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[11] O’Hanlon JM. 1989. A User’s Guide to Vacuum Technology,<br />

2nd ed. New York (NY): John Wiley & Sons. p 4.<br />

[12] Taylor BN and Kuyatt CE. 1994. Guidelines for Evaluating<br />

and Expressing the Uncertainty of NIST Measurement<br />

Results. NIST Technical Note 1297. Washington<br />

(DC): US Government Printing Office. p 4.<br />

[13] O’Hanlon. p. 69.<br />

[14] Viton® is a registered trademark of DuPont Performance<br />

Elastomers L.L.C., Wilmington, DE, USA.<br />

[15] A.S.M.E. Boiler and Pressure Vessel Code. 1974. Section<br />

VIII, Division 1, Appendix V.<br />

[16] Handbook of Vacuum Technology, Karl Jousten ed.<br />

2008. Weinheim, Germany: Wiley-VCH Verlag GmbH &<br />

Co. p 782 - 784.<br />

[17]Moore JH, Davis CC, Coplan MA, Greer SC. 2009.<br />

Building Scientific Apparatus 4th ed. New York (NY):<br />

Cambridge University Press. p 139 <strong>–</strong> 142.<br />

[18] O’Hanlon, p 288 - 290.<br />

[19] O’Hanlon, p 315-318.<br />

[20] Atlas Technologies, Port Townsend, WA, USA. www.<br />

AtlasUHV.com<br />

[21] SilcoTek, 112 Benner Circle Bellefonte, PA 16823.<br />

www.SilcoTek.com<br />

[22] Mettler-Toledo, “Comparator Balances." Available<br />

at http://us.mt.com/global/en/home/supportive_content/<br />

product_documentation/product_brochures/Mass_Comparators.rxHgAwXLlLnPBMDSzq--.ExternalFileComponent.html/11795840_Comparator_BS_internet_02-2009.<br />

pdf.<br />

[23] Kalrez® is a registered trademark of DuPont Performance<br />

Elastomers L.L.C., Wilmington, DE, USA.<br />

[24] Roth A. 1990. Vacuum Technology. Amsterdam: Elsevier<br />

Science B.V. p 342.<br />

[25] Peacock RN. 1980. Practical selection of elastomer<br />

materials for vacuum seals. J. Vac. Sci.Technol. 17: 330-336.<br />

[26] Picard A, Fang H. 2004. Water vapor sorption on mass<br />

standards. Metrologia 41: 333-339.<br />

[27] Kobayashi Y. 1984. On a more precise correction for<br />

buoyancy and gas adsorption in mass measurement. Natl<br />

Bur. Stand. Spec. Publ. 617. p 441-443.<br />

[28] Schwartz R. 1994. Precision determination of adsorption<br />

layers on stainless steel standards by mass comparison<br />

and ellipsometry: Part I Adsorption isotherms in air.<br />

Metrologia 31: 117-128.<br />

[29] Schwartz R. 1994. Precision determination of adsorption<br />

layers on stainless steel standards by mass comparison<br />

and ellipsometry: Part II Sorption phenomena in<br />

vacuum. Metrologia 31: 129-136.<br />

[30]Kendall BRF. Spring 1989. Physics 537 Vacuum Physics<br />

lecture notes. Penn State University (unpublished). See<br />

also recent texts on vacuum technology.<br />

[31] O, Hanlon, p 169 - 179.<br />

An Introduction to Mass Metrology in Vacuum<br />

Patrick J. Abbott, Zeina J. Jabbour<br />

[32] Hablanian MH. 1997. HighVacuum Technology: A<br />

Practical Guide, 2nd ed. New York (NY): Marcel Dekker<br />

Inc. p 137 <strong>–</strong> 205.<br />

[33] Jousten, p 247 <strong>–</strong> 352.<br />

[34] Hablanian, p 190 - 196.<br />

[35] Liepert A, Lessard P. 2001. Design and operation of<br />

scroll-type dry primary vacuum pumps. J. Vac. Sci. Technol.<br />

A 19: 1708-1711.<br />

[36] Hablanian, p 269- 318.<br />

[37] Dushman S. 1962. Scientific Foundations of Vacuum<br />

Technique, 2nd ed. Lafferty JM, editor. New York (NY):<br />

Wiley. p 80 <strong>–</strong> 117.<br />

[38] Roth, p 62 <strong>–</strong> 108.<br />

[39] Welch KM. 2006. Speed and convenient abstractions.<br />

Vacuum Technology and Coating 7: 22-30.<br />

[40] Hyland RW and Shaffer RL. 1991. Recommended<br />

practices for the calibration and use of capacitance diaphragm<br />

gages as transfer standards J. Vac. Sci. Technol. 9:<br />

2843-2862.<br />

[41] Ellefson RE and Miiler AP. 2000. Recommended practice<br />

for calibrating vacuum gauges of the thermal conductivity<br />

type. J. Vac. Sci. Technol. A 18: 2568-2577.<br />

[42] Jitschin W. 1990. Accuracy of vacuum gauges. J. Vac.<br />

Sci. Technol. A 8: 948-956.<br />

[43] NIST Policy on Traceability: Traceability requires the<br />

establishment of an unbroken chain of comparisons to<br />

stated references. NIST assures the traceability of results<br />

of measurements or values of standards that NIST itself<br />

provides, either directly or through an official NIST program<br />

or collaboration. Other organizations are responsible<br />

for establishing the traceability of their own results or values<br />

to those of NIST or other stated references. NIST has<br />

adopted this policy statement to document the NIST role<br />

with respect to traceability. See the NIST web site http://<br />

ts.nist.gov/Traceability/Policy/nist_traceability_policyexternal.cfm.<br />

[44] Berry J and Davidson S. 2008. Contamination deposited<br />

on mass standards in vacuum from an inverted<br />

magnetron gauge. Meas. Sci. Technol. 19: 1 <strong>–</strong> 4.<br />

[45] Miiller AP. 1999. Measurement performance of highaccuracy<br />

low-pressure transducers. Metrologia 36: 617<br />

<strong>–</strong> 621.<br />

[46] On the possible future revision of the International<br />

System of Units, the SI, Draft Resolution A of the General<br />

Conference on Weights and Measures (CGPM) at its 24th<br />

meeting, 17 <strong>–</strong> 21 October 2011. http://www.bipm.org/utils/<br />

en/pdf/24_CGPM_Convocation_Draft_Resolution_A.pdf.<br />

Patrick J. Abbott and Zeina J. Jabbour, National Institute of<br />

Standards and Technology (NIST), Gaithersburg, MD.<br />

This paper was previously presented at the Measurement Science<br />

Conference (MSC) 2011 in Pasadena, <strong>Cal</strong>ifornia.<br />

Oct • Nov • Dec 2011 35 <strong>Cal</strong> <strong>Lab</strong>: The International Journal of Metrology

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