Review of TXRF Applications for Trace Elemental Analysis

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Principles of total reflection X-ray fluorescence (TXRF) spectroscopy Total reflection X-ray fluorescence spectroscopy monochromator X-ray tube detector sample disc • Samples must be prepared on a reflective media • Polished quartz glass or polyacrylic glass disc • Dried to a thin layer, or as a thin film or microparticle Beam angle: 0 o / 90 o
Principles of total reflection X-ray Quantification C i = C IS ⋅ N N IS C i: Element concentration i ⋅ ⋅ S S i IS C IS: Internal standard concentration N i: Element net countrate N IS: Internal standard net countrate S i: Element sensitivity factor S IS: Internal standard sensitivity factor
Page 1 and 2: Review of TXRF Applications for Tra
Page 3 and 4: Principles X-ray fluorescence (XRF)
Page 5 and 6: Principles of ED X-ray fluorescence
Page 7 and 8: Principles of WD X-ray fluorescence
Page 9: Principles of total reflection X-ra
Page 13 and 14: Principles of total reflection X-ra
Page 15 and 16: Elements measured by the Mo PICOFOX
Page 17 and 18: TXRF Spectrum Multi-element standar
Page 19 and 20: The instrument - S2 PICOFOX Benchto
Page 21 and 22: Current research areas Environmenta
Page 23 and 24: Sample preparation Final steps dry
Page 25 and 26: Liquid Samples Trace Element Analys
Page 27 and 28: Application studies Sample preparat
Page 29 and 30: Application studies Sample preparat
Page 31 and 32: Application studies Wheat Flour De
Page 33 and 34: Application studies Wheat Flour Res
Page 35 and 36: Application studies Palladium Analy
Page 37 and 38: Sample preparation Microparticles M
Page 39 and 40: Particles Characterization of nanop
Page 41: © Copyright Bruker Corporation. Al

Review of TXRF Applications for Trace Elemental Analysis

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