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'HVLJQDQG$QDO\VLVRID<br />

*+]/RZ1RLVH$PSOILHUÃ<br />

by<br />

John Wetherell<br />

and<br />

Burcin Baytekin<br />

EE217 Project<br />

June 14th 1999


Table of Contents<br />

Section<br />

Page<br />

I. Introduction 2<br />

II. Emitter Degeneration Sizing 3<br />

III. Input Parameters 4<br />

IV. Process Parameters 5<br />

V. Architecture Selection 6<br />

VI. Small Signal Analysis 7<br />

VII. Scattering Parameter Analysis 8<br />

VIII. Stability Analysis 9<br />

IX. Ballast Resistor Sizing 10<br />

X. Simultaneous Conjugate Matching Analysis 11<br />

XI. Noise Analysis 12<br />

XII. Equivalent Input Noise Elements 13<br />

XIII. Noise Correlation 14<br />

XIV. Optimal Source Impedance to Trade of Noise and Power 15<br />

XV. Gain Analysis 16<br />

XVI. Distortion Analysis 17<br />

XVII. LNA Figures of Merit 18<br />

XVIII. Optimization 19<br />

XIX. Package Deibedding 20<br />

XX. Impedance Matching 21<br />

XXI. Simulation Procedure 22<br />

XXII. Simulation Results 23<br />

XXIII. Comparison of Simulation and Calculation Results 24<br />

XXIV. Conclusions 25<br />

XXV. References 26


Introduction<br />

Low noise amplifiers are useful for a variety of applications, where small signals are received.<br />

This report is written specifically for the application in a IS-95B cellular telephone handset. The<br />

routines developed to design an analyze the amplifier are organized in a way so that the design<br />

process is completely automated after entry of the process parameters and high level system<br />

specifications. Also the procedure is general purpose that keyu equations can be replaced so the<br />

routine is suitable for other configurations and devices, such as GaAs and MOSFETs. After the<br />

<strong>Mathcad</strong> automated design is complete, the results are used as a starting point for simulations on<br />

a commercial simulation tool. The graphs of performance parameters as a function of device size<br />

and current serve as a guideline for the iterations of simulations. The final simulated results for<br />

amplifier are summarized and conclusions are made.<br />

The low noise amplifier designed for this project is part of a larger project. The specifications<br />

for the amplifier were developed for use in the handset of a 1900MHz CDMA cellular telephone.<br />

The actual specifications involve trade-offs with blocks which occur later in the receiver chain. A<br />

collection of more than 16 impedance matching routines were also developed in previous project<br />

unrelated to the system analysis. These collection of routines are easily available on the<br />

following website: http://www.eecs.berkeley.edu/~wetherel/rftoolbox/matcher.html. The<br />

system analysis and the impedance matching network design routines were used as a<br />

foundation for the automated low noise amplifier design tool.<br />

An interesting comment on the report for this project is that it is written entirely in <strong>Mathcad</strong>, a<br />

tool for simultaneuous word processing and mathematics computation. This combination of<br />

features makes the report a "living" document. With a few clicks the reader can modify the LNA<br />

design for his/her specific system and process specifications. In a world where processes<br />

change every few years and new specifications are needed just as often the design automation of<br />

LNAs is a very useful feature. The use of <strong>Mathcad</strong> also allowed the rapid entering of design<br />

equations from available books on radio frequency circuit design. These equations include those<br />

for simultaneous conjugate impedance matching [ ] and distortion analysis of common-emitter<br />

amplifiers [ ].


a<br />

es[]<br />

Emitter Degeneration Sizing<br />

It is known that inductive emitter degeneration is an effective method of making the optimal<br />

source impedance for minimum noise figure (noise match) close to the optimal source<br />

impedance for conjugate matching (power gain match). Increasing emitter inductance does this<br />

by increasing the input impedance, but with little effect on the noise match. Also on the positive<br />

side, inductive emitter degeneration also helps to linearize the device and improve high<br />

frequency stability. On the minus side emitter degeneration reduces the gain of the amplifier.<br />

Similarly, for a device with fixed lower limit for emitter degeneration, the device size may be<br />

changed match the noise and power source impedances. If the required device size to provide<br />

simultaneous match is too large, which is indicated by low gain, more inductance can be added<br />

to the emitter to provide the simultaneous match. If the device becomes too small to meet noise<br />

requirements, a simultaneous match cannot be acheived. For a given noise figure goal, an<br />

upper limit is set on emitter degeneration to acheive a simultaneous power and noise match.<br />

This upper limit is very frequently exceeded, as is in the case of this design, so a method has<br />

been developed to trade off the noise and power matches to find the optimal source impedance<br />

for the transistor.<br />

For all fabricated devices, there is some inherent inductance in the emitter of the transistor<br />

from the bonding wire which connects the emitter to the pin and the outside of the chip. The<br />

value of this inductance is in the range of 0.4nH to 4nH, with a carefully-designed typical value of<br />

around 2.2nH. For the following design a low inductance ball grid array package is assumed<br />

with an inductance of 1.5nH.<br />

Project To Do List<br />

Units and Constants<br />

Input Parameters<br />

The following list contains the input parameters used to optimize the amplifier. The<br />

optimization routine uses these values of intercept point, noise figure, and current as constraints.<br />

Ideally the optimal LNA design would ask the user enter in the backend noise figure and intercept<br />

point. The routine would then design the LNA for maximum output C/(N+I) (carrier to noise plus<br />

interference ratio). This is equivalent to maximizing SNDR (signal to noise plus distortion ratio)<br />

for the system. The derivation of C/(N+I) has not been completed so the input parameters are<br />

determined from the following system needs:


∆f: The frequency spacing of the undesired signals from the desired signals. This is used for<br />

distortion calculations.<br />

S11: The maximum desired S11 is determined by the external filter connected to the LNA.<br />

This external filter relies on the low noise amplifier to have a certain impedance to provide given<br />

filtering characteristics.<br />

Gain: The minimum and maxmium desired gain constraints are set by the noise of the<br />

system behind the amplifier.<br />

V DD : The supply voltage is set by the end-of life voltage of three Lithium Ion AA batteries<br />

plus some loss for a voltage regulator. Normally they are 1.5V each, which corresponds to a<br />

normal operating voltage of 4.5V. At end of life they are 1V each, which corresponds to a 3V<br />

supply. The voltage regulator output can vary up to 10%, which gives a minimum supply voltage<br />

of 2.7V.<br />

Temp: The normal operating temperature of the device is a room temperature of 27C plus<br />

some die heating of 15C to due nonideal heat sinking. The actual operating temperature in a<br />

worst case environment may vary between -30C and 105C, but was not added to the design<br />

routine, because of time constraints.<br />

Z bias : The bias impedance is chosen by the practical size limitation of an on-chip inductor to<br />

be used as a bias choke. A 50nH inductor is assumed with a Q of 3 at 1.9 GHz.<br />

K Factor: The desired minimum K factor is somewhat of a guess. In order to simultaneously<br />

conjugate match the input and output ports of the device, the K factor must be greater than one.<br />

If the K factor is set equal to one the real part of the conjugate matching impedance of the source<br />

becomes zero ohms, which is infeasible. For this reason the K factor is set to a value somewhat<br />

larger than one. Although the value was chosen with an educated guess, a real practical value<br />

for K can be calculated by setting a lower limit to the input impedance or an upper limit to the<br />

input matching network, and using it to solve for the K.<br />

NF: The noise figure is determined by the value of the received signal when the cellular<br />

phone is operated at it’s farthest distance from the base station. Here the noise level of the<br />

receiver must be a significant value below the small desired signal.<br />

IP 3 : The third order intercept point is a measure of the low noise amplifiers ability to reject<br />

unwanted signals, such as another cellular phone. When the cellular phone is being used at it’s<br />

greatest distance from base station the phone must be able distinguish the desired signal from<br />

another cellular phone.<br />

∆f 10 MHz Jammer Frequency Spacing<br />

f 1900 MHz ω 2. π . f s j. ω<br />

Frequency of Desired Signal<br />

S 11goaldB 15 dB Input Match Requirement<br />

IP 3goaldBm 10 dBm 3rd Order Intercept Point Requirement<br />

G goaldB 13.5 dB G min 12 dB G max 15 dB Available Power Gain Requirement<br />

Z bias 100 Ω j2 . . π . f 50<br />

. nH Bias Impedance<br />

K val 1.1 Desired In-band Stability Factor<br />

V DD 2.7 V Supply Voltage<br />

Temp 300 K Operating Temperature<br />

N 40 Number of Devices in Parallel<br />

10. mA<br />

Bias Current<br />

I C<br />

The optimizer will find the best value for current and area. The entered values are used for<br />

function testing purposes and graphing.<br />

C/(N+I) Optimization Inputs


Process Description<br />

The process used to simulate the amplifier is a 0.5 µm Silicon Germanium BiCMOS process.<br />

The following process parameters are measured for a single bipolar transistor, whose emitter size<br />

measures 5µm by 2.5µm. Although this device size is suitable for prescalers and low frequency<br />

operations, larger devices are better suited for low noise amplifiers. Increasing the device size<br />

has the beneficial effect of reducing the base resistance, and thus the input referred thermal<br />

noise of the amplifier. Increasing the device size has the detrimental effect of reducing the gain,<br />

increasing the input referred current noise. A more detailed discussion of these effects is given<br />

later.<br />

Other process parameters<br />

I S<br />

C µ0<br />

2.2 . 10 18 A<br />

3.41 fF<br />

Reverse Saturation Current of<br />

Base Emitter Diode<br />

. V jc 0.386 V m jc 0.11 x jc 0.82872 Collector Emitter Capacitance Parameters<br />

C cs0 6.47. fF V js 0.34 V m js 0.178 Collector Substrate Capacitance<br />

Parameters<br />

V A 71.87 V Forward Early Voltage<br />

β 0 146.15 DC Beta<br />

τ F<br />

2.15. pS<br />

Base Transit Time<br />

r b0 177.66 ohm R e0 11.71 ohm R c0 75.42 ohm Base, Collector, and Emitter Resistances<br />

