Element analysis - Seiko Instruments GmbH

SII 

SEA (Element Monitor) Series Catalog 

~~.- 

•••• ; .0 ••••• 

.~~-- .

SEA Series 

For Analyzing material composition to deteet elements 

in any object or part, based on non-destruetive and 

non-contact fluorescent X-ray analysis. 

Uses include detection of banned materials for WEEE 

& RoHS, ELVcompliance, soi! contamination, or 

hazardous matter in chemical and mineral exploration 

industries. 

Other applications include analysis material 

eomposition in archeology, food contamination, food 

packaging, gem purity, and steel and no-ferrous 

meta!. 

The energy dispersion method enables 

rapid analysis of sam pies with nearly on 

pretreatment required. A high resolution 

semiconductor detector enables 

simultaneous analysis of multiple elements, 

Analyzes solid, liquid, and powder sampies. 

Smooth perfomance of qualitative and 

quantitative analysis of unknown sampies in 

even as little as one minune, 

Superior analysis software for smooth 

qualitative and quantitative analysis of 

sam pies fram obtained spectrum. 

Easy-to-use software that includes: 

• Auto identification 

• Comparison display 

.Bulk FP 

• Bulk ealibration 

• Routine analysis 

• Costomizing 

The SEA2001, the first SEA 

series model, was developed 

by the Scientific Instruments 

Division of Seiko Instruments 

Inc. (today SII NanoTechnology 

Inc.) In 1987. It was succeeded 

by the SEA 201 0 and SEA21 00 

models each with performance 

improvements of a standard 

desk-top XRF analyzer, The 

latest and fourth generation 

model in the SEA series is the 

SEA2200. 

Also within the SEA group are 

the SEA5000 series aimed at 

microsccpic analysis, the 

SEA200 portable system for 

outdoor analysis and large 

sampie measurement, and the 

SEA 1OOOA,the authority in 

hazardous substance 

measurements. 

Today over 2000 SEA series 

models are used worldwide for 

a variety of analytical and 

inspection purposes. 

Steel and nonferrous metals 

• Main component and impure campanent analysis 

of allays and no-ferrous metals 

• Raw material anaylysis 

.Ore anaylysis 

• Analysis of main components and 

Foods 

Contamination 

.Analysis of forelgn 

material in foods 

• Element analysis 

of animal feed 

• Analysis of impurRies 

in food cootainer 

Environment 

• Soil analysis 


of waste water 


of bumed ash 

• Duanaative anaiysis of 

hazardous substanc 

within piastics and metals 

impurities is precious metals 

• Refining slag analysis 

Chemieals 

• Analysis of impurities within catalysts 

• Analysis of impurities within rubber 

• Element analysis 01 pigments 

.Analysis of impurities in petroleum 

and crude oil 

• Analysis of main components and 

impurities in plating solutions 

SEA 

Ceramies 

eCeramic element analysis 

• Glass element analysis 

• Cement element analysis 

Electrical and 

electronic components 

.Coating thickness and 

composition measurement 

of eletronic oomponents 

.ThiCkness and 

composition measurement 

cf multi-Iayer flims on rear 

electrodes 

.AnaIysis of main oomponents 

and impurities in soIder 

Other fields 

• Element analysis of 

archeologicai sampies 

• Element analysis of gem stones 

best for large 

I~U~~d~~~naIYSiS, 

sampies 

Best for the WEEE&RoHS, 

ISEA1000A 

and ELV analysis 

2

Excellent Tool for the WEEE & RoHS and ELV Compliance 

High sensitivity measurement hardware. 

Software that achieves high precision measurement in the shortest time. 

Easy-to-use software 

Intelligent correction software that monitors Chlorine, Thickness, and Shape for accurate result. 

How the precision control software works 

With conventional methods, measurement time is 

first set then the sampie measured. Nonetheless, 

since dispersion (error)variesfrom sampie to 

sampie, of two sampies measured at equal time 

settings, one sampie may require less time to 

achieve the required precision, resulting in wasted 

measurement time while another sampie may 

require more time than what is set to achieve 

adequate measurement precision. 

