<strong>CHEM</strong> <strong>165</strong>,<strong>265</strong>/<strong>BIMM</strong> <strong>162</strong>/<strong>BGGN</strong> <strong>262</strong><strong>REFERENCE</strong> <strong>LISTS</strong>PHOTONS/ELECTRONS: Diffraction/Interference/Coherence/ResolutionSlayter (1992) Chap. 2, pp.7-22; Chap. 4, pp.39-49; Chap. 9, pp.118-130Watt (1985) Chap. 1, pp.6-10 (Chap. 1, pp.7-14 in 1997 edition)Wischnitzer (1981) Chap. 3, pp.6-15; Appendix A, pp.290-295; Appendix J, pp.316-321 (6-15,206-211,232-237 in 1970 edition)•Meek (1976) Chap. 1-2, pp.23-49 (20-45 in 1970 edition)Agar (1974) Chap. 1, pp.2-9; Chap. 3, pp.96-99Slayter (1970) Chap. 3, pp.65-71; Chap. 10, pp.233-248; Chap. 16, pp.341-346Sjostrand (1967) Chap. 2, pp.24-31; Chap. 4, pp.97-106,112-118Hall (1966) Chap. 1, pp.12-18; Chap. 3, pp.55-56; Chap. 7, pp.138-142,154-157; Chap. 9, pp.235-249OPTICS (Lens <strong>The</strong>ory)Slayter (1992) Chap. 2, pp.10-13; Chap. 6, pp.65-73; Appendix, pp.298-301Watt (1985) Chap. 1, pp.1-5 (Chap. 1, pp.1-7 in 1997 edition)Wischnitzer (1981) Chap. 3, p.19 (19 in 1970 edition)•Meek (1976) Chap. 1, pp.1-23 (1-20 in 1970 edition)Agar (1974) Chap. 1, pp.4-9Slayter (1970) Chap. 8, pp.153-170,176-185; Chap. 17, pp.364-350Sjostrand (1967) Chap. 2, pp.15-24Hall (1966) Chap. 1, pp.6-12; Chap. 3, pp.44-57Most physics textbooks have a chapter on geometrical opticsELECTRON BEAMS/OPTICS AND MAGNETIC AND ELECTROSTATIC LENSESSlayter (1992) Chap. 6, pp.73-79Watt (1985) Chap. 1, pp.10-16 (Chap. 1, pp.14-24 in 1997 edition)Wischnitzer (1981) Chap. 3, pp.15-35 (15-35 in 1970 edition)•Meek (1976) Chap. 2, pp.49-54; Chap. 4, pp.75-80; Chap. 6, pp.103-107 (45-49,66-71,93-97 in 1970ed.)Agar (1974) Chap. 3, pp.98-99; Chap. 8, pp.277Slayter (1970) Chap. 3, pp.70-71; Chap. 16-17, pp.349-363Sjostrand (1967) Chap. 2, pp.31-56Hall (1966) Chap. 2, pp.26-43; Chap. 4-5, pp.58-117; Chap. 7, pp.154-157TRANSMISSION ELECTRON MICROSCOPE INSTRUMENTATIONGeneral ReferencesSlayter (1992) Chap. 14, pp.192-206Watt (1985) Chap. 2, pp.20-32 (Chap. 3, pp.59-85 in 1997 edition)Wischnitzer (1981) Chap. 4, pp.38-81,102-103; Appendix E, pp.304-306; Appendix N, pp.335-342.Wischnitzer (1970) Chap. 4, pp.38-81,102-103; Appendix E, pp.220-222•Meek (1976) Chap. 5, pp.97-99; Chap. 6-8, pp.111-191; Chap. 15, pp.354-355.Meek (1970) Chap. 4, pp.87-88; Chap. 5-7, pp.101-176; Chap. 14, pp.372-373.Agar (1974) Chap. 1-2, pp.9-82; Chap. 6, pp.168-169,177,186Slayter (1970) Chap. 9, pp.187-219; Chap. 17-18, pp.363-397Sjostrand (1967) Chap. 2-3, pp.56-92Hall (1966) Chap. Chap. 1, pp.6-7; Chap. 6-7, pp. pp.118-1662
