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Detailed Scientific Programme (including all lecture and poster times)

Detailed Scientific Programme (including all lecture and poster times)

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MS12.P31 Analytical TEM investigations on Co-Mn-Si thin films<br />

J. Thomas, J. Schumann, D. Lohse<br />

MS12.P32 Microstructural evolution of electroplated CuAg <strong>all</strong>oy thin<br />

films during thermal cycling studied by SEM techniques<br />

S. Strehle, K. Wetzig, S. Menzel, H. Wendrock, T. Gemming<br />

MS12.P33 Structural evolution of CeMX (M = Ni, Cu <strong>and</strong> X = Si, Ge,<br />

Sn) intermet<strong>all</strong>ics induced by hydrogenation<br />

F. Weill, M. Pasturel, J.L. Bobet, B. Chevalier<br />

MS12.P34 Room-temperature reaction between Laser-chemical-vapor-<br />

deposited selenium <strong>and</strong> some metals<br />

J. Bohacek, A. Ouchi, P. Bezdicka, J. Pola, S. Bakardjieva, J. Subrt<br />

MS12.P35 TEM studies on the early stage of oxidation process of copper<br />

H. Jiang, M. Honkanen, M. Vippola, E.I. Kauppinen, T. Lepistö<br />

MS12.P36 Oxidation of OF-, CuAg- <strong>and</strong> DHP-copper at 200°C studied<br />

by AEM<br />

M. Honkanen, M. Vippola, T. Lepistö, H. Jiang, E. Kauppinen<br />

MS12.P37 Oxidation of copper <strong>all</strong>oys<br />

M. Honkanen, M. Vippola, T. Lepistö<br />

MS12.P38, SEM <strong>and</strong> TEM characterization of Ti6242 <strong>all</strong>oys<br />

X. Zheng, B. Dogan, U. Lorentz, M. Oehring<br />

MS12.P39 Study of TiCu precipitates in a Ti50Ni25Cu25 melt spun ribbon<br />

R. Santamarta, D. Schryvers<br />

MS12.P40 A new ytterbium silicide with a modulated structure<br />

F. Krumeich, M. Wörle, C. Kubata, R. Nesper<br />

MS12.P41 TEM microstructural investigation of creep deformed single<br />

crystal Ni-base super<strong>all</strong>oy CM186LC<br />

B. Dubiel, D. Bale, M. Blackler, A. Czyrska-Filemonowicz<br />

MS12.P42 TEM observation of stress corrosion cracks for nickel base<br />

<strong>all</strong>oy in sulfate solution<br />

F. Delabrouille, B. Viguier, L. Legras, E. Andrieu<br />

MS12.P43 Quantitative TEM met<strong>all</strong>ography <strong>and</strong> fourier transform<br />

images analysis for determination of γ' precipitate parameters in single<br />

crystal nickel-base super<strong>all</strong>oy<br />

M. Biel, F. Diologent, A. Hessler-Wyser, A. Czyrska-Filemonowicz, P.A.<br />

Buffat<br />

MS12.P44 EBSD - <strong>and</strong> the recryst<strong>all</strong>isation of Ni-base <strong>all</strong>oys<br />

P. Poelt, S. Mitsche, C. Sommitsch, M. Walter<br />

MS12.P45 In situ TEM observation of the transformations in aged NiTi<br />

shape memory <strong>all</strong>oy<br />

D. Stróż<br />

MS12.P46 HREM study of the layered martensitic structures in Ni-Mn-<br />

Ga shape memory <strong>all</strong>oys<br />

J. Pons, R. Santamarta, V.A. Chernenko, E. Cesari<br />

MS12.P47 Precipitation processes in aged Ni-23Cr-16Mo <strong>all</strong>oy resolved<br />

by TEM<br />

E.S.M. Nicoletti, G. Solórzano<br />

MS12.P48 An HREM study of the disordered NiAs type phases in the Ni-<br />

Sn-P system<br />

F.J. García-García, A.-K. Larsson, S. Furuseth<br />

MS12.P49 The effects of pre-deformation on the induced phase<br />

transitions in NiTi shape memory thin films under swift ion irradiation<br />

T. La Grange, R. Gotthardt<br />

MS12.P50 Influence of compression aging on phase transition<br />

temperatures in single cryst<strong>all</strong>ine Ni-rich NiTi shape memory <strong>all</strong>oys<br />