This software allows you to set the value of permissi 

able error so that the measurement automatically 

ends when error is less than the set value. 

f.i!"!;u:.i.D 

• Cd concentration: 

·PE 

E 

0- 

3 

E 0- 

3 

Measurement 

100ppm 

time 

~ 

• Cd concentration: 

• PVC 

100ppm 

~L1!!!i_, 

• Cd concentration: 100ppm 

• PE +Sr lire retardant 

E 0- 

3 

E 0- 

3 

Measurement 

time 

Optimum measurement end time 



.s 

~ 

Accurate correction for 

shape and thickness is done 

through scattering. 

.Thickness correction results 01 

100ppm Cd with in hard PVC. 

0 300 

w 350 Thickness1 D Corrected mmfor Calibration Thickness 

'" 

"[ 

~c 

200 150 

X i" 

250 0 

,., 

g 100 

.~ 8 

~ 

'~,;, 

Secondary 

(Patent Pending) 

Difference is determined and correction performed based on 

the material. Correction can be done for both soft PVC and 

hard PVC, 

E 

400 

~ 350 

w 

~ 300 

1; 250 

~ 

~ 200 

c 

o 

.'§ 150 

C 

g 100 

8 

~ 50 

x 0 

o Soft pvc Calibration 

o Correctedtor pvc 

Cd, Pb measurements 

The amount of chlorine is 

measured before measuring 

for hazardous substances 

When using the calibration method, measured 

values will greatly vary depending one the 

amount of chlorine in the sampie. 

- 

!~~I 

• ~ " j!1i 31 74350 , I 140 93 33 83 B4 11- 110 3' 10 45 19 117 1110 53 !dHI'~ ", , 

~~ 1986, 2H 1- B40 i2 80 DI :Im: 

240- 

"1- 

o51 n" 

190 o- 1270 , B911 LI 

- ~ 

D- 

CI Btt L

Hazardous Substance High 

Sensitivity Measurement 

SEA 1OOOAis equipped 

detector 

with a 

that does not require liquid 

nitrogen (LN2) cooling. X-ray 

intensity is up to 72 times that of 

conventional systems using newly 

developed 

filters and optimized 

detection layout. Global voltage 

capability allows use without any 

transformer. Built -in CCD camere 

allows measurement of a specific 

location 

on sam pies. 

[ HS (Hazardous Substance) Monitor ) 

SII 

•. 

~~b\1000A 

-. 

Equipped with 

electronic cooling. No 

liquid nitrogen 

required. No worries 

about the cost, 

safety, and supply of 

liquid nitrogen. 

Compact enough 

to be setup in a 

narrow space at 

the inspection site 

(900X700mm) 

but is capable of measuring large 

sampies (370X320mm). 

Different language 

versions of 

operation 

software including English, Chinese 

(simplified and traditional), and 

Korean. 

.Software windows of hazardous substance judgement software 

"'-""--J"'>'HO,,~ ""'",,, ~"*",,,"":i: _" '

High Sensitivity 

Fluorescent X-rays are efficiently detected 

by employing a large area detector and 

minimizing distance between sam pie and 

detector. 

• Spectrum of 5.8ppm Cd in polyethelene 

High precision 

(built-in peak separation software) 

Deconvolution of spectrum difficult to separate is 

possible with the new digital peak deconvolution 

software (DPD) and Si (Li) detector . 

IISpectrum of Si (Li) detector 

Large sampie ehamber 

Large chamber that can easily contain a 

laptop computer. 

370 (w) X 320 (D) X 155 (H)mm. 

CPS 

• Hg200 ppm Spectrum in PVC that contains 

much Pb 

"* DPD (Digrtal Peak Decomposition) 

0.00 m (40mil) 

Example of analysis by miero X-ray beam 

Qualitative and quatitative analysis anywhere on small metal parts is possible by the 1 mm 

X-ray beam. 

10.00 

.Measurement 30.00 40.00 20.00 

Au 

Cr Fe Conditions 120.00 .X-ray .Quantitative Spectrum Results 

0.00 Ni 

[cps) 

80.00 

e Voltage: 50kV 

0.00 

Stage options 

eSample Changer (turret) 

Maximum 12 sam pie continuous 

measurement 

Material Cr Mn Ni Fe 

Au coating 

thickness 

72.85 18.05 7.57 5000.00 1.53 (wt%) (IJm) 1.03 (IJm) 

eExternally driven X-V stage 

Able to measure anywhere on a sampie 

Inside the chamber (Stroke 40mm) 