C je0<br />

10.82 . fF V je 1.48 V m je 0.679 Base Emitter Capacitance Parameters<br />

Scaling Model Parameters with Device Size<br />

The small signal model used for the transistor is a relatively simple model. The resistances<br />

and capacitances of the transistor are assumed to scale linearly with the area of the emitter. The<br />

resistances are reduced by a factor of N as the device size increases, and the capacitances are<br />

increased by N as the device size increase. In reality, for small devices the base resistance<br />

stays relatively constant with device size, because of the added resistance and capacitance<br />

associated the contacts. In most practical LNA’s large devices are used so linear scaling is a<br />

good assumption.<br />

Small-signal parameters


Architecture Selection<br />

Amplifier Evolution<br />

The simplest versions of common emitter and common base amplifiers are shown in the<br />

following figure. They are essentially the same amplifier with the ground connection placed on<br />

the emitter and the base respectively. The distortion output power of these two amplifiers is<br />

identical, but the concept of input referred distortion and noise power is invalid, because the<br />

source impedance is zero ohms.<br />

I out<br />

I out<br />

V S<br />

V S<br />

Fig. 1: Unmatched Undegenerated Common Emitter and Common Base LNA<br />

All real amplifier have some value for source impedance. For high frequency amplifiers, this<br />

impedance is typically provided by a low loss matching network to a 50 ohm input. The value of<br />

the source impedance seen by the amplifier is usually somewhere between the optimal value for<br />

minimum noise and maximum gain. For a typical common emitter amplifier with good<br />

performance, the desired source impedance is close to 50 ohms. For a common base amplifier<br />

the desired source impedance is much smaller than 50 ohms. The large impedance difference<br />

of a common base amplifier from 50ohms requires a high-Q matching network. High Q matching<br />

networks usually have narrower bandwidths, more in-band loss, and are more sensitivity to<br />

process variations. This will degrade the performance of the common base amplifier. The<br />

distortion performance of the matched undegenerated common emitter and common base are<br />

similar.<br />

I out<br />

I out<br />

Z S<br />

V S<br />

V S<br />

Z S<br />

Fig. 2: Matched Undegenerated Common Emitter and Common Base LNA<br />

Usually the distortion and stability performance of a undegenerated amplifier is very poor, so<br />

it is desirable to place local or global feedback around the amplifier to improve it’s performance.<br />

For a bipolar amplifer, this is easily done with some inductance in the emitter of the amplifier.<br />

This inductance also helps to make the optimal source impedance for minimum noise figure<br />

closer to the conjugate match source impedance. For a common-base it is much more difficult to<br />

linearize the amplifier, because impedances in the base have little effect on the amplifier<br />

distortion. Furthermore, inductances in the base tend to destabilize the amplifier. Incidentally,<br />

inductance in the base is an common effective way to build an oscillator, such as the Colplitt’s<br />

oscillator. Our goal here is to build an amplifier, not an oscillator, so inductance in the base is<br />

undesirable.


undesirable.<br />

Common Emitter Amplifier<br />

For the reasons of stability, low distortion, low noise, and input matching described above,<br />

an inductively degenerated common emitter configuration was chosen for the input stage of the<br />

amplifier design. The circuit is shown in the following figure. A simplified equation for the<br />

intercept point is given in the following equation [2].<br />

I out<br />

Z S<br />

V S<br />

L e<br />

Fig. 3: Matched Degenerated Common Emitter LNA<br />

IP 3ce 10<br />

10 log<br />

8I . 4. Cce ω 4 . 4<br />

L e . 1<br />

2<br />

V T<br />

I . C τ F<br />

V . T C . je0 Area<br />

2<br />

. Intercept Point of a Common-Emitter LNA<br />

Now that the first stage of the amplifier is chosen, we still have the architectural choice of<br />

adding a common base configuration (the cascode) to the output of the common emitter (the<br />

driver) configuration. This configuration is also known as a cascode configuration. The cascode<br />

configuration has the increased gain and reverse isolation advantages of all cascaded amplifiers.<br />

Unfortunately it also has the reduced dynamic range disadvantage of cascaded amplifiers from<br />

increased distortion and increased noise.<br />

When the cascode configuration is compared against two cascaded common emitter<br />

amplifiers, we see the performance is much worse. This is because first the common emitter is<br />

not matched to the common base and second because the second common base stage is not<br />

degenerated resulting in higher distortion. This disadvantage is reduced at lower frequencies as<br />

will be discussed below. If a primary goal of the amplifier was low noise and high gain it is<br />

possible to increase the performance of the amplifier with an impedance matching circuit<br />

between the common emitter and common base transistors. Unfortunately, this has the<br />

undesirable effect of reducing input referred distortion. This distortion increase comes from two<br />

different mechanisms. The first mechanism is from the increased swing at the emitter of the<br />

cascode transistor, which increases the distortion in the cascode transistor. The second<br />

mechanism comes from saturating the collector of first stage amplifier. The second mechanism<br />

can be alieviated with a higher bias for the base of the cascode transistor. In general the<br />

distortion of the cascode configuration is pretty bad without matching so it is undesirable to<br />

match the cascode and driver.<br />

An important advantage of the cascode configuration is it’s simplicity and it’s inherent bias<br />

current sharing, which shows up in cost and area comparisons. Ultimately the system requirements<br />

will justify one amplifier over another.


Common Base Amplifier<br />

To find the distortion of the cascode configuration we analyze the distortion due to the driver<br />

transistor and the cascode transistor separately. To find the distortion of the common base<br />

amplifier, we input-refer the distortion through an linear inductively degenerated transconductor.<br />

The result of the distortion from this configuration is given in the following equation.<br />

I out<br />

V S<br />

Z S<br />

V π<br />

g m*<br />

V π<br />

L e<br />

IP 3cb 10<br />

10 log<br />

Fig. 4: Common-base LNA (input-referred through ideal transconductor)<br />

4I . 3. Ccb ω . 2<br />

L e<br />

C . je0 Area . cb V T<br />

. Intercept Point of Common-Base LNA<br />

Now the distortion due to the common-emitter device can be compared to the distortion from the<br />

common base device in a cascode configuration. The following equation is result of taking the<br />

difference between the intercept point. From this difference equation we can see the common<br />

base is the dominant source of distortion at high frequencies and for large emitter degeneration.<br />

For typical values L e =1.5nH, I C =6mA, f=1.9GHz, f T =20GHz, the common emitter is 5.4dB more<br />

linear than the input referred common base. Which reduces the overall distortion of the cascode<br />

amplifier to 6.5dB below that of the common emitter alone.<br />

Intercept Point Difference between<br />

IP 3ce IP 3cb 3dB 20logg . . m ω . L e 10.<br />

log ω<br />

Common Base and Common Emitter<br />

Cascode LNA<br />

ω T<br />

V S<br />

Z S<br />

I out<br />

L e<br />

Fig. 5: Cascode LNA<br />

IP 3ce IP 3cb<br />

10 10<br />

IP 3cascode 10. log 10 10 IP 3ce 10.<br />

log 1 10<br />

∆IP 3ce_cb<br />

10<br />

Intercept Point of a Cascode LNA


Small Signal Analysis<br />

A small signal analysis of the network is necessary for noise, gain, and impedance matching<br />

calculations. Kirkoff’s Current Laws (KCL) were used to set up a general purpose matrix to solve<br />

for the necessary gains. The following figure was used perform the small signal analysis.<br />

C µ<br />

Z S<br />

r b<br />

i bn I cn R L<br />

V S<br />

Z π<br />

g m *v π<br />

Z bias<br />

Z L<br />

v nRbias<br />

Z e<br />

v nRL<br />

Fig. 6: Small Signal Model of LNA Circuit<br />

KCL at bias node, V bias<br />

V S<br />

V bias V bias V nbias V bias V b<br />

Z S Z bias r b<br />

V S<br />

Z S<br />

V bias<br />

Z S<br />

V bias V bias V b<br />

Z bias r b<br />

KCL at base node, V b<br />

V bias V b<br />

V b V . c j. ω . C µ<br />

r b<br />

KCL at collector node, V c<br />

V b V . c j. ω . C µ g . m V b V e<br />

V b V e<br />

V b<br />

0<br />

Z π<br />

V c<br />

r o<br />

V e<br />

V c<br />

R L<br />

V c V L<br />

Z L<br />

V bias<br />

V b V . c j. ω . C µ<br />

r b<br />

V . c j. ω . C cs<br />

V b<br />

Z π<br />

V e<br />

V L<br />

V c V . b j. ω . C µ g . m V b V e<br />

Z L<br />

V c<br />

r o<br />

V e<br />

V c<br />

R L<br />

V c<br />

Z L<br />

V . c j. ω . C cs<br />

KCL at emitter node, V e<br />

V b V e<br />

g . m V b V e<br />

Z π<br />

V c<br />

r o<br />

V e<br />

V e<br />

Z e<br />

0<br />

These KCL equations are now placed into a KCL matrix<br />

V S<br />

Z S<br />

0<br />

V L<br />

Z L<br />

0<br />

1 1 1<br />

Z S Z bias r b<br />

1<br />

r b<br />

0<br />

0<br />

V e V e V b<br />

g . m V e V b<br />

Z e Z π<br />

1<br />

0<br />

0<br />

r b<br />

1<br />

j. ω . 1<br />

C µ<br />

j. ω .<br />

1<br />

C µ<br />

r b<br />

Z π<br />

Z π<br />

j. ω . C µ g m j. ω . 1 1<br />

1<br />

C µ<br />

g m<br />

Z L r o<br />

r o<br />

1<br />

1 1 1 1<br />

g m g m<br />

Z π r o Z e Z π r o<br />

Note that these equations don’t have R L in them. The necessary R L will be calculated later in the<br />

stability section.<br />

.<br />

V bias<br />

V b<br />

V c<br />

V e<br />

V e<br />

r o<br />

V c


KCL N, I C<br />

, s, Z S<br />

, Z L<br />

1 1 1<br />

Z S Z bias r b<br />

1<br />

r b<br />

0<br />

0<br />

1<br />

0<br />

0<br />

r b<br />

1<br />

j. ω . 1<br />

C µ<br />

j. ω .<br />

1<br />

C µ<br />

r b<br />

Z π<br />

Z π<br />

j. ω . C µ g m j. ω . 1 1<br />

1<br />

C µ<br />

g m<br />

Z L<br />

r o<br />

r o<br />

1<br />

1 1 1 1<br />

g m g m<br />

Z π r o Z e Z π r o<br />

KCLinv N, I C , s, Z S , Z L KCL N, I C , s, Z S , Z L<br />

1<br />

2<br />

V bias<br />

V b<br />

V c<br />

V e<br />

KCLinv N, I C , s, 50 ohm,<br />

50 ohm<br />

.<br />

50 ohm<br />

0<br />

ohm<br />

0<br />

ohm<br />

0<br />

ohm<br />

V bias 1.537 0.038i<br />

V e<br />

1.467 0.242i<br />

V b 1.498 0.03i<br />

=<br />

V c 0.129 4.151i<br />

Scattering Parameter Analysis<br />

Scattering-parameters are the most widely used representation of RF small signal networks.<br />

Their advantages stem from their ease of use for power gain and reflection calculations, and<br />

serve as standard output parameters from network analyzers. S parameter values can be<br />

calculated for a small signal network using a variety of procedures including calculating other<br />

parameters and converting to S parameters, but the following method is chosen for it’s simplicity.<br />

The S parameters are referenced to 50 ohms, because it a common value used in test<br />

equipment, passive components, such as filters and antennas, and commercially available active<br />

components, such as amplifiers and mixers.


