Detailed Scientific Programme (including all lecture and poster times)

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IM 4. Quantitative diffraction, electron crystallography (Jean-Paul Morniroli) (Tu. 24/8) IM4.P1 Channelling contrast by focused ion beam and EBSD - two complementary techniques M. Schmied, S. Mitsche IM4.P2 Determination of local lattice parameters within a 0.1 % accuracy using non-energy filtered CBED T. Yamazaki, T. Isaka, K. Kuramochi, K. Watanabe, I. Hashimoto IM4.P3 Calculation of energy filtered electron diffraction patterns of GaAs C. Prietzel, H. Kohl IM4.P4 Quantitative convergent beam electron diffraction study of GaAs J. Pacaud, J.M. Zuo IM4.P5 TEM determination of the composition of strained epitaxial semiconductor surface layers using LACBED D. Jacob, B. Kedjar, A. Lefebvre, X. Wallart IM4.P6 HOLZ lines fine structure in epilayers plan-view CBED patterns F. Houdellier, C. Roucau, M.J. Casanove IM4.P7 LACBED study of the LaGaO3 pervoskite J.P. Morniroli, G. Auchterlonie, J. Drennan IM4.P8 QCBED measurements in strontium titanate J. Friis, B. Jiang, K. Marthinsen, R. Holmestad IM4.P9 Sodium ion ordering in NaxCoO2 and structural models for that ordering V. Kumar, H.W. Zandbergen, M. Foo, Q. Xu, R. Cava IM4.P10 CBED on copper and aluminum - a comparison M. Hofmann, T. Gemming, J. Thomas, K. Wetzig IM4.P11 The role of geometric distortions in limiting the accuracy of quantitative convergent beam electron diffraction P. Nakashima IM 6. Electron holography (Hannes Lichte) (Th. 26/8) IM6.P1 Simulation of quantum noise and application in electron holography D. Wolf, M. Lehmann, D. Geiger, H. Lichte IM6.P2 Electron holography: noise limit and lateral resolution H. Lichte IM6.P3 Theoretical interpretation of plasmon-holography experiments J. Verbeeck, H. Lichte, D. Van Dyck IM6.P4 Direct visualization of magnetic micro-field around a barium ferrite particle by modified double-exposure electron holography A. Ohshita, M. Okuhara, Y. Yamakawa, K. Hata, K. Lida IM6.P5 Holographic tilt-series of ferroelectric BaTiO3 C. Matzeck, H. Lichte, M. Reibold IM 7. Electron tomography (Paul Midgley, Dirk Van Dyck) (Th. 26/8) IM7.P1 Benefits and drawbacks of dual-axis STEM tomography J. Tong, M. Weyland, R.E. Dunin-Borkowski, P.A. Midgley IM7.P2 Advances of electron tomography for materials science TEM and HAADF-STEM tomography C. Kübel, M. Otten, R. Schoenmakers, D.H.W. Hubert IM7.P3 Analytical electron tomography for ultra-resolution pole-piece TEM G. Mübus, B. Inkson, I. Ross, J. Rodenburg, B. Morrison IM7.P4 3D electron tomography: a high-resolution imaging tool for cell biological applications W. Geerts, D. Zeuschner, J. Klumperman, A.J. Koster IM7.P5 Conical tomography of freeze-fracture replicas of membrane proteins in their native environments S. Lanzavecchia, M. Kreman, F. Cantele, L. Zampighi, P.L. Bellon, G.A. Zampighi IM 8. EELS-EFTEM (Henny Zandbergen) (Wed. 25/8) IM8.P1 Improvement of energy-resolution in EELS by drift correction and deconvolution K. Kimoto, K. Ishizuka, Y. Matsui IM8.P2 STEM performance on a monochromated TEM W. Rechberger, G. Kothleitner, W. Grogger, F. Hofer IM8.P3 Improving energy resolution of EELS spectra : an alternative to the monochromator solution ? A. Gloter, A. Douiri, M. Tencé, C. Colliex IM8.P4 Model based EFTEM W. Van den Broek, S. De Backer, J. Verbeeck, P. Scheunders IM8.P5, Intensity oscillations of electron beams scattered by crystals with characteristic energy losses