Detailed Scientific Programme (including all lecture and poster times)

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Technical lectures (Main exhibition hall, first floor) Monday August 23, p.m. 15.00 – 15.30 Thermo Electron B.V. (C. Van Hoek): Modern Analytical Software Tools in Microanalysis 15.30 – 15.50 Kleindiek Nanotechnik GmbH (S. Kleindiek): Nanorobots for electron microscopy 15.50 – 16.10 ScienTec (G. Kada): Atomic Force Microscopy (AFM) Applications for Nanotechnology and Bionanotechnology 16.10 – 16.30 Coffee Break 16.30 – 17.00 Maia Scientific (K. Verdonck): High Volume Image Processing In The Life Sciences 17.00 – 17.20 Tescan s.r.o (J. Klima): Detection of secondary electrons in low vacuum TESCAN VEGA SEMs Tuesday August 24, a.m. 09.30 - 10.00 Gatan UK (N. Wilkinson): Recent progress in digital imaging 10.00 - 10.30 Gatan UK (R. Morrison): Advances in TEM specimen holders 10.30 – 11.00 Coffee Break 11.00 - 11.30 Röntec GmbH (T. Grafe): New features in EDX spectroscopy based on SDD detectors 11.30 – 12.00 Nanofactory Instruments AB (C. Grimaud): SPM-TEM systems for in situ electrical and mechanical nanocharacterization. Wednesday August 25, a.m. 09.30 – 10.00 j.j. bos b.v. (J. Friel): The Method of PTS 10.00 – 10.30 Carl Zeiss (C. Power): Setting the standard in sensitivity and the GaAsP technology 10.30 – 11.00 Coffee Break 11.00 – 11.30 Oxford Instruments (L. Shepherd): Automated Microanalysis 11.30 – 12.00 Alicona Imaging GmbH (S. Scherer): Innovations in 3D in Digital Microscopy Wednesday August 25, p.m. 15.00 – 15.20 PerkinElmer LAS (P. Vervoort): Real Time, Multi Dimensional Confocal Imaging: Defining Limits 15.20 – 15.40 Bal-Tec AG (D. Kuechler): New Ion Beam Milling System for Fast and Efficient Site Specific Sample 15.40 – 16.00 Nano Technology Instruments (S. Lemeshko, NT-MDT Co. (Molecular devices and tools for nanotechnology Co.): Scanning Probe Laboratories - new class of analytical equipment for nanoscale material properties characterization 16.00 – 16.30 Coffee Break 16.30 – 16.50 Atomic Force F&E GmbH (R. Goschke/S. Vinzelberg): New Instrumentation for Single Molecule Force Spectroscopy and Atomic Force Microscopy 16.50 – 17.10 Cameca (M. Outrequin): Recent developments in high resolution micro-analysis: EPMA and NanoSIMS from CAMECA 17.10 – 17.30 TVIPS GmbH (I. Daberkow): Latest developments in TEM imaging Thursday August 26, a.m. 09.30 – 10.00 Gatan Inc. (M. Kundmann): Advances in analytical TEM with third-generation post-column energy 10.00 – 10.30 Gatan UK (S. Galloway): New applications and advances in SEM based Beam Induced techniques 10.30 – 11.00 Coffee Break 11.00 – 11.20 Diatome Ltd (G. Helmut): A new era in ultramicrotomy: the oscillating diamond knife 11.20 – 11.40 Thermo Electron B.V. (C. Van Hoek): MAXray, a Parallel Beam Spectrometer - An analytical Tool for Low Voltage and Low Beam Current Applications 11.40 – 12.00 Hitachi High-Technologies Europe GmbH (M. Capers): Detector strategy of Hitachi´s Ultra High-Resolution FE-SEM´s
Instrumentation & Methodology IM 1. Aberration correctors (David J. Cockayne) (Mon. 23/8) IM1.P1 Seamless integration of a TEM Cs corrector into the various architectures of present-day microscopes: a challenging software task F. Kahl, S. Uhlemann, P. Hartel IM1.P2 Residual aberrations of hexapole-type Cs-correctors P. Hartel, H. Müller, S. Uhlemann, M. Haider IM1.P3 An automatic geometrical aberration correction system of scanning electron microscopes K. Honda, S. Uno, N. Nakamura, M. Matsuya, B. Achard, J. Zach IM1.P4 Accuracy of aberration measurements for HRTEM using Zemlin tableaus M. Lentzen, A. Thust, K. Urban IM1.P5 Diagnosis of aberrations from crystalline samples in aberrationcorrected STEM Q. Ramasse, A. Bleloch IM1.P6 Exit wave reconstruction using an energy filtered aberration corrected TEM A. Kirkland, R.R. Meyer, D.J.H. Cockayne, C.J.D. Hetherington, J.L. Hutchison, J.M. Titchmarsh IM1.P7 Performance of monochromized and aberration-corrected TEMs G. Benner, E. Essers, M. Matijevic, A. Orchowski, P. Schlossmacher, A. Thesen, M. Haider, P. Hartel IM1.P8 Atomic structure of quasicrystal studied by spherical aberration corrected 300kV-STEM E. Abe, S.J. Pennycook IM1.P9 First direct imaging of oxygen atoms at (100) surfaces of magnesium oxide in cross-sectional observations