Review of TXRF Applications for Trace Elemental Analysis
Review of TXRF Applications for Trace Elemental Analysis
Review of TXRF Applications for Trace Elemental Analysis
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Application Examples<br />
Conclusion<br />
Accuracies and Sensitivities comparable to AAS or ICP without the need <strong>for</strong><br />
complex and time-consuming sample preparation and instrument calibration<br />
• Ability to analyze minute<br />
samples<br />
• Allows <strong>for</strong> analysis <strong>of</strong> toxic<br />
and nutritious elements at<br />
very low levels<br />
• Virtually any sample is<br />
possible with limited<br />
sample prep (powders,<br />
nanoparticles, liquids, thin<br />
films, etc.)<br />
• Elements Na to U within one<br />
measurement<br />
• Detection limits <strong>of</strong> 1 to 100 ppb<br />
<strong>for</strong> most elements
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