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Welcome to SWTW - 2008 - Semiconductor Wafer Test Workshop

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<strong>SWTW</strong>-2007 Awards<br />

Best Poster Presentation<br />

“Design Considerations for Parametric-RF Probing<br />

in Production <strong>Test</strong> Environments ”<br />

Roger Hayward<br />

Bob Hansen<br />

Cascade MicroTech<br />

Lifetime Achievement Award<br />

Presented <strong>to</strong> …<br />

William Mann<br />

SW-<strong>Test</strong> <strong>Workshop</strong><br />

Founder and Chair Emeritus<br />

June 8 <strong>to</strong> 11, <strong>2008</strong><br />

IEEE SW <strong>Test</strong> <strong>Workshop</strong> 16

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