Image !rom laptop version controller 

.SEA 1OOOA Specifications 

Elements 900 AC100 90kg • Hazardous (W) Small Atomic Si 370(W) 4-Mode-Auto 

Solid, 1mm(4mil), Color Laptop Inkiet KLM Spectrum MS-WORD'" MS-EXCEL® x Semiconductor 700 120V, marker air CCD Powdered, substance (D) nos. or Xcooled 200 320(D)X xDesktop 

Dimensions 

Weight Power Options Measurement, 

Camera 460 5mm(200mil) 13(AI) display, Switching X-ray 240V±10%, (H judgment Supply Detector Liquid to 155(H)mm Quantitative Statlstlcal X-ray Printer Qualitative Report Subtraction 92(U) tube (Printer (Ln2 Auto Station 

(Rh: • software (Optional) Creation 

Thln Spectrum 10A Sampie Extenmally not Processing 

target) sw~ch 

Analysis 

required) film included) Changer(turret) 

FP calibration matching driver method (OS; Auto display, X- Ysoftware(material method MS-Windows ID, stage Bulk Comparison FP, Calibration XP~) discrimlnation) 

display 

5

SEA Series Options 

Speetrum Matching 

Determines which 

among the 

registered sam pie 

library an unknown 

sam pie is nearest. 

Bulk Analysis 

* Option setting in 

SEA5000 series, 

(FP) 

Constituent analysis 

without a reference 

standard, 

~~ 

, Cr 

; 

'i

Unparalleled Performance Offering New Value in Flu 

---~--," 

Fluorescent X-ray Analyzer 

I 

Optimum Analysis of WEEE & RoHS, 

ELV, and other typical applications 

Fluorescent X-ray analyzer achieves unparalleled sensitivity without liquid nitrogen 

High resolution and light element capability enables simple analysis of a variety of materials. High count 

rate detector reduces measuring time to 1110 or less of conventional models. The optimum system for 

WEEE & RoHS, and ELV measurements. 

Capable of a wide variety of applications 

r'\ 

SIINT innovation: High count rate detector and precision 

r---- 

contral software drastically reduces measuring time. 

Measuring time is 1/10 that of conventional instruments. 

1.20 

1.00 

Pb 100ppm in brass 

(SEA1200VX~ 

• 

Capable of Light Element 

Analysis (Option) 

Vacuum capability allows 

measurements fram Na 

to U. 

• Measurement 01 Peoncentration in electroless Ni coatings 

IA llJl9cps aiI.spc . SI! • 

Ci) 0.80 

fr 

~ 

~ 0.60 

0.40 

0.20 

0.00 

8.00 

1099cps! 

B 

vacwrn.spc 

energy 

(keV) 

Our new detector does not require liquid nitrogen yet 

achieves a count rate and resolution that far exceeds 

conventional detectors that use liquid nitrogen. 

The optimum performance has been achieved by peak 

deconvolution (DPD). 

,,m 

,. 

0.00 k,V ~ 

Operation Software 

'" 

112.3ik,V 

Real 

data 

DPD Simulation Pb_La line real data 

Operability depending on operator experience 

32.00 

28.00 

24.00 

R20.00 

3 

'~16.00 

14.0 

Two modes of operation pravide separate levels of 

operation for staft and basic users. Operation is 

simple for novice users by selecting the best recipe 

for that sampie. Various settings are automated. 

mi1.Ml:.r".,_ 

'~12.00 

&00 10.00 12.00 14.00 16.00 

energy (keVl 

-2.0 1 5 9 13 17 21 2529 33 

energy (keV) 

....•.. meas ....•• Pb_La Zn_L.B ~ BLla

" ~ - 

orescent X-ray Analysis 

eConfiguration 

Measurement 

Head 

Sam pie 

LN Free Detector achieves smooth and 

high reliable daily operation; one advantage 

is couple of minutes of its idling time, and 

the other is easy of use without worrying 

about cumbersome LN 

refilling procedure. 

·, 

eVortex Principle 

Negative Electrode 

Anode 

CCD 

Camera 

~olor 

••--------~ 

Computer 

 

I 

Front-Side 

0 ';

. -. ... 

• Pb in Pb-free solder 

• •• 

.Cd and Pb in Br and Sb rich plastic .Cd, Pb, & Cr in Brass 

40.00 

30.00 

ill:u 

9.00 

6.00 

7.00 

6.00 

8. 

