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Detailed Scientific Programme (including all lecture and poster times)

Detailed Scientific Programme (including all lecture and poster times)

Detailed Scientific Programme (including all lecture and poster times)

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Tuesday 24/8 p.m.<br />

12.15 Special Interest Lecture (T 103) : Ian Parker : Microscopy with photons<br />

13.00 Poster sessions : IM 3, IM 4, IM 11, MS 12b, MS 14, MS 15, MS 16, LS 4, LS 5, LS 6, LS 10, LS 15<br />

IM 3 – T 103 IM 11 – U 024 MS 12b – T 129 MS 14 – T 105 LS 5 – T 148 LS 15b – V 008<br />

15.00 Perspectives for quantitative phase Coherent diffractive imaging - new Nano-sized metal clusters: ch<strong>all</strong>enges New horizons for TEM investigations in Imaging cytoskeleton <strong>and</strong> sign<strong>all</strong>ing Development of a web-accessible<br />

contrast electron microscopy at high approach to high resolution microscopy <strong>and</strong> opportunities<br />

material sciences thanks to the focused dynamics in live cells with GFP-based SEM/EDX database of gun shot residue<br />

resolution<br />

I. Vartanyants (invited)<br />

J. De Hosson, T. Vystavel, G.<br />

ion beam<br />

4D-microscopy, FRET <strong>and</strong> FLIM particles using a neural network search<br />

C. Kisielowski, J.R. Jinschek, S. Bals,<br />

Palasantzas, S. Koch (invited)<br />

W. Saikaly, C. Dominici, C. Vanni, A. T. Gadella, E. van Munster, P.<br />

engine<br />

X. Xu (invited)<br />

Charaï (invited)<br />

Dhonukshe, M. Adjobo-Hermans, J. B. Nys, L. Niewoehner, L. Gunaratnam<br />

Vermeer, G.-J. Kremers, J. Goedhart (invited)<br />

(invited)<br />

15.30 Quantitative evaluation of asymmetric Weak lens diffractive imaging<br />

Solute segregation in Al3(Sc, Zr) Using FIB sample preparation in the FRET analysis reveals a direct protein- Characterization of El Tor choleraphage<br />

features contained by wave functions of J. Rodenburg<br />

intermet<strong>all</strong>ic phase in Al-rich <strong>all</strong>oys study of historical artefacts<br />

protein interaction between members of S5 by electron microscopy<br />

centrosymmetric objects in HRTEM<br />

A. Tolley, V. Radmilovic, U. Dahmen J. Dik, V. Sivel, P. Alkemade, F. both FtsZ families in Physcomitrella K. Mitra, A.N. Ghosh<br />

A. Thust, C.-L. Jia<br />

Tichelaar, A. W<strong>all</strong>ert, N. Groot<br />

patens,<br />

B. Hause, J. Keissling, R. Reski, E.L.<br />

Decker<br />

15.45 Optimization of the experimental design CHIRALTEM - circular dichroism in EFTEM study on cube-shaped phase in Development of a site specific sample Rapid constriction of lipid bilayers by The impacts of virus infection on the<br />

of quantitative atomic resolution the TEM<br />

Al-Mg-Si <strong>all</strong>oy<br />

preparation technique for high rsolution the mechanochemical enzyme dynamin subcellular distribution <strong>and</strong> localization<br />

transmission electron microscopy P. Schattschneider, E. Carlino, H. K. Matsuda, Y. Ishida, T. Sato, S. Ikeno 3D TEM observation<br />

D. Danino, K.-H. Moon, J.E. Hinshaw of glutathione in Cucurbita pepo L.<br />

experiments<br />

Lichte, P. Novak, J. Zweck, C. Hebert,<br />

T. Kamino, T. Yaguchi, M. Konno, T.<br />

B. Zechmann, M. Müller, G. Zellnig<br />

S. Van Aert, A. den Dekker, D. Van J. Bernardi<br />

Hashimoto, K. Umemura, T. Ohnishi<br />

Dyck<br />

16.00 Point Defect Detection using an Charge microscopy in insulating A TEM study of the precipitate<br />

Advanced ion beam milling method for Observing the spatio-temporal<br />

Electron microscopic rapid virus<br />

aberration-free STEM: what is possible samples<br />

microstructure in Al-Mg-Si <strong>all</strong>oys in fast <strong>and</strong> efficient sample preparation dynamics of proteins in the secretory diagnosis of negative-stained urine<br />