N. Borgardt, A.V. Zykov IM8.P6 Magic angle: an unsolved mystery C. Hébert, P. Schattschneider, B. Jouffrey IM8.P7 Quantitative plasmon imaging of multiple materials properties using universality and scaling in solid-state property - valence electron density relationships V. Oleshko, J. Howe IM8.P8 Simulation and recording of elemental maps using an energyfiltering transmission electron microscope (EFTEM) A.K. Rokahr, A. Thesing, H. Kohl IM8.P9 Characterization and compensation of environmental magnetic fields for a monochromized TEM W. Grogger, G. Kothleitner, B. Kraus, F. Hofer IM8.P10 EELS study of near edge fine structure in AlxGa1-xN alloys G. Radtke, P. Bayle-Guillemaud IM8.P11 High resolution EELS measurements on GaN in a monochromated transmission electron microscope S. Lazar, G. Botton, M.-Y. Wu, F. Tichelaar, H.W. Zandbergen IM8.P12 Imaging Si nanocrystals designed for multi-dot floating-gates S. Schamm, G. Zanchi, M. Tencé, C. Colliex, C. Bonafos, H. Coffin, N. Cherkashin, G. Ben Assayag, A. Claverie IM8.P13 Comparison of simulated and experimental ELNES of SiC M.Y. Park, K. Giese, P. Krüger, H. Kohl IM8.P14 Electron energy loss analysis of a lamellar C3N4 phase Ph. Moreau, V. Mauchamp, G. Goglio, F. Boucher, G. Ouvrard IM8.P15 Applications of EELS spectrum imaging M. Bosman, V.J. Keast IM8.P16 The formation of molecular nitrogen in chromium nitrides monitored by EELS C. Mitterbauer, W. Grogger, P. Wilhartitz, F. Hofer IM8.P17 Optimization of the positions and the width of the energy windows for the recording of Ti elemental maps B. Gralla, A. Thesing, H. Kohl IM8.P18 Measurement of the absolute positions of EELS ionisation edges in regular TEM/STEM instruments P. Potapov, D. Schryvers IM8.P19 The relationship between EELS white-line characteristics and manganese oxidation states T. Riedl, T. Gemming, K. Wetzig IM8.P20 Low energy-loss study of perovskites Ph. Moreau, V. Mauchamp, F. Boucher
IM8.P21 Micro- and electronic structure of vanadium phosphorous oxides M. Willinger, D. Su, R. Schlögl IM8.P22 Electron beam sensitivies of manganites M.Y. Wu, H.W. Zandbergen, Z. Yang, J. Aarts IM8.P23 The electronic structure of SrTiO3 K. Hu, B. Su, I.P. Jones IM8.P24 EELS of interfaces between sub nanometre oxide layers J.L. Maurice, D. Imhoff, T.T. Nguyen, M. Tencé, M. Bibes, U. Lüders, J.-F. Bobo, C. Colliex IM8.P25 Nano--precipitation of niobium carbides within ferrite: a HRTEM, EDX, EELS, HAADF and EFTEM study of thin foils and extraction replica E. Courtois, T. Epicier, P. Barges, C. Scott IM8.P26 Observation of anisotropy in clays at an atomic level by high resolution and EELS S. Laribi, B. Jouffrey IM8.P27 Electron energy loss study of LixTiP4, a possible negative electrode for lithium-ion batteries V. Mauchamp, Ph. Moreau, L. Monconduit, F. Boucher, M.-L. Doublet, G. Ouvrard IM8.P28, EELS L3 edge shift mapping in oxidised NiFe nano-particles M. Walls, M. Tencé, C. Duhamel, Y. Champion IM8.P29 Semi-quantitative EFTEM of small precipitates in steels S. Lozano-Perez, M.L. Jenkins, J.M. Titchmarsh IM8.P30 Mapping the physical properties of He nanobubbles at the nanometer scale D. Taverna, M. Kociak, A. Fabre, E. Finot, O. Stephan, C. Colliex IM 9. Low Voltage SEM, variable pressure SEM (Ludek Frank) (Mon. 23/8) IM9.P1 Measurement of the beam skirt profile in a low vacuum SEM J. Bilde-Sørensen IM9.P2 Very low energy scanning transmission electron microscopy P. Hrnčiřik, O. Křivánek, I. Müllerová IM9.P3 Two-stage secondary electron detector for ESEM