35.00 

4.00.40 

1.20 Cd 

12.00 10.00 C, 12.00 6.00 24.00 0.00 1.40 

Pb 

0.80 

6.00 600 (i) 18.00 0.20 

.~ >- 24.00 energy 6.00 (keV) 

20.00 

'~12.00 § 

J 

10.00 

2.00 

0.00 

1.00 

0.60 

~ z 

'0; 

'f 4.00 

.~ 3.00 

.~ 20.00 

Pb 

2.00 

10.00 

12.00 16.00 20.00 

24.00 

0.00 

6.00 8.00 10.00 12.00 14.00 16.00 18.00 

energy (keV) 

Sam pies: Sn-Cu Solder 

Conditions 

Measurement Area: 8.0mmClJ 

Measurement Time: 10 sec 

Results 

Pb Coneentration: Average Value 463ppm 

10-second Measurement: CV 4.5% 

energy 

(keVJ 

Sam pies: Cd100ppm, Pb200ppm in a soft PVC 

sam pie that eontains Br5% and Sb4% 

Conditions 

Measurement 

Area: 8.0mmClJ 

Measurement Time: Cd: 20see Pb: 10see 

Results 

Cd Coneentration: Average Vaiue 109pprn 

20-seeond Measurement: CV 8.2% 



Sampies: Cd 70ppm, Pb 990ppm, Cr 1010ppm 

in Brass sampie 

Conditions 

Measurement Area: 8.0mmClJ 

Measurement Time: Cd :30see Pb & Cr: 1Osee 

Results 

Cd Coneentration: Average Value 72.2ppm 




Cr Concentration: Average Value 1143ppm 

10-seeond Measurement: CV 107% 

~~~stallation 

eSEA1200VX 

Example 

I' 1080 "I 

rf'····, 

,001 ~ 

[ I = I 1~1C1Jj 

L-580------1 

L460-J 

Vaeuum Pump: 150(W)X427(D)X228.5(H)mm 17kg 

Printer: 460(W)X242(D)X192(H)mm 4kg 

(Unit:mm) 

L ~ . _ 

~ 

.Specification 

Elements Measured : Atomie Numbers 11 (Na) to 92(U) 

Sampletype 

: Solid, Powder, Liquid 

Source 

: Small air-eooled tube (Rh target) 

Voltage: 15kV, 30kV, 40kV, 50kV Current: 1mA 

Detector 

. Vortex® Si semiconduetor (No LN2 required) 

Analysis area 

: 1mm (40 mil) and 5mm (200 mil) (auto switehing) 

Sampie Observation 

: Color CCD Camem 

Filter 

Sampie Chamber 

: 5 filter auto switehing 

: 430(W)X320(D)X200(H)mm 

239(W)X280(D)X66(H)mm (in vaeuum) 

X-my Station 

: Laptop or Desktop computer 

(OS: MS-Windows XP®) 

Printer(Options) 

. Ink Jet Printer 

Qualitative Analysis funetions : Speetrum measurement, Auto ID, Comparison display 

Quantitative Analysis : _B_u_lk_F_P_, _C_a_lib_r_a_tio_n 

_ 

funetions KLM marker display, Subtraetion display 

Statistics Funetion : MS-EXCEL® installed 

Report Function Dimensions: MS-WORD® installed 

Dimensions : 1080(W)X750(D)X810(H)mm (not include printer) 

Weight 

: 90Kg 

Power : AC 100 to 120V, 200 to 240 V ±10%, 10A 

Options: *Preeision control judgment (hazardous substanee judgment software) 

*Speetrum matching software (material identifieation) 

* This film calibration eurve software 

*Sample changer 

*Measurerment area : 3mmcD 

*Vaeuum pump Ccapable of light element analysis) 

*Standard referenee material (for metal foils, for hazardous substanee) 

eWindows, Word,& Excel® are the registered trademarks of Microsoft 

e SIINT maintains agiobai SEA sales and service network. For global inquires please 

contact SIINT International Sales and Marketing Department ft 03 (6280) 0066 

SII 

Seiko Instruments GmbH NanoTechnology 

Siemensstrasse 9 

63263 Neu-Isenburg, Germany 

Tel.: +49 6102 297 0 ; Fax: +49 6102 297 222 

info@seiko-instruments.de www.SIINT.EU 

*printed on1 00% recyded paper Note: These specifications are subuject to change due to product improvement pJinted in japan SNT-0703E

Element analysis - Seiko Instruments GmbH

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