?<br />

H.J. Fitting, X. Meyza, C. Guerret- relation with hardness <strong>and</strong> thermal W. Gruenewald<br />

pathway with light microscopy<br />

samples can be useful in the diagnosis<br />

G. Anstis<br />

Piecourt, V. S. Kortov<br />

process<br />

M. Weiss (invited)<br />

<strong>and</strong> monitoring of polyomavirus<br />

E. Olariu, J.H. Chen, H.W. Z<strong>and</strong>bergen<br />

infections in renal transplant recipients<br />

J. Schroeder, B. Kraemer, F.<br />

Hofstaedter<br />

16.15<br />

Ultrastructural analysis of sperms in<br />

patients with oligoasthenospermia<br />

Coffee break<br />

D. Jezek, B. Colak, P. Romac, M.<br />

Balarin, O. Barcot<br />

16.30<br />

Annular dark field imaging in a Precipitate structures in Al-Mg-Si<br />

A prospective study on the use of the<br />

transmission electron microscope <strong>all</strong>oys related by Si-network<br />

molecular marker p16<br />

S. Bals, B. Kabius, M. Haider, V. S. Andersen, C. Marioara, R. Vissers,<br />

Radmilovic, C. Kisielowski<br />

A. Frøseth, P. Derlet<br />

Ink4a Measurement of stress <strong>and</strong> strain at the<br />

Application of FIB to support<br />

nanometre scale by high - resolution<br />

semiconductor process development<br />

as an adjunct<br />

electron microscopy<br />

H. Bender (invited)<br />

Coffee break<br />

in liquid-based cervical cytology<br />

M. Hÿtch, J.-L. Putaux, J.-M. Pénisson<br />

G. Boulet, S. Sahebali, C. Depuydt et al.<br />

16.45 (invited) Intensity variations of the atomic Cryst<strong>all</strong>ography of precipitates of the S-<br />

columns in HR HAADF-STEM images phase in Al-Cu-Mg <strong>all</strong>oys<br />

originating from lattice distortions G. Winkelman, K. Raviprasad, B.<br />

Coffee break<br />

M. Čeh, S. Sturm, M. Shiojiri<br />

Muddle<br />

17.00 TEM investigations of Indium<br />

Which forms of microscopy will fill the The real structure of aluminium Topography in the ion beam cut<br />

segregation during epitaxial growth of energy/frequency gap in spati<strong>all</strong>y- diboride studied by HREM<br />

surfaces due to sputtering rate<br />

InP quantum wells on GaP<br />

resolved spectroscopy ?<br />

R. Ramlau, U. Burkhardt, V. Gurin, Y. differences; the role of sputtering<br />

H. Kirmse, R. Otto, I. Häusler, I. A. Howie<br />

Grin<br />

parameters<br />

Hähnert, W. Neumann, F. Hatami, W.T.<br />

A. Barna, M. Menyhard, A. Koos, L.P.<br />

Masselink<br />

Biro<br />

17.15 Optimum imaging conditions for strain Quantitative microscopy with a high- In situ T.E.M study of thermo-<br />

Quantitative comparison of the effect of<br />

state analysis of InGaN/GaN<br />

resolution FESEM in the transmission mechanical properties in Cu-Al-Ni focused ion beam milling in scanning<br />

heterostructures<br />

mode<br />

shape memory <strong>all</strong>oys<br />

electron microscope <strong>and</strong> transmission<br />

A. Rosenauer, D. Gerthsen<br />

V. Krzyzanek, H. Nüsse, R. Reichelt A. Ibarra, D. Caillard, J.M. San Juan, electron microscope dopant profiling<br />

M.L. Nó<br />

techniques<br />

P. Kazemian, A. Twitchett, C.<br />

Humphreys<br />

17.30 Carbon at Si(111)-twins: TEM analysis A new inclusive approach to remote Multiple step martensitic<br />

Sputtering-induced nanometre hole<br />

supported by molecular dynamics microscopy<br />

transformations in compression aged formation in Ni3Al under intense<br />

structure relaxations<br />

W. Costello, A. Bleloch, P. Goodhew, Ni-rich NiTi single crystals<br />

electron beam irradiation<br />

K. Scheerschmidt, M. Werner<br />

P. McBurney, R. Paton<br />

C. Somsen, J. Michutta, A. Yawny, G. B. Tang, I. Jones<br />

Eggeler

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