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Element analysis - Seiko Instruments GmbH

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SEA Series<br />

For Analyzing material composition to deteet elements<br />

in any object or part, based on non-destruetive and<br />

non-contact fluorescent X-ray <strong>analysis</strong>.<br />

Uses include detection of banned materials for WEEE<br />

& RoHS, ELVcompliance, soi! contamination, or<br />

hazardous matter in chemical and mineral exploration<br />

industries.<br />

Other applications include <strong>analysis</strong> material<br />

eomposition in archeology, food contamination, food<br />

packaging, gem purity, and steel and no-ferrous<br />

meta!.<br />

The energy dispersion method enables<br />

rapid <strong>analysis</strong> of sam pies with nearly on<br />

pretreatment required. A high resolution<br />

semiconductor detector enables<br />

simultaneous <strong>analysis</strong> of multiple elements,<br />

Analyzes solid, liquid, and powder sampies.<br />

Smooth perfomance of qualitative and<br />

quantitative <strong>analysis</strong> of unknown sampies in<br />

even as little as one minune,<br />

Superior <strong>analysis</strong> software for smooth<br />

qualitative and quantitative <strong>analysis</strong> of<br />

sam pies fram obtained spectrum.<br />

Easy-to-use software that includes:<br />

• Auto identification<br />

• Comparison display<br />

.Bulk FP<br />

• Bulk ealibration<br />

• Routine <strong>analysis</strong><br />

• Costomizing<br />

The SEA2001, the first SEA<br />

series model, was developed<br />

by the Scientific <strong>Instruments</strong><br />

Division of <strong>Seiko</strong> <strong>Instruments</strong><br />

Inc. (today SII NanoTechnology<br />

Inc.) In 1987. It was succeeded<br />

by the SEA 201 0 and SEA21 00<br />

models each with performance<br />

improvements of a standard<br />

desk-top XRF analyzer, The<br />

latest and fourth generation<br />

model in the SEA series is the<br />

SEA2200.<br />

Also within the SEA group are<br />

the SEA5000 series aimed at<br />

microsccpic <strong>analysis</strong>, the<br />

SEA200 portable system for<br />

outdoor <strong>analysis</strong> and large<br />

sampie measurement, and the<br />

SEA 1OOOA,the authority in<br />

hazardous substance<br />

measurements.<br />

Today over 2000 SEA series<br />

models are used worldwide for<br />

a variety of analytical and<br />

inspection purposes.<br />

Steel and nonferrous metals<br />

• Main component and impure campanent <strong>analysis</strong><br />

of allays and no-ferrous metals<br />

• Raw material anaylysis<br />

.Ore anaylysis<br />

• Analysis of main components and<br />

Foods<br />

Contamination<br />

.Analysis of forelgn<br />

material in foods<br />

• <strong>Element</strong> <strong>analysis</strong><br />

of animal feed<br />

• Analysis of impurRies<br />

in food cootainer<br />

Environment<br />

• Soil <strong>analysis</strong><br />

• <strong>Element</strong> <strong>analysis</strong><br />

of waste water<br />

• <strong>Element</strong> <strong>analysis</strong><br />

of bumed ash<br />

• Duanaative anaiysis of<br />

hazardous substanc<br />

within piastics and metals<br />

impurities is precious metals<br />

• Refining slag <strong>analysis</strong><br />

Chemieals<br />

• Analysis of impurities within catalysts<br />

• Analysis of impurities within rubber<br />

• <strong>Element</strong> <strong>analysis</strong> 01 pigments<br />

.Analysis of impurities in petroleum<br />

and crude oil<br />

• Analysis of main components and<br />

impurities in plating solutions<br />

SEA<br />

Ceramies<br />

eCeramic element <strong>analysis</strong><br />

• Glass element <strong>analysis</strong><br />

• Cement element <strong>analysis</strong><br />

Electrical and<br />

electronic components<br />

.Coating thickness and<br />

composition measurement<br />

of eletronic oomponents<br />

.ThiCkness and<br />

composition measurement<br />

cf multi-Iayer flims on rear<br />

electrodes<br />

.AnaIysis of main oomponents<br />

and impurities in soIder<br />

Other fields<br />

• <strong>Element</strong> <strong>analysis</strong> of<br />

archeologicai sampies<br />

• <strong>Element</strong> <strong>analysis</strong> of gem stones<br />

best for large<br />

I~U~~d~~~naIYSiS,<br />

sampies<br />

Best for the WEEE&RoHS,<br />

ISEA1000A<br />

and ELV <strong>analysis</strong><br />

2

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