CEAC-2021-02-February

Advantest Debuts Two New Cloud
Solutions to Boost Production
Efficiencies for New IC Designs
TOKYO (GLOBE NEWSWIRE) — Leading semiconductor test
equipment supplier Advantest Corporation (TSE: 6857),
working with its partner PDF Solutions Inc., has introduced
two new innovative cloud-based software solutions: the
Advantest V93000 Dynamic Parametric Test (DPT) system
powered by PDF Exensio® DPT, and an edge high-performance
compute (HPC) system. These solutions are part of
the newly introduced Advantest Cloud Solutions (ACS), an
ecosystem of cloud-based products and services. At the core
of this ecosystem is the data- and analytics-focused platform
Advantest Cloud powered by PDF Exensio, which Advantest
is co-developing with PDF Solutions.
Leveraging the core technology developed by PDF Solutions,
the data generated from customer workflows is used to
provide feedback on processes from semiconductor design
validation to manufacturing, chip test, and system-level test.
Customers can get more value out of their supply chain,
their equipment, and their test data, to achieve faster timeto-yield
with higher overall equipment efficiency by using
advanced algorithms, integrated workflows, and methodologies
delivered through Advantest Cloud Solutions.
Advances in semiconductor technology such as advanced
process nodes, electrical scaling, 2.5D, and 3D packaging,
and a new focus on systems present unique challenges that
can only be solved through comprehensive software-guided
solutions. Integrating traditional data silos throughout the
semiconductor value chain can significantly improve product
quality, manufacturing yield, and cost efficiencies.
The Advantest V93000 Dynamic Parametric Test system
powered by PDF Exensio® DPT, jointly developed by Advantest
and PDF Solutions, adds rule-based, intelligent test flow
adaptation to the V93000 SMU8 parametric test platform.
With this technology, test flows are automatically optimized
on-the-fly within milli-seconds to increase die test coverage,
improve the characterization of aberrant measurements,
correct equipment issues, and streamline the collection of
additional data to support root-cause identification and
down-stream analytics.
The new ACS edge HPC product can run complex test
workloads with millisecond latencies and is available for
early adopters. With pre-configured containers for machine
learning (ML), demodulation, or other high-performance
workloads, the system makes it easy to implement ML in
semiconductor test. Besides allowing users to track, manage,
and secure all containers from the cloud, it also provides
on-demand access to previous insertion data through application
programming interfaces (APIs) with built-in forward
Advantest’s new offerings represent the global semiconductor industry’s
first integrated cloud-based software solutions portfolio.
and backward data feeds. Customers can deploy machine
learning models and algorithms in production, perform
in-situ test flow optimizations, and remotely manage highly
sensitive IP with maximum security.
“Just as we deliver value to our customers by offering the
most advanced test technologies, Advantest is continually
working to pioneer new business practices and expand our
product portfolio with fast-response, cost-saving services
from the cloud,” said Doug Lefever, president and CEO of
Advantest America Inc. “We view such innovations as part
of our Grand Design objective to add value throughout the
entire semiconductor value chain.”
These ACS products and other services are now available.
Volume 85 · Number 3 | 53