2V<br />

50 Ω<br />

1V<br />

1 GΩ<br />

S 21<br />

Circuit<br />

S 11<br />

50 Ω<br />

S 12<br />

50 Ω<br />

50 Ω<br />

Circuit<br />

1V<br />

2V<br />

S 22<br />

1 GΩ<br />

Fig. 7: Circuit used for scattering parameter calculations<br />

2<br />

50 ohm<br />

0<br />

Sparam N, I C , s V KCLinv N, I C , s, 50 ohm,<br />

50 ohm .<br />

ohm<br />

0<br />

ohm<br />

0<br />

ohm<br />

S 11 ,<br />

V 1<br />

1<br />

S 21 ,<br />

V 3<br />

V<br />

KCLinv N, I C , s, 50 ohm,<br />

50 ohm<br />

S 22 ,<br />

V 3<br />

1<br />

S 12 ,<br />

V 1<br />

S<br />

.<br />

0<br />

ohm<br />

0<br />

ohm<br />

2<br />

50 ohm<br />

0<br />

ohm<br />

Sparam N, I C , s<br />

=<br />

0.537 0.038i<br />

0.129 4.151i<br />

0.015 0.098i<br />

0.648 0.278i


100<br />

10<br />

1<br />

0.1<br />

0.01<br />

0.01 0.1 1 10 100<br />

| S11 |<br />

| S21 |<br />

| S12 |<br />

| S22 |<br />

Fig. 8: S Parameters vs. Frequency<br />

Stability Analysis<br />

Often it happens a designer designs an amplifier, but he gets an oscillator in return. This<br />

scenario typically occurs at frequencies out of the desired band, where the source and load<br />

impedances can be unknown. If the out of band source and load impedances are unknown it is<br />

desirable to make the amplifier stable for all source and load impedances. This is known as an<br />

unconditionaly stable amplifier. If the out-of-band source and load impedances are known it is<br />

possible to design a conditionally stable amplifier design. Usually conditionally stable amplifiers<br />

can acheive higher performance levels than unconditionally stable amplifiers. This is becuase<br />

the amplifier performance must be degraded some with form of ballasting resistor to make it<br />

stable.<br />

It is desirable to make the stability factor greater than one for another reason other than<br />

stability. With a K factor greater than one it is possible to simultaneously conjugate match the<br />

input and output impedance of the amplifier. Conjugate matches are desirable, because the<br />

filters connected to the amplifier require a conjugate impedance to provide their specified<br />

frequency response.<br />

For a K factor of one, the real part of the matching impedances is zero ohms, so it is<br />

impossible to match with practical matching networks. For this same reason it is desirable to<br />

make the K factor some value significantly larger than one.<br />

KS ( ) ∆ S .<br />

1, 1<br />

S 22 ,<br />

S .<br />

12<br />

,<br />

S 2,<br />

1<br />

1 ( ∆ ) 2 2<br />

S 1, 1<br />

2. S .<br />

1,<br />

2<br />

S 21 ,<br />

2<br />

S 2, 2<br />

K Sparam N, I C , s = 1.016<br />

The mu factor is often a more desirable parameter to use for stability than K factor. This is<br />

because the K factor must be specified with other conditions, such as ∆. In this sense the µ<br />

factor is easier to use, because it does not require any other parameters to guarantee<br />

unconditional stability. Although the K factor and µ factor curves are different, their values are<br />

equal for the transition point between unconditionally stable and conditionally stable regions<br />

(K=µ=1). µ S<br />

.<br />

, , s = 1.102<br />

( ) ∆ S .<br />

1, 1<br />

S 22 ,<br />

S 12<br />

S 1 1<br />

,<br />

S 2,<br />

1<br />

2<br />

1 S 22 ,<br />

,<br />

∆ . S 2,<br />

2<br />

S .<br />

2 1<br />

,<br />

S 12 ,<br />

µ Sparam N I C


10<br />

1<br />

K, Mu<br />

0.1<br />

0.01<br />

0.01 0.1 1 10 100<br />

K Factor<br />

mu Factor<br />

Desired Stability Factor<br />

Frequency<br />

Fig. 9: K Stability Factor vs. Frequency<br />

1.15<br />

1<br />

K, Mu<br />

1.1<br />

K, Mu<br />

0.8<br />

1.05<br />

0.6<br />

1<br />

0 20 40 60 80 100<br />

0.4<br />

0 5 10 15 20<br />

Number of Device in Parallel<br />

K Factor<br />

Mu Factor<br />

Desired Stability Factor<br />

Bias Current (mA)<br />

K Factor<br />

Mu Factor<br />

Desired Stability Factor<br />

Fig. 10: K Factor vs. Device Size<br />

Fig. 11: K Factor vs. Bias Current


Ballast Resistor Sizing<br />

The term ballast is of Swedish origin, where bal means " to bear," and llast means "load."<br />

Thus the term ballast means to bear the load. The load refers to a heavy weight placed at the<br />

bottom of ship to stabilize the ship in heavy waves. The term ballast is used here to describe a<br />

resistor, which is added to the circuit to provide stability. Most transistors given by a<br />

manufacturer are only conditionally stable. For this reason, and the reasons described above a<br />

ballast resistor is added to stabilize the transistor<br />

The following procedure is used to find the ballast resistor needed to make the amplifier<br />

unconditionally stable, or to provide the desired K factor. First, the procedure involves<br />

converting a given set of S parameters to ABCD parameters and multiplying them with the S<br />

parameters of a parallel resistor. Then the combination ABCD parameters are converted back<br />

into a new set of S parameters, which are used to find the K factor for the device. The value of<br />

resistance is swept to find the value need to meet a desired value of K factor.<br />

ABCD Parameters of a Parallel Resistor<br />

ABCD( R)<br />

1<br />

ohm<br />

R<br />

0<br />

1<br />

S to ABCD Parameter Calculation<br />

S2ABCD S,<br />

Z 0<br />

Note: The units are removed, for calculation purposes only<br />

1 S .<br />

1, 1<br />

1 S 22 ,<br />

S .<br />

12<br />

.<br />

2S 2,<br />

1<br />

,<br />

S 2,<br />

1<br />

ohm 1 S .<br />

1, 1<br />

1 S 22 ,<br />

S .<br />

.<br />

12<br />

Z .<br />

0<br />

2S 21 ,<br />

,<br />

S 21 ,<br />

Z 0 1 S .<br />

1, 1<br />

1 S 22 ,<br />

S .<br />

.<br />

12<br />

ohm<br />

.<br />

2S 21 ,<br />

1 S .<br />

1, 1<br />

1 S 22 ,<br />

S .<br />

12<br />

.<br />

2S 2,<br />

1<br />

,<br />

S 21 ,<br />

,<br />

S 2,<br />

1<br />

S2ABCD Sparam N, I C , s , 50 ohm<br />

=<br />

0.063 0.013i<br />

1.39. 10 4 1.384i . 10 3<br />

2.099 17.814i<br />

0.013 0.042i<br />

ABCD to S Parameter Calculation<br />

ABCD2S ABCD, Z 0 A ABCD 11 ,<br />

B ABCD 12 ,<br />

C ABCD 21 ,<br />

A<br />

D ABCD 22 ,<br />

1<br />

B . ohm<br />

Z 0<br />

Z 0<br />

C. D<br />

ohm<br />

.<br />

A<br />

B . ohm C. Z 0<br />

D<br />

Z 0 ohm<br />

2<br />

A<br />

2.( A. D BC . )<br />

B . ohm<br />

Z 0<br />

Z 0<br />

C. D<br />

ohm<br />

ABCD2S S2ABCD Sparam N, I C , s , 50 ohm , 50 ohm<br />

=<br />

0.537 0.038i<br />

0.129 4.151i<br />

1 0<br />

KwithR( S,<br />

R) K ABCD2S S2ABCD( S,<br />

50 ohm)<br />

. ohm ,<br />

1<br />

50 ohm<br />

R<br />

0.015 0.098i<br />

0.648 0.278i<br />

K Factor with Load Resistor<br />

KwithR Sparam N , I C , s , 1000 ohm = 1.082


1 0<br />

µwithR( S,<br />

R) µ ABCD2S S2ABCD( S,<br />

50 ohm)<br />

. ohm ,<br />

1<br />

50 ohm<br />

R<br />

µwithR Sparam N , I C<br />

, s , 1000 ohm = 1.248<br />

µ Factor with Load Resistor<br />

1.3<br />

K and Mu Factor<br />

1.2<br />

1.1<br />

1<br />

100 1 .10 3 1 .10 4<br />

Ballast Resistance (kohm)<br />

K Factor<br />

Mu Factor<br />

Desired K Factor<br />

Fig. 12: K and Mu vs. Ballast Resistor<br />

Rguess<br />

0.1 kΩ<br />

Rneeded N , I C , s, Kval if K Sparam N, I C , s > Kval, 100 kΩ,<br />

root KwithR Sparam N, I C , s , Rguess Kval,<br />

Rguess<br />

Rneeded2 N , I C , s, Kval if µ Sparam N , I C , s > Kval, 100 kΩ,<br />

root µwithR Sparam N, I C , s , Rguess Kval,<br />

Rguess<br />

Rneeded2 N , I C , s, K val = 100 kΩ<br />

R L N, I C , s Rneeded N, I C , s, K val R L N, I C , s = 773.703 ohm<br />

It is interesting to plot the ballast resistor needed vs. the device size and current. These<br />