by Cs-corrected TEM N. Tanaka, J. Yamasaki, T. Kawai IM 2. Lenses, filters, spectrometers, sources, detectors (Pieter Kruit) (Mon. 23/8) IM2.P1 Nanoresolution BSE images created using a new type of YAG II scintillator R. Autrata, P. Schauer IM2.P2 Optimization of a high resolution highly sensitive detector for fast electrons N. Vedrenne, G. Hug, B. Fleury IM2.P3 The collection efficiency of the Everhart-Thornley detector of secondary electrons in SEM I. Konvalina, I. Müllerová, L. Frank IM2.P4 Modulation transfer function of electron-bombarded CCD M. Horacek IM2.P5 Corrected OMEGA in-column energy filter in practice: energy resolution and stability G. Benner, E. Essers, B. Huber, G. Lang, M. Matijevic, A. Orchowski, W.-D. Rau, B. Schindler, P. Schlossmacher, A. Thesen IM2.P6 Measurements of the magnification for the Philips TEM EM400T against specimen level and objective lens current R. Berti, U. Valdrè IM2.P7 Back-illuminated electron multiplying CCD technology and its impact on ultra low-light microscopy C. Coates, D. Denvir, N. McHale, K. Thornbury, M. Hollywood Poster Sessions: details (main exhibition hall, first floor) IM 3. Quantitative HRTEM and STEM (Andreas Rosenauer) (Tu. 24/8) IM3.P1 Measurement of beam-broadening in thin specimens in analytical electron microscopy T. Oikawa, T. Suzuki, Y. Aoyama, D. Shindo IM3.P2 TrueImage - understanding decreasing dimensions by focal- Series reconstruction C. Kübel, B. Freitag, M.T. Otten, T. Fliervoet, D.H.W. Hubert IM3.P3 Calibration of projector lens distortions F. Hüe, G. Wang, M. Hÿtch IM3.P4 The use of back focal plane apertures in the study of non-linear interferences and diffuse scattering C. Benito Castro, H.W. Zandbergen, V. Sivel, P. Alkemade IM3.P5 Temperature dependence of high-angle annular dark-field scanning transmission electron microscopy images T. Oikawa, T. Yamazaki, M. Kawasaki, M. Shiojiri IM3.P6 Improvement of spatial resolution of STEM-HAADF image by maximum-entropy and Richardson-Lucy Deconvolution K. Ishizuka, E. Abe IM3.P7 Contrast formation mechanism of high resolution brigh-field STEM images T. Yamazaki, Y. Kikuchi, K. Watanabe, N. Nakanishi, E. Asano, E. Okunishi, I. Hashimoto IM3.P8 A novel method for the focus assessment in atomic resolution STEM HAADF experiments V. Grillo, E. Carlino IM3.P9 Segregation in InGaAs/GaAs quantum wells grown by MOCVD E. Piscopiello, A. Rosenauer, A. Passaseo, G. Van Tendeloo IM3.P10 Strain and interdiffusion at the nanometric scale in Ge/Si quantum effect devices J.Y. Laval, D. Brouri, C. Cabanel, C. Delamarre, M. Allioux IM3.P11 Measurement of the nitrogen-concentration profile in GaInNAs/GaAs heterostructures by quantitative high-resolution transmission electron microscopy D. Litvinov, D. Gerthsen, A. Rosenauer, Ph. Gilet, L. Grenouillet IM3.P12 Strain state analysis of InGaAs/GaAs heterostructures: Elastic relaxation in cross section and cleaved specimen M. Schowalter, A. Rosenauer, D. Lamoen, D. Gerthsen IM3.P13 Compositional characterisation of InAs/GaAs nanostructures N. Zakharov, V. Talalaev, Yu. Samsonenko, G. Cirlin, A. Tonkikh, P. Werner IM3.P14 HRTEM investigation and numerical modeling of cadmium distribution in ZnTe/CdTe QDs superlattice S. Kret, P. Traczykowski, P. Dluzewski, P. Dluzewski, P. Ruterana, M. Zak, A. Szczepanska, S. Mackowski, G. Karczewski IM3.P15 Thinckness dependent imaging of atomic columns in a CaxCuO2 composite crystal O. Milat, N. Demoli, L. Righi, A. Migliori, G. Calestani IM3.P16 Analysis of aberration corrected grain boundary phase images from focal series reconstruction in YBa2Cu3O7 L. Houben, A. Thust, K. Urban
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Page 3 and 4: Week Schedule Monday 23/8 a.m. 8.30
Page 5 and 6: Tuesday 24/8 a.m. 8.30 Plenary Lect
Page 7 and 8: Wednesday 25/8 a.m. 8.30 Plenary Le
Page 9 and 10: Thursday 26/8 a.m. 8.30 Plenary Lec
Page 11: MS 1 - T 103 MS 3b - T 105 MS 5 - U
Page 15 and 16: IM8.P21 Micro- and electronic struc
Page 17 and 18: MS2.P3 Size determination of aeroso
Page 19 and 20: MS5.P6 Visualization and measuremen
Page 21 and 22: MS 11. "soft" materials and mineral
Page 23 and 24: MS14.P7 Electron holography of a fo
Page 25 and 26: LS 9. Biological applications of sc
Page 27: LS17.P8 Fine structure of dorsal sk

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