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SDS 2009<br />

<strong>Performance</strong> <strong>and</strong> <strong>spectroscopic</strong> behavior <strong>of</strong><br />

<strong>DePFET</strong> Macropixels<br />

Thomas Lauf 1,3 , Sven Herrmann 1,3 , Peter Lechner 3,6 , Gerhard Lutz 3,6 , Michael Krumrey 5 ,<br />

Matteo Porro 1,3 , Rainer Richter 2,3 , Frank Scholze 5 , Lothar Strüder 1,3 , Johannes Treis 3,4 , Giulio de Vita 1,3<br />

1 Max-Planck-Institut für extraterrestrische Physik<br />

2 Max-Planck-Institut für Physik<br />

3 MPI Halbleiterlabor<br />

4 Max-Planck-Institut für Sonnensystemforschung<br />

5 Physikalisch-Technische Bundesanstalt<br />

6 PNSensor GmbH<br />

08/06/2009


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 2/18<br />

<strong>DePFET</strong> Macropixels<br />

• What is a <strong>DePFET</strong> Macropixel?<br />

• How is such a device operated?<br />

• First results <strong>of</strong> measurements at the BESSY<br />

synchrotron facility


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 3/18<br />

<strong>DePFET</strong> Macropixels<br />

Depleted P-channel Field Effect Transistor<br />

• Persistent potential minimum<br />

(Internal gate)<br />

• Low readout noise<br />

• First stage amplification<br />

Cut through a <strong>DePFET</strong> pixel cell


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 4/18<br />

<strong>DePFET</strong> Macropixels<br />

• Macropixel:<br />

Combination <strong>of</strong> Silicon Drift Detector (SDD)<br />

<strong>and</strong> <strong>DePFET</strong> readout device<br />

• Properties<br />

Decoupling <strong>of</strong> readout capacitance <strong>and</strong> size (SDD)<br />

Charge storage (<strong>DePFET</strong>)<br />

Readout on dem<strong>and</strong> (<strong>DePFET</strong>)<br />

Low readout capacity (<strong>DePFET</strong>)<br />

First stage amplification (<strong>DePFET</strong>)


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 5/18<br />

<strong>DePFET</strong> Macropixels<br />

• Homogeneous entrance window<br />

• 100% fill factor<br />

• Fully depleted bulk<br />

• Pixel sizes: 100 μm - 1 cm<br />

Cut through a macropixel cell


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 6/18<br />

<strong>DePFET</strong> Matrices<br />

Readout scheme<br />

- Global drain contact<br />

- Gate,Clear <strong>and</strong> Cleargate<br />

connected row-wise<br />

- Sources connected column-wise<br />

- Only one row is turned on <strong>and</strong><br />

read out<br />

Source follower readout<br />

- Column bias by current source<br />

- Alternatively: Conversion <strong>of</strong><br />

drain current


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 7/18<br />

<strong>DePFET</strong> Matrices<br />

ROW<br />

60<br />

50<br />

40<br />

30<br />

20<br />

10<br />

0<br />

0 10 20 30 40 50 60<br />

COLUMN<br />

4500<br />

4000<br />

3500<br />

3000<br />

2500<br />

2000<br />

1500<br />

1000<br />

500<br />

0<br />

ENERGY[ADU]<br />

• Frame stored in File<br />

• Subtract Offset<br />

• Filter Events<br />

– Discard data below<br />

threshold<br />

– Cluster adjacent pixels:<br />

• Singles (Sng)<br />

• Doubles (Dbl)<br />

• Triples (Trp)<br />

• Quadruples (Qud)


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 8/18<br />

<strong>DePFET</strong> Matrices<br />

Accumulated energy values


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 9/18<br />

<strong>DePFET</strong> Matrices<br />

Spectrum <strong>of</strong> an Fe55 source<br />

Energy resolution for all valid patterns<br />

ALL<br />

#<br />

Constant: 24283.18<br />

10<br />

4<br />

SNG<br />

DBL<br />

4<br />

10<br />

Mean: 5897.72<br />

TRP<br />

QUD<br />

Sigma: 54.49<br />

Counts<br />

10<br />

10<br />

3<br />

2<br />

3<br />

10<br />

2<br />

10<br />

FWHM: 128.31<br />

10<br />

10<br />

1<br />

0 2000 4000 6000 8000 10000 12000 14000 16000<br />

Energy [eV]<br />

1<br />

3000 4000 5000 6000 7000 8000 9000<br />

Energy [eV]<br />

Energy [eV]