curves are shown in the following figures. From these plots we see the stability of the device<br />

increases with bias current and decreases with device size. Conversely we see we need a<br />

smaller parallel ballast resistor for more potentially unstable devices. Thus a smaller ballast<br />

resistor is needed for larger devices and devices with smaller currents.<br />

1 .10 6 Ballast Resistor Need to make K=Kval<br />

Ballast Resistor Size (ohms)<br />

1 .10 5<br />

1 .10 4<br />

1 .10 3<br />

100<br />

1 10 100<br />

Number of Devices in Parallel<br />

Ballast Resistor Need to make mu=Kval<br />

Fig 13: Ballast Resistor vs. Device Size


2000<br />

Ballast Resistor (ohms)<br />

1500<br />

1000<br />

500<br />

0<br />

0 5 10 15 20<br />

Resistance Needed w/ 25 Devices<br />

Resistance Needed w/ 50 Devices<br />

Resistance Needed w/ 75 Devices<br />

Bias Current (mA)<br />

Fig. 14: Ballast Resistor vs Current<br />

Simultaneous Conjugate Matching Analysis<br />

It is desirable from a gain perspective to simultaneously conjugate the input and output of the<br />

amplifier. This maximizes gain, but may not be optimal for noise as we shall see later. If the<br />

device is unilateral (i.e. the reverse isolation, S12, is zero) the conjugate matching impedances<br />

can be calculated directly from S11 and S22. In reality S12 is some non-zero value, so matching<br />

the input will change the impedance at the output. Simultaneous matching can be done<br />

iteratively, which can be tedious and time consuming. An easier method involves solving a<br />

second order equation for the desired values. The derivation of Zpopt is done in [4]. To use the<br />

equation the S-Parameters must first be recalculated with the necessary ballast resistor.<br />

KCL N, I C , s, Z S , Z L<br />

1 1 1<br />

Z S Z bias r b<br />

1<br />

r b<br />

0<br />

0<br />

1<br />

0<br />

0<br />

r b<br />

1<br />

j. ω . 1<br />

C µ<br />

j. ω .<br />

1<br />

C µ<br />

r b<br />

Z π<br />

Z π<br />

j. ω . C µ g m j. ω . 1 1 1<br />

1<br />

C µ<br />

g m<br />

R L Z L r o<br />

r o<br />

1<br />

1<br />

1 1 1<br />

g m g m<br />

Z π r o Z e Z π r o<br />

KCLinv N, I C , s, Z S , Z L KCL N, I C , s, Z S , Z L<br />

1


Sparam N, I C<br />

, s KCLi KCLinv N , I C<br />

, s, 50 ohm,<br />

50 ohm<br />

V<br />

KCLi.<br />

S 11 ,<br />

V 1<br />

1<br />

S 21 ,<br />

V 3<br />

V<br />

KCLi.<br />

S 22 ,<br />

V 3<br />

1<br />

S 12 ,<br />

V 1<br />

S<br />

2<br />

50 ohm<br />

0<br />

ohm<br />

0<br />

ohm<br />

0<br />

ohm<br />

0<br />

ohm<br />

0<br />

ohm<br />

2<br />

50 ohm<br />

0<br />

ohm<br />

Sparam N, I C , s<br />

=<br />

0.548 0.015i<br />

0.256 3.975i<br />

5.547 . 10 3 0.095i<br />

0.599 0.115i


Z popt SZ , 0 ∆ S .<br />

11 ,<br />

S 22 ,<br />

S .<br />

1 2<br />

2<br />

B 1 1 S 11 ,<br />

2<br />

B 2 1 S 22 ,<br />

,<br />

S 21 ,<br />

2<br />

S 22 ,<br />

2<br />

S 11 ,<br />

( ∆ ) 2<br />

( ∆ ) 2<br />

C 1 S 11 ,<br />

∆ . S 22 ,<br />

C 2 S 22 ,<br />

∆ . S 11 ,<br />

Γ Spopt<br />

B 1 B 1<br />

2<br />

2C . 1<br />

4.<br />

2<br />

C 1<br />

2<br />

B 1 B 1<br />

Γ Spopt if Γ Spopt < 1,<br />

Γ Spopt ,<br />

Γ Lpopt<br />

B 2 B 2<br />

2<br />

2C . 2<br />

4.<br />

2<br />

C 2<br />

2<br />

B 2 B 2<br />

Γ Lpopt if Γ Lpopt < 1,<br />

Γ Lpopt ,<br />

1 Γ<br />

Z Lpopt Z . Lpopt<br />

0<br />

1 Γ Lpopt<br />

1 Γ<br />

Z Spopt Z . Spopt<br />

0<br />

1 Γ Spopt<br />

Z Spopt<br />

2C . 1<br />

2C . 2<br />

4.<br />

2<br />

C 1<br />

4.<br />

2<br />

C 2<br />

Z Lpopt<br />

Z L N, I C , s Z popt Sparam N, I C , s , 50 ohm<br />

Z Sp N, I C , s Z popt Sparam N, I C , s , 50 ohm<br />

2<br />

1<br />

Z L N, I C , s = 120.278 52.473i ohmOptimal Load Impedance<br />

Z Sp N, I C , s = 91.811 18.536i ohmOptimal Source Impedance<br />

1 .10 3 Fig. 14: Max Gain Impedaces vs Frequency<br />

Impedance (ohms)<br />

100<br />

10<br />

0.1 1 10 100<br />

Frequency (GHz)


Noise Analysis<br />

Noise analysis for low noise amplifier design is important not only for the definition of the<br />

amplifier, but also for it’s application. The noise requirements are determined by the amplitude<br />

of the signal being received and the desired signal to noise ratio. It is also important to allow<br />

some of the total system noise budget to other elements in the receiver chain. For cellular<br />

phones the desired signal amplitude is calculated when the cellular phone is the farthest<br />

distance from the base station.<br />

To do the noise calculation we need to include all of the noise sources for the entire low noise<br />

amplifier circuit, including noise from the bias circuitry and ballast resistor. To simplify the bias<br />

noise calculations we first need to convert the bias circuit into an equivalent parallel resistance<br />

and inductance. The current noise from this parallel resistor is added to the input referred current<br />

noise of the amplifier and not in the input referred voltage noise. In reality it will also have a small<br />

affect on the voltage noise, but since the bias impedance is usually large it is acceptable to model<br />

the noise as a current source.<br />

Conversion from Z bias to L bias and R bias<br />

Im Z bias<br />

Q bias<br />

Q bias = 5.969 Q of an L S in series with R S<br />

Re Z bias<br />

2<br />

L bias if Q bias 0,<br />

j10 . 9 1 Q bias Im Z bias<br />

H, .<br />

L<br />

2<br />

bias 51.403 nH<br />

Q ω<br />

bias<br />

= Equivalent Parallel Inductance<br />

R bias 1 Q bias<br />

2<br />

. Re Z bias<br />

R bias 3.663 . 10 3 ohm<br />

= Equivalent Parallel Bias Resistance<br />

To simplify the noise analysis we neglect C µ . C µ is only important for stability and gain analysis.<br />

KCL analysis of the simplified circuit with noise sources is used to find the gains of the noise<br />

sources.<br />

at Base Node<br />

V s V b V b V e<br />

V s V b V b V e<br />

i bn<br />

r b Z S Z π r b Z S r b Z S Z π<br />

at Emitter Node<br />

V b V e<br />

V<br />

i bn g . e<br />

m V b V e i cn 0<br />

Z π Z e<br />

at Collector Node<br />

V b V e<br />

g . m V b V e<br />

Z π<br />

V<br />

g . c<br />

m V b V e i cn 0 0 g . m V b V e<br />

Z L<br />

V c<br />

Z L<br />

V e<br />

Z e<br />

KCLsimpleinv Z S , Z L<br />

1<br />

1<br />

0<br />

r b ( N) Z S Z π N, I C , s<br />

1<br />

g m I C<br />

Z L<br />

1<br />

g m I C 0<br />

Z π N, I C , s<br />

1<br />

Z π N, I C , s<br />

1<br />

Z π N, I C , s<br />

g m I C<br />

1<br />

g m I C<br />

Z e ( N,<br />

s)<br />

1<br />

79.793 13.307i<br />

0<br />

0.301 3.141i<br />

KCLsimpleinv Z Sp N, I C , s , Z L N, I C , s<br />

=<br />

377.04 445.504i<br />

120.278 52.473i<br />

94.09 50.208i<br />

ohm<br />

76.496 24.317i<br />

0<br />

1.793 3.307i


Solve<br />

r . b i . bn Z . e β β . V . s Z e Z . S i . bn Z . e β i . bn Z . π Z S i . bn Z . π r b Z . π V s Z . S i . cn Z e V . s Z e r . b i . cn Z e<br />

Z S r b g . m Z . π Z e Z e Z π<br />

Z . L<br />

Z . S i . bn Z . π g m r . b i . bn Z . π g m Z . π V . s g m i . bn Z . π Z . e g m Z . S i cn r . b i cn i . cn Z e i . cn Z π<br />

Z S r b g . m Z . π Z e Z e Z π<br />

A v<br />

Z . e<br />

i . cn Z π r . b i cn i . bn Z π Z . S i . bn Z . π g m r . b i . bn Z . π g m Z . π V . s g m Z . S i cn V s<br />

β N, I C , s . para R L N, I C , s , Z L N, I C , s<br />

r b ( N) β N, I C , s 1 . Z e ( N,<br />

s)<br />

Z π N, I C , s<br />

Z S r b g . m Z . π Z e Z e Z π<br />

A v = 2.845 5.479i Zero Source Impedance<br />

Voltage Gain<br />

A i β N, I C , s . para R L N, I C , s , Z L N, I C , s A i = 1.438 2.475i kΩ Infinite Source Impedance<br />

Current Gain<br />

Now we can use the gains we just calculated to find the equivalent input voltage and current<br />

sources and the correlation between the two. In order to find the equivalent input noise source,<br />

we must first know the magnitude of each of the individual noise sources. These are well known<br />

values of 4kTr b for the base resistance thermal noise, 2qI B for the base current shot noise, and<br />

