Consumer/Commercial Qualification Plan

Objective: MPC5121e Commercial Substrate Redesign Qualification Summary Results
Freescale PN:
Customer Name(s):
Summary
Rev 1.0
Part Name: MPC5121e PN(s): Varies
Revision # & Date: 9 February 2010
Technology: CMOS90LP
Package: TEPBGA 516 27 x 27 mm Design Engr: Andreas Stahl
QUARTZ Tracking #: 169520
Fab / Assembly /
(Signature/Date shown below
Final Test Sites: TSMC/SCK/SCK Product Engr: Kevin Kirkendoll
may be electronic)
Maskset#:
PPE Approval W.H. Tan
Rev#: M36P Prod. Package Engr: W.H. Tan
Signature & Date: 10 February 2010
Die Size (in mm)
NPI PRQE Approval Noel Arguello
W x L x T 6.52 x 6.02 mm NPI PRQE: Noel Arguello
Signature & Date: 10 February 2010
Part Operating
LOT A LOT B LOT C CAB Approval 09402811M
Temp. Grade: Spec = 0'C to 70'C Trace/DateCode: UHAA0944A
Signature & Date: 10 February 2010
Target Test Start
Customer Approval
Target Test Finish
Signature & Date:
This testing is performed by the Freescale (Austin) unless otherwise noted in the Comments
GROUP A - ACCELERATED ENVIRONMENTAL STRESS TESTS
STRESS TEST Reference Test Conditions
End Point Minimum # of Lots Total Units Results
Comments
(Surface Mount Devices Only - PC required Requirements Sample Size
including LotID-(#Rej/SS)
for THB, HAST, AC, UHST, TC, PC+PTC)
spares NA=Not Applicable
PC (Electrical) JESD22- Preconditioning :
TEST @ RH All surface mount devices prior to THB, HAST,
A113
J-STD-020
MSL 3 @ 260°C, +5/-0°C
AC, UHST, TC
PC (CSAM Only) JESD22- CSAM:
Pre-stress CSAM
11 1 11 Lot A: 0/11 Generic Data:
A113 MSL 3 @ 260°C, +5/-0°C
Post-stress CSAM
MPC5121, 516 TePBGA, 27 x 27
J-STD-020 CSAM SS=11 units per lot
mm, MSL3, 260C
These units may be a subset of the PC
(electrical) units
0/33 (Quartz # 110296)
THB JESD22- PC before THB required for SMDs.
TEST @ RH 80 3 0 Passed Generic Data:
A101
MPC5121, 516 TePBGA, 27 x 27
A110 Temperature-Humidity-Bias:
mm, MSL3, 260C
THB = 85°C/85%RH for 168, 504 & 1008 hrs.
0/231 @ 504 hours (Quartz #
Bias: VDUT 1 = 1.4V+5%, VDUT 2 = 3.3V+10%
Queue Time of 48hrs. MAX
110296)
TC JESD22-
A104
HTSL JESD22-
A103
Temperature Cycle:
TC = -55°C to +125°C for 400 cycles
High Temperature Storage Life:
150°C for 504, 1008 hrs
Timed RO = 96hrs. MAX
STRESS TEST Reference Test Conditions End Point
Requirements
HTOL JESD22-
A108
ELFR JESD22-
A108
High Temperature Operating Life:
Ta = 125°C for 168 hrs.
Tj =/< 175°C;
Bias: VDUT 1.8V, VDUT 4.0V
Early Life Failure Rate:
Ta = 125°C for 48 hrs and
1 year equivalent for commercial.
Bias: VDUT 1.8V, VDUT 4.0V
Timed RO of 24 hrs MAX
STRESS TEST Reference Test Conditions End Point
Requirements
WBS AEC Q100-
001
WBP MilStd883-
2011
SD JESD22-
B102
PD JESD22-
B100
DIMENSIONAL
&
BOM
VERIFICATION
TEST @ HC 240 1 240 Lot A: 0/240 Generic Data:
MPC5121, 516 TePBGA, 27 x 27
mm, MSL3, 260C
0/231 @ 400 cycles (Quartz #
110296)
TEST @ RH 80 1 0 Passed Generic Data:
MPC5121, 516 TePBGA, 27 x 27
mm, MSL3, 260C
0/231 @ 504 hours (Quartz #
110296)
Minimum
Sample Size
Note 1
# of Lots Total Units
including
spares
Results
LotID-(#Rej/SS)
NA=Not applicable
Comments
TEST @ RHC 77 3 0 Passed Generic Data:
MPC5121, C90LP, TSMC 12
0/231 @ 168 hours (Quartz #
136937)
TEST @ RHC 306 3 0 Passed Generic Data:
MPC5121, C90LP, TSMC 12
0/918 @ 48 hours (Quartz #
136937)
Minimum
Sample Size
Note 1
Wire Bond shear Cpk = or > 1.67 30 bonds
from minimum
5 units
Wire Bond Pull
Cond. C or D
Cpk = or > 1.67 30 bonds
from minimum
5 units
Solderability;
>95% lead coverage
8hr. Steam age (1 hr. for Au-plated leads) prior to of critical areas
test.