W. Slówko IM9.P4 Detection of angular distribution of signal electrons in lowvoltage SEM I. Vlček, B. Lencová, M. Horáček IM9.P5 Combined influences of the SE emission and detection in LVSEM J. Cazaux, L. Castel, P. Lehuédé, J.M. Patat IM9.P6 Dependence of contrast on pressure using segmental ionization detector in environmental SEM, L, Schneider J. Jirák, R. Autrata, P. Schauer IM9.P7 Direct measurement of specimen voltage in High Pressure Scanning Electron Microscope R. Belkhorissat, A. Kadoun, B. Khelifa, C. Mathieu IM9.P8 Some specific effects involving the SE emission from insulators J. Cazaux IM9.P9 Dynamic imaging of latices film-formation by STEM in an environmental SEM A. Bogner, C. Gauthier, P.-H. Jouneau, G. Thollet IM9.P10 Low energy and high resolution STEM for unstained or weak stained biological specimens A. Takaoka, T. Hasagawa, A. Kuwae, M. Sato IM9.P11 Methods of observation of water containing specimens in ESEM R. Autrata, V. Neděla IM 10. X-ray microscopy and microtomography (Koen Janssens) (Th. 26/8) IM10.P1 Microtomographic investigation of Ti-rich particles in foamed aluminium E. Cornelis, H.P. Degischer, B. Kriszt, A. Kottar IM10.P2 X-ray microCT as powerful tool to study wood anatomical characteristics K. Steppe, V. Cnudde, C. Girard, R. Lemeur, P. Jacobs IM 11. New microscopies and novelties (Jacques Cazaux) (Tu. 24/8) IM11.P1 Progressive image transmission in telemicroscopy V. Gonzalez-Ruiz, J.P. García-Ortiz, J.-J. Fernandez, J.M. Carazo, I. Garcia IM11.P2 Remote operation system for the 3MV electron microscope with a two-way conversation capability K. Yoshida, H. Mori, S. Shimojo, T. Akiyama, T. Shibayama IM11.P3 Telepathology at the ultrastructural level - a diagnostic application of remote electron microscopy via internet J. Schroeder, P. Buescher, F. Hofstaedter IM11.P4 A system designed for exploring the human cytome P. Van Osta, B. Vanherck, K. Ver Donck, L. Bols, J. Geysen IM11.P5 Is it necessary to stain ultrathin sections for low voltage electron microscopy ? J. Nebesarova, M. Vancova IM11.P6 A combined Raman spectrometer with SEM/EDS K. Kawauchi, K. Ogura, F. Charles, A. Brooker, R. Bennett IM11.P7 Focal shift correction on thickness data measured with confocal microscopy L. Kuypers, W. Decraemer, J. Dirckx IM11.P8 STEM-Unit measurements in a scanning electron microscope U. Golla-Schindler IM11.P9 The main principles of improved spatial resolution cathodoluminescence microscopy and microtomography using elliptical mirror optics E.I. Rau, R.A. Sennov, D.S.H. Chan, J.C.H. Phang IM11.P10 New method for determining the second crossover energy in electron irradiated insulators S. Fakhfakh, O. Jbara, S. Rondot, E.I. Rau, M.V. Andrianov IM11.P11 In-situ electrical probing of nanowires by TEM-STM M. Larsson, L.R. Wallenberg, A.I. Persson, L. Samuelson IM11.P12 Improved design of a double tilt side entry straining stage for TEM Z. Dlabácek, A. Gemperle, J. Gemperlová IM11.P13 Digital holography microscopy applications in partially coherent illumination F. Dubois, C. Yourassowsky, O. Monnom IM 12. Image analysis and processing (José M. Carazo García) (Wed. 25/8) IM12.P1 Three dimensional surface reconstruction in scanning electron microscopy J. Paluszynski, W. Slówko IM12.P2 Distortion compensation of 3D surface reconstruction in SEM J. Paluszynski, W. Slówko
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Page 3 and 4: Week Schedule Monday 23/8 a.m. 8.30
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