2qI C for the collector current shot noise.<br />

v bn ( N ) 4. k. Temp. r b ( N)<br />

v bn N = Base Thermal Noise Voltage<br />

( ) 0.271 nV Hz<br />

i cn I C<br />

i bn I C<br />

2q . . I C<br />

2q .<br />

I<br />

. C<br />

β 0<br />

i cn I C = 56.604 pA Collector Shot Noise Current<br />

Hz<br />

i bn I C = 4.682 pA Base Shot Noise Current<br />

Hz<br />

i biasn R bias<br />

i RLn R L<br />

4k . . 1<br />

Temp. i biasn R bias 2.126 pA<br />

R bias<br />

Hz<br />

4k . . 1<br />

Temp. i RLn R L 4.626 pA<br />

R L N, I C , s<br />

Hz<br />

= Bias Resistor Current Noise<br />

= Load Resistor Current Noise


Equivalent Input Noise Elements<br />

The equivalent input-referred voltage noise source is found by setting the source impedance<br />

to zero, finding the transfer function of all the noise sources to the output, adding the up all the<br />

noise powers at the output, and dividing by the voltage gain from the source itself. Similarly,<br />

the equivalent input-referred current noise can be found with an input current source and the<br />

source impedance set to infinity.<br />

Noiseless<br />

Noiseless<br />

v n<br />

Z L<br />

Z L<br />

i neq<br />

Fig. 15: Circuit used to find input-referred noise voltage<br />

Fig. 16: Circuit used to find input-referred noise current<br />

V neq N, I C , s 4k . . Temp. r b ( N ) r b ( N) Z e ( N,<br />

s)<br />

+<br />

r b ( N) Z e ( N,<br />

s) Z π N, I C , s<br />

β N, I C , s<br />

4k . . 1<br />

+ Temp.<br />

.<br />

R L N, I C , s<br />

2 2<br />

. . q.<br />

I B I C<br />

2<br />

. 2 . q.<br />

I C ...<br />

r b ( N ) β N, I C , s 1 . Z e ( N,<br />

s)<br />

Z π N, I C , s<br />

...<br />

β N, I C , s<br />

2<br />

I neq N, I C , s 4k . . Temp<br />

2q . . I B I C<br />

R bias<br />

V neq N, I C , s = 0.317 nV Equivalent Input Noise<br />

Hz<br />

Voltage<br />

2q . . I C 4k . . 1<br />

Temp.<br />

R L N, I C , s<br />

β N, I C , ω<br />

2<br />

Equivalent Input Noise<br />

Current<br />

I neq N, I C , s = 5.764 pA Hz<br />

The input referred noise can be represented by two noise resistances and the correlation<br />

impedance or admittance. R n is the value of a resistor whose voltage thermal noise is equal to<br />

the equivalent input voltage noise. g n is the value of a resistor whose current thermal noise is<br />

equal to the equivalent input current noise.<br />

R n N, I C , s<br />

g n N, I C , s<br />

2<br />

V neq N, I C , s<br />

4k . . Temp<br />

2<br />

I neq N, I C , s<br />

4k . . Temp<br />

R n N, I C , s = 6.064 Ω Equivalent Input Noise<br />

Resistance<br />

1<br />

g n N, I C , s<br />

498.381 Ω<br />

= Equivalent Input Noise<br />

Conductance


Noise Correlation<br />

Except in special cases, the optimal noise source impedance will be different from the optimal<br />

power source impedance. Thus, when using the optimal noise source impedance, the power<br />

gain will not be maximized. On the other hand lower power gain will increase the significance of<br />

the noise from later stages on the noise figure of the system. Thus a tradeoff exists between the<br />

optimal noise source impedance and optimal power source impedance for minimum overall<br />

system noise figure. The optimal source impedance for minimum system noise figure can be<br />

found by including the noise of the following stages, such as the mixer, in the optimal noise<br />

source impedance calculation. In many optimal source impedance calculations, other sources of<br />

noise are also neglected. The noise sources to be included in the source impedance calculation<br />

are noise from the bias source, bonding pad series resistance, series resistance of inductor<br />

degeneration from bond wires and especially from low-Q on-chip spiral inductors. The series<br />

resistance of these spirals tend to increase optimal noise source impedance, when they are used<br />

for emitter degneration of common emitter and common source amplifiers.<br />

To find the noise gains, a load impedance is assumed, which will in turn affect the gains and the<br />

optimal noise source impedance. The optimal load impedance for maximum power transfer is a<br />

good guess for the load impedance. It becomes a better guess as the noise of following stages is<br />

increased. Once the optimal source impedance is found using a guess for the load impedance, the<br />

load impedance for maximum power transfer should be recalculated from the complex conjugate of<br />

the output impedance of the device with the optimal system noise source impedance.<br />

Thus the steps for finding optimal system noise source impedance are as follows:<br />

1. Find S parameters of the circuit directly or indirectly by finding the Y<br />

parameters of the device directly.<br />

2. Find the optimal load and source impedance with the calculated S<br />

parameters.<br />

3. Find the gains of all noise sources and an input voltage source to the output<br />

with a zero source impedance. Include all noise source gains, including the<br />

noise of following stages and bias noise.<br />

4. Find the gains of all noise sources and an input current source to the output<br />

with a infinite source impedance.<br />

5. Use the gains to find the input referred equivalent voltage and noise sources<br />

and the correlation impedance.<br />

6. Use the equivalent voltage and current noise sources to find the equivalent<br />

series and parallel noise resistances.<br />

7. Use the correlation impedance and noise resistances to find the optimal<br />

source impedance.<br />

8. Recalculate desired output impedance given the optimal system noise<br />

source impedance.<br />

.<br />

I<br />

VI conj N, I C , s r b ( N) Z e ( N,<br />

s) . 2.<br />

C<br />

q. r b ( N ) Z e ( N,<br />

s) Z π N, I C , s<br />

β 0<br />

+<br />

VI conj N, I C , s = 0 W Hz<br />

r b ( N ) β N, I C , s 1 . Z e ( N,<br />

s)<br />

Z π N, I C , s<br />

.<br />

2q . I C<br />

β N, I C , s<br />

4k . . 1<br />

Temp.<br />

R L N, I C , s<br />

.<br />

β N, I C , s<br />

2<br />

2<br />

...


γ N, I C<br />

, s<br />

VI conj N, I C<br />

, s<br />

V neq N, I C<br />

, s<br />

2.<br />

I neq N, I C<br />

, s<br />

2<br />

γ N, I C<br />

, s = 0.111 0.088i<br />

Correlation Coefficient<br />

The correlation impedance is derived from the zero and infinite source impedance noise<br />

gains and the equivalent input noise sources. The noise correlation impedance is useful for<br />

finding the optimal source impedance for low noise. In the special case, where the input<br />

equivalent voltage and noise sources are 100% correlated, the correlation impedance is equal to<br />

the input impedance. This ideal scenario allows maximum power transfer to occur<br />

simultaneously with minimum noise figure. An example when this situation occurs is when the<br />

backend noise, such as the mixer noise, is high.<br />

The correlation impedance or admittance between the input equivalent current and voltage<br />

noise can now be calculated as shown in the following equations. Note that the correlation is not<br />

equal to the inverse of the correlation impedance, except in the special case, where current and<br />

voltage noise is 100% correlated.<br />

Noiseless<br />

Noiseless<br />

Z S<br />

v n<br />

i n<br />

Z L<br />

Z S<br />

v neq<br />

i n2<br />

=Y corr<br />

*V neq<br />

Z L<br />

i n1<br />

Fig. 17: Circuit with correlated noise sources<br />

Fig. 18: Circuit used to find Y corr<br />

Y corr N, I C , s γ N, I C , s<br />

I neq N, I C , s<br />

. 1<br />

2<br />

V neq N, I C , s<br />

2<br />

Y corr N, I C , s<br />

= 304.9 241.319i Ω Correlation Conductance<br />

Noiseless<br />

v n2<br />

=Z corr<br />

*I neq<br />

Z S<br />

v n1<br />

i neq<br />

Z L<br />

Fig. 19: Circuit used to find Z corr<br />

Z corr N, I C , s γ N, I C , s<br />

2<br />

V neq N, I C , s<br />

. Z<br />

2 corr N, I C , s 6.094 4.823i Ω<br />

I neq N, I C , s<br />

= Correlation Impedance


n is the noise resistance representing the portion of V neq<br />

2 which is uncorrelated with I neq<br />

2.<br />

It is always less than R n , and in the case where the noise is 100% correlated, it is equal to 0.<br />

r n N, I C<br />

, s R n N, I C<br />

, s . 1 γ N, I C<br />

, s r n N, I C<br />

, s 5.943 Ω<br />

2<br />

= Correlation Resistance<br />

G n is the noise resistance representing the portion of I 2 neq which is uncorrelated with V neq<br />

2.<br />

It is always greater than g n , and in the case where the noise is 100% correlated, it is equal to<br />

infinity.<br />

2<br />

G n N, I C<br />

, s g n N, I C<br />

, s . 1 γ N, I C<br />

, s<br />

1<br />

G n N, I C , s<br />

Optimal Noise Figure and Source Impedance<br />

= 508.546 Ω Correlation Conductance<br />

The optimal source resistance is then given by the following equation, using admittance or<br />

impedance noise parameters. Both cases should given the same answer.<br />

Z nopt N, I C , s<br />

r n N, I C , s<br />

g n N, I C , s<br />

Z nopt N, I C , s = 54.761 4.823i ohm<br />

Re Z corr N, I C , s<br />

2<br />

. Optimal Source Impedance<br />

for Minimal Noise Figure<br />

jImZ corr N, I C , s<br />

In the special case, where the noise of the following stages dominates, the optimal noise<br />

source impedance will equal the optimal power source impedance. In the special case, where the<br />

noise of the following stages is zero, the optimal system source impedance will equal the optimal<br />

device source impedance. An optimal system noise figure can be derived by cascading an<br />

infinite number of identical devices and finding the optimal source impedance. Friis explored this<br />

ideal to derive and optimal system source impedance given a single device charateristics. In<br />

reality, all of the devices in a receiver chain will not be the same for distortion purposes.<br />

NF min N, I C , s 10.<br />

log 1 2.<br />

g n N, I C , s . Re Z corr N, I C , s<br />

...<br />

+<br />

g n N, I C , s . r n N, I C , s g n N, I C , s Re Z corr N, I C , s<br />

.<br />

2<br />

NF min N, I C , s = 0.949 dB<br />

Optimal Noise Figure<br />

Noise figure will also be increased by a jammer a frequency offset from the desired signal<br />

f off +f desired , mixing with bias noise at the same offset at basband, f off . This derivation is breifly<br />

described in the <strong>Mathcad</strong> file: biasnoise.mcd.


