11.09.2013 Views

Review of TXRF Applications for Trace Elemental Analysis

Review of TXRF Applications for Trace Elemental Analysis

Review of TXRF Applications for Trace Elemental Analysis

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Particles<br />

Characterization <strong>of</strong> nanoparticles<br />

Results<br />

even smallest sample<br />

amounts allow the<br />

determination <strong>of</strong><br />

element ratios in<br />

nanoparticles<br />

S2 PICOFOX<br />

“Standardless”<br />

analysis applied<br />

Ratio (wt.-%)<br />

12<br />

10<br />

8<br />

6<br />

4<br />

2<br />

0<br />

10<br />

Element ratios <strong>of</strong> nanoparticles<br />

1<br />

Zn/S Cd/Se Zn/Cd<br />

Measured ratios <strong>of</strong> 3 samples<br />

versus target value ()<br />

4<br />

Sample 1<br />

Sample 2<br />

Sample 3

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