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 10/18<br />

<strong>DePFET</strong> Macropixels<br />

Simbol-X detector hybrid, 500 μm pixel egde, 64x64 pixels


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 11/18<br />

Measurements & Results<br />

Measurements conducted at BESSY synchrotron facility<br />

• Linearity & Homegeneity<br />

Detector response to monoenergetic beam<br />

Measurements from 100 eV to 10 keV<br />

(Double Crystal Monochromator & SX700)<br />

• Charge collection<br />

Detector in tank conntected<br />

to SX700 beampipe


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 12/18<br />

Measurements & Results<br />

Some example spectra<br />

Counts Counts<br />

4<br />

10<br />

3<br />

10<br />

2<br />

10<br />

10<br />

1<br />

4<br />

10<br />

3<br />

10<br />

2<br />

10<br />

10<br />

ALL<br />

SNG<br />

DBL<br />

TRP<br />

QUD<br />

0 2000 4000 6000 8000 10000 12000 14000 16000<br />

ALL<br />

SNG<br />

DBL<br />

TRP<br />

QUD<br />

E=10 keV E=7.5 keV<br />

E=2.5 keV<br />

4<br />

10<br />

3<br />

10<br />

2<br />

10<br />

10<br />

1<br />

4<br />

10<br />

3<br />

10<br />

2<br />

10<br />

10<br />

ALL<br />

SNG<br />

DBL<br />

TRP<br />

QUD<br />

0 2000 4000 6000 8000 10000 12000 14000 16000<br />

ALL<br />

SNG<br />

DBL<br />

TRP<br />

QUD<br />

E=1.0 keV<br />

1<br />

0 2000 4000 6000 8000 10000 12000 14000 16000<br />

Energy [keV]<br />

1<br />

0 2000 4000 6000 8000 10000 12000 14000 16000<br />

Energy [keV]


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 13/18<br />

Measurements & Results<br />

Gain maps at different energies<br />

Row<br />

60<br />

Row<br />

60<br />

50<br />

50<br />

40<br />

30<br />

20<br />

10<br />

E = 7.5 keV<br />

Gain = 1.26 eV/ADU<br />

Var = 2.12 %<br />

40<br />

30<br />

20<br />

10<br />

E = 2.5 keV<br />

Gain = 1.27 eV/ADU<br />

Var = 1.71 %<br />

1.7<br />

1.6<br />

Gain [eV/ADU]<br />

0<br />

0 10 20 30 40 50 60<br />

Column<br />

0<br />

0 10 20 30 40 50 60<br />

Column<br />

1.5<br />

Row<br />

60<br />

Row<br />

60<br />

1.4<br />

50<br />

40<br />

30<br />

20<br />

E = 1.0 keV<br />

Gain = 1.28 eV/ADU<br />

Var = 2.58 %<br />

50<br />

40<br />

30<br />

20<br />

E = 0.5 keV<br />

Gain =1.30 eV/ADU<br />

Var = 2.88 %<br />

1.3<br />

1.2<br />

10<br />

10<br />

0<br />

0 10 20 30 40 50 60<br />

Column<br />

0<br />

0 10 20 30 40 50 60<br />

Column


Measurements & Results<br />

Linearity Measurements<br />

Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 14/18


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 15/18<br />

Measurements & Results<br />

• Linearity measurements<br />

Measurements from 100 eV to 10 keV<br />

Scanning detector surface with monoenergetic beam<br />

• Charge collection measurements<br />

Scanning 3x3 pixel patch with 100 μm beam<br />

Step width 50 μm<br />

961 single measurements for whole scan


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 16/18<br />

Measurements & Results<br />

Pixel Scans<br />

Relative Count Maps<br />

E = 5 keV<br />

Singles<br />

Doubles<br />

Scan Pos Y [mm]<br />

Relative Counts<br />

Scan Pos X [mm]


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 17/18<br />

Measurements & Results<br />

Pixel Scans<br />

Average Charge Maps<br />

E = 5 keV<br />

Singles<br />

5100<br />

Doubles<br />

5100<br />

0.8<br />

5000 0.8<br />

5000<br />

Scan Pos Y [mm]<br />

0.6<br />

0.4<br />

0.2<br />

0<br />

-0.2<br />

4900<br />

0.6<br />

4800<br />

4700 0.4<br />

4600 0.2<br />

4500<br />

0<br />

4400<br />

4300 -0.2<br />

4900<br />

4800<br />

4700<br />

4600<br />

4500<br />

4400<br />

4300<br />

Charge [eV]<br />

-0.4<br />

4200<br />

-0.4<br />

4100<br />

4200<br />

4100<br />

-0.2 0 0.2 0.4 0.6 0.8 1 1.2<br />

-0.2 0 0.2 0.4 0.6 0.8 1 1.2<br />

Scan Pos X [mm]


Thomas Lauf, MPE / MPI Halbleiterlabor<br />

08/06/2009 18/18<br />

Conclusions & Outlook<br />

• Macropixels matrix showed excellent linear response<br />

• Gain is very homogeneous over matrix<br />

• No charge loss within pixel area detected in selected<br />

patch<br />

• Will use detector for XRF experiment at ELETTRA (Triest)<br />

• Continue analysis <strong>of</strong> measurement data<br />

• Derive quantum efficiency<br />

• Exp<strong>and</strong> range to higher energies


SDS 2009<br />

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