Noise Figure Plots<br />

NF N, I C<br />

, s, Z S 10.<br />

log 1<br />

r n N, I C<br />

, s<br />

Re Z S<br />

g n N, I C<br />

, s<br />

. Z S Z corr N, I C<br />

, s<br />

Re Z S<br />

2<br />

4<br />

5<br />

3<br />

4<br />

Noise Figure (dB)<br />

2<br />

Noise Figure (dB)<br />

3<br />

2<br />

1<br />

1<br />

0<br />

0 200 400 600<br />

0<br />

200 100 0 100 200<br />

Source Resistance (ohms)<br />

Source Reactance (ohms)<br />

Fig. 20:Noise Figure vs Source Impedance<br />

Fig. 21:Noise Figure vs Source Reactance<br />

1.4<br />

2.5<br />

Minimum Noise Figure (dB)<br />

1.2<br />

1<br />

0.8<br />

Minimum Noise Figure (dB)<br />

2<br />

1.5<br />

1<br />

0.6<br />

0 5 10 15 20<br />

0.5<br />

0 20 40 60 80 100<br />

Bias Current (mA)<br />

Minimum Noise Figure (dB)<br />

Number of Devices in Parallel<br />

Minimum Noise Figure (dB)<br />

Fig. 22: Min. Noise Figure vs. Current<br />

Fig. 23: Noise Figure vs. Device Size<br />

150<br />

150<br />

100<br />

100<br />

Impedance (ohms)<br />

50<br />

Impedance (ohms)<br />

50<br />

0<br />

0<br />

50<br />

0 5 10 15 20<br />

50<br />

0 20 40 60 80 100<br />

Bias Current (mA)<br />

Imaginary Part of Optimal Source Impedance<br />

Real Part of Optimal Source Impedance<br />

Number of Devices in Parallel<br />

Imaginary Part of Optimal Source Impedance<br />

Real Part of Optimal Source Impedance<br />

Fig 24: Optimal Noise Impedance vs Ibias<br />

Fig. 25:Optimal Source Impedance vs Size


Optimal Source Impedance to Trade-Off Power and Noise<br />

The following method is a crude, but quick and relatively easy method for finding the optimal<br />

source impedance to trade-off power and noise. A more accurate method is discusses below<br />

but not implemented.<br />

Optimal Noise Source Impedance:<br />

Z n =r n +jx n ,<br />

NF=NF min<br />

Optimal Gain Source Impedance<br />

Z p =r p +jx p ,<br />

G=G max ,<br />

S 11 =0<br />

Constant S 11 contour<br />

Desired Source Impedance<br />

Z=r+jx<br />

S 11 =Desired Specification<br />

Fig. 26: Figure used to illustrade noise and power trade-off<br />

In the design of a low noise amplifier,LNA, or mixer driver stage there exists an optimal source<br />

source impedance to provide the maximum power transfer into the transistor and thus the<br />

maximum gain. There also exists an optimal source impedance, Z nopt , to provide the minimum<br />

noise figure for the circuit. At the maximum power source impedance, Z popt , the input is matched<br />

to the source impedance and no reflections occur. This is desirable, because the filters attached<br />

to designed for the LNA or mixer, are designed for a matched load impedance, but can tolerate a<br />

certain amount of deviation from it’s desired impedance. The amount of acceptable deviation is<br />

usually specified by the maximum return loss, or S 11 , the filter can handle. The routine below<br />

finds the source impedance to the LNA or mixer, which will provide the lowest noise figure and<br />

maximum gain, while maintaining a desired S 11 specification.<br />

The calculation is performed by drawing a straight line between the optimal noise and power<br />

source impedances and finding where it intersects the desired S 11 contour. This line intersects<br />

the contour at two points, so the point must be chosen, which is closet to the optimal noise<br />

source impedance. Sometimes, the desired S 11 specification is acheived at the optimal noise<br />

source impedance. In this case the optimal noise source impedance is chosen over the<br />

intersecting point. This calculation is not optimal in the truest sense, because the noise and<br />

power gain circles are not coencentric, but it serves as an good estimate to meet design criteria.


Z Ss11 Z p<br />

, Z n<br />

, S 11goaldB S 11goal 10<br />

S 11goaldB<br />

20<br />

Z in<br />

r i<br />

x i<br />

r p<br />

x p<br />

r n<br />

x n<br />

Z p<br />

Re Z in<br />

Im Z in<br />

Re Z p<br />

Im Z p<br />

Re Z n<br />

Im Z n<br />

S 11n 20 log Z in Z<br />

.<br />

n<br />

Z in Z n<br />

g<br />

1 S 11goal<br />

2<br />

1 S 11goal<br />

2<br />

m x p x n<br />

r p r n<br />

a 1 m 2<br />

b 2. x i x n mr . . n m 2r . . i g<br />

c r i<br />

2<br />

x i x n mr . 2<br />

n<br />

1<br />

r . 1<br />

( 2a . )<br />

b b 2 4a . . c<br />

x 1 m. r 1 r n x n<br />

d 1 r 1 r n<br />

2<br />

x 1 x n<br />

2<br />

1<br />

r . 2<br />

( 2a . )<br />

b b 2 4a . . c<br />

x 2 m. r 2 r n x n<br />

d 2 r 2 r n<br />

2<br />

x 2 x n<br />

2<br />

r if d 1 < d 2 , r 1 , r 2<br />

x if d 1 < d 2 , x 1 , x 2<br />

Z Sans<br />

if S 11n < S 11goaldB , Z n , r 1.<br />

x<br />

Z Sans<br />

Z Sp N, I C , s = 91.811 18.536i ohm<br />

Optimal Source Impedance for Conjugate Matching<br />

Z nopt N, I C , s = 54.761 4.823i ohm<br />

Optimal Source Impedance for Minimum Noise Figure<br />

Z S N, I C , s Z Ss11 Z Sp N, I C , s , Z nopt N, I C , s , S 11goaldB Z S N, I C , s = 67.707 3.339i ohm<br />

Optimal Source Impedance to trade-off Noise and<br />

Power


Gain Analysis<br />

Z2Γ( Z)<br />

Z<br />

Z<br />

G T<br />

Γ G<br />

, Γ L<br />

, S<br />

50 ohm<br />

50 ohm<br />

Available Power Gain<br />

1 Γ L<br />

2<br />

2<br />

S 2, 1<br />

Power<br />

2<br />

. . 1 Γ G<br />

1 S .<br />

22 ,<br />

Γ . L<br />

1 S .<br />

1, 1<br />

Γ G S 12<br />

Impedance to Reflection Coefficient Conversion<br />

. . Γ L<br />

Γ G<br />

,<br />

S 21 ,<br />

.<br />

2<br />

Transducer Gain<br />

G avail N, I C<br />

, s 10. log G T Z2Γ Z S N, I C<br />

, s , Z2Γ Z L N, I C<br />

, s , Sparam N, I C<br />

, s G avail N, I C<br />

, s = 14.166 dB<br />

15<br />

25<br />

Available Power Gain (dB)<br />

14<br />

13<br />

Available Power Gain (dB)<br />

20<br />

15<br />

12<br />

0 5 10 15 20<br />

10<br />

0 20 40 60 80 100<br />

Bias Current (mA)<br />

Available Power Gain (dB)<br />

Number of Devices in Parallel<br />

Available Power Gain (dB)<br />

Fig. 27: Power Gain vs. Bias Current<br />

Fig. 28: Power Gain vs. Device Size<br />

Distortion Analysis<br />

The distortion analysis routines were copied directly from the thesis of Keng Fong [2]. They are<br />

the most inaccurate portion of the design routine as they do not reflect the impact of the input<br />

matching network on distortion performance. From comparisions to simulations we see the results<br />

differ by 3-9dB. Future work will add the effects of the input matching network and bias circuitry.<br />

Low distortion in a low noise amplifier is important to prevent undesired signals from<br />

interfering with the desired signal. The most important measure of distortion performance is the<br />

third order intercept point. The scenario where third order distortion is important is when the<br />

receiving device is located a distance far from the transmitting device, and two devices are<br />

transmitting signals close to the device, spacing at frequencies ∆f and 2*∆f from the desired<br />

signal. Through third order distortion, the undesired signals, jammers, mix together to produce a<br />

signal in the desired band. To prevent this signal from degradation the performance of the<br />

receiver the low noise amplifier must be acceptably linear.<br />

A measure of the third order intercept point is used define at acceptable level of linearity. The<br />

third order intercept point is defined the as the jammer power required to make the amplitude of the<br />

jammer equal to the power of the undesired signal produced through third order intermodulation.<br />

This is shown graphically in the following figure.