<strong>CHEM</strong> <strong>165</strong>,<strong>265</strong>/<strong>BIMM</strong> <strong>162</strong>/<strong>BGGN</strong> <strong>262</strong><strong>REFERENCE</strong> <strong>LISTS</strong>TRANSMISSION ELECTRON MICROSCOPE INSTRUMENTATION (Cont'd)A. Electron GunSlayter (1992) Chap. 14, pp.196-199Watt (1985) Appendix 4, pp.276-286 (Appendix 4, pp.432-447 in 1997 edition)Wischnitzer (1981) Chap. 4, pp.38-46 (38-46 in 1970 edition)•Meek (1976) Chap. 6, pp.111-117 (101-106 in 1970 edition)Agar (1974) Chap. 1, pp.15-21; Chap. 2, pp.42-46Slayter (1970) Chap. 18, pp.379-383Sjostrand (1967) Chap. 3, pp.66-75Hall (1966) Chap. 7, pp.145-151Field Emission Gun TechnologyBrock, J. M., M. T. Otten and W. M. Coene. (1992) High resolution imaging with a coherent electron source:<strong>The</strong> field emission gun. Micron 23:149-150.Brock, J. M., M. T. Otten and M. J. C. deJong. (1992) Improved spatial resolution in imaging, diffraction,microanalysis and scanning with a field emission TEM/SEM. Micron 23:151-152.Zemlin, F. (1992) Desired features of cryoelectron microscopy for the electron crystallography of biologicalmaterial. Ultramicrosc. 46:25-32.deJong, A. F. and D. VanDyck. (1993) Ultimate resolution and information in electron microscopy II. <strong>The</strong>information limit of transmission electron microscopes. Ultramicrosc. 49:66-80.Delong, A. (1993) Electron sources for electron microscopes. Microscopy and Analysis 3:17-19.Otten, M. T. and W. M. J. Coene. (1993) High-resolution imaging on a field emission TEM. Ultramicrosc.48:77-91.Zhou, Z. H. and W. Chiu. (1993) Prospects for using an IVEM with a FEG for imaging macromoleculestowards atomic resolution. Ultramicrosc. 49:407-416.•Zemlin, F. (1994) Expected contribution of the field-emission gun to high-resolution transmission electronmicroscopy. Micron 25:223-226.Rathkey, D. (1995) Field emission basics: <strong>The</strong> water bucket analogy. Microsc. Today 95 10:20-21.B. Condenser LensSlayter (1992) Chap. 14, pp.199-201Watt (1985) Chap. 2, pp.23-25 (Chap. 3, pp.63-65 1997 edition)Wischnitzer (1981) Chap. 4, pp.46-50,102-103; Appendix E, pp.304-306 (46-50,102-103,220-222 in 1970)•Meek (1976) Chap. 6, pp.117-123 (107-113 in 1970 edition)Agar (1974) Chap. 1, pp.21-26; Chap. 2, pp.46-50Slayter (1970) Chap. 18, pp.388-391Sjostrand (1967) Chap. 3, pp.75-78Hall (1966) Chap. 7, pp.151-154C. Lens AberrationsSlayter (1992) Chap. 6, pp.79-87Watt (1985) Chap. 1, pp.2-5,11-17 (Chap. 1, pp.1-6,18-24 in 1997 edition)Wischnitzer (1981) Chap. 4, pp.53-59,64-65 (53-59,64-65 in 1970 edition)•Meek (1976) Chap. 4, pp.80-89 (71-80 in 1970 edition)Agar (1974) Chap. 1, pp.9-13Slayter (1970) Chap. 9, pp.187-219; Chap. 17, pp.363-372Sjostrand (1967) Chap. 2, pp.56-62Hall (1966) Chap. 6, pp.118-1353
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