Element analysis - Seiko Instruments GmbH

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" ~ - orescent X-ray Analysis eConfiguration Measurement Head Sam pie LN Free Detector achieves smooth and high reliable daily operation; one advantage is couple of minutes of its idling time, and the other is easy of use without worrying about cumbersome LN refilling procedure. ·, eVortex Principle Negative Electrode Anode CCD Camera ~olor ••--------~ Computer I Front-Side 0 ';
. -. ... • Pb in Pb-free solder • •• .Cd and Pb in Br and Sb rich plastic .Cd, Pb, & Cr in Brass 40.00 30.00 ill:u 9.00 6.00 7.00 6.00 8. 35.00 4.00.40 1.20 Cd 12.00 10.00 C, 12.00 6.00 24.00 0.00 1.40 Pb 0.80 6.00 600 (i) 18.00 0.20 .~ >- 24.00 energy 6.00 (keV) 20.00 '~12.00 § J 10.00 2.00 0.00 1.00 0.60 ~ z '0; 'f 4.00 .~ 3.00 .~ 20.00 Pb 2.00 10.00 12.00 16.00 20.00 24.00 0.00 6.00 8.00 10.00 12.00 14.00 16.00 18.00 energy (keV) Sam pies: Sn-Cu Solder Conditions Measurement Area: 8.0mmClJ Measurement Time: 10 sec Results Pb Coneentration: Average Value 463ppm 10-second Measurement: CV 4.5% energy (keVJ Sam pies: Cd100ppm, Pb200ppm in a soft PVC sam pie that eontains Br5% and Sb4% Conditions Measurement Area: 8.0mmClJ Measurement Time: Cd: 20see Pb: 10see Results Cd Coneentration: Average Vaiue 109pprn 20-seeond Measurement: CV 8.2% Pb Coneentration: Average Value 192ppm 10-seeond Measurement: CV 5.0% Sampies: Cd 70ppm, Pb 990ppm, Cr 1010ppm in Brass sampie Conditions Measurement Area: 8.0mmClJ Measurement Time: Cd :30see Pb & Cr: 1Osee Results Cd Coneentration: Average Value 72.2ppm 30-seeond Measurement: CV 8.5% Pb Coneentration: Average Value 1040ppm 10-seeond Measurement: CV 11.3% Cr Concentration: Average Value 1143ppm 10-seeond Measurement: CV 107% ~~~stallation eSEA1200VX Example I' 1080 "I rf'····, ,001 ~ [ I = I 1~1C1Jj L-580------1 L460-J Vaeuum Pump: 150(W)X427(D)X228.5(H)mm 17kg Printer: 460(W)X242(D)X192(H)mm 4kg (Unit:mm) L ~ . _ ~ .Specification Elements Measured : Atomie Numbers 11 (Na) to 92(U) Sampletype : Solid, Powder, Liquid Source : Small air-eooled tube (Rh target) Voltage: 15kV, 30kV, 40kV, 50kV Current: 1mA Detector . Vortex® Si semiconduetor (No LN2 required) Analysis area : 1mm (40 mil) and 5mm (200 mil) (auto switehing) Sampie Observation : Color CCD Camem Filter Sampie Chamber : 5 filter auto switehing : 430(W)X320(D)X200(H)mm 239(W)X280(D)X66(H)mm (in vaeuum) X-my Station : Laptop or Desktop computer (OS: MS-Windows XP®) Printer(Options) . Ink Jet Printer Qualitative Analysis funetions : Speetrum measurement, Auto ID, Comparison display Quantitative Analysis : _B_u_lk_F_P_, _C_a_lib_r_a_tio_n _ funetions KLM marker display, Subtraetion display Statistics Funetion : MS-EXCEL® installed Report Function Dimensions: MS-WORD® installed Dimensions : 1080(W)X750(D)X810(H)mm (not include printer) Weight : 90Kg Power : AC 100 to 120V, 200 to 240 V ±10%, 10A Options: *Preeision control judgment (hazardous substanee judgment software) *Speetrum matching software (material identifieation) * This film calibration eurve software *Sample changer *Measurerment area : 3mmcD *Vaeuum pump Ccapable of light element analysis) *Standard referenee material (for metal foils, for hazardous substanee) eWindows, Word,& Excel® are the registered trademarks of Microsoft e SIINT maintains agiobai SEA sales and service network. For global inquires please contact SIINT International Sales and Marketing Department ft 03 (6280) 0066 SII Seiko Instruments GmbH NanoTechnology Siemensstrasse 9 63263 Neu-Isenburg, Germany Tel.: +49 6102 297 0 ; Fax: +49 6102 297 222 info@seiko-instruments.de www.SIINT.EU *printed on1 00% recyded paper Note: These specifications are subuject to change due to product improvement pJinted in japan SNT-0703E
Page 1 and 2: SII SEA (Element Monitor) Series Ca
Page 3 and 4: Excellent Tool for the WEEE & RoHS
Page 5 and 6: High Sensitivity Fluorescent X-rays
Page 7: Unparalleled Performance Offering N

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