Atomically defined tips in scanning probe microscopy - McGill Physics

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List of Abbreviations2/3D Two/three dimensionalAESAuger electron spectroscopyAFM Atomic force microscopy/eAMAmplitude modulationBEBack electrodee-EFM Single-electron sensitive electrostatic force microscopyDFTDensity functional theoryENV EnvironmentFEM Finite element methodFIBFocused ion beamFMFrequency modulationGMR Giant magnetoresistanceHOMO Highest occupied atomic orbitalHVHigh voltageKPFM Kelvin probe force microscopyLLangmuir, 1 L = 10 −6 Torr·s(L)CPD (Local) contact potential differenceLEED Low-energy electron diffractionLHeLiquid heliumLN 2Liquid nitrogenLUMO Lowest unoccupied atomic orbitalMLMonolayerMOSFET Metal-oxide semiconductor field-effect transistorMTJMagnetic tunnel junctionNCNon-contactNPNanoparticlePLLPhase-locked loopRFARetarding field analyzerx
xiRTSEMSETSPMSTMTEMTMRUHVVCOVLSXRDRoom temperatureScanning electron microscopy/eSingle-electron transistorScanning probe microscopy/eScanning tunneling microscopy/eTransmission electron microscopy/eTunneling magnetoresistanceUltra-high vacuumVoltage controlled oscillatorVapor-liquid-solidX-Ray diffraction
Page 1: Ultra-high vacuum fabricationof nan
Page 5 and 6: RésuméDans ce travail, nous décr
Page 8: viACKNOWLEDGEMENTSDr. Margaret Magd
Page 11: Contributions of Co-authorsThis the
Page 15 and 16: ContentsAbstractRésuméAcknowledge
Page 17 and 18: CONTENTSxv7.3.2 Structure of 2 ML t
Page 19: 1MotivationLow-dimensional systems
Page 23: 5simulations can be used to charact
Page 26 and 27: 8 CHAPTER 2. THEORETICAL BACKGROUND
Page 28 and 29: 10 CHAPTER 2. THEORETICAL BACKGROUN
Page 44 and 45: 26 CHAPTER 3. EXPERIMENTAL METHODSs
Page 46 and 47: 28 CHAPTER 3. EXPERIMENTAL METHODSw
Page 48 and 49: 30 CHAPTER 3. EXPERIMENTAL METHODSc
Page 50 and 51: 32 CHAPTER 3. EXPERIMENTAL METHODSt
Page 52 and 53: 34 CHAPTER 3. EXPERIMENTAL METHODSk
Page 54 and 55: 36 CHAPTER 3. EXPERIMENTAL METHODSF
Page 56 and 57: 38 CHAPTER 3. EXPERIMENTAL METHODSt
Page 59 and 60: 4Description of instrumentationThis
Page 61 and 62: 4.1 ULTRA-HIGH VACUUM APPARATUS 43G
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4.1 ULTRA-HIGH VACUUM APPARATUS 45c
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4.1 ULTRA-HIGH VACUUM APPARATUS 47t
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4.1 ULTRA-HIGH VACUUM APPARATUS 49d
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4.2 NC-AFM OPERATION 51Drive outDis
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4.2 NC-AFM OPERATION 53the frequenc
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5Preparation of Fe(001) substratesT
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5.1 GROWTH OF FE WHISKERS 57aHClWhi
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5.1 GROWTH OF FE WHISKERS 59way. If
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5.2 THE FE(001) SURFACE 61FeCl 2 is
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5.3 THE FE(001)-P(1×1)O SURFACE 63
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6Reactive growth of MgO films on Fe
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6.1 INTRODUCTION 67either case MgO
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6.2 EXPERIMENTAL DETAILS 69directly
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6.3 RESULTS AND DISCUSSION 71aClean
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6.3 RESULTS AND DISCUSSION 734r/p =
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6.3 RESULTS AND DISCUSSION 75a ab a
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6.3 RESULTS AND DISCUSSION 77to a c
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6.3 RESULTS AND DISCUSSION 79tions
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6.4 CONCLUSIONS 816.4 ConclusionsTh
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84 CHAPTER 7. GROWTH OF NACL FILMS
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102 CHAPTER 8. ROOM-TEMPERATURE SIN
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126 CHAPTER 9. CONCLUSIONS AND OUTL
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AEffect of self-capacitance on sing
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138 APPENDIX A. EFFECT OF SELF-CAPA
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140 APPENDIX B. REPAIR OF LEED OPTI
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142 APPENDIX C. FIELD INDUCED DEPOS
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144 APPENDIX C. FIELD INDUCED DEPOS
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146 BIBLIOGRAPHY[9] Ray, V.; Subram
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148 BIBLIOGRAPHY[30] Parkin, S. S.
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150 BIBLIOGRAPHY[50] Simic-Milosevi
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152 BIBLIOGRAPHY[70] Cockins, L.; M
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154 BIBLIOGRAPHY[89] Gardner, R. Co
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156 BIBLIOGRAPHY[109] Müller, M.;
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158 BIBLIOGRAPHY[130] Blonski, P.;
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160 BIBLIOGRAPHY[150] Ohgi, T.; Fuj
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Atomically defined tips in scanning probe microscopy - McGill Physics

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