If production burn-in is done, samples must also
undergo burn-in.
Physical Dimensions -
PD per 98A drawing
a) PPE to verify PD against valid 98A drawing.
b) PPE to verify qual lot ERF BOM is accurate.
Consumer/Commercial Qualification Plan
TEST GROUP B - ACCELERATED LIFETIME SIMULATION TESTS
TEST GROUP C - PACKAGE ASSEMBLY INTEGRITY TESTS
# of Lots Total Units
including
spares
Results
LotID-(#Rej/SS)
NA=Not applicable
Comments
Note 2
1 0 Passed Generic Data:
MPC5121, 516 TePBGA, 27 x 27
mm, MSL3, 260C
0/28 Cpk >= 1.67
1 0 Passed Generic Data:
MPC5121, 516 TePBGA, 27 x 27
mm, MSL3, 260C
0/28 Cpk >= 1.67
15 1 0 Passed Generic Data:
MPC5121, 516 TePBGA, 27 x 27
mm, MSL3, 260C
Passed
Cpk = or > 1.67 10 3 0 Passed Generic Data:
MPC5121, 516 TePBGA, 27 x 27
mm, MSL3, 260C
0/30 Cpk >= 1.67

SBS AEC-Q100- Solder Ball Shear;
010 Performed on all solder ball mounted packages
e.g. PBGA, Chip Scale, Micro Lead Frame (but
NOT Flip Chip). No reflow cycle before shear.
Cpk = or >1.67 10
(5 balls from a
min. of 10
devices)
STRESS TEST Reference Test Conditions End Point
Requirements
TEST Freescale
48A
ESD
(HBM)
CLASSIFICATION
ESD
(CDM)
CLASSIFICATION
JESD22-
A114
JESD22-
C101
Pre- and Post Functional / Parametrics
Test software shall meet requirements of AEC-
Q100-007.
Testing performed to the limits of device
specification in temperature and limit value.
ElectroStatic Discharge/
Human Body Model Classification:
Test @ 500 / 1000 / 1500 / 2000 / 2500
Volts(FYI)
See AEC-Q100-002 for classification levels.
ElectroStatic Discharge/
Charged Device Model Classification:
Test @ 125 / 250 / 500 / 750 / 1000 Volts
Timed RO of 96hrs MAX.
LU JESD78 Latch-up:
Test per JEDEC JESD78
Ta= Operating Temperature Maximum (ROOM
and HOT)
ED AEC-Q100-
009,
Freescale
48A spec
Electrical Distribution/Drift Analysis
(Pre and Post HTOL)
NBTI Identify the speed pattern that drifts the most and
create guardband if needed. (Two rdpts -
TimeZero and at final NBTI readpoint). Serialized
CONTROL /
CORRELATION
UNITS
Freescale
12MYS-
62419B
FG AEC-Q100-
007
units
Correlation units are required for NBTI drift
analysis.
TEST @ RH
2KV min.
TEST @ RH
500V min
Minimum
Sample Size
0 Fails All All All
3 units per
Voltage level
3 units per
Voltage level
3 0 Passed Generic Data:
MPC5121, 516 TePBGA, 27 x 27
mm, MSL3, 260C
0/15 Cpk >= 1.67
# of Lots Total Units Results
LotID-(#Rej/SS)
NA=Not applicable
Comments
1 0 Passed Generic Data:
MPC5121e Consumer
0/3 @ 500V
0/3 @ 1000V
0/3 @ 1500V
3/3 @ 2000V
3/3 @ 2500V
1 0 Passed Generic Data:
MPC5121e Consumer
0/3 @ 125V
0/3 @ 250V
0/3 @ 500V
3/3 @ 750V
3/3 @ 1000V
TEST @ RH 6 1 0 Passed Generic Data:
MPC5121e Consumer
0/6
TEST @ RHC
Cpk = or > 1.67
Fault Grading FG shall be = or >
90% for qual units
TEST GROUP E - ELECTRICAL VERIFICATION TESTS
5 3 0 Passed Generic Data:
MPC5121e Consumer
All Cpk > 1.67 except for
ABIST_61 speed pattern on first
qual lot. The Vt targets were
changed for subsequent lots with
a Cpk > 1.67.
TEST @ RHC 70 3 0 Completed Generic Data:
MPC5121e Consumer
NA 25 3 0
FG%= TBD Production Test has higher %
criteria; see AEC-Q100-007 for
details