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Atomically defined tips in scanning probe microscopy - McGill Physics

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BIBLIOGRAPHY 161[161] G<strong>in</strong>gery, D.; Bühlmann, P. S<strong>in</strong>gle-step electrochemical method for produc<strong>in</strong>gvery sharp Au scann<strong>in</strong>g tunnel<strong>in</strong>g <strong>microscopy</strong> <strong>tips</strong>. The Review of ScientificInstruments 2007, 78, 113703.[162] Fostner, S.; Burke, S. A.; Topple, J.; Mativetsky, J. M.; Beerens, J.; Grutter, P.Silicon nanostencils with <strong>in</strong>tegrated support structures. Microelectronic Eng<strong>in</strong>eer<strong>in</strong>g2010, 87, 652–657.[163] Waser, R., Ed. Nanoelectronics and Information Technology, 3rd ed.; Wiley-VCH:Berl<strong>in</strong>, 2012.[164] Fostner, S. Ultra high vacuum fabrication of metallic contacts for moleculardevices on an <strong>in</strong>sulat<strong>in</strong>g surface. Ph.D. thesis, <strong>McGill</strong> University, Montreal,QC, Canada, 2010.

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