P jammer<br />

P jammer<br />

Amplitude<br />

P desired<br />

P IM3<br />

IM 3<br />

P IM3<br />

f<br />

Fig. 29: Nonlinear LNA Output Spectrum with Undesired Signals<br />

Amplitude (dBm)<br />

P jammer<br />

P IM3<br />

IM 3<br />

IP 3<br />

P jammer<br />

Fig. 30: Intermodulation as a function of Undesired Signal Power<br />

This routine finds the two-tone third-order intermodulation intercept point, IP 3 , given device<br />

size, current, and base and emitter impedances. The collector base capacitance is neglected for<br />

simplicity.<br />

f 1 f ∆f ω 1 2. π . f 1 s 1 j. ω 1<br />

Frequency of First Jammer<br />

f 2 f 2. ∆f ω 2 2 π<br />

. Frequency of Second Jammer<br />

. . f 2 s 2 j ω 2<br />

2. π . f 1 s 3 j. ω 1<br />

Third Frequency for Distortion Analysis<br />

= Base Impedance for Distortion<br />

ω 3<br />

Z b N, Z S , s r b ( N) Z S Z b ( N, 50 ohm,<br />

s) 54.441 ohm<br />

ZNZ , S , s Z b N, Z S , s Z e ( N,<br />

s)<br />

A 1 N, I C , Z S , s<br />

A 1 N, I C , 50 ohm s<br />

g m I C<br />

Calculations<br />

ZNZ ,<br />

sC . je N,<br />

I . C ZNZ , S , s s. τ . F g m I . S , s<br />

C ZNZ , S , s g m I . C 1 g m I . C Z e ( N,<br />

s)<br />

β 0<br />

, = 6.412 48.737i mA<br />

Linear Term<br />

V<br />

A 2 N, I C , Z S , s 1 , s 2 A 1 N, I C , Z S , s 1 s . 2 A 1 N, I C , Z S , s . 1 A 1 N, I C , Z S , s 2<br />

A 2 N, I C , 50 ohm, s 1 , s 2 91.636 2.859i mA<br />

A1A2 N, I C , Z S , s 1 , s 2 , s 3<br />

V 2<br />

V<br />

. T . 1 s<br />

2 1 s . 2 C je N,<br />

I . C Z<br />

2I . C<br />

= Second Order Distortion Term<br />

A 1 N, I C , Z S , s 1<br />

. A 2 N, I C , Z S , s 2 , s 3 ...<br />

+ A 1 N, I C , Z S , s 2<br />

. A 2 N, I C , Z S , s 1 , s 3 ...<br />

+ A 1 N, I C , Z S , s 3<br />

. A 2 N, I C , Z S , s 1 , s 2<br />

A1A2 N, I C , 50 ohm, s 1 , s 2 , s 3 412.597 3.031i . 10 3 mA 2<br />

3<br />

= Second Order Interaction Term<br />

V 3


A 3 N, I C<br />

, Z S<br />

, s 1<br />

, s 2<br />

, s 3 A 1 N, I C<br />

, Z S , s 1 s 2 s 3<br />

A 3 N, I C<br />

, 50 ohm, s 1<br />

, s 2<br />

, s 3 8.458 5.157i mA<br />

V 3<br />

V<br />

. T . A<br />

3 1 N, I C<br />

, Z S<br />

, s . 1<br />

A 1 N, I C<br />

, Z S<br />

, s . 2 A 1 N, I C<br />

, Z S<br />

, s 3<br />

3I . C + 3I . . C A1A2 N , I C , Z S , s 1 , s 2 , s 3<br />

= Third Order Distortion Term<br />

Z in N, I C<br />

, s r b ( N) Z π N, I C<br />

, s 1 g m I . C Z π N, I C<br />

, s Z e ( N,<br />

s)<br />

. Input Impedance<br />

Z in N, I C<br />

, s = 463.053 21.963i ohm<br />

IP 3 N, I C , Z S , f, ∆f s j. 2. π . f<br />

∆s j. 2. π . ∆f<br />

10.<br />

log<br />

IP 3 N, I C , Z S N, I C , s , f, ∆f 12.046 dB<br />

1 4 A<br />

. 1 N, I C , Z S , s<br />

. . 1 . 1<br />

1mW3<br />

A 3 N, I C , Z S , s, s,<br />

( s ∆s)<br />

8 50 ohm<br />

= Third Order Intercept Point<br />

20<br />

16<br />

Intercept Point (dBm)<br />

10<br />

0<br />

3rd Order Intercept Point (dBm)<br />

14<br />

12<br />

10<br />

10<br />

0 5 10 15 20<br />

8<br />

0 20 40 60 80 100<br />

Bias Current (mA)<br />

3rd Order Intercept Point (dBm)<br />

Number of Devices in Parallel<br />

Third Order Intercept Point (dBm)<br />

Fig. 31: IP3 vs. Bias Current<br />

Fig. 32: IP3 vs. Device Size<br />

It is interesting to understand the shape of the 3 rd order intercept point curve as a function of<br />

device size. For small device sizes, as the device size is increased the distortion performance gets<br />

worse, but for very large devices the distortion performance gets better as the device size<br />

increases. This fact is not explained with the simplified equations for the distortion given above.<br />

The simplified equations for distortion given above neglect the resistance of the emitter as a<br />

function of device size. The shape can be described better by separating the interept point into it’s<br />

two components: The linear term, A 1 , and the nonlinear term, A 3 . As we plot A 1 and A 3 as a<br />

function of device size, we notice A 3 is a much stronger function of area than A 1 , but they both<br />

have a similar shape. The intercept point reaches it’s minimum about the same time A 1 reaches it’s<br />

maximum.


maximum.<br />

So why does A 1 increase intially for small devices and decrease for large devices? For small<br />

devices the device is operating well below the maximum frequency, f T , for the device. In this<br />

region capacitive effects are less significant and resistive effects are more significant. Here A 1<br />

is approximately gm/(1+g m *r e0 /N). As the device size gets larger the effective degeneration is<br />

reduced, which increases the linear gain, A 1 . However for large devices, the base emitter<br />

capacitance increases to the point, approaching f T , where the capacitive effects become<br />

significant, the effective device f T is reduced with increasing device size, and we see losses in<br />

the high frequency gain. The resistive and capacitive effects tend to cancel at some point, and<br />

which gain only varies slowly as a function of device size.<br />

Now we must answer the more important question: Why does A 3 decrease for large devices?<br />

If we look carefully at the equations for the intercept point, we notice A 3 is a strong function of<br />

A 1<br />

3. If this is true A 3 will have a similar shape to A 1 , except exaggerated more. This is exactly<br />

what we see if we plot A 1 and A 3 independently as a function of frequency.<br />

0.05<br />

0.04<br />

Linear and Third-Order Terms<br />

0.03<br />

0.02<br />

0.01<br />

0<br />

0 20 40 60 80 100<br />

Device Size<br />

Linear Term<br />

Third Order Term<br />

Fig. 33: A1 and A3 vs. Device Size<br />

Overall LNA Figure of Merit<br />

The input referred minimum detectable signal with an amplifier is defined below for a signal<br />

of a given bandwidth and noise figure. The noise figure is given in dB and MDS in dBm.<br />

MDS( BW,<br />

NF) k. T. BW 3 NF<br />

The spurious free dynamic range, DR f , is defined as the ratio between vmax and vmin, where<br />

vmax the input signal where the IM 3 just breaks the noise floor defined by vmin. IP 3 is specified<br />

in dBm, G in dB, and MDS in dBm.<br />

DR f IP 3 , G,<br />

MDS<br />

2 .<br />

3 IP 3 G MDS<br />

The dynamic range is defined similarly with the 1dB compression point defined as vmax.<br />

DR P 1dB , G, MDS P 1dB G MDS


Optimizing Area and Current<br />

I C 0.006 Unitless Guesses at optimal bias current<br />

and device size<br />

N 50<br />

NF N, I C NF min N, I . C A,<br />

s<br />

Given<br />

I C<br />

> 0<br />

Bias Current Constraint<br />

N> 0<br />

Device Size Constraints<br />

G avail N, I . C A, s G goaldB<br />

IP 3 N, I . C A, Z nopt N, I . C A,<br />

s , f, ∆f IP 3goaldBm<br />

46.572<br />

P Minimize NF, N, I C P =<br />

7.277 . 10 3<br />

N opt P 1<br />

N opt 46.572<br />

I Copt<br />

> Available Power Gain Constraint<br />

> Intercept Point Constraints<br />

= Optimal Device Size<br />

P .<br />

2<br />

A<br />

I Copt = 7.277 mA Optimal Bias Current Size<br />

NF min N opt , I Copt , s = 0.84 dB<br />

Optimal Minimum Noise Figure<br />

, , , s , f, ∆f = 10 dBm Optimal Intercept Point<br />

IP 3 N opt , I Copt Z nopt N opt I Copt<br />

Z S N opt , I Copt , s = 62.211 5.063i ohm<br />

Optimal Source Impedance<br />

Z L N opt , I Copt , s = 110.436 61.585i ohm<br />

Optimal Load Impedance<br />

G avail N opt , I Copt , s = 13.5 dB<br />

Optimal Gain<br />

Package (Bonding Wire/ Bonding Pad) Deimbedding<br />

The actual impedance matching network is outside of the chip, but calculations for the desired<br />

source and load impedances were calculated for the device inside the chip. These internal<br />

source and load impedances must be transformed into the source and load impedances seen by<br />

the matching networks. To find these conversion equations we first write the equation for<br />

impedance seen by the device, Z S , given an impedance seen by the outside of the chip, Z Schip .<br />

Then we use this equation to solve for Z Schip in terms of Z S .<br />

Source Impedance Bonding Pad/Wire Deimbedding<br />

Z Schip<br />

L bond<br />

C pad<br />

Z S<br />

AMP<br />

Fig. 34: Circuit Used to Solve for Source Impedance Bonding Deimbedding


First we write the equation for the impedance seen by transistor. Then use this equation to solve<br />

for the desired impedance seen by the chip given the impedance the transistor wants to see.<br />

Z S para<br />

1<br />

, sL .<br />

sC . bond Z Schip<br />

pad<br />

Z Schip N opt , I Copt , s<br />

1 .<br />

sC . pad<br />

1<br />

sC . pad<br />

1 . Z<br />

sC . S N opt<br />

, I Copt<br />

, s<br />

pad<br />

1<br />

sC . pad<br />

Z S N opt , I Copt , s<br />

sL . bond Z Schip<br />

sL . bond Z Schip<br />

Load Impedance Bonding Pad/Wire Deimbedding<br />

sL . bond<br />

Z Schip N opt , I Copt , s = 60.362 6.225i Ω<br />

Z L<br />

L bond<br />

Z Lchip<br />

AMP<br />

C pad<br />

Z L para<br />

Fig. 35: Circuit Used for Solve for Load Impedance Bonding Deimbedding<br />

1<br />

, sL .<br />

sC . bond Z Lchip<br />

pad<br />

Z Lchip N opt , I Copt , s<br />

1 .<br />

sC . pad<br />

1<br />

sC . pad<br />

1 . Z<br />

sC . L N opt , I Copt , s<br />

pad<br />

1<br />

sC . pad<br />

Z L N opt , I Copt , s<br />

sL . bond Z Lchip<br />

sL . bond Z Lchip<br />

sL . bond<br />

Z Lchip N opt , I Copt , s = 86.832 53.027i Ω


Impedance Matching<br />

High-pass impedance matching networks are chosen to compensate for the gain loss of the<br />

transistor at higher frequencies. This also helps to stabilize the transistor at lower frequencies.<br />

