Review of TXRF Applications for Trace Elemental Analysis

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Typical TXRF Results Multi-element standard Element Conc./(mg/l) LLD/(mg/l) Ca 0.991 0.003 Ti 0.997 0.003 V 0.986 0.002 Cr 0.994 0.002 Mn 1.015 0.002 Fe 0.996 0.001 Co 1.006 0.001 Ni 1.005 0.001 Cu 1 0.001 Zn 0.989 0.001 As 1.019 0 Se 1.1 0 Sr 0.987 0
The instrument - S2 PICOFOX Benchtop TXRF Spectrometer S2 Picofox Metal ceramic X-ray tube Mo or W anode Air cooled Multilayer Monochromator Xflash ® silicon drift detector Electro-thermally cooled ≤149 eV @ MnKα 100 kcps Automatic Version 25 sample cassette changer
Page 1 and 2: Review of TXRF Applications for Tra
Page 3 and 4: Principles X-ray fluorescence (XRF)
Page 5 and 6: Principles of ED X-ray fluorescence
Page 7 and 8: Principles of WD X-ray fluorescence
Page 9 and 10: Principles of total reflection X-ra
Page 15 and 16: Elements measured by the Mo PICOFOX
Page 17: TXRF Spectrum Multi-element standar
Page 21 and 22: Current research areas Environmenta
Page 23 and 24: Sample preparation Final steps dry
Page 25 and 26: Liquid Samples Trace Element Analys
Page 27 and 28: Application studies Sample preparat
Page 29 and 30: Application studies Sample preparat
Page 31 and 32: Application studies Wheat Flour De
Page 33 and 34: Application studies Wheat Flour Res
Page 35 and 36: Application studies Palladium Analy
Page 37 and 38: Sample preparation Microparticles M
Page 39 and 40: Particles Characterization of nanop
Page 41: © Copyright Bruker Corporation. Al

Review of TXRF Applications for Trace Elemental Analysis

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