High Energy X-ray Diffraction Microscopy (HEDM) - Materials ...
High Energy X-ray Diffraction Microscopy (HEDM) - Materials ...
High Energy X-ray Diffraction Microscopy (HEDM) - Materials ...
Create successful ePaper yourself
Turn your PDF publications into a flip-book with our unique Google optimized e-Paper software.
Near-field <strong>HEDM</strong>: Orientation Field Mapping<br />
Apparatus at 1-ID at APS<br />
• Monochromatic x-<strong>ray</strong>s (> 50keV)<br />
• 1 – 5 mm beam height<br />
• 1.3 mm beam width<br />
• Air bearing rotation<br />
• 1.5 mm detector pixels<br />
• L = 4 – 12 mm<br />
Meaurement resolutions<br />
• Spatial: 1 - 4 mm<br />
• Orientation resolution: ~ 0.1 degree<br />
• Elastic strain: ??<br />
• Time: ~10 layers/hour<br />
Image diffracted beams<br />
from planar grain crosssections<br />
during 180<br />
degree w rotation<br />
in dw integration intervals<br />
• Lienert et al, JOM 2011<br />
• Suter et al, Eng Mat &<br />
• Tech 2007<br />
• Suter et al, RSI 2006<br />
• H.F. Poulsen, Springer<br />
Tracts, 2004
Change language