Comparison of the TDCR method and the CIEMAT/NIST method for ...
Comparison of the TDCR method and the CIEMAT/NIST method for ...
Comparison of the TDCR method and the CIEMAT/NIST method for ...
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Free parameter model<br />
Basic assumptions:<br />
• Statistical distribution <strong>of</strong> emitted photoelectrons at <strong>the</strong> photo cathode<br />
<strong>of</strong> <strong>the</strong> PMT (e.g. Poisson distribution):<br />
with<br />
P(<br />
x,<br />
m(<br />
E<br />
))<br />
x number <strong>of</strong> electrons<br />
E’ energy deposit in <strong>the</strong> scintillator<br />
m(E’) mean number <strong>of</strong> electrons<br />
• low PMT noise (coincidence circuit)<br />
m(<br />
E<br />
• threshold adjustment (single electron peak)<br />
'<br />
=<br />
) e<br />
x!<br />
x −m(<br />
E<br />
O. Nähle <strong>and</strong> K. Kossert <strong>Comparison</strong> <strong>of</strong> <strong>TDCR</strong> <strong>and</strong> CN <strong>for</strong> β emitters<br />
'<br />
'<br />
)
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