Welcome to SWTW - 2008 - Semiconductor Wafer Test Workshop
Welcome to SWTW - 2008 - Semiconductor Wafer Test Workshop
Welcome to SWTW - 2008 - Semiconductor Wafer Test Workshop
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“How’s s My Driving?”<br />
• Organization and Technical Program …<br />
– Jerry Broz, Ph.D., International <strong>Test</strong> Solutions, General Chair<br />
– William Mann, Chair Emeritus and Social Coordina<strong>to</strong>r<br />
– Brett Crump, Micron Technology, Program Chair<br />
– Maddie Harwood, CEM Inc, Registration and Finance Chair<br />
– Meredith Griffith, CEM Inc., Exhibits / Registration Coordina<strong>to</strong>r<br />
Program Committee and Steering Committee<br />
• Ken Karklin, Touchdown Technologies<br />
• Patrick Mui, JEM America<br />
• Roger Sinsheimer, Xandex<br />
• Fred Taber, BiTS <strong>Workshop</strong><br />
– Proceedings Coordina<strong>to</strong>r<br />
• Warren “Stu” Crippen, Intel<br />
• Nadine Aldahhan, Freescale<br />
• Jack Courtney, IBM<br />
• Ger Koch, NXP Semiconduc<strong>to</strong>r<br />
• Michael Egloff, AMD<br />
• Michael Harris, Texas Instruments<br />
• Rey Rincon, Consultant<br />
June 8 <strong>to</strong> 11, <strong>2008</strong><br />
IEEE SW <strong>Test</strong> <strong>Workshop</strong> 7
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