J. Michutta, C. Somsen, A. Yawny, G. Eggeler<br />

MS12.P51 Measuring strain fields surrounding Ni4Ti3 precipitates with<br />

HRTEM<br />

W. Tirry, D. Schryvers<br />

MS12.P52 Superelastic cycling effects on the microstructure of Cu-Al-Ni<br />

shape memory <strong>all</strong>oys<br />

A. Ibarra, J.M. San Juan, D. Caillard, M.L. Nó<br />

MS12.P53, Microstructural studies on martensitic transformation in<br />

copper-based shape memory <strong>all</strong>oys<br />

O. Adiguzel<br />

MS12.P54 An EFTEM study on a NiTi shape memory <strong>all</strong>oy<br />

Z. Yang, W. Tirry, D. Schryvers<br />

MS12.P55 A SEM study of the structure characteristics of in situ Al<br />

matrix composites<br />

E. Pavlidou, G. Vourlias, N. Pistofidis, G. Stergioudis<br />

MS12.P56 Amorphous FeNiSiB <strong>all</strong>oy structure relaxation under low<br />

temperature treatment<br />

E.V. Pustovalov, V.S. Plotnikov, N.D. Zakharov, B.N. Grudin<br />

MS12.P57 Contribution to the study of the relationship between<br />

structural characteristics <strong>and</strong> properties using mathematical models<br />

O. Novitovic, Z. Cvijovic, R. Kovacevic, A. Novitovic<br />

MS 13. Spectroscopy in materials science (Joachim<br />

Mayer) (Wed. 25/8)<br />

MS13.P1 Near edges structure interpretation in EELS spectra of ill<br />

organized materials: a multiple scattering approach for b<strong>and</strong> structure<br />

calculations with EEL Spectra correlation<br />

T. Césaire, J.L. Mansot, V. Jeanne-Rose, J.J. Rehr<br />

MS13.P2 Advanced investigations of the composition of submicron<br />

particles by using EDXS <strong>and</strong> Monte Carlo methods<br />

J. Wagner, M. Schmied, S. Mitsche<br />

MS13.P3 Synthesis of ZrTiO4 by b<strong>all</strong>-milling <strong>and</strong> sintering of equimolar<br />

mixture of TiO2 <strong>and</strong> ZrO2<br />

A. Gajovic, K. Furic, S. Musić, N. Tomašić<br />

MS13.P4 EELS investigation of different niobium oxide phases<br />

D. Bach, H. Störmer, D. Gerthsen<br />

MS13.P5 Introduction of EELS in the microstructural study of MDMO-<br />

PPV:PCBM films used in organic solar cells<br />

J. D'Haen, E. Ferain, J. Manca, T. Martens, M. D'Olieslaeger<br />

MS13.P6 Cathodoluminescence of "wet" <strong>and</strong> "dry" SiO2<br />

T. Ziems, A. von Czarnowski, S.S. Hlaing, H.-J. Fitting<br />

MS 14. FIB <strong>and</strong> advanced sample preparation (Arpad<br />

Barna) (Tu. 24/8)<br />

MS14.P1 TEM specimen preparation by an in-situ plucker system in a<br />

FIB<br />

A. Benedetti, H. Bender<br />

MS14.P2 TEM lamellae preparation on met<strong>all</strong>ization thin films using the<br />

lift-out technique inside a single beam FIB workstation<br />

S. Menzel, B. Arnold, H. Wendrock, T. Gemming<br />

MS14.P3 Reducing ion damage in FIB-prepared HSLA steel TEM<br />

specimens using a low energy ion milling system<br />

C. Collins, M. MacKenzie, A. Craven, L. Tóth, G. Vincze, D. Szigethy<br />

MS14.P4 Combined ion beam preparation procedures for simultaneous<br />

investigation of surface <strong>and</strong> bulk properties by SEM<br />

W. Hauffe, D. Glöβ, M. Besold<br />

MS14.P5 The use of low energy Ar ion milling to reduce surface damage<br />

on silicon resulting from focused ion beam milling<br />

A. Barna, R.E. Dunin-Borkowski, A.C. Twitchett, P.A. Midgley, B. Pécz<br />

MS14.P6 High resolution SEM Imaging in real-time of FIB direct-write<br />

nanolithography<br />

P. Gnauck, U. Zeile

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