Highpass L Matching Network<br />

highL Z S<br />

, Z L<br />

, f ω 2. π . f<br />

C 1 if Im Z L 0,<br />

1000 F<br />

1<br />

,<br />

ω . Im Z L<br />

R S<br />

Q S<br />

Re Z L<br />

Im Z S<br />

Re Z S<br />

R p 1 Q S<br />

2<br />

.Re Z S<br />

2<br />

1 Q S Im Z<br />

L . S<br />

1<br />

2<br />

Q ω S<br />

Q<br />

R p<br />

R S<br />

1<br />

L p<br />

R p<br />

ω . Q<br />

1<br />

C S<br />

Q . ω . R S<br />

C<br />

L<br />

L<br />

H<br />

C<br />

F<br />

C . 1 C S<br />

C 1<br />

L . p L 1<br />

L 1<br />

C S<br />

L p


Source Matching Network #1: Highpass<br />

50 ohms<br />

C<br />

Z S<br />

AMP<br />

V S<br />

L<br />

Fig. 36: Highpass source matching network<br />

x<br />

L S<br />

C S<br />

highL Z S N opt , I Copt s<br />

, , 50 ohm,<br />

f<br />

x .<br />

1<br />

H<br />

L S = 8.985 nH Source Matching Inductance<br />

x .<br />

2<br />

F<br />

C S = 3.334 pF Source Matching Capacitance<br />

Load Matching Network<br />

Z L<br />

L<br />

AMP<br />

C<br />

50 ohms<br />

Fig. 37: Highpass load matching network<br />

x<br />

L L<br />

C L<br />

highL Z L N opt , I Copt s<br />

, , 50 ohm,<br />

f<br />

x .<br />

1<br />

H<br />

L L = 6.269 nH Load Matching Inductance<br />

x .<br />

2<br />

F<br />

C L = 1.217 pF Load Matching Capacitance


Low Frequency Stabilization<br />

It is desirable to convert the parallel combination of the load matching network inductor and<br />

the ballast resistor into a series combination. This has the beneficial effect of improving the<br />

stability of the amplifier at lower frequencies, at the expense of stability at higher frequencies.<br />

The assumption is that stability is acheived at higher frequencies because of the reduced gain<br />

and because the small parasitic losses of the passive elements become significant<br />

Ballast Resistor<br />

R S<br />

R p<br />

L p<br />

L S<br />

AMP<br />

AMP<br />

C<br />

50 ohms<br />

C<br />

50 ohms<br />

Fig. 38: Ballast resistor conversion from parallel to series<br />

Q LP R P , L P , ω<br />

R P<br />

L . P ω<br />

Q of an L P in parallel with R P<br />

LP2S R P , L P , ω<br />

L LS<br />

R LS<br />

Q LP R P , L P , ω<br />

1 Q LP R P , L P , ω<br />

1<br />

1 Q LP R P , L P , ω<br />

LP2S R L N opt , I Copt , s , L L , ω<br />

LP2S R L N opt , I Copt , s , L L , ω<br />

2<br />

1<br />

2<br />

2<br />

L<br />

. P<br />

H<br />

R<br />

. P<br />

ohm<br />

. H L LS 6.205 nH<br />

2<br />

Conversion from L P and R P to L S and R S<br />

= Series Load Inductance<br />

. ohm R LS 7.508 ohm<br />

= Series Load Resistance<br />

Outputs<br />

I Copt = 7.277 mA<br />

N opt = 46.572<br />

L S<br />

C S<br />

= 8.985 nH<br />

= 3.334 pF<br />

C L = 1.217 pF<br />

L LS<br />

R LS<br />

= 6.205 nH<br />

= 7.508 ohm<br />

Optimal Bias Current<br />

Optimal Device Size<br />

Optimal Source Matching Inductance<br />

Optimal Source Matching Capacitance<br />

Optimal Load Matching Capacitance<br />

Optimal Load Matching Inductance<br />

Optimal Series Load Ballast Resistor


Simulation<br />

Fig. 39: Circuit schematic used in Cadence simulations<br />

After the initial design with <strong>Mathcad</strong>, we simulated the circuit using Cadence. Cadence’s IC<br />

design tools allow the LNA design to be taken to the next levels of layout and fabrication. Just like<br />

its counterpart, Cadence is also capable of displaying stability, gain and noise figure circles on a<br />

Smith chart. However, setting up Cadence requires a considerable amount of time to guarantee<br />

reliable<br />

results.<br />

The distortion specification for our LNA is the input-referred third-order intercept point, IIP 3 ,<br />

which is measured with a two-tone test. The two tone test is simulated by adding two sinusoidal<br />

signals at 1.90 GHz and 1.91 GHz to the input, each having a -20 dBm available input power,<br />

P in (dB). The amplitude of the third order intermodulation, products, IM3(dB), is then measured by<br />

performing a discrete-time Fourier transform of the output signal. When plotted in decibels<br />

against input power, the output power and IM 3 curves are relatively straight lines with slopes of 1<br />

and 3 respectively, which is shown in figure 1 below. IIP 3 , is defined as the input power at which<br />

the extrapolated IM 3 and output power curves intercept. As we know the slope of each curve and<br />

a point through which each one passes, we can easily calculate IIP 3 with a single transient<br />

simulation with the following formula:<br />

IIP 3 ( dBm)<br />

IM 3 ( dB)<br />

2<br />

P in ( dBm)<br />

The schematic used for the simulation is presented in figure 39. For additional accuracy in<br />

modeling the fabricated amplifier, the inductance of the bonding wires, capacitance of the bonding<br />

pads, and the resistance of the bond wires were added to the schematic. The vias from the ground<br />

plane of the PC board were calculated to be 0.11nH, and were initially added to the schematic with<br />

little effect.


To insure stability over the spectrum, resistors were strategically placed throughout the circuit.<br />

The best method to improve low frequency stability is to add a resistance in series with an inductor<br />

connected from the signal path to ground. Similarly, high frequency stability is enhanced with a<br />

resistance in series with a capacitor connected from the signal path to ground. Resistors degrade<br />

the noise and gain performance of the amplifier so it would be desirable to use reactive elements to<br />

improve stability. Unfortunately, although reactances affect the input and impedances of the<br />

amplifer, they have no effects on the unconditionaly stability factor, K around the K=1 point. In this<br />

LNA resistance was intentionally placed in series with the output and input bonding pads to<br />

achieve unconditional stability condition at high frequencies. The simulation results for the K-factor<br />

of the final version of our circuit have been plotted in Fig. 40 and Fig. 41.<br />

Fig. 40: Simulation results for K-factor<br />

Fig. 41: A closer look at K-factor at high frequencies


After the amplifier was unconditionally stabilized, the input-matching networks were optimized<br />

to trade-off gain and noise while meeting the specifications of 12 dB gain and 1.5dB NF.<br />

Although including more parasitic elements in our simulations than in the <strong>Mathcad</strong> calculations<br />

prevented us from getting exactly the predicted values, we have happily observed that the<br />

general trends stayed the same. The device size, bias current, value of the degeneration<br />

inductance and the input-matching network based on our simulations of power gain, noise figure,<br />

linearity,<br />

Fig. 42: Input reflection coefficient as a function of frequency<br />

Fig. 43: Transducer power gain vs. frequency


It is possible to use on-chip inductors to increase integration, decrease external component<br />

count, thus reducing the price of the overall LNA. Unfortunately, on-chip inductors have a series<br />

resistance, which reduces their Q to 3-5 at 1GHz. On-chip inductors were not used for the<br />

input-matching network to prevent a noise figure increase, but it is possible to use on-chip<br />

inductors for the load inductance without degradation of performance. A load inductance loss is<br />

already introduced to stability the amplifier at low frequencies. This resistance of the on-chip<br />

inductor can be subtracted from this loss to yield the same performance amplifier. Off-chip<br />

inductors manufactured by Toko, with Q values between 30 and 60 at around 2 GHz, were<br />

assumed for the input matching network. When compared with an on-chip inductor with a Q value<br />

of 3, the input-referred noise power increased by 20%, which would give a large 0.3dB increase<br />

in noise figure.<br />

The input-matching network used is a first order high-pass filter. In our final version we used a<br />

series input capacitance of 2.5pF and a shunt inductance of 11nH (Q is assumed to be 50). DC<br />

coupling between the input and the LNA has been achieved by using a capacitance of 100pF.<br />

According to our simulations, this network provides a good compromise between the power and<br />

noise source input impedance.<br />

The output-matching network used is a 5.5nH shunt inductor and a series capacitance of<br />

800fF. The inductor is in series with a 10 ballast resistance and both of them are placed between<br />

the voltage supply and the output node. The capacitance also enables us to get DC coupling<br />

between the amplifier and the output.<br />

Conclusions<br />

A 2.7V 1.9 GHz low noise amplifier with a noise figure of 1.31 dB, transducer power gain of<br />

14.25 dB, an S11 of -14 dB and IIP3 of 7.75dBm has been presented. Unconditional stability at<br />

all frequencies with negligible loss in performance has been guaranteed with carefully placed<br />

resistances in the load matching networks. An automated LNA design procedure has been<br />

developed to optimize and enhance the speed of the designing low noise amplifiers. The design<br />

procedure includes a new method for trading the optimal noise and power source impedances of<br />

the amplifier.<br />

References<br />

[1] Microwave Engineering, 2nd edition, 1998, David M. Pozar, pg. 208.<br />

[2] "Analysis and Design of Monolithic Integrated Mixer," by Keng Fong, U.C. Berkeley Ph. D.<br />

thesis, 1997.<br />

[3] "The implementation of a High Speed Experimental Transceiver Module with an Emphasis on<br />

CDMA Applications," by Arya Reza Behzad, U.C. Berkeley Electronics Research Laboratory<br />

Memorandum No. UCB/ERL M95/40<br />

[4] "RF Circuit Design," by Chris Bowick, 1982, Butterworth Heinemann Publishers


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