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修士論文 硬X線多層膜ミラーでの反射が偏光測定に与える影響の評価

修士論文 硬X線多層膜ミラーでの反射が偏光測定に与える影響の評価

修士論文 硬X線多層膜ミラーでの反射が偏光測定に与える影響の評価

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5.2.2.2 <br />

4.2 <br />

30 keV β 0 ◦ <br />

,30µm,50µm,100µm<br />

<br />

<br />

200 ×30 <br />

B <br />

C <br />

5.2.2.3 <br />

5.6 200 <br />

<br />

<br />

(Count IC ) = 6.32 × 10 −3 × (Count Det ) − (30 ± 8) (5.1)<br />

Count Det Count IC <br />

Counts/sec<br />

−30 <br />

() = (Count Det )/(Count IC + 30) (5.2)<br />

5.2<br />

<br />

5.7 -30 <br />

<br />

5.8<br />

5.8 <br />

()=158.3±0.4(1σ) <br />

0.4/158.3=0.25%<br />

41

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