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InP-based polarisation independent wavelength demultiplexers

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4.3 Loss reduction 71<br />

On-chip loss [dB]<br />

0<br />

-10<br />

-20<br />

-30<br />

-40<br />

1510 1515 1520 1525 1530<br />

Wavelength [nm]<br />

4.2.4 Conclusions<br />

In this section the method for obtaining <strong>polarisation</strong> independence by using nonbirefringent<br />

waveguides has been presented. Two waveguide structures were analysed: the embedded<br />

square waveguide and the raised-strip waveguide. The first has the advantage that it is<br />

inherently <strong>polarisation</strong> <strong>independent</strong>, due to the identical lateral and transverse index contrast.<br />

For low-contrast waveguides, however, the bending radius becomes unpractically large,<br />

whereas the size of high-contrast waveguides gets into the submicron range, which puts<br />

stringent demands on the lithography. Additionally, an expitaxial regrowth is needed. The<br />

raised-strip waveguides at the other hand only need one single etching step for the production.<br />

Furthermore, they can be made relatively wide and thick, while maintaining their monomode<br />

nature. Also small bending radii can be used (even with a small GaAs-fraction in the guiding<br />

layer) due to the high lateral index contrast. Both structures have low fibre-chip coupling losses<br />

due to the circular mode profile, which gives a good match to the fibre mode. The raised-strip<br />

waveguide, however, has a higher potential for application because compact devices can be<br />

produced with a relatively simple manufacturing process.<br />

4.3 Loss reduction<br />

(a) (b)<br />

A significant part of the phased-array loss occurs at the junction between the array waveguides<br />

and the FPR. At this junction the field in the waveguide section shows a very deep modulation<br />

(figure 2.10a, solid line) caused by the trenches between the array waveguides. Due to the<br />

ripple in the field pattern, a considerable fraction of the power is diffracted into adjacent<br />

orders. As the coupling efficiency is found from the overlap of the sum field of the array<br />

waveguides and the far field (dashed line), filling the zeros between the individual waveguide<br />

modes (figure 2.10b, solid line) allows for an increase of the coupling efficiency. This can be<br />

obtained by the insertion of a shallowly etched transition region (TR) between the deeply<br />

etched array waveguides and the FPR [33]. This method has successfully been applied earlier<br />

to waveguide bends in order to reduce the bending and scattering losses [102].<br />

On-chip loss [dB]<br />

0<br />

-10<br />

-20<br />

-30<br />

-40<br />

1480 1482 1511 1513<br />

Wavelength [nm]<br />

1544 1546<br />

Figure 4.10 Measured <strong>wavelength</strong> response of all channels (a), and of a single<br />

channel for different orders of operation (b), both for TE (solid lines) and TM<br />

<strong>polarisation</strong> (dashed lines).

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