Innovation Grantees and ResearchConference, Honolulu, HI, June 2009.• A New Modeling Approach for Mixture-of-Mixture ExperimentsSpring Research Conference on Statistics in Industry and Technology, Vancouver,Canada, May 2009.• Design and Analysis of Mixture-of-Mixtures Experiments3 of 4

INFORMS Annual Meeting, Washington DC, October 2008.• Bayesian Optimal Single Arrays for Robust Parameter DesignJoint Statistical Meeting, Denver, CO, August 2008.• Bayesian Optimal Blocking Factorial DesignQuality and Productivity Research Conference, University of Wisconsin-Madison, Madison, WI, June 2008.• Bayesian Optimal Single Arrays for Robust Parameter DesignSpring Research Conference on Statistics in Industry and Technology, GeorgiaTech., Atlanta, GA, May 2008.• Bayesian Optimal Single Arrays for Robust Parameter Design (Poster)NSF CMMI Engineering Research and Innovation Grantees and ResearchConference, Knoxville, TN, January 2008.• Bayesian Optimal Single Arrays for Robust Parameter DesignINFORMS Annual Meeting, Seattle, WA, November 2007.• Confidence Bounds for the Overall Product Defect Rate with Attribute andVariable DataSpring Research Conference on Statistics in Industry and Technology, IowaState Univ., Ames, IA, May 2007.Referee forJournalsProfessionalSocietyActivities• Annals of Statistics• Statistica Sinica• Technometrics• Statistics & Probability Letters• Computational Statistics and Data Analysis• Journal of Quality Technology• IIE Transactions• Annals of Operations Research• AIAA Journal• Simulation Modeling Practice and Theory• Member of the American Statistical Association.• Member of the Institute for Operations Research and the Management Sciences(INFORMS).4 of 4